X–Ray Photoelectron Spectra and Electronic Energy Structure of Tetragonal Cu x Ni1-xTi Alloys

The electronic energy structure (EES) of Cu_0.8Ni_0.2Ti and Cu_0.6Ni_0.4Ti alloys, stoichiometric CuTi compound with a tetrahedral CuTi–type crystal lattice, and cubic NiTi was studied experimentally and theoretically. The experimental study of valence band EES was carried out by Xray photoelectron spectroscopy (XPS). The EES of both the stoichiometric compounds and the alloys was calculated using the cluster version of multiple scattering theory in a selfconsistent field approximation. The calculation and experimental results are in good agreement. The major contribution to XPS of the studied compounds is from the d states of copper and nickel. The specifics of chemical bonding in the compounds are discussed. The EES of tetragonal Cu—Ni—Ti alloys is modeled.     

Determination of the interface band alignment of Mg2Si/4H-SiC heterojuction for potential photodetector application

The Mg₂Si/4H-SiC heterojunction was prepared by radio frequency (RF) magnetron sputtering technique. The binding energies of Mg 2p, Si 2p, and C 1s core levels and the maxima of valence band were measured by X-ray photoelectron spectroscopy (XPS). Using the optical bandgap of Mg₂Si (0.78 eV) and 4H-SiC (3.25 eV), the band offsets of valence band (VBO) and conduction band (CBO) at Mg₂Si/4H-SiC interface were identified as 1.47 and 1.00 eV, respectively. The band alignment was evaluated to be type-I band alignment. The Mg₂Si/4H-SiC heterojunction could be a promising candidate for the infrared (IR) photodetector.     

Electronic structure of adducts of Nd(III) carboxylate complexes determined by DFT and XPS methods

X-ray photoelectron spectroscopy and quantum chemistry methods are used to study Nd(tol)₃ and Nd(сor)₃ carboxylate complexes and their adducts with 1,10-phenanthroline (Nd(tol)₃Phen and Nd(сor)₃Phen₂). The electronic structure and specific features of the nature of chemical bonds are studied, as well as the effect of 1,10-phenanthroline on the electronic structure of the adduct. We propose the band assignment of the valence band of the XPS spectra of all compounds.     

Xps measurement and molecular orbital calculation of valence band electronic structure of sodium cyanate

The electronic structure of the core and the valence band region of sodium cyanate is investigated by X-ray photoelectron spectroscopy (XPS). The energy levels and the molecular wavefunctions of the NCO^? ion are calculated by the INDO method and the results are used to obtain the photoionization cross sections for the valence levels of the anion. A simulation of the XPS spectra in good agreement with the experimental spectra is obtained.     

Work function and negative electron affinity of ultrathin barium fluoride films

Thin films of barium fluorides with different thicknesses were deposited on GaAs substrate by electron beam evaporation. The aim of the work was to identify the best growth conditions for the production of coatings with a low work function suitable for the anode of hybrid thermionic-photovoltaic (TIPV) devices. The chemical composition and work function φ of the films with different thicknesses were investigated by X-ray photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS). The lowest value of φ = 2.1 eV was obtained for the film with a thickness of ~2 nm. In the valence band spectra of the films at low kinetic energy, near the cutoff, a characteristic peak of negative electron affinity was present. This effect contributed to a further reduction of the film's work function.     

Analysis of the electronic structure of Hf(Si0.5As0.5)As by X-ray photoelectron and photoemission spectroscopy

The ternary hafnium silicon arsenide, Hf(Si_xAs_1−x)As, has been synthesized with a phase width of 0.5?x?0.7. Single-crystal X-ray diffraction studies on Hf(Si_0.5As_0.5)As showed that it adopts the ZrSiS-type structure (Pearson symbol tP6, space group P4/nmm, Z=2, a=3.6410(5) Å, c=8.155(1) Å). Physical property measurements indicated that it is metallic and Pauli paramagnetic. The electronic structure of Hf(Si_0.5As_0.5)As was investigated by examining plate-shaped crystals with laboratory-based X-ray photoelectron spectroscopy (XPS) and synchrotron radiation photoemission spectroscopy (PES). The Si 2p and As 3d XPS binding energies were consistent with assignments of anionic Si¹⁻ and As^1-. However, the Hf charge could not be determined by analysis of the Hf 4f binding energy because of electron delocalization in the 5d band. To examine these charge assignments further, the valence band spectrum obtained by XPS and PES was interpreted with the aid of TB-LMTO band structure calculations. By collecting the PES spectra at different excitation energies to vary the photoionization cross-sections, the contributions from different elements to the valence band spectrum could be isolated. Fitting the XPS valence band spectrum to these elemental components resulted in charges that confirm that the formulation of the product is Hf²⁺[(Si_0.5As_0.5)As]²⁻.     

Preparation and characterization of nitrogen-doped TiO2 photocatalyst in different acid environments

Nitrogen-doped TiO₂ powders were successfully prepared by a wet method, i.e., a micro-emulsion-hydrothermal method, in different acid environments. Several characterization techniques, X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS) and UV-visible diffuse reflectance spectra, were combined to determine the crystal phase, concentration and chemical states of the nitrogen doped in TiO₂. The high photocatalytic activity of the nitrogen-doped TiO₂ was evaluated through the decomposition of rhodanmine B under visible light irradiation. It was suggested that the doped nitrogen formed oxynitride (NO) and produced impurity states at higher above the valence band of TiO₂. Therefore, the nitrogen doping could enhance the response of photocatalyst to the visible light and improve the photocatalytic activity because of the narrowing of band gap of TiO₂.     

Electronic Structure of Fe+X Alloys (X = Si, Ge, Co)

The electronic structure of Fe–Ge, Fe–Si, and Fe–Co alloys has been investigated by X-ray photoelectron spectroscopy. In Fe–Ge alloys with less than 10 at.% Ge, the Fe–Ge bond is mainly formed by the Fe 4sp- and Ge 4p-electrons. The results obtained for this system are identical to those for the Fe–Si system. The form of the valence band reflects the density distribution of both iron d-electronic states the and p-electronic states of the second component, having more extended density distribution of valence electrons. In FeCo alloys, strong spatial localization of d-electron density takes place in the vicinity of the corresponding atoms, which is stronger on the iron atoms compared to pure iron; the valence band has a two-band structure reflecting the density distribution of the d-states of each component. X-ray photoelectron spectroscopy data are in good agreement with kinetic data for the alloys.     

Electronic structure of octavinyl- and octaphenylsilsesquioxane from XPS and DFT data

X-ray photoelectron spectroscopy (XPS) and density functional theory are employed to study the electronic structure of octasilsesquioxanes (RSiO_1.5)₈ with vinyl and phenyl terminal groups. Quantitative compositions determined from the XPS data are close to those estimated by empirical formulas. Narrow spectral lines corresponding to ionization from C1 _s core levels indicate similar chemical states of carbon atoms for both compounds. Experimental data are confirmed by close calculated values of effective charges on carbon atoms when polarization functions are included in the basis set and also by small energy ranges of core level electrons. The valence spectral region is interpreted based on the calculated energy values of electronic levels with regard to the density of states and ionization cross-sections.     

Photoelectron spectroscopic studies of the interfacial reaction between glass and commercial adhesive

The valence band and core‐level photoelectron spectroscopy [using X‐ray photoelectron spectroscopy (XPS) and ultraviolet photoelectron spectroscopy (UPS)] were used to probe the interfacial reaction between glass and a commercial adhesive (Loctite). The interaction was investigated by comparing experimental valence band spectra with spectra calculated for various possible interaction schemes. The valence band spectrum for the interfacial region between the glass and the adhesive was obtained using difference spectra on a thin film of adhesive on glass. This film was sufficiently thin that the adhesion interphase could be directly probed. Chemical interaction occurs at the interface as evidenced by the fact that the spectrum for the interfacial region could not be represented by the addition of the spectrum of the glass alone and the adhesive alone. The XPS valence band spectrum and the UPS spectrum showed that the shallow top surface layer is very much enriched in acrylic acid, which is a minor component in the adhesive. When the Loctite adhesive was coated on glass, the C1s and O1s regions of the adhesion interface region showed evidences of new chemistry at the adhesive–glass interface. The possible reactions were evaluated by comparison of the experimental spectra with calculated ones based on different models using ab initio molecular orbital calculations. The experimental spectra are well represented by models where the acrylic acid of the surface region of the adhesive reacts with the glass, suggesting chemical interaction occurred at the adhesion interphase. Copyright © 2009 John Wiley & Sons, Ltd.     

Preparation and photocatalytic antibacterial property of nitrogen doped TiO2 nanoparticles

Nitrogen doped TiO₂ (N-TiO₂) nanoparticles with about 30 nm in size were produced by a sol–gel method and characterized respectively by UV–vis, X-ray diffraction (XRD), Transmission electron microscopy, X-ray photoelectron spectroscopy (XPS). Their photocatalytic antibacterial properties were evaluated by the antibacterial ratio against Escherichia coli in dark and under simulated sunlight respectively. The XRD pattern showed that the doped nano-TiO₂ was mainly composed of anatase phase. The XPS spectra of the N-TiO₂ sample indicated that TiO₂ was doped by nitrogen atom. The nitrogen doping created a new N 2p state slightly above the valence band top consists of O 2p state, and this pushes up the valence band top and decreased the band gap. Which leaded to the absorption edge was red-shifted to the visible light region of UV–vis spectra of nitrogen doped nano-TiO₂ comparing with pure nano-TiO₂. The antibacterial percentage of N-TiO₂ against E. coli reached to 90 % under simulated sunlight for 2 h, which was much better than that in dark, also than that of pure nano-TiO₂. The photo-catalytic antibacterial activity was activated under visible light. The structure and integrity of cell wall and cell membrane were destructed, and even caused the bacteria death.     

Estimation of band alignment at CdS/Cu2ZnSnS4 hetero-interface by direct XPS measurements

This paper aims to estimate the band alignment to CdS/CZTS hetero-interface by direct X-ray photoelectron spectroscopy (XPS) measurements. XPS was used to determinate the valence-band offset (VBO) directly by determining the valence band positions at the hetero-interface. The conduction band offset (CBO) value was estimated based on the band gap measurements by UV/Visible spectroscopy and VBO measurements. The position of valence band (VB) changes close to the CdS-CZTS interface and the CBO is cliff-like. The band alignment diagram indicates that the CdS-CZTS interface heterojunction is type II.     

XPS calibration study of thin‐film nickel silicides

This paper presents a systematic X‐ray photoelectron spectroscopy (XPS)study of the Ni silicides Ni₃Si, Ni₃₁Si₁₂, Ni₂Si, NiSi and NiSi₂ produced by annealing of sputtered thin films. The in situ XPS study focuses on both the core level peaks and Auger peaks. The peak positions, shapes, satellites as well as Auger parameters are compared for different silicides. The factors that influence the Ni core level peak shifts are discussed. The Ni 2p_3/2 peak shape and satellites are correlated with the valence band structure. The effect of argon ion etching on surface composition and chemical states is also investigated. Copyright © 2009 John Wiley & Sons, Ltd.     

Valence band structure of cellulose and lignin studied by XPS and DFT

In this report, X-ray induced photoelectron spectroscopy (XPS) measurements of the valence band structure of cellulose and lignin are combined with a theoretical reconstruction of the spectra based on density functional theory (DFT) calculations. These calculations involve an analysis of the valence band structures and their respective orbitals in which basic units of cellulose and lignin are considered. In addition, photoionization cross sections are incorporated for reconstruction of the XPS spectra. This combination of theoretical calculations and experimental measurements revealed that an emission present up to 10 eV in the valence band structure is dominated by oxygen rather than by carbon, as reported in literature. Furthermore, a quantitative elemental analysis shows significant carbon contributions at binding energies above 13 eV. The valence band analysis supported by DFT provides a powerful basis for a detailed interpretation of spectroscopic data and enables a profound insight into application relevant processes in future.     

Wet chemical synthesis and photocatalytic activity of potassium niobate K6Nb10.8O30 powders

The nanometer potassium niobate powders with tungsten bronze (TB)-type structure were synthesized by a wet chemical method and characterized by X-ray diffraction (XRD) and field emission scanning electron microscope (FESEM). X-ray photoelectron spectroscopy (XPS) analysis confirmed the niobium with mixed valence states exists in the crystal structure of the photocatalyst, which may be advantage for increasing the photocatalytic activity. The band gap of K₆Nb_10.8O₃₀ powders was estimated to be about 2.92 eV and shows a markedly blue-shift as compared to that of the sample obtained by the solid-state reaction. The photocatalytic activity of the samples was evaluated by degradation of acid red G under UV irradiation and the photocatalytic reaction follows first-order kinetics. The photocatalytic activity of the as-prepared sample is much higher than that of sample synthesized by solid-state reaction, and slightly higher than that of P25-TiO₂.     

Effect of Radiation Defects on the Electronic Structure of Zircon by X-Ray Photoelectron Spectroscopy Data

X-Ray photoelectron spectroscopy (XPS) is used to study the electronic structure of radiation damaged samples of ZrSiO₄ zircon mineral at early and middle stages of its radiation destruction. The effects of radiation induced atomic disordering are found to be most distinctly manifested in the spectra of O1s states and to a smaller extent in the spectra of Si2p states, and also in the zircon valence band. Based on the quantum chemical calculation results the conclusion is drawn that the observed changes in XPS lines are caused by the formation of oxygen vacancy defects and an increase in the covalency of interatomic bonds near oxygen vacancies. For zircon samples with a low/moderate degree of radiation damage these changes reflect the initial stage of the polymerization of the ZrSiO₄ structure due to the formation of Si—O—Si chain fragments.     

Valence and origin of metal-insulator transition in Mn doped SrRuO3 studied by electrical transport, X-ray photoelectron spectroscopy and LSDA+U calculation

We have studied the valence and electronic properties of Mn doped SrRuO₃ using electrical transport measurement, X-ray photoelectron spectroscopy (XPS) and local (spin) density approximation plus Coulomb interaction strength calculation (LSDA+U). The resistivity data revealed that the system undergoes transition from metal to insulator at the critical Mn doping level, x∼0.2, which is accompanied by the structural transition from orthorhombic to tetragonal crystal symmetry. Besides, the significant reduction of the spectral weight at the coherent zone (0.8 eV) of the valence band is observed for x>0.2. The core XPS spectra suggest that both the transition elements exist in the mixed ionic pair, Ru⁺⁴/Ru⁺⁵↔Mn⁺³/Mn⁺⁴. The detail analysis of the results suggests that the Coulomb correlation effect in conjugation with localization of the charge carriers predominate over the mixed ionic pair effect and responsible for the metal-insulator transition in the series.     

The nature of the chemical bond in UO2

The nature of the chemical bond in UO₂ was analyzed taking into account the X-ray photoelectron spectroscopy (XPS) structure parameters of the valence and core electrons, as well as the relativistic discrete variation electronic structure calculation results for this oxide. The ionic/covalent nature of the chemical bond was determined for the UO₈ (D_4h) cluster, reflecting uranium's close environment in UO₂, and the U₁₃O₅₆ and U₆₃O₂₁₆ clusters, reflecting the bulk of solid uranium dioxide. The bar graph of the theoretical valence band (from 0 to ~35 eV) of XPS spectrum was built such that it was in satisfactory agreement with the experimental spectrum of a UO₂ single crystalline thin film. It was shown that unlike the crystal field theory results, the covalence effects in UO₂ are significant due to the strong overlap of the U 6p and U 5f atomic orbitals with the ligand orbitals, in addition to the U 6d atomic orbital (AO). A quantitative molecular orbital (MO) scheme for UO₂ was built. The contribution of the MO electrons to the chemical bond covalence component was evaluated on the basis of the bond population values. It was found that the electrons of inner valence molecular orbitals (IVMO) weaken the chemical bond formed by the electrons of outer valence molecular orbitals (OVMO) by 32% in UO₈ and by 25% in U₆₃O₂₁₆.     

SCF-Xα MO studies of the x-ray spectra of CuO and ZnO

SCF-Xα scattered wave cluster MO calculations for the oxyanions CuO^?6₄ (D_4h symmetry) and ZnO^?6₄ (Td symmetry) yield results in good agreement with the X-ray photoelectron and X-ray emission spectra of CuO and ZnO, respectively. Agreement of the calculations with optical data is fair. Calculations of the valence electron and core electron hole states of these oxyanions support the assignment of photoelectron shakeup satellites to valence band to conduction band transitions. Calculated shakeup energies for the Cu2p core spectrum in CuO are 7.4 and 9.9 eV (cf. experimental values of 7.5 and 10.0 eV) while shakeup peaks in the valence region spectrum are predicted at 6.1 and 8.0 eV. (Cf. a broad peak with maximum at 8.1 eV observed experimentally.) The absence of intense low energy satellites in the spectra of ZnO is explained by the small amount of electron reorganization in the outer valence levels attendant upon hole formation.     

Cu掺杂TiO2纳米管可见光催化矿化甲苯

采用低温水热法制备氢钛酸管, 通过吸附-煅烧法制备Cu掺杂TiO₂纳米管(Cu-TNT)催化剂. 利用X射线衍射(XRD)、电感耦合等离子体-原子发射光谱(ICP-AES)、X射线光电子能谱(XPS)、透射电镜(TEM)、紫外-可见漫反射光谱(UV-Vis-DRS)和电化学测试手段对样品进行表征, 并进行平面波赝势密度泛函理论(DFT)计算. 结果表明, 样品中Cu/Ti原子比接近理论值, Cu掺杂进入TiO₂晶格内部, 诱发催化剂可见光活性. 掺Cu后,Cu 3d轨道和O 2p轨道杂化形成价带顶, 价带负向偏移, 样品禁带宽度减小为2.50-2.91 eV, 具有可见光响应.以甲苯为模型污染物研究催化剂对挥发性有机化合物(VOCs)的催化去除和矿化效果. 未掺杂的TNT可见光催化活性较差; Cu掺杂量超过0.1%(Cu/Ti原子比)时, 样品催化活性也减弱; Cu掺杂量为0.1%的催化剂具有最佳可见光催化氧化能力, 7 h内甲苯的去除率达77%, 甲苯的矿化率达59%.