New data-processing technique for measurement of metallic foil thickness with differential white-light interferometry

The thickness of metallic foil was measured by differential white-light interferometry (DWLI). Two tandem Michelson interferometers (MI), in which the reflective surfaces measured are the surfaces of the metallic foil, were used as a basic interferometry system to obtain interference fringes on a spectrometer. Therefore, the interference fringes depend only on the path differences caused by the thickness of the metallic foil. The interference fringes were analyzed using a modified extremum method based on the least root-mean-square (RMS) deviation. Experimental results for thickness measurements are presented. Measurement time is only 100 ms or less for a thickness of 1–80 μm.     

Initiation of a reaction in aluminum-Teflon multilayer thin-film samples by drop-hammer impact loading

Experimental results on the initiation of samples composed of alternating layers of aluminum foil (0.65, 4, 10, or 20 μm in thickness) and Teflon films (20 or 50 μm) by drop-hammer impact loading are presented. In contrast to powdery mixtures, lamellar compositions have a rigorously controlled surface area of contact of the interacting components. The light flash signifying the event of initiation and the impact pressure were recorded with a photodiode and a tensiometer, respectively. It was established that, under typical condition of initiation of HEs, the aluminum-Teflon lamellar samples are deformed as brittle materials. At a certain pressure, after the stage of elastic compression, a rapid disintegration (within 30 μs) with the formation of local reaction initiation sites at shear surfaces of individual segments occurs. The results obtained are indicative of the mechanochemical nature of the interaction between aluminum and Teflon layers under impact loading conditions.     

整形飞秒激光金属材料精细加工

实验通过二极管记录透射光信号随脉冲个数变化关系以及观测样品烧蚀形貌来研究不同实验条件对激光烧蚀的影响。使用的样品是厚度为50 m铝箔。实验中通过研究不同变量:激光焦点与样品的相对位置、激光的能量、背景气体压强以及脉冲形状对烧蚀加工过程和结果的影响,从而获得较好烧蚀效果的条件,达到控制烧蚀加工过程的目的。特别是通过使用不同形状的脉冲和具有一定规律的脉冲序列对样品进行烧蚀,发现某些形状的整形脉冲烧蚀结果明显优于变换极限脉冲。说明脉冲整形作为一种新的技术可以在激光精细钻孔领域得到更深入的研究和应用。     

一维光子晶体带隙结构研究

在考虑介质色散的基础上,研究了介质层厚度对光子晶体带隙结构的影响.利用传输矩阵法,计算了以LiF和Si两种材料组成的一维光子晶体带隙结构.结果表明,介质层厚度的增加会引起禁带的红移,厚度减小会引起蓝移.分析了含空气缺陷层、金属缺陷层的光子晶体结构,发现空气缺陷层对带隙结构的高反射区域变化不大,而在低反射区域,反射系数为零的波带之间出现了两边反射系数增加,中间反射系数减小的情况.在金属缺陷层的带隙结构中,金属对整个波长范围光的吸收作用不同,金属对低反射区1.6 μm、1.85 μm处透射率较大的透射光吸收作用明显,而在1.28~1.38 μm处透射率波长区间,几乎无吸收.     

靶丸壳层厚度及其分布的白光反射光谱测量技术

为了精密检测靶丸壳层厚度及其分布数据,开展了靶丸壳层厚度及其分布的白光反射光谱测量技术研究。介绍了靶丸壳层的白光反射光谱及其光谱数据处理方法（极值法、峰值拟合法、干涉级次校正法等）的基本原理,搭建了基于白光反射光谱的精密回转轴系测量装置;开展了GDP靶丸壳层厚度及其分布的白光反射光谱测量、数据处理和可靠性验证实验,获得了靶丸壳层厚度圆周分布曲线。结果表明,基于峰值拟合法和干涉级次校正的白光反射光谱技术可实现靶丸壳层厚度及其分布的准确测量,其测量误差小于0.1 μm。     

XUV radiation transfer through high-Z metal foil in a laser-produced plasma

Aluminum and gold foils have been irradiated with 1.05-μm, 100-psec laser pulses at an intensity of 3 × 10¹⁴ W/cm². A spatially resolved spectrum of XUV radiation from a rear-side plasma has been observed in the wavelength range from 10 to 100 Å. The spectral intensity for the Al foil decays exponentially with foil thickness and goes to zero at 3 μm. The intensity for the Au foil also decays exponentially up to 1 μm but remains almost constant from 1 to 6 μm. This result for the Au foil indicates that radiation heat conduction plays an important role in energy transport through high-Z plasmas.     

THz near-field measurements of metal structures

We report on electro-optic measurements of THz electric fields in the near-field of metal structures lying on GaP electro-optic sampling crystals. With (110) oriented crystals, the x or y component of the THz electric field is measured, whereas with a (001) oriented crystal, the z-component is measured. With an estimated spatial resolution of 20 μm, the technique allows us to map the field on a scale, orders of magnitude smaller than the spatial dimensions of these structures. We illustrate the technique by showing results of measurements of the THz electric field in a plane underneath a metal sphere and a single square hole in a metal foil. The technique provides us with a wealth of information on the time-evolution of light fields near metal structures. To cite this article: A.J.L. Adam et al., C. R. Physique 9 (2008).     

XUV成像系统中像传递函数研究用的Si刻蚀膜

研制具有网格或条状图形的Si刻蚀膜靶,用于XUV系统中像传递函数的研究。在自截止腐蚀工艺制备Si平面薄膜的基础上,结合离子束刻蚀工艺,获得刻蚀深度为1.0 μm左右,网格尺寸为25 μm×25 μm,或条状线宽为5 μm的Si刻蚀膜;测量了Si刻蚀膜的形貌和刻蚀深度;研究了离子束刻蚀参数对图形形貌的影响。并介绍采用两种靶型获得的像传递函数信息。     

测量光纤外腔Fabry-Perot干涉仪的白光干涉术

提出了一种基于白光干涉术测量低锐度光纤外腔Fabry Perot干涉仪（EFPI）的方法用宽带光源注入F P腔,在接收端用一高锐度的可调谐光纤F P滤波器对EFPI的反射光谱进行扫描,获得了周期性变化的光谱输出为了测量出EFPI的腔长,对光谱信号进行傅里叶变换,得到光谱的周期,由此求出EFPI的绝对腔长证明了用低锐度EFPI的测量准确度由腔长决定F P腔越长,测量准确度越高在腔长分别是200 μm,400 μm和600 μm时,测量的腔长与实际腔长相同.     

XUV成像系统中像传递函数研究用的Si刻蚀膜

 研制具有网格或条状图形的Si刻蚀膜靶，用于XUV系统中像传递函数的研究。在自截止腐蚀工艺制备Si平面薄膜的基础上，结合离子束刻蚀工艺，获得刻蚀深度为1.0 μm左右，网格尺寸为25 μm×25 μm，或条状线宽为5 μm的Si刻蚀膜；测量了Si刻蚀膜的形貌和刻蚀深度；研究了离子束刻蚀参数对图形形貌的影响。并介绍采用两种靶型获得的像传递函数信息。     

Interference in the ultracold neutron transmission through thin layers

At the time-of-flight spectrometer for ultracold neutrons (UCN) with energies below 10^?4 eV at the FRM, Munich, the perpendicular neutron transmission through carbon and gold films of thickness 450 to 800 Å was measured as a function of neutron velocity in the range 11≧v _z≧3.7 m/s. The transmission curves obtained show the expected interference patterns due to interference between the partial waves transmitted and reflected at the two surfaces. From these curves absolute values for the thickness and density could be obtained. From the UCN transmission through a 4.71 μm thick copper foil a value a_coh=7.5±0.15 F was derived for the nuclear scattering length of Cu.     

用迈克尔逊干涉仪测量全息干板膜厚度

全息干板膜的厚度是全息干板的重要参数之一。使用迈克尔逊干涉仪和白光光源对2种全息干板膜厚度进行测量，并对测量结果误差进行分析，给出了测量误差与膜厚及折射率之间的关系以及此方法的适用范围。研究结果表明：在膜厚从8μm增至41μm的过程中，测量结果的绝对误差≤2μm且变化很小，相对误差则从14.1%降到了2.2%。随着膜厚的增加，相对误差明显降低；折射率n也参与了误差传递，其值与测量误差呈类似反比关系；当n值在1.5附近时，为保证测量的准确性，所测膜厚≥40μm。最后指出，迈克尔逊干涉仪在测量全息干板膜等较厚的薄膜时，具有测量范围大，结果较准确等优点。     

10μm级聚酯薄膜介质电临界击穿场强初步研究

分析了聚酯薄膜电击穿可能的模型,如本征击穿模型和电一机械击穿模型,估算了两种模型下常用聚合物介质的临界击穿场强。实验研究了平板电极结构下10μm级聚酯薄膜的自击穿电压,得出了聚酯薄膜的临界击穿场强450-500kV／mm。实验结果与理论计算值比较表明：本征击穿模型下的聚酯薄膜临界击穿场强都远小于实验结果,电～机械击穿模型下聚酯薄膜临界击穿场强大于实验结果。     

X–UV laser radiography

We have used a technique for studying the effect of a laser beam impinging on a thin foil using an X-ray laser as an X–UV backlighter, i.e. X–UV laser radiography. This technique allows us to measure small fractional variations in the transmission of the foil. We present an overview of measurements of imprinted thickness modulation and growth due to a 0.53 μm wavelength drive beam incident on a 2 μm thick Al foil using a germanium X-ray laser. Initial imprint is determined for single optical modes. Moreover the change in opacity is measured in a strongly coupled, highly compressed Al foil.     

超短激光与金薄膜靶相互作用产生的质子能谱

在能量11 mJ、波长744 nm、脉宽120 fs、功率密度61016 W/cm2的超短脉冲装置上,开展了超短脉冲激光与2.1 m和5.0 m金薄膜靶相互作用产生质子束的实验研究。利用Thomson谱仪测量了产生的质子能谱,发现利用2.1 m金薄膜靶时,质子能谱由于质子源数量不足而在74 keV附近出现单能峰,5.0 m的金薄膜靶产生的质子计数和能谱均比2.1 m的金薄膜靶产生的低,主要原因是超热电子穿过薄膜靶时出现的能量损失和几何倾斜降低了电子回流所致。     

Observation of increase in Raman intensity of surface phonon polaritons on rough surfaces of ZnTe

An increase in Raman intensity of surface phonon polaritons has been observed in free-standing thin slabs (thickness ～ 7 μm) of single- crystal ZnTe with rough surfaces by a conventional Raman-scattering technique at room temperature. The samples with various root-mean- square roughness heights have been prepared by making use of final polishing powders with different mean-grit sizes, and the surface roughness has been confirmed by measuring the intensities of the diffuse scattering of the laser light. The increase of the Raman intensity is proportional to the mean-square height of the surface roughness, and the shift of the dispersion relation is also proportional to it. The frequency shift is explained by a perturbation theory of the surface-roughness-induced scattering.     

溶胶-凝胶法制备SiO2-TiO2平板光波导工艺研究

采用溶胶-凝胶法制备了SiO₂-TiO₂平板光波导,计算了平板光波导通光条件,分析了硅/钛溶胶-凝胶材料的热性能,观测了平板光波导的结构形貌,并测试了其通光损耗。结果表明：经过200℃,30 min干燥处理的凝胶薄膜呈疏松多孔状态,对于非对称平板波导,存在芯层通光截止厚度,而且当SiO₂-TiO₂芯层厚度为0.5 μm时,SiO₂下包层厚度至少有6 μm才能防止1550 nm波长光泄露入单晶硅衬底中。制备的光波导对于1550 nm波长光传输损耗最小值为0.34 dB/cm。     

荧光粉层厚度对激光照明的影响

针对荧光粉层厚度对激光照明的影响展开研究,采用自行设计的反射式照明模块进行测试,利用独创的荧光粉层厚度确定方案精确地确定厚度。通过实验分析得出:随着荧光粉层厚度的增加,光通量逐渐增大,在荧光粉层厚度达到600μm之后呈现下降趋势;在荧光粉层厚度达到600μm之前,蓝光含量呈下降趋势,600μm后略有上升,但整体趋于稳定;色温与蓝光含量变化趋势相同,存在正比关系。同时,本文还验证了光分布密度对激光照明有很大影响。     

Radioactive Ion Implantation as a Tool for Wear Measurements

The present paper deals with ion implantation of radioactive krypton ions in surfaces with aim of measuring wear of different magnetic materials in sound-heads.

The techniques is especially suited for a relatively fast comparison of wear-characteristics of materials of varying composition in small inaccessible areas.

In the present case utilisation of a 60 KeV accelerator allows determination of a total wear as small as 0.05 μm with an accuracy of 10%. Further the technique yields information of the time dependence of the wear process with an accuracy less than 0.001 μm.     

An effective optical evaluation technique using visible low-coherence interferometry

An easy and effective path length deviation detection technique is described which uses low-coherent visible light source and Michelson interferometer configuration. This technique uses large-amplitude piezoelectric modulation of a mirror, which probes portions of a complete interferogram. The maximum ambiguity in determining the center position of white light fringes is confined to half the source wavelength. Using this technique, the physical thickness and group index of an optical material are measured with an error around 0.1%. The method of improving the accuracy is also discussed.