基于阿秒XUV-飞秒IR泵浦-探测的冷靶反冲离子动量成像谱仪

利用多道可见光谱探测系统测量了Hα、CⅢ(464.7nm)和OⅡ(441.5nnm)谱线的时间行为,得出了碳、氢和氧元素的入射通量。在简化模型下算出了氧碳间的化学溅射率,结果表明HT-6M托卡马克边界杂质产生机制主要是氢氧间的化学溅射和氧碳间的化学溅射,因此控制氧杂质尤其重要。     

HT-6M托卡马克等离子体紫外-可见谱

利用光学多道分析仪(OMA)拍摄了HT-6M托卡马克等离子体近紫外可见谱.系统分析了杂质行为,给出了主要杂质碳和氧的朝内的通量,在简化模型下计算了碳氧的化学溅射率,并由此得出碳氧杂质产生机制和可能的循环途径.结果表明,氧杂质在循环途径中起关键性的作用,控制氧杂质尤其重要.     

光谱学与光谱技术

利用光学多道分析仪(OMA)拍摄了HT-6M托卡马克等离子体近紫外可见谱。系统分析了杂质行为,给出了主要杂质碳和氧的朝内的通量,在简化模型下计算了碳氧的化学溅射率,并由此得出碳氧杂质产生机制和可能的循环途径。结果表明,氧杂质在循环途径中起关键性的作用,控制氧     

经典漂移对EAST钨杂质产生和输运特性影响的模拟研究

本文采用蒙特卡罗杂质输运程序DIVIMP,针对先进实验超导托卡马克(EAST)的上单零位形放电,模拟研究了不同漂移情况下(无漂移、离子BíB漂移向下/上)的钨杂质产生和输运特性。结果表明,经典漂移显著影响了钨杂质自偏滤器靶板的溅射通量及其在上游区域的含量。     

HT－6M托卡马克蒸钛硼化实验的可见辐射测量

给出了在蒸钛和硼化实验中碳氧杂质以及中性氢的朝内通量的变化。在蒸钛实验中，碳氧杂质朝内通量减小２倍以上，中性氢的朝内通量减小４０％，粒子循环系数由０．９５降到０．８５．在硼化实验中，碳氧杂质朝内通量减小６０％左右，中性氢的朝内通量减小２０％，粒子循环系数由０．９５降到０．９１左右．充分表明钛和硼化能有效地控制碳氧杂质的来源，改善粒子循环和杂质循环。     

HL-2M 装置宽谱段光谱诊断系统研制

HL-2M 装置宽谱段光谱诊断系统由采集光学、石英光纤和集成式光栅光谱仪构成,工作波段为 300~1100nm,可实现对工作气体(氢及其同位素)和内在杂质(碳、铁、氧等)线辐射的同步监测。通过将 5 台紧凑 型光谱仪并联形成集成式光栅光谱仪,可在保证宽谱段覆盖的同时实现较好的光谱分辨(0.04~0.19nm⋅pixel⁻¹)。目 前系统具有一个空间通道,最优时间分辨为 1.05ms,常规采样时间为 20ms。在 HL-2M 装置初始等离子体放电 实验期间,利用该套系统识别出氢等离子体的主要杂质为碳和氧,并对不同粒子的辐射特性进行了初步分析。     

HL－1M托卡马克硼化实验的杂质辐射特性

文中叙述了ＨＬ－１Ｍ托卡马克硼化真空紫外光谱区杂质辐射的观测结果。分析得出：硼化有效地控制等离子体中的杂质，其中，氧杂质减少约６５％，碳杂质减少约６０％，金属杂质减少约８５％。     

HL—1M托卡马克硼化实验的杂质辐射特性

文中叙述了ＨＬ－１Ｍ托卡马克硼化真空紫外光谱区杂质辐射的观测结果。分析得出：硼化有效地控制等离子体中的杂质，其中，氧杂质减少约６５％，碳杂质减少约６０％，金属杂质减少约８５％。     

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通过参量转化，将杂质速率方程转化为具有三角对称系数矩阵的矢量方程，并进行了数值求解，得到了托卡马克等离子体中常见轻杂质特征参量 随等离子体温度的变化曲线。计算结果显示，对常见的轻杂质如氦、碳、氧、氖及氩等在1eV～10keV温度范围内特征参量基本分布在1015～1019m-3•s数量级范围内；平均特征参量数值与核电荷数Z没有明确的函数关系；在曲线最后两个峰值处，相应杂质的平衡时间基本一致；当等离子体中杂质主要以类氦、类氖离子形态(具有闭合壳层形态离子)存在时，对应温度下特征参量曲线达到极小值。     

氧、碳杂质对B1结构氮化钒薄膜的Tc和电阻率ρ(T)的影响

我们对几种典型的溅射B1结构VN_x薄膜进行了T_c和电阻率ρ(T)的测量(从Tconset到300K)。以X-射线衍射术、Auger和XPS技术对这些样品进行了分析。实验结果表明,T_c和ρ(T)随膜的厚度和膜中所含氧、碳等杂质而变化。我们认为,氧在膜中所起的作用可能是阻碍VN_x的B_1结构的形成,造成结构中多空位的情况,压低T_c,并导致电子的跳跃式导电。     

替位杂质对低能Pt原子与Pt(111)表面相互作用影响的分子动力学模拟

采用嵌入原子方法的原子间相互作用势，通过分子动力学方法模拟了低能Pt原子与Cu，Ag，Au，Ni，Pd替位掺杂Pt(111)表面的相互作用过程，系统研究了替位原子对表面吸附原子产额、溅射产额和空位缺陷产额的影响规律，分析了低能沉积过程中沉积原子与基体表面的相互作用机理以及替位原子的作用及其影响规律.研究结果显示：替位原子的存在不仅影响着沉积能量较低时的表面吸附原子的产额与空间分布，而且对沉积能量较高时的低能表面溅射过程和基体表面空位的形成产生重要影响.替位原子导致的表面吸附原子产额、表面原子溅射以及空位形 关键词： 分子动力学 低能粒子 替位掺杂 表面原子产额 溅射 空位     

Non-intrusive, on-line, simultaneous multi-species impurity monitoring in hydrogen using LIBS

Laser-induced breakdown spectroscopy (LIBS) has been evaluated for on-line, simultaneous multi-species impurity monitoring in hydrogen. A miniature spectrometer with spectral coverage of 620–800 nm and a gated detection system with spectral coverage of 40 nm were both used to record LIBS spectra from the spark produced in sample gas by a frequency-doubled Nd YAG laser. The effect of pressure on detecting the impurity (e.g., nitrogen, argon, and oxygen) in hydrogen was studied. LIBS spectra with different impurity levels of nitrogen, argon, and oxygen were recorded, and the intensity of the spectral lines of Ar, O, N, and H observed were used to form calibration plots for impurity measurement. The limits of detection (LODs) for oxygen, argon, and nitrogen in hydrogen were estimated from the calibration obtained with both the gated and ungated detection. The hydrogen impurity measurements based on the ungated miniature system show reliable and reproductive results. But the LODs with this system are about four times higher than the LODs obtained with a gated detection system in this work.     

HT-6M托卡马克装置杂质输运

利用多道可见光谱探测系统和近紫外转镜系统测量了HT-6M托卡马克等离子体中杂质的时空分布.建立完备的杂质输运程序，数值模拟碳、氧杂质在欧姆放电时的输运行为，得出了杂质的扩散和对流系数、不同电离态杂质离子密度、辐射功率密度和有效电荷数的空间分布. 分析低混杂波电流驱动（LHCD）期间杂质行为，结果表明等离子体粒子约束、杂质约束和能 量约束提高，辐射功率和有效电荷数减小. 关键词： 托卡马克 杂质输运 扩散系数 对流系数     

Numerical Modelling of Impurity Retention in the ITER Tokamak Scrape-off Layer Plasma

The hydrogen plasma and carbon ions flows generated at the target plates in the ITER tokamak scrape-off layer are numerically investigated. A 2D model of hydrogen plasma and impurity ions is presented. The model is based on the electron-ion Braginski fluid equations [1] for hydrogen plasma and rate equations for impurities. Arbitrary level of impurity ions concentration is assumed. Recycling of hydrogen, sputtering and self sputtering of carbon atoms at the target plates are taken into account. Equations of the model are solved in the slab geometry using 2D-multifluid numerical code EPIT [2]. Problems of impurity ions retention and radiation in the divertor volume are analyzed. Results of calculations for ITER tokamak boundary plasma are presented, showing that poor retention is likely at high impurity concentration in the divertor volume. The radiation power can be a significant part of ingoing energy.     

Dependence of in—tube doping on the radius and helicity of single—wall carbon nanotubes

Using the Lennard－Jones interaction potential between the impurity atom and carbon atom, we have studied the dependence of in-tube impurity doping on the radius of a single-wall carbon nanotube (SWNT), as well as its helicity. The obtained results show that the radius of the most stably doped SWNT is different for different kinds of impurity atoms. This is useful for producing the required doped SWNT. In addition, it is found that the helicity of tube has a strong effect on the potential energy of the atoms doped in the SWNT.     

基于WO3- Pd复合膜的D型光纤光栅氢气传感器

采用磁控溅射方法在侧边抛磨的光纤光栅（D型光纤光栅）上溅射40 nm WO3-Pd复合薄膜,制作了D型光纤光栅氢气传感器.40 nm WO3-Pd复合薄膜是由5 nm的WO3、5 nm的WO3/Pd混合膜和30 nm的Pd 薄膜组成.实验中,首先采用射频溅射技术向D型光纤光栅溅射5 nm WO3薄膜,再利用共溅射技术溅射5 nm WO3/Pd混合膜,最后用直流溅射技术溅射30 nm的Pd薄膜.SEM结果显示在多次通氢气后WO3-Pd薄膜仍然具有较好的表面形貌,这说明WO3-Pd复合薄膜具有较好的机械性能.实验结果表明:该氢气传感器具有较好的重复性,同镀有同样氢气敏感膜的普通FBG相比,D型光纤光栅的灵敏度提高了200%|在氢气体积浓度为6%时,D型光纤光栅传感器的波长变化为15pm.     

Surface energy and hybridization studies of amorphous carbon surfaces

Surface properties of a large number of amorphous carbon (a-C) films have been investigated using contact angle measurements and X-ray photoelectron spectroscopy (XPS). Dense a-C surfaces with variable sp³/(sp² + sp³) average hybridization were grown using sputtering or pulsed laser deposition (PLD) and were further chemically modified by thermal annealing, ion bombardment or covalent grafting of organic monolayers. The average carbon hybridization, impurity level and mass density, were deduced from XPS and photoelectron energy loss spectroscopy (PEELS). The depth sensitivity of the dispersive (Lifshitz–van der Waals) interaction, estimated at 1–2 nm from the dependence of γ^LW on the grafted perflorodecene molecule coverage, is much better than XPS which probes a 3–5 nm depth. The observation of a non-monotonic behavior in the correlation between surface hybridization and electron donor component of surface energy reveals that the average carbon hybridization alone does not describe the entire surface energy physics. The role of π bond clustering in the polar interactions is thus considered and some implications on surface reactivity and mutual interactions with molecular or biomolecular species are discussed.     

分子束外延GaN薄膜的X射线光电子能谱和俄歇电子能谱研究

用XPS和AES电子能谱的方法对等离子体辅助分子束外延(MBE)生长的GaN薄膜进行了表面分析和深度剖析.发现红外分子束外延(RFMBE)生长的富镓GaN薄膜实际表面存在O和C吸附层,C主要为物理吸附,而O在GaN表面形成局域化学键产生氧络合物覆盖层,并形成一定的深度分布.杂质O在GaN带隙中导带底形成杂质带同时引入深受主能级,使得带隙变窄室温光吸收谱向低能方向移动,光致发光谱出现宽带发光峰.从而影响GaN薄膜的电学和光学性质 关键词： GaN薄膜 X射线光电子能谱 俄歇电子能谱 表面分析