ISS measurement of surface composition of AuCu alloys by simultaneous ion bombardments with Ar+ and He + ions

Surface composition of Au-Cu(43 at%) alloy under 1.5–5 keV argon ion bombardment has been investigated by ion scattering spectroscopy (ISS). In this experiment, we adopted a specific technique to use mixed He⁺ and Ar⁺ ions as primary beam in order to perform sputtering (Ar⁺) and ISS measurement (He⁺) simultaneously. The outermost atom layer of Au-Cu alloys under Ar⁺ ion bombardment is Au-rich leading to the conclusion that Ar⁺ ion bombardment of AuCu alloys causes the preferential sputtering of Cu atoms, resulting in a Au-rich outermost atom layer and a depletion layer of Au atoms beneath the outermost atom layer due to ion-beam-enhanced surface segregation. This result explains the experimental results obtained by AES as well.     

低能Ar3+ + Ar碰撞反应过程实验研究

测量了入射离子能量为27 keV、45 keV和66 keV时Ar3 Ar碰撞反应各子过程的分截面,通过将其归一化到Bliman,Dousson等人所测量的截面值,获得了绝对截面.结果表明,该能区电子俘获过程仍占主导地位,但转移电离过程已不能忽略.结果还表明,各子过程反应截面基本不随能量变化.与考虑自电离的MCBM(Molecular Coulombic overBarrier Model)模型比较发现,模型所给截面普遍高于实验测量值,这在一定程度上是由于归一化时带来的系统误差.在误差允许的范围内,单电子和双电子俘获截面符合的比较好,但三电子俘获截面却相差一个数量级.对于实验观测到的转移电离过程,模型却预言并没有此过程发生.     

kinetic energy reflection from polycrystals bombarded with Ar+, Kr+, and Xe+ ions

When the surface of a solid is bombarded with ions a fraction of the primary energy is reemitted by ion reflection and sputtering. The contribution of ion reflection or sputtering to energy reflection is determined by the mass ratio of the bombarding ions to the target atoms.^1,2 In the case of light ions the contribution of reflected ions is dominant. Results for He⁺ and Ne⁺ bombardment were described in a previous paper.³ The present paper deals with results for Ar⁺, Kr⁺, and Xe⁺ bombardment of the same targets as investigated before.³ The energies of the mass selected bombarding ions range from 9 to 16 keV. The measurements were carried out by means of the thermic detector described in a separate paper.⁴ For the given mass ratios most of the reemitted energy is related to sputtering.     

Sputter damage in Si surface by low energy Ar+ ion bombardment

The damage distributions in Si(1 0 0) surface after 1.0 and 0.5 keV Ar⁺ ion bombardment were studied using MEIS and Molecular dynamic (MD) simulation. The primary Ar⁺ ion beam direction was varied from surface normal to glancing angle. The MEIS results show that the damage thickness in 1.0 keV Ar ion bombardment is reduced from about 7.7 nm at surface normal incidence to 1.3 nm at the incident angle of 80°. However, the damage thickness in 0.5 keV Ar ion bombardment is reduced from 5.1 nm at surface normal incidence to 0.5 nm at the incident angle of 80°. The maximum atomic concentration of implanted Ar atoms after 1 keV ion bombardment is about 10.5 at% at the depth of 2.5 nm at surface normal incidence and about 2.0 at% at the depth of 1.2 nm at the incident angle of 80°. However, after 0.5 keV ion bombardments, it is 8.0 at% at the depth of 2.0 nm for surface normal incidence and the in-depth Ar distribution cannot be observable at the incident angle of 80°. MD simulation reproduced the damage distribution quantitatively.     

L α emission from collisional excitation of H Atoms by threshold energy Ar+ ions

In a specially designed collision chamber, H atoms produced by a microwave discharge were excited into the 2p state by impact of Ar⁺ ions in a beam. A degree of dissociation up toη=94% was measured at the exit of the microwave source, although in the center of the collision cellη is smaller, with a lower limit of 33 %. The effect of vibrational excitation of H₂ by the discharge and the resulting difficulties of measuringη are discussed. The cross section forL _α emission increases linearly from the threshold, at 10.2 eV_CM, to 17.1 eV_CM. The absolute cross section at this energy is 1.5·10^?17 cm² forη=33% (with a minimum of 0.6·10^?17 cm², for the maximum possibleη). The absence of an activation barrier rules out some features shown by an earlier ab initio calculation.     

Effect of surface semichanneling on energy distributions of molecular ions reflected from single-crystal surface

Regularities in the energy distributions of molecular nitrogen ions reflected from (100)Cu crystal face are studied. The half-widths (FWHM) of the energy distributions of the reflected ions have been found to vary strongly near aligned orientations of the target with respect to the bombarding ion beam. A relationship has been found between the survival fraction of reflected molecular ions and the effect of ion focusing in surface semichanneling.     

低能Ar9+离子与Na原子碰撞反应中的多电子转移过程

利用近代物理研究所新建的原子物理实验平台,采用位置灵敏探测和散射离子-反冲离子飞行时间符合技术,研究了180 keV的Ar9+离子与Na原子碰撞中的多电子转移过程,对实验结果做了分析和简单的讨论,并同修正后的分子库仑过垒模型结果进行了比较.     

Effect of Ti4+ ions on the magnetic and dielectric properties of Mg-ferrite

X-ray diffraction, the real part (ε′), the imaginary part (ε″) of dielectric constant, and the molar magnetic susceptibility (χ_M) for Mg_1+xTi_xFe_2−2xO₄ ferrite (0.1⩽x⩽0.9) were studied. The date of X-ray diffraction showed that the unit cell parameter increases with Ti concentration and ascribed to the predicted variation of the cation distribution, while Mg²⁺ ions are highly diffusible and very sensitive to heat. The effect of dilution by Ti ions is discussed in terms of increasing superparamagnetic and single domain (SP/SD) grains. The measurements of ε′ were performed at different temperatures as a function of frequency, while the magnetic susceptibility was studied at different magnetic field intensities. The variation of the dielectric properties depends mainly on the valence exchange between the different metal ions in the same site or in different sites. All parameters such as ε′, ε″, χ_M showed a decrease in value with increasing Ti and Mg concentration. The dispersion in ε′ with frequency disappeared gradually with increasing Ti concentration.     

低速高电荷态离子40Ar16+与云母表面作用中的电子发射研究

报道了由兰州ECR源提供的低速高电荷离子40Ar16 入射到云母表面产生的电子发射的实验测量结果.结果发现,电子发射产额Y与离子入射角ψ有近似1/tanψ的关系.基于经典过垒模型,我们对这一关系进行了理论分析.实验结果和理论结果相当符合,这就间接说明势能电子发射是低速高电荷态离子作用于表面发射电子的一个主要途径.     

Preferential sputtering of TIC under keV Ar+ ion bombardment: Simultaneous sputtering-ISS measurement with He+ and Ar+ ions

The composition change of the outermost atom layer of TiC(110) under ion bombardment with 1.5–3 keV He⁺ and He⁺ + Ar⁺ ions has been measured by ion scattering spectroscopy with He⁺ ions at different sample temperatures. It has been found that the preferential sputtering of C atoms takes place for both the He⁺ and Ar⁺ ion bombardment, however the preferred sputtering is more pronounced for Ar⁺ ions than for He⁺ ions. The ion bombardment with He⁺ ions at elevated sample temperatures hardly results in any change in surface composition below ～800°C, while Ar⁺ ion bombardment results in C enrichment for elevated temperatures as reported so far.     

Resonant coherent excitation of Ar17+ ions taking into account a fine structure of energy levels

The effect of a fine structure of the orbital electron energy levels of an Ar¹⁷⁺ ion on the resonant coherent excitation under planar channeling has been investigated by computer simulation technique. The obtained resonance curves are characterized by two closely situated peaks due to the transitions of an electron from the ground to excited states corresponding to the different components of a fine structure of the first excited state which differ in the value of the total electron momentum (1/2 or 3/2).     

Effect of In3+ ions on the electrochemical performance of the positive electrolyte for vanadium redox flow batteries

Influence of In³⁺ ions on electrochemical performance of positive electrolyte for vanadium redox flow battery was investigated in this paper. The electrochemical activity and kinetics of V(IV)/V(V) redox couple can be enhanced by the addition of In³⁺ ions, and the optimal concentration of In³⁺ ions was found at 10 mM. At this condition, the oxidation peak current with 10 mM In³⁺ ions is 46.6 mA at a scan rate of 20 mV s^?1, larger than that of pristine electrolyte (41.8 mA), and the standard rate constant is 6.53?×?10^?5 cm s^?1, 42 % larger than that of the pristine electrolyte (4.58?×?10^?5 cm s^?1). The cell using electrolyte with 10 mM In³⁺ ions was assembled, and the charge–discharge performance was evaluated, and the average energy efficiency increases by 1.9 % compared with the pristine cell. The improved electrochemical performance may be ascribed to that In³⁺ ions change the hydration state of vanadium ions in electrolyte and promote charge transfer process.     

Spectroscopic study of dissociative recombination between Ar2 + ions and electrons

Translated from Zhurnal Prikladnoi Spektroskopii, Vol. 49, No. 3, pp. 407–412, September, 1988.     

Sputtering of SiC with low energy He and Ar ions under grazing incidence

The effect of low energy sputtering under grazing incidence upon the surface composition of SiC was investigated by Auger electron spectroscopy. The energy of the sputtering projectiles (He, Ar) varied from 200 to 1500?eV. Peak shifts to the higher energies with increasing argon ion energy were observed for all silicon and carbon Auger transitions. These shifts were explained by enhanced damage of the surface region within the sampling depth of the Auger electrons. The insensitivity of the Auger peak position to the energy of helium ions indicates that the damage state in the surface region does not change with the increasing energy of helium ions. An increase of the carbon concentration with the decrease of the argon energy was observed. The experiments were accompanied by dynamic Monte Carlo simulations by the TRIDYN code.     

Structural features of aluminium alloy 1441 irradiated by Ar+ ions

Using electron microscopy it was found that irradiation of clad cold-worked specimens made of commercial aluminium-lithium alloy 1441 by the Ar ⁺ ions of energy 40 keV at low doses of irradiation (10¹⁵ cm⁻², irradiation time 1 s, T < 70 °C) and ion-current density of about 100 μA/cm² results in the transformation of the cellular structure formed in the alloy under deformation. As the dose of irradiation is increased up to 10¹⁶ cm⁻², a transition from a cellular to a subgrain structure close to a polygonal one is observed. The efficiency of the process is increased with ion-current density. Furthermore, under ion irradiation at increased ion-current densities, the β′(Al ₃ Zr) and Al ₈ Fe ₂ Si particles present in the deformed alloy dissolve, and disperse particles of a new Al ₂ LiMg phase of platelet shape are formed. The changes in the dislocation structure and phase composition in alloy 1441 are observed several seconds after irradiation not only in the surface layer adjacent to the ion incorporation band but also through the thickness of the specimen tens of thousands times greater than ion projective ranges. __________ Translated from Izvestiya Vysshikh Uchebnykh Zavedenii, Fizika, No. 2, pp. 73–81, February, 2007.     

Metastable Decomposition of Ar3+ Cluster Ions Into Ar2+ and Ar+

In this note we present the first account of a study of metastable (unimolecular decay) and collision-induced dissociation of Ar₃+ cluster ions using an experimental setup consisting of a molecular beam-electron impact ion source and a double focussing (reversed Nier Johnson geometry) mass spectrometer. The existence of the following metastable decay processes (accessible by our sampling time window) could be demonstrated: Ar₃⁺* → Ar₂+ and Ar₃⁺* → Ar⁺. The processes were studied as a function of electron impact energy. The present results are of importance in order to provide some guidance for the development of appropriate theoretical models for the dissociation of cluster ions.     

Recombination measurements at low energies with Ar16+ and Ar18+ ions in a dense, cold electron target

Recombination of multiply charged ions with electrons at very low relative energies has become a major topic of interest, due to the observation of rates which are enhanced beyond the expectations for radiative recombination. We present results for Ar¹⁶⁺ and Ar¹⁸⁺ ions from systematic measurements along the argon isonuclear sequence using a high density cold electron beam target (n_e = 7 × 10⁹ cm^-3) at the UNILAC of GSI. The transverse and longitudinal temperatures of the electron beam were determined from DR resonance features observed with metastable Ar¹⁶⁺ (2³S) ions. The rate at E_rel = 0 for radiative recombination of completely stripped Ar¹⁸⁺ calculated with electron beam temperatures kT_∥ = 0.002 eV, kT_⊥ = 0.2 eV amounts to α = 10^-9 cm³ s^-1. This is exceeded by nearly a factor of 10 by the rate measured in experiments with Ar¹⁸⁺ ions. This revised version was published online in August 2006 with corrections to the Cover Date.     

Investigation of the binary model of scattering of 1 keV to 25 eV Ar+ ions from a Cu surface 1

The validity of the binary collision approximation for describing the scattering of low energy Ar ions from a polycrystalline Cu surface was investigated. The Ar ions were incident upon the target surface at an angle of 45° (with respect of the plane of the surface). The range of primary ion energy studied was 1000–25 eV. An ultra-high vacuum magnetic sector mass spectrometer was used to analyze those secondary ions emitted from the specimen surface at an angle of 90° with respect to the primary ion beam. The scattered ions were identified and their energies measured. No significant deviation from the prediction of the binary collision model was found throughout the range of energy studied.