采用AES深度刻蚀研究不同氧气含量下短路熔痕的成分

火灾中短路发生时周围的环境气氛对短路时导线上形成的熔化痕迹特征具有决定性影响。为了探讨环境气氛中氧浓度对短路熔痕特征的影响,文章对木材、纸板、泡沫、橡胶、塑料等典型燃烧物燃烧时燃烧部位的氧气浓度进行了测定,确定了典型燃烧物燃烧时燃烧部位氧气浓度的极限条件。选择100% N₂, 10% O₂+90% N₂和20% O₂+80% N₂三种浓度的试验气体,分别在3种气体环境下进行短路实验,然后对得到的短路熔痕样品进行AES深度剖析,得出短路熔痕样品表层平均氧含量与环境氧浓度成近似线性的对应关系。因此可以根据测得的氧浓度,确定出短路发生时的周围环境气氛条件,推断其与火灾发生的关系,进一步推断火灾原因。     

分子束外延GaN薄膜的X射线光电子能谱和俄歇电子能谱研究

用XPS和AES电子能谱的方法对等离子体辅助分子束外延(MBE)生长的GaN薄膜进行了表面分析和深度剖析.发现红外分子束外延(RFMBE)生长的富镓GaN薄膜实际表面存在O和C吸附层,C主要为物理吸附,而O在GaN表面形成局域化学键产生氧络合物覆盖层,并形成一定的深度分布.杂质O在GaN带隙中导带底形成杂质带同时引入深受主能级,使得带隙变窄室温光吸收谱向低能方向移动,光致发光谱出现宽带发光峰.从而影响GaN薄膜的电学和光学性质 关键词： GaN薄膜 X射线光电子能谱 俄歇电子能谱 表面分析     

X射线光电子能谱中的俄歇参数

简要介绍了几种俄歇参数定义以及俄歇参数图中涉及的原子外部驰豫能和俄歇双电离体系终态能，最后评述它们的应用。     

苝四甲酸二酐薄膜电子结构的同步辐射共振光电子能谱研究

利用基于同步辐射的近边X射线吸收精细结构谱(NEXAFS)和共振光电子谱(RPES)研究了苝四甲酸二酐分子(PTCDA)薄膜的电子结构.碳K边NEXAFS谱中能量小于290 eV的四个峰对应于PTCDA分子不同化学环境碳原子1s电子到未占据分子轨道的共振跃迁.RPES谱中观察到共振光电子发射和共振俄歇电子发射导致的共振峰结构,以及二次谐波激发的碳1s信号.根据电子动能对入射光能量的依赖性分别对三类峰结构进行了归属.同时,发现PTCDA分子轨道共振光电子峰的强度具有光子能量依赖性.这种能量选择性共振增强效应是由于PTCDA分子轨道空间分布差异导致的.共振俄歇峰主要源于高结合能(4.1 eV)分子轨道能级电子参与的退激发过程.明确RPES实验谱图中各个峰结构的起源有助于准确利用基于RPES的芯能级空穴时钟谱技术定量估算有机分子/电极异质界面处电子从分子未占据轨道到电极导带的超快转移时间.     

XPS研究Nd表面氧化物的生长过程

用X射线光电子能谱(XPS)研究新鲜Nd表面在不同氧气和空气进气量的情况下,表面氧化物的生长过程.发现氧化层由氧化物、氢氧化物及表面化学吸附水三种成分,这三种成分的增加与进气量都存在正比对数关系,氧化物和吸附水在一定进气量后趋于饱和,而氢氧化物持续不断增加,最终氢氧化物占据主要地位. 关键词： X射线光电子能谱(XPS) Nd 氧化     

ZnTe（ZnTe：Cu）多晶薄膜的XPS研究

用共蒸发法在室温下制备了ZnTe及ZnTe：Cu多晶薄膜，测量了电导率温度曲线，发现不掺杂的ZnTe薄膜的暗电导随温度的增加而线形增加，呈常规的半导体材料特征；掺Cu的ZnTe薄膜在温度较低时，lnσ随温度升高而缓慢增加，随后缓慢降低，达到一极小值，当温度继续升高时又陡然增加，呈现异常现象。用XPS研究了N2气氛下退火前后表面状态，发现不掺Cu的ZnTe薄膜呈现富Te现象。掺Cu后Te氧化明显，以ZnTe形式存在的Te明显减少；ZnTe：Cu薄膜中Zn的含量在退火前后变化明显，退火前，Zn主要以ZnTe形式存在，退火后Zn原子向表面扩散，使表面成分更加均匀，谱峰变宽；退火时，部分Cu原子进入晶格形成CuxTe相，引起载流子浓度变化，导致ZnTe：Cu多晶薄膜的电导温度关系异常。     

超高真空俄歇电子能谱原位加热和GaN热效应研究

建立一套基于超高真空俄歇电子能谱的原位加热系统,对GaN薄膜进行热效应研究．随着温度的增加,Ga LMM和Ga MVV的动能减小．利用第一性原理计算,获得理论的GaMVV俄歇谱.加热过程由于晶格热膨胀以及表面原子再构引起价电子态密度发生变化,从而导致价带俄歇谱负移．     

材料化学分析的物理方法(Ⅰ)

材料的化学信息是理解科学、工程与技术领域各种过程、机制和材料行为的最基本要素，材料研究的第一步是要确定材料的化学，包括构成材料的原子的种类、分布以及具体的化学态等内容，任何具有元素特征的物理信息，包括原子量、电子的能级、原子核自旋，甚至局域的电子态密度等都可以用来做材料的化学分析，化学信息由来自材料本身的或用作探针的电子、光子、离子或中性原子携带，相应的分析技术包括X射线光电子能谱、俄歇电子谱、核磁共振、特征X射线分析、二次离子质谱、能量损失谱、溅射中性粒子质谱，各类离子散射谱以及扫描隧道显微学方法等等，文章对上述各种分析方法的物理原理、仪器以及应用等逐一做扼要的介绍。     

模拟退火算法的并行实现及其应用

利用高性能并行超级计算机系统THNPSC-1成功地实现了模拟退火算法的并行运算,并将其应用于会聚束电子衍射、俄歇电子能谱等实验数据的分析中,取得了以往实验数据分析方法无法获得的定量数据.整个模拟退火计算程序是一个独立的模块,具有良好的可移植性,适用于任何多变量函数的最优化问题. 关键词： 最优化 会聚束电子衍射 俄歇电子能谱     

ZnTe(ZnTe∶Cu)多晶薄膜的XPS研究

用共蒸发法在室温下制备了ZnTe及ZnTe∶Cu多晶薄膜,测量了电导率温度曲线,发现不掺杂的ZnTe薄膜的暗电导随温度的增加而线形增加,呈常规的半导体材料特征;掺Cu的ZnTe薄膜在温度较低时,lnσ随温度升高而缓慢增加,随后缓慢降低,达到一极小值,当温度继续升高时又陡然增加,呈现异常现象。用XPS研究了N₂气氛下退火前后表面状态,发现不掺Cu的ZnTe薄膜呈现富Te现象。掺Cu后Te氧化明显,以ZnTe形式存在的Te明显减少;ZnTe∶Cu薄膜中Zn的含量在退火前后变化明显,退火前,Zn主要以ZnTe形式存在,退火后Zn原子向表面扩散,使表面成分更加均匀,谱峰变宽;退火时,部分Cu原子进入晶格形成Cu_xTe相,引起载流子浓度变化,导致ZnTe∶Cu多晶薄膜的电导温度关系异常。     

不同表面状态镀锡钢板铬酸盐钝化膜中铬元素的XPS分析

用X射线光电子能谱(X-ray photoelectron spectroscopy, XPS)分析的方法,对铬酸盐钝化镀锡钢板的正常表面及缺陷点处铬元素的含量、价态以及由铬元素组成的化合物进行了研究。用超声波的方法对铬酸盐钝化镀锡钢板进行处理后,研究了超声波处理对缺陷处的铬元素的含量、价态的影响。结果表明,钝化膜中主要含有Cr,O, Sn元素。镀锡铬酸盐钝化膜中正常表面的铬元素主要是以Cr(OH)₃,Cr单质以及Cr₂O₃的形态存在。在对镀锡板表面进行阴极电解钝化的过程中,Cr(Ⅵ)发生了转化,价态降低。在缺陷处,除了有Cr(OH)₃和Cr₂O₃以外,还有微量的Cr(Ⅵ)存在。在缺陷处铬元素的含量低于正常表面,在超声波清洗处理后,缺陷处铬元素的含量明显低于不经超声波清洗的含量。施加的超声波因产生强烈的洗脱作用,使吸附在缺陷处的微量的Cr(Ⅵ)消失。     

采用深度刻蚀与XPS能谱研究缓蚀膜/镀铜层/铁基体界面成分

为了探索焦磷酸盐镀铜层与铁基体结合强度差的原因,采用波谱技术,分析了纵向界面各种元素的成分变化,讨论了金属基体表面粗糙度对元素分布的影响.根据刻蚀时间可将膜层分为三部分:N,O量迅速减少的表面层,有基本固定组成的中间层和占一半厚度的出现基体元素的混合干扰层.通过对后期混合层中氧含量的分析,可得出镀铜层/铁基体界面含氧层的存在是影响电镀层与基体结合强度的主要原因的结论.     

CuPc/ITO结构的表面和界面电子态的XPS研究

覆盖有Indium tin oxide(ITO)膜的透明导电玻璃广泛地用作有机发光器件 (OLEDs)的空穴注入电极 ,但是ITO膜的功函数通常与空穴传输材料的最高被占据分子轨道 (HOMO)不匹配。铜酞菁 (CuPc)作为缓冲层可以提高空穴从ITO向空穴传输材料的注入效率。对CuPc ITO样品的XPS表面分析表明 ,在CuPc分子中 ,铜原子显 2价 ,通过配位键和氮原子相互作用。CuPc分子中有两类碳原子 :8个C原子与 2个N原子成键 ;其余 2 4个C原子具有芳香烃性质。N原子也处在两种化学环境中 :有 4个N原子只与 2个C原子形成CNC键 ;另外 4个N原子不仅与 2个C原子成键 ,还通过配位键与Cu原子成键。用氩离子束对样品表面进行了溅射剥蚀 ,当溅射时间分别为 2 ,5 ,10min时进行XPS采谱分析 ,结果表明 ,随着氩离子束溅射时间增长 ,C 1s,N 1s峰变弱 ,Cu 2p ,O 1s,In 3d,Sn 3d峰增强 ,C 1s,N 1s,O 1s,In 3d和Sn 3d峰都向高束缚能或低束缚能方向移动 ,但它们的情况却不相同。     

XPS study of SnTe(1 0 0) oxidation by molecular oxygen

The interaction between the (1 0 0) surface of SnTe single crystal and molecular oxygen was studied by means of X-ray photoelectron spectroscopy (XPS). Analysis of the obtained spectra shows that the mechanism of surface oxidation does not change in the range of oxygen exposure 10⁸-10¹³ L. During the oxidation an additional component shifted 1.1 eV towards higher binding energies appears in the Sn 3d spectra. The Te 3d_5/2 spectra fitting reveals two additional components with binding energies close to Te⁰ and Te⁺⁴. The dependence of the additional components fraction in both Sn 3d and Te 3d_5/2 spectra on the oxygen exposure is semi-logarithmic. On the base of the experimental data two possible mechanisms are proposed.     

PTCDA/ITO表面和界面的X射线光电子能谱分析

利用X射线光电子能谱对PTCDA/p-Si有机/无机光电探测器中PTCDA/ITO表面和界面进行了测试分析。结果表明,苝环上的C原子的结合能为284.6 eV,酸酐中的C原子的结合能为288.7 eV,并存在来源于ITO膜中的氧对C原子的氧化现象,界面处C(1s)谱中较高结合能峰消失,且峰值向低结合能发生化学位移;CO键中O原子的结合能为531.5 eV,C—O—C键中的O原子的结合能为533.4 eV。     

XPS and bioactivity study of the bisphosphonate pamidronate adsorbed onto plasma sprayed hydroxyapatite coatings

This paper reports the use of X-ray photoelectron spectroscopy (XPS) to investigate bisphosphonate (BP) adsorption onto plasma sprayed hydroxyapatite (HA) coatings commonly used for orthopaedic implants. BPs exhibit high binding affinity for the calcium present in HA and hence can be adsorbed onto HA-coated implants to exploit their beneficial properties for improved bone growth at the implant interface. A rigorous XPS analysis of pamidronate, a commonly used nitrogenous BP, adsorbed onto plasma sprayed HA-coated cobalt-chromium substrates has been carried out, aimed at: (a) confirming the adsorption of this BP onto HA; (b) studying the BP diffusion profile in the HA coating by employing the technique of XPS depth profiling; (c) confirming the bioactivity of the adsorbed BP. XPS spectra of plasma sprayed HA-coated discs exposed to a 10 mM aqueous BP solution (pamidronate) for periods of 1, 2 and 24 h showed nitrogen and phosphorous photoelectron signals corresponding to the BP, confirming its adsorption onto the HA substrate. XPS depth profiling of the 2 h BP-exposed HA discs showed penetration of the BP into the HA matrix to depths of at least 260 nm. The bioactivity of the adsorbed BP was confirmed by the observed inhibition of osteoclast (bone resorbing) cell activity. In comparison to the HA sample, the HA sample with adsorbed BP exhibited a 25-fold decrease in primary osteoclast cells.     

XPS depth-profile of the suboxide distribution at the native oxide/Ta interface

A X-ray photoelectron spectroscopy (XPS) depth-profile study of the naturally formed native oxide on polycrystalline Ta sample is probed by observing the core level spectra, valence band spectra and workfunction changes. The present paper addresses the issue of the presence of different Ta suboxides along the depth of the oxide layer. Core level spectra, valence band and workfunction measurements all manifest the transformation of insulating Ta₂O₅ to metallic Ta with a graded distribution of Ta sub-oxides. Effect of ion-beam irradiation and variation in the synthesis method in determining the profile is discussed. By using different ion-beam energies, it has been shown that the ion-beam induced effects are negligible in the study. Differences in the valence states reported in literature with the present study are attributed to the variations in the growth methods.     

Surface oxidation behavior of MgNd alloys

The oxidation kinetics of MgNd alloys oxidized in pure O₂ at high temperatures has been investigated. The results revealed two stages of the reaction: A fast initial oxidation was followed by a slow oxide growth with a parabolic kinetics. For MgNd alloys (Nd = 25 wt.%), the oxidation rate increased with the enhancement of the oxidation temperature. A sudden ignition was found for this alloys oxidized at 873 K up to about 80 min. Moreover, the increase of the Nd content would harm the oxidation resistance of the MgNd alloys. By Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD) and scanning electron microscopy (SEM) analysis, it was found that a triplex structure of oxide film formed. The outer layer was composed of MgO, Nd₂O₃ and Nd(OH)₃, the middle layer mainly consisted of MgO and Nd₂O₃, and the inner layer was the transitional layer made of MgO, Nd₂O₃ and the content of the substrate. The protective oxidation was associated with the formation of the dense Nd₂O₃/MgO layer during isothermal oxidation process. The oxidation mechanisms for the formation of oxide film are discussed.     

XPS and NEXAFS studies of aliphatic and aromatic amine species on functionalized surfaces

The chemical constitution of functionalized supports is an important parameter that determines their performance in a broad range of applications, e.g. for immobilization of biomolecules. Supports with amino functionalized surfaces are also often used for DNA microarray experiments. However, spectral data which have been reported for surfaces with amino functionalities suffer from some inconsistencies. In this article a detailed XPS (X-ray photoelectron spectroscopy) and NEXAFS (Near edge X-ray absorption fine structure) database for amino functionalized surfaces is presented. Amino-terminated surfaces prepared from aliphatic and aromatic aminosilanes or aminothiols and a field sample are considered. Effects of aging in air and damage by radiation are addressed as well.