Identification of glass and ceramics by X-ray fluorescence analysis with a pyroelectric X-ray generator.

Applications of X-ray fluorescence (XRF) analysis with a pyroelectric X-ray generator are presented. Glass and ceramics were analyzed with this novel X-ray generator to examine its capability for analyzing nonmetallic inorganic material. Although the power of X-ray output was a few orders of magnitude lower than conventional X-ray tubes, many elements such as Si, K, Ca, Ti, Cr, Fe, Zn, Sr, Ba, and Pb were detected in glass and ceramic samples. Light elements such as Na, Mg, and Al were not detected because of the low fluorescence yield and the absorption of fluorescent X-rays in air. The elements detected or the relative peak intensities of the elements were different from each other, and the samples analyzed were identified by the XRF spectrum, notwithstanding the low power of the X-ray output. This novel device showed the sufficient capability for preliminary screening before strict identification of analytes. The pyroelectric X-ray generator can also be used to analyze large samples that cannot be put into ordinary XRF spectrometers because the device has no dimensional limitation of analytes.     

An X-ray fluorescence spectrometer with a pyroelectric X-ray generator and a secondary target for the determination of Cr in steel

An X-ray fluorescence (XRF) setup with a pyroelectric X-ray generator and a secondary target for the determination of Cr in steel is presented. The pyroelectric X-ray generator, which can be driven by a dry battery, is a low power X-ray source and emits X-rays over a large solid angle. X-rays emitted by this generator can be effectively put to use by a disk-shaped secondary target. An appropriate arrangement of (i) X-ray generator, (ii) sample support, (iii) secondary target, and (iv) detector enables secondary X-rays to irradiate the sample from a short distance. The secondary X-rays are emitted from a wide-area secondary target. The present arrangement also enables the sample to be placed near the detector. The short distance from the sample to both the secondary target and the detector enhances signal intensity. An absolute amount of 1.3 μg Cr can be detected by the present setup. A minimum detection limit of 0.09 wt.% Cr in steel by 1000-s measurement has been achieved.     

Determination of low atomic number elements at trace levels in uranium matrix using vacuum chamber total reflection X-ray fluorescence

Determinations of low atomic number elements Na, Mg and Al present at trace concentrations in uranium matrix were made by vacuum chamber total reflection X-ray fluorescence spectrometer for the first time. For this purpose, synthetic samples of uranium with known amounts of these low atomic number elements were prepared by mixing different volumes of their solutions with U solution of high purity. The concentrations of these elements in the samples were in the range of 100–300 μg/g with respect to uranium and 10–20 μg/mL in the solutions. Major matrix uranium was separated by solvent extraction with 30% solution of tri-n-butyl phosphate in dodecane. After the solvent extraction, aqueous phase containing trace elements was mixed with Sc internal standard and the samples were analyzed by vacuum chamber total reflection X-ray fluorescence spectrometer having a Cr Kα excitation source. The total reflection X-ray fluorescence results obtained, after blank corrections, indicated an average deviation of 14% from the calculated concentrations of these low atomic number elements on the basis of their preparation. However, the total reflection X-ray fluorescence determined concentration of Mg was exceptionally lower than the calculated concentration in two samples. These studies have shown that vacuum chamber total reflection X-ray fluorescence is a promising technique for the determination of low atomic number elements in uranium matrix after its separation.     

Element determination in medieval soil samples by total reflection X-ray fluorescence analysis

An aqua regia extraction procedure for heavy metals in soils optimised for total reflection X-ray fluorescence analysis is presented. The procedure is applied to 92 soil samples of medieval layers from the city area of Dortmund. Sixteen elements (P, S, K, Ca, Ti, Cr, Mn, Fe, Ni, Cu, Zn, Rb, Sr, Ag, Sn, and Pb) were used to characterise 17 sample sites. The results are projected onto the medieval urban structure of Dortmund. Two sites loaded with non-ferrous heavy metal could be detected and correlated with archaeological data. The efficiency and repeatability of the proposed extraction procedure is discussed.     

X-射线荧光光谱分析技术的发展

归纳了X-射线荧光光谱分析技术发展的进程。从现代控制技术的改善、仪器检测性能的提高、元素检测范围的扩大等8方面阐述了波长色散X-射线荧光光谱技术的进展,还就能量色散X-射线荧光光谱仪的X射线管和探测器技术的快速发展及近10年来我国在X-射线荧光光谱分析方法方面的论文发表情况进行了总结,对近年来X-射线荧光光谱仪的发展趋势———手持式、偏振、微束分析等进行了评述,并对其技术的发展方向进行了展望。     

Spatially resolved X-ray fluorescence analysis with a pyroelectric X-ray emitter.

A portable instrument for two-dimensional X-ray fluorescence imaging was assembled with an X-ray source using a pyroelectric crystal, which was driven by a 9-V dry battery, a Si-PIN detector, a slit, and pulse motors. Line scanning for a mug and a knife-edge-scan of an iron sheet were carried out using this spectrometer. The sensitivity of the spectrometer was sufficient for elemental analysis of a mug using a 1 mm(2) slit, and several elements, such as Co, Ni, Zn, Pb and Zr, were detected. The estimated spatial resolution using a 0.8-mm pinhole was 3.5 mm.     

Optimization of a glancing angle for simultaneous trace elemental analysis by using a portable total reflection X-ray fluorescence spectrometer

By using a portable total reflection X-ray fluorescence spectrometer with a 1 W X-ray tube, a specimen containing nanograms of Ca, Sc, Ti, V, Cr, Mn, Fe, and Ni is measured at several glancing angles of incident X-rays. Continuum X-rays are used as the excitation source. The intensities of the spectral background which degrades sensitivity to trace elements are decreased with a decrease of the glancing angle, and all these elements are detected at the glancing angle of 0.13° smaller than the critical angle for total reflection of the incident X-rays (0.20°). An optimum glancing angle for simultaneously detecting these trace elements is around 0.13°, and detection limits at 0.13° are sub-nanograms to ten nanograms.     

X-ray fluorescence spectrometry analysis for minerals with agaron gel for sample preparation

A mineral sample preparation with agaron gel used in X-ray fluorescence analysis was developed. Mineral samples were decomposed with aqua-regia. The sample solution mixed with agaron gel was heated to boiling and then it would become quasi-solid gel under normal temperature. The elements dispersed in gel medium could be detected by X-ray fluorescence spectrometry. The method has both advantages of the solution preparation method and the solid preparation method. In addition, this method was adapted in detecting high content ores due to its' avoiding the risk of using platinum crucibles. The method has been applied to the determination of lead, zinc and iron in zinc and lead concentrates successfully.     

粉末压片-X-射线荧光光谱法分析砂岩型铀矿制样中粘结剂用量的探讨

由于砂岩型铀矿的成矿特性,样品粉末的内聚力小,采用直接压片法有时难以成型,样片表面常见裂纹,上机测量易碎裂。混合压片法适应性强,制样成功率高,但常见的问题是样品经粘结剂稀释会影响元素的检出限及结果的准确性。本文对粉末压片-X射线荧光光谱法测定砂岩型铀矿地质样品时,前期制样中添加粘结剂的比例进行了研究。试验按照不同比例在铀矿石标准物质GBW04101、GBW04102中添加粘结剂,在扫描电镜下观察到随着粘结剂用量的增加样片表面的光滑度及致密度都呈上升趋势,在X-射线荧光光谱仪上对主量元素进行测定后发现X射线强度在粘结剂添加量大于0.2 g时明显下降,经与GBW04101、GBW04102标准值进行对比后优选出粘结剂与样品的最佳比例为1：20,在此比例下制成的样片光滑平整,不易碎裂,用粉末压片-X射线荧光光谱法进行测定,标准物质测定结果的相对误差为0.56%～6.76 %,相对标准偏差(RSD,n=12)为0.013 %～7.68 %,均达到了《地质矿产实验室测试质量管理规范》DZ/T 0130-2006的要求。本文为粉末压片-X射线荧光光谱法分析砂岩型铀矿地质样品提供了可靠的实验参考依据。     

Total reflection X-ray fluorescence analysis of fly ash from Bulgarian coal-fired power plants

The contents of Cl, Ca, K, Ti, V, Cr, Mn, Fe, Ni, Cu, Zn, As, Se, Rb, Sr, Ba and Pb in raw coal fly ash from five Bulgarian power plants were determined by total reflection X-ray fluorescence (TXRF), using gallium as the internal standard. The samples were analysed as in slurry form in Triton? X-114. The experimental parameters, such as grain size, concentrations of fly ash slurry and excitation time were optimised. For validation of the method, the certified reference material BCR-176R fly ash was used. The precision of the results obtained is characterised by a relative standard deviation of approximately 10%. The resulting data confirm the suitability of TXRF for the simultaneous determination of major, minor and trace elements in coal fly ash samples. Further advantages provided by TXRF are easy sample preparation (no sample dissolution) and the small sample amount required for analysis.     

铝合金建材的X射线荧光分析

用高性能飞利浦PW2424型X射线荧光光谱仪,测定铝合金建材中的Si、Fe、Cu、Mn、Mg、Zn、Ti、Cr、Ni等9个化学元素的含量.给出各元素的干扰校正系数和基体效应校正系数.方法准确、灵敏,稳定性好,速度快.     

Influence of X-ray tube spectral distribution on uncertainty of calculated fluorescent radiation intensity

The relative radiation intensity (R_i) defined as fluorescent radiation intensity of analyte in specimen to fluorescent radiation intensity of pure element or compound, e.g., oxide is used in calculation in both fundamental parameter methods and in theoretical influence coefficient algorithms. Accuracy of calculated R_i is determined by uncertainties of atomic parameters, spectrometer geometry and also by X-ray tube spectral distribution. This paper presents the differences between R_i calculated using experimental and theoretical X-ray tube spectra evaluated by three different algorithms proposed by Pella et al., Ebel, and Finkelshtein–Pavlova. The calculations are performed for the most common targets, i.e., Cr, Mo, Rh and W. In this study, R_i is calculated for V, Cr, Mn, Fe, Co, Ni, Cu and Mo in steels as an example. The differences between R_i calculated using different X-ray tube spectrum algorithms are presented when pure element standard, multielement standard similar to the analyzed material and one pure element standard for all analytes is used in X-ray fluorescence analysis. The differences between R_i for intermediate-thickness samples (and also for thin films) and for X-ray tube, which ran for many hours, are also evaluated.     

X射线荧光光谱法结合多元统计学对热敏纸的检验研究

为建立一种快速且无损检验热敏纸的科学有效的方法,利用能量色散型X射线荧光光谱(XRF)对38个不同商家,不同规格的热敏纸样品进行检验,首先根据每个样品所测量得到的元素的不同,将38个样品分成四大类,同时采用SPSS25.0软件中的系统聚类法对38个样品的元素数据进行聚类分析处理,结果分成了12小组,再结合SPSS25.0软件中的判别分析法对上述结果进行验证,实现了基于X射线荧光光谱结合聚类分析建立数学模型用于区分热敏纸种类的目的,该方法简单易行,可以为案件侦破提供线索、指明方向。     

粉末压片-X射线荧光光谱法测定富硅土壤和沉积物样品中的5种重金属元素

X射线荧光光谱法测定土壤和沉积物中的重金属具有简便、快速、准确等优点,但现有的环境行业标准方法不适用于SiO2含量大于80%的土壤和沉积物。为提高X射线荧光光谱法测定土壤和沉积物中的重金属在环境监测领域中的适用性,建立基于粉末压片-X射线荧光光谱法测定富硅土壤和沉积物中重金属的分析方法。通过选取富硅的土壤和沉积物标准物质提高校准曲线的测量范围以及优化各元素的测量条件,探讨基体效应和谱线重叠干扰、研究压片制样的最佳压力等途径,测定富硅土壤和沉积物中的Pb、Cr、Cu、Ni、Zn。结果表明在已优化的测定条件下,通过延长校准曲线的测量上限,保证待测元素含量在校准曲线范围内,同时采用经验系数法和康普顿散射内标法校正基体效应,可进一步提高方法的准确度和精密度。方法比对结果显示该方法的测定结果与原子吸收光谱法的测定结果无显著性差异。选用2种不同的富硅标准物质进一步验证方法的精密度和准确度,Pb、Cr、Cu、Ni、Zn的测定结果与标准物质认定值的对数误差为0.002~0.08,相对标准偏差为1.0%~4.6%。该方法的精密度和正确度满足土壤和水系沉积物环境监测分析的技术要求,具有良好的应用前景。     

X-ray absorption spectral analysis with a 9 V battery X-ray generator.

X-ray absorption spectral (XAS) analysis is performed with a combination of a 9 V dry electric battery X-ray generator and a portable Si PIN X-ray detector. The calcium K edge (4.0 keV) in paper is measured with a grazing incidence geometry, which suppressed the artifact due to the Kalpha X-ray fluorescence peak at 3.5 keV. The 9 V dry battery X-ray emitter is useful for portable XAS measurements.     

X-ray fluorescence determinatin of trace elements in soil

Trace elements in soil are quantified by direct X-ray fluorescence method. Gallium is used an internal standard to compensate for variations in sample matrix, instrumental operating characteristics, and sample preparation. At the 50-mg kg^?1 level, V, Cr, Ni, Cu, Zn and As can be determined within a precision and accuracy of ± 20% or less. Sample prepartion is less elaborate than for some other methods.     

X射线荧光光谱法测定氧化铝中杂质元素

应用X-射线荧光光谱法测定了氧化铝中11种杂质成分（SiO2，Fe2O3，Na2O，K2O，CaO，TiO2，P2O5，ZnO，V2O5，Ga2O3，Cr2O3）。试样用四硼酸锂和偏硼酸锂作混合熔剂融熔制成玻璃状片形熔块。通过在高纯氧化铝中加入一定量的上述11种元素的纯氧化物配制成中间标准样品，并用此中间标准样品和纯氧化铝作为空白试样组成高、低标，制备了校正曲线。又用此中间标准样品与纯氧化铝按一定比例配制控制样品对分析过程进行质量控制。对所提出方法的精密度进行了考核，结果表明以上11种杂质成分测定结果的RSD值均小于10％。用4种标样对此方法的准确度进行验证，结果表明所得测定值与已知值之间的误差均符合标准规定。     

Analysis of tungsten carbides by X-ray fluorescence spectrometry

Five sample presentation techniques were examined for the X-ray fluorescence spectrometric analysis of tungsten carbide alloys in powder and cemented forms. Powder samples may be oxidized by air at 600° before fusion (I), or preferably by lithium nitrate during fusion (II); the fusion is effected with lithium-lanthanum tetraborate followed by briquetting with graphite. Powder samples may also be blended with wax and briquetted (III). Cemented carbides are surface-prepared with silicon carbide before analysis (V). Briquettes prepared by blending carbide powder, lithium-lanthanum tetraborate and graphite (IV), give poor reproducibility, however, owing to micro-absorption effects the technique is not recommended. The determination of eight common elements in tungsten carbide is discussed and the relative standard deviations are 0.002–0.004 for major and 0.008–0.01 for minor elements.     

应用波长色散X荧光仪和多晶X射线衍射仪联用技术 鉴定进口铜矿和含铜物料

本文首次研究进口可利用含铜物料与进口铜矿属性的不同特性并建立鉴定方法,采用X荧光光谱法和X射线衍射光谱法联用技术建立铜矿和含铜物料属性的鉴别方法。通过X荧光光谱法对铜矿和含铜物料中元素进行定性半定量分析,再用X射线衍射光谱法对铜矿和含铜物料的特征谱峰进行扫描,与X衍射仪中标准卡片比对分析,能够确定铜矿和含铜物料的物相组成。结果显示：X荧光光谱法铜矿和含铜物料的共同特点铜的含量较高,达到冶炼铜对原料的要求,硅、铁、钠、钙和镁元素都能够检出。差异性在铅和锌元素在含铜物料中较高,在铜矿石中基本未检出;在X荧光光谱法检测出的金属元素,通过X衍射仪扫描后与标准图片比对,各元素以不同的形式存在于含铜物料中,且有规律可循。     

Study of archaeological ceramics by total-reflection X-ray fluorescence spectrometry: Semi-quantitative approach

Total-reflection X-ray fluorescence spectrometry has been compared with Instrumental Neutron Activation Analysis in order to test its potential application to the study of archaeological ceramics in the archaeometric field. Two direct solid non-chemical sample preparation procedures have been checked: solid sedimentation and solid chemical homogenization. For sedimentation procedure, total-reflection X-ray fluorescence allows the analysis of the elemental composition with respect to the size fraction but not the average evaluation of the composition. For solid chemical homogenization procedure, total-reflection X-ray fluorescence provides precise (from 0.8% to 27% of coefficient of variation) and accurate results (from 91% to 110% of recovery) for 15 elements (Cr, Hf, Ni, Rb, Al, Ba, Ca, K, Mn, Ti, V, Cu, Ga, Y and Fe) with an easy sample preparation process of the solid clay and without previous chemical treatment. The influence of the particle sizes has been checked by total-reflection X-ray fluorescence sample angle scans and anomalous behaviors have been found for three additional detected elements: As, Sr and Zn, which can be attributed to interference effects of the mineral grain sizes of their associated chemical phases in the total-reflection X-ray fluorescence interference region. The solid chemical homogenization procedure produces data useful for archaeological interpretation, which is briefly illustrated by a case-study. Finally, the decantation procedure data can be also useful for size chemical speciation and, consequently, for alternative environmental total-reflection X-ray fluorescence applications.