正负压一体式无空气X射线光电子能谱原位转移仓的开发及研制

针对空气敏感材料的表面分析,为了获得更加真实的表面组成与结构信息,需要提供一个可以保护样品从制备完成到分析表征过程中不接触大气环境的装置.通过使用O圈密封和单向密封柱,提出一种简便且有效的设计概念,自主研制了正负压一体式无空气X射线光电子能谱(XPS)原位转移仓,用于空气敏感材料的XPS测试,利用单向密封柱实现不同工作需求下正负压两种模式的任意切换.通过对空气敏感的金属Li片和CuCl粉末进行XPS分析表明,采用XPS原位转移仓正压和负压模式均可有效避免样品表面接触空气,保证测试结果准确可靠,而且采用正压密封方式转移样品可以提供更长的密封时效性.研制的原位转移仓具有设计小巧、操作简便、成本低、密封效果好的特点,适合给有需求的用户开放使用.     

表面修饰二氧化锡纳米微晶的制备与表征

制备了硅烷偶联剂KH-570表面修饰的SnO2纳米微晶，通过FT-IR、XPS、TEM和TG-DTA对其结构和表面特性进行表征和研究. FT-IR和XPS分析结果确证了KH-570与SnO2表面是以化学键合或物理吸附方式相结合,粒子表面存在酯基等有机官能团的红外吸收特征；观测到KH-570中Si原子的Si2s和Si2p谱线. TEM分析表明，表面修饰反应增强了SnO2纳米微晶的疏水性和分散性.由XPS和TG的实测数据探讨了纳米粒子具有较低包覆量的可能原因.     

X射线光电子能谱技术在高分子材料摩擦化学研究中的应用

X射线光电子能谱技术(XPS)是材料表面分析的重要手段,其近年的快速发展促进了表面化学领域研究的深入.高分子及其复合材料在摩擦学性能方面具有普遍的优势,通过XPS对高分子及其复合材料摩擦表面的分析,可以确定摩擦过程的化学变化,并对改进材料的摩擦学性能起到理论的指导作用.作者主要介绍XPS技术的基本原理,及其在高分子与复合材料摩擦学性能研究中的应用.     

采用XPS与接触角法研究氟聚合物表面结构与性能

本文采用接触角和变角XPS方法对FA共聚物的表面能、 表面微相结构做了进一步的研究.     

聚ε-己内酯/聚氯乙烯球晶表面的XPS研究

聚合物薄膜在微电子领域中的应用日益增加.聚ε-己内酯/聚氯乙烯（PCL/PVC）是研究得最广泛的聚合物共混薄膜之一.PCL与PVC以一定比例混合时,可以形成环带球晶；同时,体系分为结晶PCL相及PCL/PVC非晶混溶相.用XPS和成象XPS分析技术,对PCL/PVC膜的表面化学组成和元素分布情况进行了研究.观察到PCL在薄膜表面富集.此外,成象XPS表明,PVC在球晶边界处富集,且球晶边界宽度约15 μm.     

羊毛表面改性对拒水拒油整理的作用及机理研究

应用扫描电镜(SEM)、X射线光电子能谱(XPS)和衰减全反射红外光谱(FTIR-ATR)等现代表面分析技术研究不同改性处理羊毛表面的化学和物理结构特性.SEM研究结果表明,经低温等离子体表面改性或特定化学改性后的羊毛鳞片表面呈现纳米尺度的沟槽和凹凸结构,应用Wenzel公式和Cassie and Baxter公式阐述了表面粗糙度与接触角的关系,揭示了羊毛表面改性对于提高拒水拒油整理效果的原因所在.XPS和FTIR-ATR研究表明,上述物理和化学的表面改性技术使羊毛表面的二硫键氧化断裂和表面类脂物质改性/除去,促进拒水拒油整理剂的吸附和固着.表面改性和拒水拒油整理的协同效应赋予羊毛类荷叶效应,使其呈现超级拒水拒油拒污功能.     

非晶态金属合金作催化材料的研究——Ⅲ.Ni-Fe-P非晶态合金对CO加氢活性的研究

本文用连续微型反应器、X 射线光电子能谱(XPS)、程序升温还原(TPR)、X 射线衍射(XRD)等方法,研究了骤冷法制备的 Ni-Fe-P 非晶态催化剂的加氢活性和表面结构.结果表明:非晶态 Ni-Fe-P 合金在常压下对 CO 的加氢活性优于晶态 Ni-Fe-P 合金;表面的不同预处理对反应活性影响很大.XPS 的结果显示在较高温度下氧化时表面富铁,表面存在的镍物种和元素态铁是 CO 催化加氢的活性中心.     

X-光电子能谱仪的管理与维护

X-射线光电子能谱仪(XPS)是表面分析领域的重要工具,其快速发展促进了表面化学领域研究的深入.正确的使用和良好的维护不仅可以确保XPS始终保持良好的运行状态,还可以延长它的使用寿命.结合作者在实验室的工作经验和体会,从测试和维护仪器等方面介绍了管理和维护的经验,为相关人员提供参考.     

光电子能谱研究甲酸和乙酸在预氧化的铁表面上的吸附和分解

研究小分子羧酸在过渡金属和金属氧化物表面上的吸附和分解,可提供有关反应途径和过渡吸附态的丰富信息.Trillo 等对甲酸在金属氧化物上分解作了较系统的研究.我们利用XPS方法研究了甲酸和乙酸在多晶铁表面上的吸附和分解,表明在低酸覆盖度时,铁表面具有较强断裂C-O键能力,生成RCO(a):增大覆盖度时,则主要生成 RCOO(a).本文报导利用 XPS方法研究甲酸和乙酸在预氧化的铁表面上吸附和分解的结果.     

三维编织C/SiC纤维复合块材的XPS研究

用常规XPS、小面积XPS和成象XPS研究了三维编织的C/SiC纤维复合材料.结果表明,在燃气中灼烧后材料表面生成的暗红色反应是由于层中的SiC已氧化成氧化硅,同时反应层中还引入了杂质Fe、Na、Ca和Al;在反应层下Si以元素Si、SiC和氧化硅多种形式存在.块材横截面的多点小面积XPS分析结果表明,元素硅的相对浓度随深度增加而减少, SiC的相对浓度则随深度增加而增加.块材横截面的成象XPS分析清楚地显示了SiC 在纤维束边界间呈大致均匀的分布,在块材两边元素Si的浓度明显偏高.根据XPS象的线性扫描结果估计了纤维束、束间SiC层和块材边缘元素Si富集层的厚度.     

In situ ion beam sputter deposition and X‐ray photoelectron spectroscopy (XPS) of multiple thin layers under computer control for combinatorial materials synthesis

Deposition of ultra‐thin layers under computer control is a frequent requirement in studies of novel sensors, materials screening, heterogeneous catalysis, the probing of band offsets near semiconductor junctions and many other applications. Often large‐area samples are produced by magnetron sputtering from multiple targets or by atomic layer deposition (ALD). Samples can then be transferred to an analytical chamber for checking by X‐ray photoelectron spectroscopy (XPS) or other surface‐sensitive spectroscopies. The ‘wafer‐scale’ nature of these tools is often greater than is required in combinatorial studies, where a few square centimetres or even millimetres of sample is sufficient for each composition to be tested. The large size leads to increased capital cost, problems of registration as samples are transferred between deposition and analysis, and often makes the use of precious metals as sputter targets prohibitively expensive. Instead we have modified a commercial sample block designed to perform angle‐resolved XPS in a commercial XPS instrument. This now allows ion‐beam sputter deposition from up to six different targets under complete computer control. Ion beam deposition is an attractive technology for depositing ultra‐thin layers of great purity under ultra‐high vacuum conditions, but is generally a very expensive technology. Our new sample block allows ion beam sputtering using the ion gun normally used for sputter depth‐profiling of samples, greatly reducing the cost and allowing deposition to be done (and checked by XPS) in situ in a single instrument. Precious metals are deposited cheaply and efficiently by ion‐beam sputtering from thin metal foils. Samples can then be removed, studied and exposed to reactants or surface treatments before being returned to the XPS to examine and quantify the effects. Copyright © 2016 The Authors Surface and Interface Analysis Published by John Wiley & Sons Ltd.     

Status monitoring of ion sputter relevant parameters of an XPS depth profiling instrument

An X-ray photoelectron spectroscopy (XPS) instrument is utilized for sputter depth profiling of thin films. Relevant instrumental parameters are the ion gun sputter rate, the contamination level of the sputter ion gun, and the purity of the sputter ion gun gas supply as well as the vacuum quality of the instrument at the sample position. A long-term recording of these instrumental parameters ensures the reliability of the measured depth profile data. The ion gun sputter rate was estimated using the standard ISO conform depth profiling of a SiO₂ reference layer of known thickness. Two new procedures are developed to determine the other relevant parameters. Gases that are emitted by the ion sputter gun get implanted into a Si target. An analysis of the implanted gases allows judging on the contamination level of the sputter gun and the purity of the sputter gun gas supply. The vacuum condition of an XPS microprobe at the sample position is monitored by the recontamination of a sputtered Ti surface by adsorbed residual gas particles.     

凝胶色谱仪的开放使用与管理

凝胶色谱仪是高分子化学学科日常科研工作的必备仪器.随着高校高分子化学学科的迅猛发展,如何提高该仪器的开放使用和管理维护变得十分重要.总结了管理的经验及体会.     

XPSSurfA: An open collaborative XPS data repository using the CMSShub platform

X‐ray photoelectron spectroscopy (XPS) is a widely used surface analysis technique employed in fundamental research, applied research, service laboratories, and industry. Good‐quality analytical outcomes depend critically on spectral references. Many examples of XPS reference databases exist, including print editions, sets of spectral peak positions drawn from the literature, and digital archives and libraries. We report the development of a new digital XPS database comprising survey spectra and region spectra for a range of materials types, collected under a common set of analytical conditions. Each material is described using spectra collected at multiple pass energies with all photoelectron and X‐ray induced Auger transitions represented. Detailed metadata are provided for each material and each spectrum, presented using a schema that incorporates the ISO 16243 and 14976 standards and extensions developed in this work. Spectra are shared under a Creative Commons International (4.0) attribution, non‐commercial licence (CC BY‐NC) in Kratos (.dset), VAMAS (.vms), and XML (.xml) formats. It is intended that reference spectra be imported directly into XPS data analysis software packages for reference and comparison purposes, matching either the peak or transition of interest and the instrument pass energy. The database is flexible and scalable in structure and has the potential to become a core XPS reference resource.     

A facile route to fabricate stable reduced graphene oxide dispersions in various media and their transparent conductive thin films

Experimental data on the influence of the hydrothermal opening procedure conditions on the polarity, surface chemical composition and adsorption properties of multiwalled carbon nanotubes toward phenol are reported. The enthalpy of immersion measurements is reported, and it is shown that with the rise in burn-off, a progressive rise in nanotube surface polarity was observed. Using XPS data, the surface groups are identified. Moreover, by the analysis of HRTEM images and the values of enthalpy of immersion in benzene, it is shown that the removal of internal caps takes place mainly at higher burn-offs (larger than ca. 15%). Obtained series of nanotubes is tested in phenol adsorption, and calculated differential enthalpies of adsorption values are in the range of those determined for adsorption on graphite. Basing on obtained data, it is shown that the state of phenol in first layer is close to solid for adsorption on closed tubes and progressively approaches the state of supercooled liquid after tube opening and with the rise in burn-off.     

Application of confocal 3D micro-XRF for solid/liquid interface analysis.

Solid/liquid interfaces are important locations for various chemical reactions, such as electrode chemical reactions and metal corrosions. Conventional surface analytical methods, such as XPS and SEM-EDS, have been applied to solid materials after being removed from the liquid phase. These methods do not involve direct observation, although useful information is available. It is important to directly observe surface reactions on solid materials in the liquid phase in order to understand the details of these reactions. One feasible method of doing this is 3D micro-XRF analysis. The confocal 3D micro XRF method enables nondestructive x-ray elemental analysis of localized microspace. We have applied a confocal 3D micro-XRF instrument for solid/liquid interface analysis. This technique was applied for direct observation of the chemical deposition of Cu on an Fe plate and the dissolution of Fe in a CuSO4 solution.     

Numerical approximation of AR‐XPS spectra for rough surfaces considering the effect of electron shadowing

A computational scheme is presented that takes into account the topography, i.e. the shadowing and hence the local emission angle of the electrons when evaluating AR‐XPS data of macroscopic rough surfaces. The topography of the sample surface is supposed to be recorded by atomic force microscopy and/or optical microscopy. The emitted photoelectrons are simulated based on an extension of the Beer–Lambert law that includes the shadowing, the current local emission angle, and the geometrical instrument setup. The obtained angle‐resolved XPS spectra are optimized in accordance with experimental ones via a self‐consistent minimization algorithm that also allows one to determine the layer thicknesses of the corrugated sample. In order to validate the proposed numerical scheme, the simulation program simulation of electron spectra for surface analysis is used. An additional analysis is then performed considering only experimental data. The numerical scheme gives good agreement in simulation–simulation as well as simulation–experiment comparisons and permits a comprehensible interpretation of the measured data. Copyright © 2014 John Wiley & Sons, Ltd.     

Monitoring Fibre Surfaces with XPS in Papermaking Processes

 Recent instrumental advances have vastly improved the analysis power of X-ray photoelectron spectroscopy (XPS), which has been widely used in applied surface research for decades. In this presentation a set of XPS analysis methods well suited for problems and analytical needs encountered in papermaking technology is presented. The emphasis will be on analysis of pulps and non-coated papers. Examples given describe the use of XPS in quantification of surface lignin and extractives; an alternative approach for evaluating elemental surface distributions via the Tougaard background analysis is also presented. The experimental work and interpretations presented are based on more than two thousand XPS analyses performed at Helsinki University of Technology during 1996–2000. With strictly standardised experimental setup, state-of-the-art instrumentation and a proper combination of analysis methods XPS can yield valuable and consistent information on surface properties of natural fibers.     

XPS和TOF—SIMS在硬盘驱动器（HDD）磁头表面微污染分析中的应用

XPS和TOF－SIMS表面分析仪器联用分析磁头臂焊接位表面有机微污染物成分,找出污染物的来源;XPS能够提供污染物中元素组成及价态信息,而TOF－SIMS能够提供其分子信息。试验证明两者联用是分析表面有机微污染物强有力的手段。     

Evolution of surface chemistry during sintering of water-atomized iron and low-alloyed steel powder

Water-atomized iron and steel powder is commonly used as the base material for powder metallurgy (PM) of ferrous components. The powder surface chemistry is characterized by a thin surface oxide layer and more thermodynamically stable oxide particulates whose extent, distribution, and composition change during the sintering cycle due to a complex set of oxidation–reduction reactions. In this study, the surface chemistry of iron and steel powder was investigated by combined surface and thermal analysis. The progressive reduction of oxides was studied using model sintering cycles in hydrogen atmospheres in a thermogravimetric (TG) setup, with experiments ended at intermediate steps (500–1300°C) of the heating stage. The surface chemistry of the samples was then investigated by means of X-ray photoelectron spectroscopy (XPS) to reveal changes that occurred during heating. The results show that reduction of the surface oxide layer occurs at relatively lower temperature for the steel powder, attributed to an influence of chromium, which is supported by a strong increase in Cr content immediately after oxide layer reduction. The reduction of the stable oxide particulates was shifted to higher temperatures, reflecting their higher thermodynamic stability. A complementary vacuum annealing treatment at 800°C was performed in a furnace directly connected to the XPS instrument allowing for sample transfer in vacuum. The results showed that Fe oxides were completely reduced, with segregation and growth of Cr and Mn oxides on the particle surfaces. This underlines the sequential reduction of oxides during sintering that reflects the thermodynamic stability and availability of oxide-forming elements.