Variables sampling plans with PPM fraction of defectives and process loss consideration

Acceptance sampling plans provide the vendor and the buyer decision rules for lot sentencing to meet their product quality needs. A problem the quality practitioners have to deal with is the determination of the critical acceptance values and inspection sample sizes that provide the desired levels of protection to both vendors and buyers. As today's modern quality improvement philosophy, reduction of variation from the target value is the guiding principle as well as reducing the fraction of defectives. The C_pm index adopts the concept of product loss, which distinguishes the product quality by setting increased penalty to products deviating from the target. In this paper, a variables sampling plan based on C_pm index is proposed to handle processes requiring very low parts per million (PPM) fraction of defectives with process loss consideration. We develop an effective method for obtaining the required sample sizes n and the critical acceptance value C₀ by solving simultaneously two nonlinear equations. Based on the designed sampling plan, the practitioners can determine the number of production items to be sampled for inspection and the corresponding critical acceptance value for lot sentencing.     

Multiple dependent state sampling plans for lot acceptance based on measurement data

This paper proposes a multiple dependent (or deferred) state sampling plan by variables for the inspection of normally distributed quality characteristics. The decision upon the acceptance of the lot is based on the states of the preceding lots (dependent state plan) or on the states of the forthcoming lots (deferred state plan). The lot acceptance probability is derived and the two-point approach to determining the plan parameters is described. The advantages of this new variables plan over conventional sampling plans are discussed. Tables are constructed for the selection of parameters of this plan under the specific values of the producer’s and consumer’s risks, indexed by acceptable quality level and limiting quality level, when the standard deviation is known or unknown.     

A variables sampling plan based on Cpmk for product acceptance determination

Process capability indices are useful management tools, particularly in the manufacturing industry, which provide common quantitative measures on manufacturing capability and production quality. Most supplier certification manuals include a discussion of process capability analysis and describe the recommended procedure for computing a process capability index. Acceptance sampling plans have been one of the most practical tools used in classical quality control applications. It provides both vendors and buyers to reserve their own rights by compromising on a rule to judge a batch of products. Both sides may set their own safeguard line to protect their benefits. Two kinds of risks are balanced using a well-designed sampling plan. In this paper, we introduce a new variables sampling plan based on process capability index C_pmk to deal with product sentencing (acceptance determination). The proposed new sampling plan is developed based on the exact sampling distribution hence the decisions made are more accurate and reliable. For practical purpose, tables for the required sample sizes and the corresponding critical acceptance values for various producer’s risk, the consumer’s risk and the capability requirements acceptance quality level (AQL), and the lot tolerance percent defective (LTPD) are provided. A case study is also presented to illustrate how the proposed procedure can be constructed and applied to the real applications.     

Capability-based quick switching sampling system for lot disposition

Various acceptance sampling schemes have been developed for quality control and assurance. In this research, two types of variables quick switching sampling (VQSS) system based on the process capability index C_pk are proposed. The VQSS is composed of two single sampling plans, one is under a normal inspection and the other is under a tightened inspection. Requirements for accepting a lot under the tightened inspection are more stringent than under the normal inspection. The concept of the VQSS system is that the sampling mechanism can adjust flexibly based on the quality history of the preceding submitted lots. A minimization model is constructed to solve the plan parameters for each type of the VQSS system under different mixes of quality levels and risk endurance levels, and several tables are prepared for references. In addition, the performance of the two types of VQSS system are compared with the single sampling plan through the operating characteristic (OC) curve and the average sample number (ASN) required for inspection. Finally, a real example from a dielectric layer coating machine is presented to show the practicality of the proposed system.     

Integrated inventory and inspection policies for stochastic demand

In this paper, we develop integrated inventory inspection models with and without replacement of nonconforming items. Inspection policies include no inspection, sampling inspection, and 100% inspection. We consider a buyer who places an order from a supplier when his inventory level drops to a certain point, due to demand which is stochastic in nature. When a lot is received, the buyer uses some type of inspection policy. The fraction nonconforming is assumed to be a random variable following a beta distribution. The order quantity, reorder point and the inspection policy are decision variables. In the inspection policy involving determining sampling plan parameters, constraints on the buyer and manufacturer risks is set in order to obtain a fair plan for both parties. A solution procedure for determining the operating policies for inventory and inspection consisting of order quantity, sample size, and acceptance number is proposed. Numerical examples are presented to conduct a sensitivity analysis for important model parameters and to illustrate important issues about the developed models.     

Variable sampling inspection for resubmitted lots based on process capability index Cpk for normally distributed items

In this article, a variables sampling inspection plan for resubmitted lot based on the process capability index C_pk is developed for normally distributed items with unknown mean and variance. The three plan parameters, sample size n, critical acceptance value k_a and the number of resubmissions m, are determined simultaneously by minimizing average sample number (ASN) with two conditions specified by the producer and the consumer. The advantages of the proposed resubmitted sampling plan over the variables single sampling plan are also discussed. Tables of plan parameters for selected values of acceptable quality level (AQL), limiting quality level (LQL), producer’s α-risk and consumer’s β-risk are provided and discussed with the help of an application example.     

Variables sampling inspection scheme for resubmitted lots based on the process capability index Cpk

This paper attempts to develop a sampling inspection scheme by variables based on process performance index for product acceptance determination, which examines the situation where resampling is permitted on lots not accepted on original inspection. The equations for plan parameters, the required sample size and the corresponding critical value, are derived based on the exact sampling distribution rather than an approximation approach hence the decisions made are more accurate and reliable. Moreover, the efficiency of the proposed variables resubmitted sampling plan is evaluated and compared with the existing variables single sampling plan. For illustrative purpose, an example is presented to demonstrate the use of the derived results for making a decision on product acceptance determination.     

Classical versus Bayesian risks in acceptance sampling: a sensitivity analysis

Assuming a beta prior distribution on the fraction defective, $p$ , failure-censored sampling plans for Weibull lifetime models using classical (or average) and Bayesian (or posterior) producer’s and consumer’s risks are designed to determine the acceptability of lots of a given product. The average risk criterion provides a certain assurance that good (bad) lots will be accepted (rejected), whereas the posterior risk criterion provides a determined confidence that an accepted (rejected) lot is indeed good (bad). The performance of classical and Bayesian risks are analyzed in developing sampling plans when the lifetime variable follows the Weibull distribution. Several figures and tables illustrate the sensitivity of the risks and optimal sample sizes for selected censoring levels and specifications according to the available prior information on $p$ . The analysis clarifies the distinction among the different risks for a given sampling plan, and the effect of the prior knowledge on the required sample size. The study shows that, under uncertainty in the prior variance of $p$ , the designs using Bayesian risks are more appropriate.     

Optimal lot size and inspection policy for products sold with warranty

This paper develops a mathematical model to jointly determine the optimal lot size and product inspection policy for a deteriorating production system, when products are sold with free minimal repair warranty. Due to system deterioration, a last-K product inspection scheme is proposed, under which the last K products in a production lot are inspected and nonconforming products found are reworked. Based on the model, we show that there exist a unique optimal lot size and a corresponding inspection policy such that the expected total cost per unit time is minimized. Since there is no closed-form expression for the optimal lot size, an upper bound and approximate solutions are obtained to facilitate the search process. Furthermore, an algorithm is provided to efficiently search for the optimal policy and the performance of the optimal policy is evaluated through numerical examples.     

An efficient inspection scheme for variables based on Taguchi capability index

Acceptance sampling has been one of practical tools for quality assurance applications, which provide a general rule to the producer and the consumer for product acceptance determination. It has been shown that variables sampling plans requires less sampling compared with attributes sampling plans. Thus, variables sampling plans become more attractive and desirable especially when the required quality level is very high or the allowable fraction non-conforming is very small. This paper attempts to develop an efficient and economic sampling scheme, variables repetitive group sampling plan, by incorporating the concept of Taguchi loss function. The OC curve of the proposed plan is derived based on the exact sampling distribution and the plan parameters are determined by minimizing the average sample number with two constraints specified by the producer and the consumer. The efficiency of the proposed variables RGS is examined and also compared with the existing variables single sampling plan in terms of the sample size required for inspection. In addition, tables of the plan parameters for various combinations of entry parameters are provided and an example is presented for illustration.     

A new system of skip‐lot sampling plans having a provision for reducing normal inspection

The skip‐lot sampling program can be used for reducing the amount of inspection on a product that has excellent quality history. Thus skip‐lot sampling plans are designed to reduce inspection costs. Moreover, the skip‐lot concept is sound and useful and is economically advantageous to use in the design of sampling plans. Hence, a new system of skip‐lot sampling plans designated as the SkSP‐V plan is developed in this paper. The proposed plan requires a return to normal inspection whenever a lot is rejected during sampling inspection, but has a provision for a reduced normal inspection upon demonstration of superior product quality. A Markov chain formulation and derivation of performance measures for this new plan are presented. The properties of SkSP‐V plan are studied with single sampling plan as the reference plan. Advantages of this new plan are also discussed. Finally, certain cost models are given for the economic design of the SkSP‐V plan. Copyright © 2010 John Wiley & Sons, Ltd.     

An innovative Bayesian sequential censored sampling inspection method and application to test design

This paper proposes an innovative Bayesian sequential censored sampling inspection method to improve the inspection level and reduce the sample size in acceptance test plans for continuous lots. A mathematical model of Bayesian sequential censored sampling is built, where a new inspection parameter is created and two types of risk are modified. As the core of Bayesian risk formulas, a new structure method of the prior distribution is presented by combining the empirical distribution with the uncertainty of the estimation. To improve the fitting accuracy of parameter estimation, an adaptive genetic algorithm is applied and compared with different parameter estimation methods. In the prior distribution, a prior estimator is introduced to design a sampling plan for continuous lots. Then, three types of producer's and consumer's risks are derived and compared. The simulation results indicate that the modified Bayesian sampling method performs well, with the lowest risks and the smallest sample size. Finally, a new sequential censored sampling plan for continuous lots is designed for the accuracy acceptance test of an aircraft. The test results show that compared with the traditional single sampling plan, the sample size is reduced by 66.7%, saving a vast amount of test costs.     

Continuous sampling plans for Markov-dependent production processes under limited inspection capacity

A continuous sampling plan is a set of rules that provide a given Average Outgoing Quality (AOQ), ideally with the minimum of effort (as measured by the Average Fraction Inspected, or AFI). Most such plans are based on the assumption that the quality (either defective or not) of successive production units is uncorrelated. In this paper, we explore the impact of correlation in the production process on the design of a sampling plan when it is not possible to inspect long runs of production unit-by-unit. We shall generalize Dodge's continuous sampling plan on two counts, replacing Level 1 100% inspection by 100f_o% inspection, and considering the production process to be Markov dependent instead of consisting of independent Bernoulli trials. We derive formulae for the AOQ and AFI, and consider how best to choose the sampling plan parameters in the presence of nonzero correlation.     

Assessing process capability based on the lower confidence bound of Cpk for asymmetric tolerances

It has been proved that process capability indices provide very efficient measures of the capability of processes from many different perspectives. At the present time, the C_pk index is used more than any other index for measuring process capability. However, most existing research works for capability testing have focused on processes with symmetric tolerances, but not for asymmetric tolerances. A lower confidence bound estimates the minimum process capability, conveying critical information regarding product quality, which is essential to quality assurance. The sample size determination, which provides the sample sizes necessary to achieve a desired lower confidence bound, is directly related to the cost of the data collection plan. This paper provides explicit formulas with efficient algorithms to obtain the lower confidence bounds and sample sizes required for specified precision of the estimation on C_pk for processes with asymmetric tolerances. A Matlab computer program using a binary search method is developed. For the practitioners to use in their in-plant applications, we tabulate lower confidence bounds for some commonly used capability requirement and the sampling accuracy of C_pk for sample sizes determination. A realistic example of forging process is presented to illustrate the applicability of the proposed method.     

计数调整型抽样系统T→D转移规则特性研究

在计数调整型抽样检验系统中 ,ISO2 85 9/ 1- 1994将加严检验到暂停检验规则 (TD规则 )修改为“累计五批在加严下不合格”。本文系统比较了“累计五批”和“连续十批”这两个TD规则。分析了样本字码为B ,在批质量水平为 p =AQL处的一次加严方案的转移概率、平均链长 ,并进行了灵敏度分析。     

非正态总体控制图和预防维修策略耦合优化的研究

主要探讨非正态有偏总体的过程监控和预防维修耦合优化问题。假定设备故障率随时间递增,设备发生异常前在正常状态的停留时间服从威布尔分布,一旦发生异常将导致过程均值漂移。采用赋权方差法构造X控制图,将过程监控和预防维修策略联系起来,结合生产不合格品损失、抽样成本及维修成本等,构建综合损失模型,提出动态抽样方案、控制图参数和预防维修间隔的确定方法。最后对模型进行了灵敏度分析。     

Equitable quality level and error-areas under the operating characteristic curves of normal single sampling inspection plans (with σ known)

Summary This article assumes a continuous prior distribution for lot quality in the case of a normal single sampling inspection plan with known standard deviation. The definition of Equitable Quality Level (EQL) as given in this paper ensures that the proportion of lots of quality better than the EQL—as obtained under the prior distribution—is equal to the average probability of acceptance. The first kind of error-area at the quality levelp′ is the joint probability of producing a lot of quality equal to or better thanp′ and getting such a lot rejected by the plan whereas the second kind of error-area is the joint probability of producing a lot of quality worse thanp′ and getting it accepted. Certain measures of producer's and consumer's risks can therefore be defined in terms of error-areas. It is noted that the OC can be viewed as the upper cumulative distribution function of a hypothetical random variableY. It is shown that the EQL and the error-areas can be expressed in terms of the derivatives of the prior distribution and the moments ofY. The latter do not depend on the prior distribution. It is hinted how this technique can be used to construct plans having certain optimum properties and also to obtain approximations to compound distribution. The case of a normal prior distribution is fully dealt with.     

Optimal truncated repetitive lot inspection with defect rates

Single and repetitive sampling schemes are conventional methods for evaluating the quality of lots or batches of products. Truncation repetitive sampling plans are introduced in this paper in order to significantly reduce the size of samples drawn from the lot. Under this scheme type, if a decision about the acceptance or rejection of the lots cannot be made in the original inspection, they can be reinspected, at most, a prefixed number of times. The Poisson distribution is assumed for the number of defects found in the samples drawn from the lot. Best truncated repetitive sampling plans are determined by solving integer nonlinear programming problems. A simplified methodology is suggested to obtain the plans with optimal inspection effort and controlled risks by using an iterative procedure. According to the results obtained, optimal truncated plans are shown to be better than the optimal single and repetitive schemes in reducing the average sample number of the inspection. An application to the manufacturing of glass is presented for illustrative purposes.     

Tool replacement policy for one-sided processes with low fraction defective

In most manufacturing industries, tool replacement policy is essential for minimizing the fraction defective and the manufacturing cost. Tool wear is caused by the action of sliding chips in the shear zone, and the friction generated between the tool flank and workpiece. This wear, apparently, is a dominant and irremovable component of variability in many machining processes, which is a systematic assignable cause. As the tool wear occurs in the machining processes, the fraction of defectives would gradually become significant. When the fraction defective reaches a certain level, the tool must be replaced. Therefore, detecting suitable time for tool replacement operation becomes essential. In this paper, we present an analytical approach for unilateral processes based on the one-sided process capability index C _PU (or C _PL ) to find the appropriate time for tool replacement. Accurate process capability must be calculated, particularly, when the data contains assignable cause variation. By calculating the index C _PU (or C _PL ) in a dynamical environment, we propose estimators of C _PU (or C _PL ) and obtain exact form of the sampling distribution in the presence of systematic assignable cause. The proposed procedure is then applied to a real manufacturing process involving tool wear problem, to demonstrate the applicability of the proposed approach.