Space-charge-limited currents and photoconductive properties of Tl2InGaSe4 layered crystals

The extrinsic electronic parameters of Tl₂InGaSe₄ layered crystals were investigated through measurement of the temperature-dependent dark conductivity, space-charge-limited currents and photoconductivity. Analysis of the dark conductivity reveals the existence of two extrinsic energy levels at 0.40 and 0.51 eV below the conduction band edge, which are dominant above and below 260 K, respectively. Current–voltage characteristics show that the one at 0.51 eV is a trapping energy level with a concentration of (4.8–7.7) × 10¹⁰ cm^?3. Photoconductivity measurements reveal the existence of another energy level located at 0.16 eV. In the studied temperature range, the photocurrent increases with increasing temperature. The dependence of the photoconductivity on the incident light intensity exhibits a linear recombination character near room temperature and a supralinear character as the temperature decreases. The change in recombination mechanism is attributed to an exchange in the behavior of sensitizing and recombination centres.     

Photoelectronic and electrical properties of Tl2InGaS4 layered crystals

Tl₂InGaS₄ layered crystals are studied through the dark electrical conductivity, space charge limited current and illumination- and temperature-dependent photoconductivity measurements in the temperature regions of 220-350 K, 300-400 K and 200-350 K, respectively. The space charge limited current measurements revealed the existence of a single discrete trapping level located at 0.44 eV. The dark electrical conductivity showed the existence of two energy levels of 0.32 eV and 0.60 eV being dominant above and below 300 K, respectively. The photoconductivity measurements reflected the existence of two other energy levels located at 0.28 eV and 0.19 eV at high and low temperatures, respectively. The photocurrent is observed to increase with increasing temperature up to a maximum temperature of 330 K. The illumination dependence of photoconductivity is found to exhibit supralinear recombination in all the studied temperature ranges. The change in recombination mechanism is attributed to exchange in the behavior of sensitizing and recombination centers.     

Dark electrical conductivity and photoconductivity of Ga4Se3S layered single crystals

Ga₄Se₃S layered crystals were studied through the dark electrical conductivity, and illumination- and temperature-dependent photoconductivity in the temperature region of 100-350 K. The dark electrical conductivity reflected the existence of two energy states located at 310 and 60 meV being dominant above and below 170 K, respectively. The photoconductivity measurements revealed the existence of another two energy levels located at 209 and 91 meV above and below 230 K. The photoconductivity was observed to increase with increasing temperature. The illumination dependence of photoconductivity was found to exhibit linear and supralinear recombination above and below 280 K, respectively. The change in recombination mechanism was attributed to the exchange in the behavior of sensitizing and recombination centers.     

Electrical conduction mechanism and carrier trapping in β-metal free phthalocyanine single crystals

The dark electrical conductivity of β-metal free phthalocyanine single crystals has been investigated over the temperature range 273–600°K, at a reduced pressure of 10^?7 torr. The results obtained are in accordance with the model proposed by Barbe and Westgate[5] for this material, in which the energy gap between the top of the valence band and the bottom of the conduction band is determined to be 2·00 eV. At temperatures below about 410°K, the conduction process is consistent with the presence of an electron trapping level located 0·32 eV below the conduction band edge, with a density of 7×10¹⁶ cm^?3, and a donor level of density 2×10⁷ cm^?3 at the same energy. Above about 410°K, there is evidence to suggest that the conduction process is intrinsic.     

On the binding energies and configurations of vacancy and copper–vacancy clusters in bcc Fe–Cu:a computational study

The properties of trapping centres in – as grown – Tl₄GaIn₃S₈ layered single crystals were investigated in the temperature range of 10–300 K using thermoluminescence (TL) measurements. TL curve was analysed to characterize the defects responsible for the observed peaks. Thermal activation energies of the trapping centres were determined using various methods: curve fitting, initial rise and peak shape methods. The results indicated that the peak observed in the low-temperature region composed of many overlapped peaks corresponding to distributed trapping centres in the crystal structure. The apparent thermal energies of the distributed traps were observed to be shifted from ~12 to ~125 meV by increasing the illumination temperature from 10 to 36 K. The analysis revealed that the first-order kinetics (slow retrapping) obeys for deeper level located at 292 meV.     

Low-temperature photoluminescence in CuIn<Subscript>5</Subscript>S<Subscript>8</Subscript> single crystals

Photoluminescence (PL) spectra of CuIn₅S₈ single crystals grown by Bridgman method have been studied in the wavelength region of 720–1020 nm and in the temperature range of 10–34 K. A broad PL band centred at 861 nm (1.44 eV) was observed at T = 10 K. Variations of emission band has been studied as a function of excitation laser intensity in the 0.5– 60.2 mW cm^?2 range. Radiative transitions from shallow donor level located at 17 meV below the bottom of the conduction band to the acceptor level located at 193 meV above the top of the valence band were suggested to be responsible for the observed PL band. An energy level diagram showing transitions in the band gap of the crystal has been presented.     

Injection and thermodepolarization currents in GaSe <Co> single crystals

The current-voltage characteristics (CVC) at different temperatures, the temperature dependence of electric conductivity [σ(T)] and the currents of thermostimulated depolarization (TSD) have been studied in GaSe <0.05 at.% Co> on a combined basis.The location depth (E_t=0.57eV) and the concentration of traps (N_t=2.7x10¹²cm^?3) have been determined from the temperature dependence of the trapping factor. In the course of TSD investigations, levels with location depths of 0.28±0.02 and 0.57±0.03 eV have been revealed. It is noted that traps with the energy of 0.57±0.03 eV are found both with TSD measurements and on the basis of the temperature dependence of the electric conductivity and the trapping factor.It has been established that the hole centres above the valence band are responsible for the CVC, σ(T) and TSD. The location depths, concentrations and trapping cross-sections of these centres have been determined.     

Thermoluminescence of pure and doped ThO2

Thermoluminescence (TL) measurements in the temperature range 295–675 K indicate the existence of at least five trapping centres for single crystals of nominally pure “reduced” ThO₂ and three trapping centres for “oxidized” ThO₂. Deliberate doping with Ca²⁺, Y³⁺ and Ta⁵⁺ impurities decreases TL emission. For reduced ThO₂, accidentally incorporated rare-earth impurities, Pr³⁺, Tb³⁺, Er³⁺ act as the electron-hole recombination sites. In oxidized crystals the impurity Fe³⁺ is thought to be involved in the recombination process. In the temperature range 80–295 K an additional eight trapping centres exist for both oxidized and reduced ThO₂. For the reduced crystals the emission is probably associated with Fe in the +2 state, and in the +3 state for oxidized crystals. The differences in the TL glow curve intensities are partially explained by differences in the temperature dependence of the luminescence efficiency of the different recombination centres.     

Refractive index, oscillator parameters and temperature-tuned energy band gap of Tl4In3GaS8-layered single crystals

Transmission and reflection measurements in the wavelength region 450-1100 nm were carried out on Tl₄In₃GaS₈-layered single crystals. The analysis of the room temperature absorption data revealed the presence of both optical indirect and direct transitions with band gap energies of 2.32 and 2.52 eV, respectively. The rate of change of the indirect band gap with temperature dE_gi/dT=-6.0×10⁻⁴ eV/K was determined from transmission measurements in the temperature range of 10-300 K. The absolute zero value of the band gap energy was obtained as E_gi(0)=2.44 eV. The dispersion of the refractive index is discussed in terms of the Wemple-DiDomenico single-effective-oscillator model. The refractive index dispersion parameters: oscillator energy, dispersion energy, oscillator strength and zero-frequency refractive index were found to be 4.87 eV, 26.77 eV, 8.48×10¹³ m⁻² and 2.55, respectively.     

Two-carrier conduction in Rb-TCNQ-II

Single crystal electrical resistivity and thermoelectric power (TEP) measurements as a function of temperature are repotted in Rb-TCNQ-II. Results suggest intrinsic conductivity by holes above 360 K with an activation energy of 0.44 eV. Below room temperature conductivity is extrinsic and is due to donors located 0.18 eV below the conduction band.     

Light-induced charge transport processes in photorefractive barium titanate doped with rhodium and iron

Absorption, light-induced absorption changes, photo and dark conductivities, bulk photovoltaic currents and two-beam coupling gain coefficients are measured for oxidized, as grown and reduced BaTiO₃:Rh,Fe crystals. Theoxidized sample shows hole conductivity and three photorefractive levels are present: Rh^4+/5+ Fe^4+/5+ and Rh^3+/4+. The measurements indicate that Rh^3+/4+ is responsible for the photo conductivity and that its energy level is located (0.9 ± 0.1) eV above the valence band edge. Theas grown sample also shows hole conductivity and two photorefractive levels are involved: Rh^3+/4+ and Fe 3+/4+. The results yield that the Fe^3+/4+ level is located (0.95 ± 0.05) eV above the valence band edge. In thereduced sample electrons are the dominant charge carriers and two levels are of importance. The shallow one is located (0.39 ± 0.05) eV below the conduction band edge. Here the performance of this crystal is strongly impaired by a pronounced sublinear photo conductivity.Dedicated to O. F. Schirmer on the occasion of his 60th birthday     

Electrical properties of LiNbO3 crystals reduced in a hydrogen atmosphere

The temperature dependence of the electrical conductivity and pyroelectric coefficient of lithium niobate crystals reduced in a hydrogen atmosphere has been studied. It has been established that the activation energy of dark electrical conduction in these crystals in the temperature range 288?C350 K differs from the corresponding values for crystals reduced in vacuum and is equal to 0.68 ± 0.02 eV. It has been shown that the annealing of LiNbO₃ crystals in a hydrogen atmosphere hardly affects their pyroelectric properties. The mechanism of electrical conduction of LiNbO₃ crystals reduced in a hydrogen-containing atmosphere has been discussed.     

Semiconducting properties of CuIn5S8 single crystals I. Electrical properties

The electrical resistivity and Hall coefficient of n-type CuIn₅S₈ single crystals were measured in the temperature range from 80 K–500 K. The energy gap at 0 K was determined to be 1.4 eV. The donor levels at 0.017 eV and 0.09 eV below the conduction band are identified. The mobility data are analysed assuming scatterings by acoustic and polar optical phonons and ionized impurities.     

Determination of trapping parameters of thermoluminescent glow peaks of semiconducting Tl2Ga2S3Se crystals

Thermoluminescence (TL) properties of Tl₂Ga₂S₃Se layered single crystals were researched in the temperature range of 290–770 K. TL glow curve exhibited two peaks with maximum temperatures of ~373 and 478 K. Curve fitting, initial rise and peak shape methods were used to determine the activation energies of the trapping centers associated with these peaks. Applied methods were in good agreement with the energies of 780 and 950 meV. Capture cross sections and attempt-to-escape frequencies of the trapping centers were reported. An energy level diagram showing transitions in the band gap of the crystal was plotted under the light of the results of the present work and previously reported papers on photoluminescence, thermoluminescence and thermally stimulated current measurements carried out below room temperature.     

Ionic and electronic conduction in β-PbF2

β-PbF₂ is an extrinsic n-type semiconductor at temperatures below 300 K. The contribution of lattice defects to the electrical conductivity increases rapidly above room temperature. Polarization studies using a Wagner-cell indicate that above 350 K ionic conductivity becomes predominant in undoped β-PbF₂ crystals.     

Photo- and thermostimulated processes in α-Al2O3

We reported on the recombination processes determined by the release of electrons from defects connected with the dosimetric 430 K thermostimulated luminescence (TSL) peak as well as with the 260 K TSL peak. These TSL peaks appear in thermochemically reduced α-Al₂O₃ crystals containing hydrogen and emission of these TSL peaks corresponds to luminescence of the F-center. The X-ray exposure or UV excitation in the absorption band of F-centers at 6.0 eV of reduced α-Al₂O₃ crystals doped with acceptor impurities results in the appearance of a broad anisotropic complex absorption band in the spectral region 2.5–3.5 eV and in the appearance of a predominant TSL peak at 430 K. Above 430 K the above-mentioned broad absorption band disappears. Optical bleaching of the 2.5–3.5 eV band is accompanied by the disappearance of the 430 K TSL peak and results in F-center emission. The X-ray or UV excitation of reduced α-Al₂O₃ crystals with donor-type impurities results in the appearance of an anisotropic absorption band at 4.2 eV and the appearance of a dominant TSL peak at 260 K. Above 260 K the 4.2 eV absorption disappears and photostimulated luminescence (PSL) of the F-center recombination luminescence in the 4.2 eV region is no longer observed. Optical bleaching of the 4.2 eV absorption band is accompanied by the disappearance of the 260 K TSL peak. The successful use of reduced α-Al₂O₃ in dosimetry needs the optimization of the concentration of all components (acceptors, hydrogen, intrinsic defects) involved in the thermo- and photostimulated processes.     

Self-activated luminescence in zinc-sulfo-selenide crystals

The orange luminescence at 2.15eV of As-grown ZnS_0.52Se_0.48crystals has been studied. The peak energy, halfwidth and Gaussian band shape exhibit a temperature dependence which is similar to that of the self-activated (SA) luminescence of ZnS at 2.66 eVand to that of ZnSe at 2.03 eV, and which can be described satisfactorily by a configurational coordinate model. However, optically detected magnetic resonance experiments at 1.8 K show that the luminescence is due to the recombination of an electron thermally released from a donor state with a hole trapped at an A-center acceptor state. The temperature dependence of the thermoluminescence spectra above 77 K and their spectral shift under additional IR exposure are also consistent with radiative recombination involving distant donor-acceptor pairs.     

Optoelectrical investigations on MOS-sandwiches at low temperatures

MOS-structures are irradiated with light of energy from 1.5 to 6 eV at different temperatures (300, 77, 12 K) while the resulting photocurrent is measured. At high photon energies (hv>4 eV) the threshold energy and the scattering mean free path for electrons at the Si — SiO₂-interface are determined. They are independent from temperature. At low photon energies (hv<3 eV) electrons are released from traps with energy levels 1.2 and 1.9 eV below the Si-conduction band. The trap concentration is 4.8 10¹³ cm^–3. The capture cross section is measured in a rather direct way. The temperature and electrical field dependence of this cross section is explained by a trapping model.     

锑化铟中载流子的复合过程

用定态光电导及光磁电的方法测量了p型n型InSb在85—290°K之间的电子及空穴的寿命。在室温附近,所有样品的截流子寿命都趋于同一值,在290°K时为3×10^-8秒。从寿命的绝对值及温度依赖关系,以及掺杂对寿命的影响,可以肯定在室温附近起主要作用的复合过程是带间碰撞复合过程。在200°K以下,p型样品中的电子寿命与空穴寿命有很大差别,表明有陷阱作用。用位于价带之上0.05eV的复合中心及位于导带之下0.11eV的电子陷阱能完满地解释200°K以下的寿命与温度的依赖关系。