高能电子照相成像模糊模拟研究

高能电子照相是一种新兴的无损探测技术,可以在不拆解客体的情况下对客体材料及其内部结构进行定量测量。与高能质子照相相比,其分辨能力更高,可达到亚m量级,有望成为介观现象诊断的有力工具。为研究相互作用和成像束线对成像模糊度的影响,采用Geant4模拟软件,建立12 GeV电子束从客体到像平面全过程照相模型,主要分析了成像束线引起的色差模糊、客体纵向长度引起的模糊以及次级粒子造成的模糊。研究结果表明,高能电子照相成像模糊为亚m量级,其中成像束线引起的色差模糊为主要贡献项,次级粒子和客体纵向长度引起的模糊可以忽略。     

高能电子照相成像模糊模拟研究

高能电子照相是一种新兴的无损探测技术,可以在不拆解客体的情况下对客体材料及其内部结构进行定量测量。与高能质子照相相比,其分辨能力更高,可达到亚m量级,有望成为介观现象诊断的有力工具。为研究相互作用和成像束线对成像模糊度的影响,采用Geant4模拟软件,建立12 GeV电子束从客体到像平面全过程照相模型,主要分析了成像束线引起的色差模糊、客体纵向长度引起的模糊以及次级粒子造成的模糊。研究结果表明,高能电子照相成像模糊为亚m量级,其中成像束线引起的色差模糊为主要贡献项,次级粒子和客体纵向长度引起的模糊可以忽略。     

X射线点投影技术在高能量密度物理相关实验中的应用

利用激光驱动4.8 keV左右的Ti等离子体X射线源作为背光,通过静态成像实验研究了针孔辅助点投影诊断方法及其特点。进行了点投影技术动态诊断应用探索,建立了光子能量约4.8 keV、时间分辨力约100 ps、空间分辨约10μm的动态诊断实验平台。并简要介绍了此诊断平台上开展的流体力学不稳定性研究、激光加速射流、材料预压缩特性研究等一系列实验结果。     

高能电子成像暗场成像技术特性研究及改进方案

基于EGS5与PARMELA模拟软件组成的高能电子成像系统,对暗场成像的模拟研究发现,通过调节光阑位置实现的暗场成像结果存在失真现象。针对该失真现象提出的改进方案,消除了暗场成像结果的失真。通过对40 MeV电子透射7~224 μm的铝样品开展的成像模拟结果表明：40 MeV高能电子暗场成像技术在铝样品厚度小于25 μm情况下具有明显的面密度分辨优势,且空间分辨率达到μm量级,非常适用于高能量密度物质诊断。     

双自由度诊断高能电子透镜成像技术

电磁场及流体演化过程信息的获取在高能量密度物理、可控核聚变及实验天体物理的研究中起着重要的作用,然而在实验过程中,电磁场信息及流体信息的同步获取是非常困难的。基于高能电子透镜成像技术,利用面密度差分的方法,提出了一种可以实现面密度和场积分强度同时获取的双自由度诊断设计方案。结合了蒙特卡罗模拟和束流光学分析,该方案在相对较强的电磁场情况下的适用性得到了验证。此外,我们可以通过改变Fourier面处光阑的形状将其适用区间扩展到低电磁场强度相空间。结合高能电子束相对论速度及超短脉冲的特点,该技术非常适用于磁流体超快演化过程的诊断。     

硬X光光电成像系统面密度分辨能力

针对基于将X光转换成可见光接收的硬X光光电成像系统,研究了系统面密度分辨能力的理论模型,获得了系统面密度分辨能力的上下限的表达式;建立了对硬X光成像系统对面密度分辨能力的测量方法。利用自制面密度分辨率板,实验测量了由射频X光机、转换屏、光纤锥耦合和CCD相机组成的硬X光光电成像系统在不同照射量下的面密度极限分辨能力的上下限值。实验结果与理论分析模型分析趋势一致,在未饱和条件下面密度分辨力上限随着照射量的增加而不断增加,而面密度分辨力下限随着照射量的增加将减小。     

Efficient, 1-100-keV x-ray radiography with high spatial and temporal resolution

Transient x-ray radiography using laser-plasma emission is a powerful tool for diagnosing a large variety of high-energy-density phenomena. Traditional area- and point-backlighting techniques used at inertial confinement fusion facilities such as Nova and Omega cannot be extended efficiently to the future 100-times-larger National Ignition Facility. We have developed an x-ray backlighting technique that uses a backlit pinhole as a source for point-projection radiography. This method incorporates the principal advantages of point projection over traditional area backlighting in that it requires far less backlighter energy and produces data that are free from residual backlighter plasma structure. Moreover, the use of pinholes overcomes the usual disadvantages of point projection from pin targets, namely, degradation of spatial resolution and cooling due to plasma expansion.     

A magnetic-free high resolution parabolic mirror time-of-flight electron energy spectrometer

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Practical spatial resolution of electron energy loss spectroscopy in aberration corrected scanning transmission electron microscopy

The resolution of electron energy loss spectroscopy (EELS) is limited by delocalization of inelastic electron scattering rather than probe size in an aberration corrected scanning transmission electron microscope (STEM). In this study, we present an experimental quantification of EELS spatial resolution using chemically modulated 2×(LaMnO(3))/2×(SrTiO(3)) and 2×(SrVO(3))/2×(SrTiO(3)) superlattices by measuring the full width at half maxima (FWHM) of integrated Ti M(2,3), Ti L(2,3), V L(2,3), Mn L(2,3), La N(4,5), La N(2,3) La M(4,5) and Sr L(3) edges over the superlattices. The EELS signals recorded using large collection angles are peaked at atomic columns. The FWHM of the EELS profile, obtained by curve-fitting, reveals a systematic trend with the energy loss for the Ti, V, and Mn edges. However, the experimental FWHM of the Sr and La edges deviates significantly from the observed experimental tendency.     

Recent developments in high energy and spatial resolution analysis of polymers by XPS

Historically, obtaining useful XPS spectra from polymers has been perceived to be difficult. Problems have included low signal intensities from monochromatic sources, poor spatial resolution, and difficulties with charge compensation. Recent improvements in XPS instrumentation now make it possible to routinely analyze samples which previously would have been considered challenging or impossible. This is particularly true for multi-component polymer samples, which can be difficult to characterize using only large-area spectroscopy. The status of current XPS instrumentation is overviewed, with a variety of examples from polymer analysis. Examples include the use of imaging XPS in the analysis of PVC/PMMA blends, quantification using the valence band region, chemical derivatization of PVMK using hydrazine and trifluorophenylmethyl hydrazine, and high spatial resolution analysis of fiber mats. The importance of high spatial resolution analyses in the evaluation of heterogeneous samples is discussed.     

An accelerator scenario for a hard X-ray free electron laser combined with high energy electron radiography

In order to study the dynamic response of the material and the physical mechanism of fluid dynamics,an accelerator scenario which can be applied to both hard X-ray free electron laser and high energy electron radiography is proposed.This accelerator is mainly composed of a 12 GeV linac,an undulator branch and an eRad beamline.In order to characterize a sample's dynamic behavior in situ and real-time with XFEL and eRad simultaneously,the linac should be capable of accelerating the two kinds of beam within the same operation mode.Combining in-vacuum and tapering techniques,the undulator branch can produce more than 1011 photons per pulse in 0.1%bandwidth at42 keV.Finally,an eRad amplifying beamline with 1:10 ratio is proposed as an important complementary tool for the wider view field and density identification ability.     

数值模拟高能中子照相

 模拟了14 MeV中子在穿透样品后与闪烁体光纤的作用。对每根光纤中的能量沉积进行了计算,并转换成可见光(496 nm)光子数。在模拟实验中,分析了影响图像质量的因素。计算了散射中子本底与闪烁体和样品(聚乙烯)间距的关系。当间距为cm量级时,散射中子本底对图像的影响很小。计算表明系统对样品的甄别厚度与入射中子总数有关,在一定范围内近似与中子总数的对数成线性关系。通过模拟结果给出了理想平行中子束入射情况下系统的平面分辨率。     

数值模拟高能中子照相

模拟了14 MeV中子在穿透样品后与闪烁体光纤的作用。对每根光纤中的能量沉积进行了计算,并转换成可见光(496 nm)光子数。在模拟实验中,分析了影响图像质量的因素。计算了散射中子本底与闪烁体和样品(聚乙烯)间距的关系。当间距为cm量级时,散射中子本底对图像的影响很小。计算表明系统对样品的甄别厚度与入射中子总数有关,在一定范围内近似与中子总数的对数成线性关系。通过模拟结果给出了理想平行中子束入射情况下系统的平面分辨率。     

Image blur in high energy proton radiography

Proton radiography has provided a potential development direction for advanced hydrotesting, and its image blur is a crucial point that needs to be deeply studied. In this article, numerical simulation by using the Monte Carlo code Geant4 has been implemented to investigate the entire physics mechanism of high energy proton beam travelling through the object and beamline and arriving at the image plane. This article will mainly discuss the various factors which cause the image blur, including the chromatic aberration of the imaging beamline, the insufficient modulation of an incident particle's transverse displacement and angle deviation, the longitudinal length of an object, the influence of containment vessel and otherwise.     

Imaging beamline for high energy proton radiography

Proton radiography is a new tool for advanced hydrotesting. This article will discuss the basic concept of proton radiography first, especially the magnetic lens system. Then a scenario of 50 GeV imaging beamline will be described in every particular, including the matching section, Zumbro lens system and imaging system. The simulation result shows that the scenario of imaging beamline performs well, and the influence of secondary particles can be neglected.     

Comparison of cross sections in high resolution electron energy loss spectroscopy and infrared reflection spectroscopy

Electron energy losses and absorption of infrared radiation are both caused by the dipole moment of the surface vibration. A comparison of absolute intensities between both techniques should therefore be possible. In this paper the appropriate formulas are derived. For the adsorption system CO on Pt(111) which has been investigated by both techniques a perfect agreement is found. For a number of adsorbate systems the effective ionic charge is calculated from previously published electron energy loss data.     

Increasing spatial resolution in the backscattered electron mode of scanning electron microscopy

A new method for increasing spatial resolution in the detection of backscattered electrons and induced current in scanning electron microscopy (SEM) is proposed in terms of regularized Fourier transform. The real size of an electron probe and its blurring in a solid target sample are considered in forming the algorithm. The experiments reveal an almost 100% improvement in resolution in the processed images.     

Operating mode of high pressure straws with high spatial resolution

The article presents results of studying the operating mode of thin-walled drift tubes (straws) at flushing it with a high-pressure gas mixture, which allowed obtaining extremely high spatial resolution for straw detectors. The results of studying the radiation ageing of straws operating in this mode are also described.