原子力显微镜高次谐波幅度对样品弹性性质表征的研究

轻敲模式下原子力显微镜微悬臂探针在接近其基态共振频率的外加驱动下振荡, 其末端针尖周期性靠近、远离样品, 产生于针尖与样品非线性相互作用过程中的高次谐波信号包含更多的待测样品表面纳米力学特性等方面的信息. 通过理论分析、计算, 系统地研究了针尖与样品接触时间受样品弹性模量的影响, 以及高次谐波幅度与接触时间的关系, 获得了通过高次谐波幅度区分待测样品表面弹性性质差异的规律. 并在自制的高次谐波成像实验装置上, 得到了与理论预期一致的实验结果. 关键词： 轻敲模式原子力显微镜 接触时间 高次谐波幅度 弹性模量     

力曲线重构实验课程平台

原子力显微镜(AFM)作为一种分辨率可达原子量级的测量工具已经广泛应用于纳米材料、生物医学等领域.目前大学里开设与AFM成像技术相关的实验课程中,大多是向学生展示AFM扫描样品获得形貌图的功能,较为单调,无法使学生在实验课程中更深入地了解AFM的工作模式及成像方式.近年来,通过对原子力显微镜的输出信号进行分析,并利用高次谐波信号进行重建力曲线,使探测样品表面力学信息的方法得到了深入的研究.本文完整地叙述了使用自主开发的AFM实验平台进行重构力曲线的过程,并将其应用于AFM实验课程中,从而加深学生对AFM成像原理的了解.     

扫描探针声显微镜轻敲模式中相位像的反差机理

根据扫描探针声显微镜(SPAM)轻敲工作模式中探针作周期振动的特点,以及在探针与试样相接触过程中激振力和悬臂探针自由振动的阻尼力很小的假设下,解析求解了探针与试样的碰撞运动方程,得到了最大压痕深度和碰撞时间与探针半径、等效杨氏模量以及界面吸附能等之间的关系式,较直观地说明了SPAM中轻敲模式的相位像反差机理:信号的相位与试样微区的性质、探针振幅、设置点以及试样形貌等有关。并定量预计了纳米金刚石像中的相位差值72.59°,与实验测量平均值73.2°±8.2°一致。同时,合理地解释了实验得到的光学薄膜试样相位像的反差。这些表明SPAM轻敲模式的相位成像是一种纳米分辨率测量材料表面物理性质的成像技术。      

用数字示波器探究光磁共振实验中反常共振信号的机理

本文根据拟合得到的g_F因子大小,确定了光磁共振实验中的反常共振信号;用数字示波器测量了反常共振射频信号的频谱,计算了反常共振射频信号各高次谐波的大小;通过线性拟合,得到了正常共振信号幅度与射频信号幅度的关系。利用此关系,计算了各高次谐波产生的反常共振信号大小,计算结果与测量值基本一致。频率计连接射频信号源后,射频信号波形和频谱发生明显变化,反常共振信号随着射频信号频谱的变化发生相应改变,进一步证明了反常共振信号由射频信号的高次谐波共振所引起。这些结果表明,用数字示波器探究光磁共振实验中反常共振信号的机理不仅可行,还能定量估算和预测射频信号波形对反常共振信号大小的影响。     

5fs驱动激光脉冲的高次谐波选择性优化

研究了在紧聚焦实验条件下, 采用5 fs激光脉冲与氩气相互作用产生的高次谐波特性. 通过优化系统色散、气体靶气压与位置等参数, 观察到在60–73 eV波段范围内高次谐波光谱接近一个量级的增强. 进一步通过对单原子模型和传播方程的数值求解及模拟相位匹配实验参数下高次谐波的产生过程, 发现相位匹配在所观察到的实验现象中起着关键作用, 得到了理论上与实验规律一致的结果. 关键词： 极紫外激光 高次谐波 超快光谱     

非对称波形激光驱动的氢原子高次谐波频移及控制

提出了一种利用非对称波形激光脉冲与原子相互作用在隧穿区发射高次谐波谱的大频移方案.通过数值求解偶极近似下的三维含时薛定谔方程,研究了该激光驱动氢原子发射的高次谐波特性.结果表明,利用上升沿与下降沿不同的非对称激光驱动氢原子所发射的高次谐波在截止位置附近发生了大的频率红移和蓝移,通过改变激光脉冲的上升沿或下降沿,能调控谐波的频移量.产生频移的原因是激光脉冲上升沿或下降沿对谐波贡献的不同所致,当下降沿发射谐波的贡献大于上升沿的贡献时,谐波发生红移,反之则发生蓝移.通过改变激光脉冲波形,在隧穿电离区能够调控截止位置附近原子发射的高次谐波频率,对于给定的某一阶谐波,调控的范围可从奇次阶到邻近偶次阶之间的任意频率处.     

原子在红外激光场中产生高次谐波及阿秒脉冲随波长的变化规律

利用强场近似理论,研究了在长波红外激光场(波长800—2000 nm)驱动下氢原子产生的高次谐波,分析了在截止位置附近高次谐波的转换效率随激光波长的变化规律.发现在截止位置附近原子发射高次谐波的转换效率比平台区域的转换效率低,但获得的阿秒脉冲的宽度会随波长的增大而缩短. 关键词： 强场近似 高次谐波 阿秒脉冲     

原子力显微镜探针耦合变形下的微观扫描力研究

原子力显微镜(AFM)的微探针系统是典型的微机械构件，它在接触扫描过程处于耦合变形状态.采用数值模拟方法探究恒力模式下探针耦合变形对微观扫描力信号、微观形貌信号的影响.研究表明，AFM的恒力模式扫描中，法向扫描力并不是恒定大小，与轴向扫描力存在耦合作用，在粗糙峰峰值增加阶段，二力均增加；在粗糙峰峰值减小阶段，二力均减小；该耦合作用随形貌坡度、针尖长度等增加而加强.微观形貌的测试信号和横向扫描侧向力信号受探针耦合变形影响较小，但侧向力与形貌斜率密切相关，且其极值点与形貌极值点存在位置偏差，这些结果均与原子力 关键词： 原子力显微镜 探针悬臂梁 耦合变形 扫描力     

原子力显微术轻敲模式中探针样品接触过程及相位衬度研究

借助简单的有阻尼受迫振子模型，研究了原子力显微术轻敲模式中探针与样品接触时间t_c、样品的表面形变D_z和相位衬度对探针设置高度z_c及样品杨氏模量E_s的依赖关系.结果发现,t_c与D_z均随E_s及z_c的增大而减小，同时探针与样品作用过程伴随很小的能量耗散.对轻敲过程中相移量φ的研究表明，E_s较大的样品有较小的φ，且φ随 关键词： 原子力显微术 轻敲模式 相位衬度     

啁啾激光与半周期脉冲形成的组合场驱动原子产生单个阿秒脉冲

提出了由波长为800 nm、脉冲宽度为5 fs的啁啾激光与半周期脉冲形成组合场,并利用这种组合场驱动一维模型氦原子获得单个阿秒脉冲. 通过数值求解一维氦原子的含时薛定谔方程,发现氦原子在组合场驱动下高次谐波谱的截止位置可以扩展到I_p+21.6U_p. 对第二平台区域不同范围内高次谐波的叠加都能得到单个阿秒脉冲,最短可达37 as,特别是对平台区域的前端进行叠加不仅能够得到较短的单个阿秒脉冲,而且与截止位置附近高次谐波构造的阿秒脉冲相比,强度提高了3个数量级. 关键词： 啁啾激光场 半周期脉冲 高次谐波 阿秒脉冲     

Effect of tip mass on frequency response and sensitivity of AFM cantilever in liquid

The effect of tip mass on the frequency response and sensitivity of atomic force microscope (AFM) cantilever in the liquid environment is investigated. For this purpose, using Euler–Bernoulli beam theory and considering tip mass and hydrodynamic functions in a liquid environment, an expression for the resonance frequencies of AFM cantilever in liquid is derived. Then, based on this expression, the effect of the surface contact stiffness on the flexural mode of a rectangular AFM cantilever in fluid is investigated and compared with the case where the AFM cantilever operates in the air. The results show that in contrast with an air environment, the tip mass has no significant impact on the resonance frequency and sensitivity of the AFM cantilever in the liquid. Hence, analysis of AFM behaviour in liquid environment by neglecting the tip mass is logical.     

Fabricated cantilever for AFM measurements and manipulations: Pre-stress analysis of stress fibers

The atomic force microscope (AFM) is a highly successful instrument for imaging of nanometer-sized samples and measurement of pico- to nano-Newton forces acting between atoms and molecules, especially in liquid. Generally, commercial AFM cantilevers, which have a sharp tip, are used for AFM experiments. In this review, we introduce micro-fabricated AFM cantilevers and show several applications for cell biology. In manipulation of samples on a cellular scale with a force of tens to hundreds of nano-Newtons, attempts have been made to secure the formation of covalent/non-covalent linkages between the AFM probe and the sample surface. However, present chemistry-based modification protocols of cantilevers do not produce strong enough bonds. To measure the tensile strength and other mechanical properties of actin-based thin filaments in both living and semi-intact fibroblast cells, we fabricated a probe with a hooking function by focused ion beam technology and used it to capture, pull and eventually break a chosen thin filament, which was made visible through fusion with fluorescent proteins. Furthermore, we fabricated a microscoop cantilever specifically designed for pulling a microbead attached to a cell. The microscoop cantilevers can realize high-throughput measurements of cell stiffness.     

AFM detection of the mechanical resonances of coiled carbon nanotubes

We introduce a method for atomic force microscopy (AFM)-based detection of mechanical resonances in helix-shaped multi-walled carbon nanotubes. After deposition on an oxidized silicon substrate, the three-dimensional structure of suspended nanotubes, which bridges an artificially created step on the surface, can be visualized using AFM operating in the non-contact mode. The suspended coiled nanotubes are resonantly excited, in situ, at the fundamental frequency by an ultrasonic transducer connected to the substrate. When the AFM tip is positioned above the coiled nanotube, the cantilever is unable to follow the fast nanotube oscillations. Nevertheless, an oscillation amplitude-dependent signal is generated due to the non-linear force-to-distance dependence. Measurement of the mechanical resonances of the helix-shaped carbon nanotubes can be used to quantitatively determine their elastic properties. Assuming that a coiled nanotube can be modeled as a suspended helix-shaped uniformly thin elastic beam, the obtained resonance frequency is consistent with a Young's modulus of 0.17ǂ.05 TPa.     

Higher harmonic atomic force microscopy: imaging of biological membranes in liquid

The contribution of higher harmonics to the movement of a dynamic force microscope cantilever interacting with a sample in liquid was investigated. The amplitude of the second harmonic has been found to be an order of magnitude higher in liquid than in air, reflecting an increased sensitivity to local variations in elasticity and interaction geometries. A theoretical model of the tip-sample interactions in liquid was introduced and shown to be consistent with experimental findings. Second harmonic amplitude images were recorded on soft biological samples yielding a lateral resolution of approximately 0.5 nm.     

High finesse opto-mechanical cavity with a movable thirty-micron-size mirror

We report on the demonstration of a high finesse micro-optomechanical system and identify potential applications ranging from optical cooling to weak force detection to massive quantum superpositions. The system consists of a high quality diameter flat dielectric mirror cut from a larger substrate with a focused ion beam and attached to an atomic force microscope cantilever. Cavity ring-down measurements performed on a 25 mm long Fabry-Pérot cavity with the 30 microm mirror at one end show an optical finesse of 2100. Numerical calculations show that the finesse is not diffraction limited and that orders of magnitude higher finesse should be possible. A mechanical quality factor of more than 10(5) at pressures below 10(-3) mbar is demonstrated for the cantilever with a mirror attached.     

Accurate detection of interface between SiO2 film and Si substrate

Accurate end point detection of interface for multilayers using focused ion beam (FIB) is important in nanofabrication and IC modification. Real-time end point graph shows sample absorbed current as a function of sputtering time during FIB milling process. It is found that sample absorbed current increases linearly with ion beam current for the same material and changes when ion beam is milling through a different material. Investigation by atomic force microscope (AFM) and FIB cross-sectioning shows that accurate SiO₂/Si interface occurs to where the maximum sample absorbed current occurs. Since sample absorbed current can be real-time monitored in focused ion beam machine, the paper provides a viable and simple method for accurately determining the interface during FIB milling process for widely used SiO₂/Si system.     

Scanning probe microscope with interchangeable AFM-FFM and STM heads

Summary A scanning probe microscope operating in air with interchangeable atomic force-friction force (AFM-FFM) and electronic-tunnelling (STM) heads is presented. Our AFM operates in the so-called contact mode and utilizes the optical-lever detection method which allows simultaneous measurement of the topography as well as the lateral force. The set-up also contains an optical microscope to control both the sample and the probe laser spot on the cantilever. The experimental method to change from AFM to STM operation is based on the use of the probe laser beam and the optical microscope. The maximum scanning area is (24×24) μm² and it is well embraced in the optical-microscope visual field. The microscope attains atomic resolution in air in both AFM and STM configuration. Its performance is demonstrated on the surface of different samples. In honour of Prof. Fausto Fumi on the occasion of his retirement from teaching.     

Tip cleaning and sharpening processes for noncontact atomic force microscope in ultrahigh vacuum

Tip cleaning and sharpening processes for noncontact atomic force microscope (AFM) operated in ultrahigh vacuum (UHV) were carried out and evaluated by a scanning Auger microscope (SAM) with a field emission electron gun and a noncontact AFM in UHV combined with a scanning tunneling microscope and a field emission microscope. The cantilever used in this study was piezoresistive, which can be heated by passing a current through the resistive legs of the cantilever. As a pretreatment, the tip was irradiated with ultraviolet light in oxygen to remove carbon contaminants. It was heated at about 750°C to form a clean oxide layer in oxygen of 5×10⁻⁵ Torr in an SAM chamber. The desorption of the layer can make a remained tip apex sharper by heating under electron beam irradiation. A thermally oxidized layer was also eliminated by HF etching to sharpen the tip apex. The procedures are useful to obtain a well-defined Si tip suitable for a noncontact AFM.     

Nano-probe-assisted technology of indium-nano-dot formation for site-controlled InAs/GaAs quantum dots

We have successfully and reproducibly fabricated uniform indium (In) nano-dots at a selected point. Nano-dot formation was realized using an atomic force microscope (AFM) probe with a specially designed cantilever, which was equipped with a hollow pyramidal tip with a sub-micron size aperture on the apex and an In-reservoir tank within the stylus. The In nano-dots formed in this study can be directly converted to InAs quantum dots by subsequent irradiation of arsenic flux in the molecular beam epitaxy chamber, which is connected to the AFM chamber through an ultra-high-vacuum tunnel.