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1.
FexCo100-x (x=100, 65, 50 at%) epitaxial thin films were prepared on MgO(1 1 0) single-crystal substrates heated at 300 °C by ultra-high vacuum molecular beam epitaxy. The film structure and the growth mechanism are discussed. FeCo(2 1 1) films with bcc structure grow epitaxially on MgO(1 1 0) substrates with two types of variants whose orientations are rotated around the film normal by 180° each other for all compositions. FexCo100-x film growth follows the Volmer Weber mode. X-ray diffraction analysis indicates the out-of-plane and the in-plane lattice spacings are in agreement with the values of respective bulk FexCo100-x crystals with very small errors less than ±0.4%, suggesting the strains in the films are very small. High-resolution cross-sectional transmission electron microscopy shows that periodical misfit dislocations are preferentially introduced in the film at the Fe50Co50/MgO interface along the MgO[1 1¯ 0] direction. The presence of such periodical dislocations decreases the large lattice mismatch of about −17% existing at the FeCo/MgO interface along the MgO[1 1¯ 0] direction.  相似文献   

2.
The effect of Cr100−xTix underlayer on orderd-L10 FePt films was investigated. A low-temperature ordering of FePt films could be attained through changing the Ti content of Cr100−xTix underlayer. The ordering temperature of the 30 nm FePt film grown on 20 nm Cr90Ti10 underlayer was reduced to 250 °C which is practical manufacture process temperature. An in-plane coercivity was very high to 6000 Oe and a ratio of remnant magnetization (Mr) to saturation magnetization (Ms) was as large as 0.85. This result indicates that the coercivity obtained at 250 °C by the effect of CrTi underlayer is significantly higher than those obtained at 250-275 °C by the effect of underlayers in other conventional studies. The prominent improvement of the magnetic properties of ordered FePt thin films at low temperature of 250 °C could be understood with considering the strain-induced ordering phase transformation associated with lattice mismatch between Cr underlayer and FePt magnetic layer due to an addition of Ti content.  相似文献   

3.
Phase relationships, thermal expansion and electrical properties of Mg1 − xFexO (x = 0.1-0.45) cubic solid solutions and Fe3 − x − yMgxCryO4 ± δ (x = 0.7-0.95; y = 0 or 0.5) spinels were studied at 300-1770 K in the oxygen partial pressure range from 10 Pa to 21 kPa. Increasing iron content enlarges the spinel phase stability domain at reduced oxygen pressures and elevated temperatures. The total conductivity of the spinel ceramics is predominantly n-type electronic and is essentially p(O2)-independent within the stability domain. The computer simulations using molecular dynamics technique confirmed that overall level of ion diffusion remains low even at high temperatures close to the melting point. Temperature dependencies of the total conductivity in air exhibit a complex behavior associated with changing the dominant defect-chemistry mechanism from prevailing formation of the interstitial cations above 1370-1470 K to the generation of cation vacancies at lower temperatures, and with kinetically frozen cation redistribution in spinel lattice below 700-800 K. The average thermal expansion coefficients of the spinel ceramics calculated from dilatometric data in air vary in the range (9.6-10.0) × 10− 6 K− 1 at 300-500 K and (13.2-16.1) × 10− 6 K− 1 at 1050-1370 K. Mg1 − xFexO solid solutions undergo partial decomposition on heating under oxidizing and mildly reducing conditions, resulting in the segregation of spinel phase and conductivity decrease.  相似文献   

4.
Single-phase BiFe1 − xCrxO3 (x=0, 0.05 and 0.1) compounds are synthesized by a sol-gel process. The lattice parameters decrease and the magnetizations increase with the Cr content. Moreover, the magnetoelectric coupling between magnetic order and ferroelectric order at room temperature was enhanced.  相似文献   

5.
Bi(Fe1 − xMnx)O3 ceramics (x up to 0.3) were prepared by rapid sintering. Weak ferromagnetism with two magnetic anomalies at low temperatures was observed for Bi(Fe0.95Mn0.05)O3 and Bi(Fe0.9Mn0.1)O3. From temperature-dependent magnetic relaxation measurements, the anomalies at 20 K and 100 K are related to the freezing of cluster spin glass.  相似文献   

6.
The magnetic behavior of the FeInxCr2−xSe4 system (with x=0.0, 0.2 and 0.4) has been investigated by magnetic and Mössbauer spectroscopy. Hyperfine parameters indicate that iron is in the Fe2+ oxidation state, with a minor (∼9%) Fe3+ fraction, located at different layers in the structure. Low-field magnetization curves as a function of temperature showed that the antiferromagnetic (AFM) order temperature is TN=208(2) K for FeCr2Se4 and decreases to 174(3) K for FeIn0.4Cr1.6Se4. The effective magnetic moment μeff decreases with increasing In contents, and shows agreement with the expected values from the contribution of Fe2+ (5D) and Cr3+ (4F) electronic states. A second, low-temperature transition is observed at TG∼13 K, which has been assigned to the onset of a glassy state.  相似文献   

7.
Preparation of LaNi1 − xFexO3, which is one of the candidate materials of solid oxide fuel cell cathode, current collecting layer and interconnect coating was examined with Pechini method and solid state reaction method. Single phase LaNi1 − xFexO3 with large Ni content has successfully been prepared by low temperature sintering as 750 °C with Pechini method, whereas large amount of raw materials has remained with solid state reaction method by sintering at the same temperature. It can be ascribed to more homogenous cation distribution in raw powder material prior to sintering with Pechini method. It has also been revealed that LaNi1 − xFexO3 with x lower than 0.3 is thermodynamically unstable in air above 1000 °C. LaNi0.6Fe0.4O3 showed superior property as cathode material with high electrical conductivity, thermodynamic stability and appropriate sintering property.  相似文献   

8.
Amorphous Ge1−xCrx thin films are deposited on (1 0 0)Si by using a thermal evaporator. Amorphous phase is obtained when Cr concentration is lower than 30.7 at%. The electrical resistivities are 1.89×10−3–0.96×102 Ω cm at 300 K, and decrease with Cr concentration. The Ge1−xCrx thin films are p-type. The hole concentrations are 5×1016–7×1021 cm−3 at 300 K, and increase with Cr concentration. Magnetizations are 7.60–1.57 emu/cm3 at 5 K in the applied field of 2 T. The magnetizations decrease with Cr concentration and temperature. Magnetization characteristics show that the Ge1−xCrx thin films are paramagnetic.  相似文献   

9.
Magnetic properties of amorphous Ge1−xMnx thin films were investigated. The thin films were grown at 373 K on (100) Si wafers by using a thermal evaporator. Growth rate was ∼35 nm/min and average film thickness was around 500 nm. The electrical resistivities of Ge1−xMnx thin films are 5.0×10−4∼100 Ω cm at room temperature and decrease with increasing Mn concentration. Low temperature magnetization characteristics and magnetic hysteresis loops measured at various temperatures show that the amorphous Ge1−xMnx thin films are ferromagnetic but the ferromagnetic magnetizations are changing gradually into paramagnetic as increasing temperature. Curie temperature and saturation magnetization vary with Mn concentration. Curie temperature of the deposited films is 80-160 K, and saturation magnetization is 35-100 emu/cc at 5 K. Hall effect measurement at room temperature shows the amorphous Ge1−xMnx thin films have p-type carrier and hole densities are in the range from 7×1017 to 2×1022 cm−3.  相似文献   

10.
FexNi100−x thin films were produced by galvanostatic electrodeposition on Si (1 0 0), nominal thickness 2800 nm, and x ranging 7-20. The crystalline structure of the sample was determined by X-ray diffraction (XRD). The magnetic properties were investigated by vibration sample magnetometry (VSM) and room temperature 57Fe Mössbauer spectroscopy. Conversion Electron Mössbauer spectroscopy (CEMS) in both film surfaces for the thick self-supported films showed that the magnetic moment direction is in the plane and conventional transmission (MS) that the directions are out of the plane films. The results were interpreted assuming a three-layer model where the external layer has in-plane magnetization and the internal one, out of plane magnetization.  相似文献   

11.
CoxNi1−x/Cu3Au(1 0 0) with x ? 11% was prepared at room temperature to study the strain relaxation and their correlation with the spin-reorientation transition. The vertical interlayer distance relaxed from 1.66 Å (fct) to 1.76 Å (fcc) while the thickness increased from 8 ML to 18 ML. Such rapid strain relaxation with thickness was attributed to the larger lattice mismatch between CoxNi1−x and Cu3Au(1 0 0) (η ∼ −6.5%). The smooth change for crystalline structure was observed during strain relaxation process in which the crystalline structure seems irrespective of the alloy composition. To explain the strain relaxation, a phenomenological model was proposed. We provide a physical picture that the deeper layers may not relax while the surface layer start to relax. This assumption is based on the several experimental studies. Using the strain averaged from all layers of thin film as the volume strain of magneto-elastic anisotropy energy, the interrelation between strain relaxation and spin reorientation transition can be well described in a Néel type magneto-elastic model.  相似文献   

12.
Magnetotransport properties of magnetite thin films deposited on gallium arsenide and sapphire substrates at growth temperatures between 473 and 673 K are presented. The films were grown by UV pulsed laser ablation in reactive atmospheres of O2 and Ar, at working pressure of 8 × 10−2 Pa. Film stoichiometry was determined in the range from Fe2.95O4 to Fe2.97O4. Randomly oriented polycrystalline thin films were grown on GaAs(1 0 0) while for the Al2O3(0 0 0 1) substrates the films developed a (1 1 1) preferred orientation. Interfacial Fe3+ diffusion was found for both substrates affecting the magnetic behaviour. The temperature dependence of the resistance and magnetoresistance of the films were measured for fields up to 6 T. Negative magnetoresistance values of ∼5% at room temperature and ∼10% at 90 K were obtained for the as-deposited magnetite films either on GaAs(1 0 0) or Al2O3(0 0 0 1).  相似文献   

13.
We have prepared a series of (PLZT)x(BiFeO3)1−x transparent thin films with thickness of 300 nm by a thermal pyrolysis method. Only films with x≦0.10 formed a single phase of perovskite structure. The film where x=0.10 exhibited both ferromagnetic and ferroelectric properties at room temperature with spontaneous magnetization and coercive magnetic fields of 0.0027μB and 5500 G, respectively. The remanent electric polarization and coercive electric field for the film where x=0.10 were 3.0 μC/cm2 and 24 kV/cm, respectively. Additionally, films with 0.02≦x≦0.10 showed both magneto-optical effects and the second harmonic generation of transmitted light.  相似文献   

14.
The compositional and thermal dependencies of phase and electrical behaviour of compositions in the system Bi14W1 − xLaxO24 − 3x/2 (0.00 < x < 1.00) have been studied by X-ray powder diffraction, differential thermal analysis and a.c. impedance spectroscopy. The system exhibits polymorphism and phase separation, which shows both compositional and thermal dependence. Compositions with x = 0.25 and x = 0.50 exhibit a single phase tetragonal structure at room temperature. In contrast, the x = 0.75 composition at room temperature shows a mixture of a cubic phase and a secondary β-Bi2O3 related tetragonal phase. A full solid solution is observed at high temperatures, corresponding to the occurrence of a δ-Bi2O3 type phase. The appearance of the various phases correlates well with the observed electrical behaviour. The x = 0.75 composition exhibits exceptionally high conductivity at high temperatures (σ800 = 1.34 S cm− 1), but also shows significant phase separation at lower temperatures.  相似文献   

15.
Series of CoxCr1−x thin films have been evaporated under vacuum onto Si(1 0 0) and glass substrates. Thickness ranges from 17 to 220 nm, and x from 0.80 to 0.88. Alternating gradient field magnetometer (AGFM) measurements provided saturation magnetization values ranging from 220 to 1200 emu/cm3. Values of squareness exceeding 0.8 have been measured. Coercive field may reach values up to 700 Oe, depending on the percentage of chromium, as well as the substrate nature and the direction of the applied magnetic field. The saturation magnetization value decreases as the Cr content increases. In order to study their dynamical magnetic properties, Brillouin Light Scattering (BLS) measurements have been performed on these samples. Stiffness constant value and anisotropy magnetic field were adjusted to fit the experimental BLS spectra. These results are analyzed and correlated.  相似文献   

16.
A confocal Raman investigation of Pb1 − xLaxTi1 − x/4O3 (PLT) thin films grown by RF magnetron sputtering on PbOx/Pt/Ti/SiO2/Si substrates with an intermediate LaSrCoO3 (LSCO) layer was performed. The influence of the LaSrCoO3 buffer layer was analyzed taking advantage of the observed Raman spectral band variation, which varied according to different manufacturing procedures. In the presence of a LSCO layer, the A1(1TO) Raman mode, which was indicative of tetragonal distortion, was pronouncedly enhanced, and a slight deviation from the (0 0 1) plane of the film was observed from the angular dependence of the polarized Raman spectral intensity. Furthermore, the spectral band variation as well as the residual stress along the in-depth direction was measured in the film from cross-sectional spectral line scans. This latter measurement showed a relaxation of the lattice mismatch in the presence of LSCO and PbO layers.  相似文献   

17.
In order to gain better insight into the origin of the observed differences between Fe3−xCrxAl and Fe3−xCrxSi, alloys of Fe3−xCrxAl0.5Si0.5 (x=0, 0.125, 0.250, 0.375 and 0.5) were prepared and studied by means of X-ray and neutron diffraction as well as by magnetization measurements. Electronic structure calculations of these alloys have been performed by means of TB-LMTO-ASA method. It was expected, and experimentally verified, that the presence of silicon and aluminum atoms in 1:1 proportion will result in the independence of the lattice parameter on the iron/chromium concentration. All samples have been proved to be a single phase of the DO3-type of structure. Theoretical and experimental results indicate that chromium atoms locate preferentially in B sublattice. Cr magnetic moments are oriented antiparallel to Fe magnetic moments. Neutron measurements show a linear dependence of the magnetic moments of Fe(A,C), Fe(B) and Cr(B) as a function of Cr concentration. However the calculated total magnetic moment decreases faster with chromium content than indicated by the experiment.  相似文献   

18.
Compared to half-metallic ferromagnets, half-metallic antiferromagnets (precisely called half-metallic fully compensated ferrimagnets) are more promising candidates for spintronic applications since their zero magnetization leads to lower stray fields and thus tiny energy losses. Using the first-principles calculations, we have systematically investigated the electronic and magnetic properties of the ordered Cr1 − xCaxSb alloy. It is found that Cr1 − xCaxSb with x=0.125, 0.25, 0.5 and 0.75 all are half-metals like zinc-blende CrSb and CaSb. Interestingly, Cr0.25Ca0.75Sb is a half-metallic antiferromagnet with complete spin polarization, and the half-metallic antiferromagnetism is robust against the lattice compression and expansion and the choice of electronic exchange and correlation functional.  相似文献   

19.
BiFeO3/Zn1−xMnxO (x = 0-0.08) bilayered thin films were deposited on the SrRuO3/Pt/TiO2/SiO2/Si(1 0 0) substrates by radio frequency sputtering. A highly (1 1 0) orientation was induced for BiFeO3/Zn1−xMnxO. BiFeO3/Zn1−xMnxO thin films demonstrate diode-like and resistive hysteresis behavior. A remanent polarization in the range of 2Pr ∼ 121.0-130.6 μC/cm2 was measured for BiFeO3/Zn1−xMnxO. BiFeO3/Zn1−xMnxO (x = 0.04) bilayer exhibits a highest Ms value of 15.2 emu/cm3, owing to the presence of the magnetic Zn0.96Mn0.04O layer with an enhanced Ms value.  相似文献   

20.
We report on the structural, magnetic and electronic transport properties of thin MnxGe1−x films grown at 350 °C. Isolated Mn5Ge3 nanoclusters, about 100 nm in size, were formed at the top surface of the film, dominating the magnetic properties of the whole film. Electronic transport properties show Mn doping effect indicating the presence of substitutional Mn ions dispersed in the Ge host, contributing to the formation of a MnxGe1−x diluted phase. Electrical behaviour indicates a saturation effect with the raise of the nominal Mn concentration in the film, above x ≅ 0.03.  相似文献   

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