High Energy Charged Particle Registration in CR-39 Polycarbonated Detector

Track etch rate characteristics of CR-39 plastic detector exposed to ²⁸Si ions of 670 MeV energy have been investigated. Experimental results were obtained in terms of frequency distribution of the track diameter, track density and bulk etching rate. A dependence of the mean track diameter on energy was found. The application of the radiation effect of heavy ions on CR-39 in the field of radiation detection and dosimetry are discussed. Results indicated that it is possible to produce etchable tracks of ²⁸Si in this energy range in CR-39. We also report the etching characteristics of these tracks in the CR-39 detector.     

Studies on the nuclear tracks in CR-39 plastics

A review was given for our recent studies on the latent tracks in CR-39 nuclear track detector. The radial size of track core has been determined through UV spectral measurements combined to the model of track overlapping and by AFM observations of slightly etched detectors. The track core radius was found to be about a few nano-meters and almost proportional to the cubic root of stopping power. As a control study, the etching properties of CR-39, irradiated by low-LET radiation, has been examined. The observed depth dependence and dose-rate dependence of the bulk etch rate of the irradiated CR-39 were explained that the damage formation process was governed by the reaction between the radiation induced radicals and the oxygen supplied from the air. This indicated that latent tracks in CR-39 are produced through local radiation induced oxidation process along the ion paths. Studies on vibration spectra, near-IR, FT-IR and Raman spectra, of CR-39 have also been carried out to estimate the chemical structure of the latent tracks. The creation of OH group in irradiated CR-39 has been confirmed.     

Studies on the track formation mechanism of the heavy ions in CR-39

The bulk etch rate for two types of CR-39 detector was measured as a function of temperature and the activation energies of bulk etching was determined. Experimental values of track etch rate were derived directly from the function of the succesive measured track length vrs. etching time for ²⁰⁹Bi, ¹²⁹Xe and ²⁰Ne ions.

The maximum etchable length of 13 MeV/u ²⁰⁹Bi and 13.04 MeV/u ¹²⁹Xe ions have been measured at and below these energies. A comparison of the measured and calculated track length data is presented.     

Post-irradiation sensitization of CR-39 track detector in carbon dioxide atmosphere

The effect of post-irradiation treatment of CR-39 track detector in carbon dioxide atmosphere on the alpha particle registration sensitivity was investigated. Significant increase in etch rate ratio for 6.1 MeV ²⁵²Cf alpha particle was observed. The sensitization increasedboth as a function of trating time and as a function of carbon dioxide pressure in the treating vessel. Energy dependence of the sensitization was found to be small in the 2–9 MeV alpha particle energy interval. Fading of latent tracks after the sensitization process was slow in a one day period. Pre-irradiation treatment in carbon dioxide showed also some sensitization, though to a lesser extent than post-irradiation treatment. However, exposing CR-39 alpha particles in pure carbon dioxide atmosphere resulted in dramatic decrease in sensitivity. The role of dissolved oxygen and carbon dioxide in the primary latent track formation and in post-irradiation latent track transformation is discussed. Potential influence of the application of sensitization of CR-39 in radon, neutron and cosmic ray charged particle dosimetry is also discussed.     

Etchability of Latent Fission Fragment Tracks in CR-39

We report the chemical etching behaviour of the CR-39 polymer detector exposed to fission fragments of 252Cf describing etchability of latent tracks, which are like nanocylinders. The fission fragment exposed detectors were etched in 1-7 N NaOH water solutions at temperatures 50-80℃ for 45 min in the case of track length and 180 min in the case of track diameter measurements. The reduced etch rate S （called here etchability） is determined using experimental results for all etching conditions and the etching conditions with the highest reduced etch are obtained. Physics and energetics of bulk and track etching are discussed. Possible effects causing spurious changes in determination of activation energy of etching are investigated.     

CR-39 sensitivity analysis on heavy ion beam with atomic force microscope

Preliminary results of feasibility study to apply atomic force microscope (AFM) to the quantitative analysis for minute etch pits on CR-39 are reported comparing with the optical microscope observation. The growth curves of the Si track diameter and length obtained by both technqiues were discussed in relation to the track sensitivity and the etch induction time.     

Activation energy of etching for CR-39 as a function of linear energy transfer of the incident particles

In this work, we have studied the effect of the radiation damage caused by the incident particles on the activation energy of etching for CR-39 samples. The damage produced by the incident particle is expressed in terms of the linear energy transfer (LET). CR-39 samples from American Acrylic were irradiated to three different LET particles. These are N (LET₂₀₀ = 20 KeV/μm) as a light particle, Fe (LET₂₀₀ = 110 KeV/μm) as a medium particle and fission fragments (ff) from a ²⁵²Cf source as heavy particles. In general the bulk etch rate was calculated using the weight difference method and the track etch rate was determined using the track geometry at various temperatures (50–90 °C) and concentrations (4–9 N) of the NaOH etchant. The average activation energy F_b related to the bulk etch rate v_b was calculated from ln v_b vs. l/T. The average activation energy E_t related to the track etch rate v_t was estimated from ln v_t vs. l/T. It is shown that activation energy of etching is a constant value for CR-39 detector where E_t was found to be independent on the damage produced by the incident particle.     

Single-sheet identification method of heavy charged particles using solid state nuclear track detectors

The theoretical and experimental investigations of the penetration of charged particles in matter played a very important role in the development of modern physics. Solid state nuclear track detectors have become one of the most important tools for many branches of science and technology. An attempt has been made to examine the suitability of the single-sheet particle identification technique in CR-39 and CN-85 polycarbonate by plotting track cone length vs. residual range for different heavy ions in these detectors. So, the maximum etchable ranges of heavy ions such as ⁹³Nb, ⁸⁶Kr and ⁴He in CR-39 and ⁴He and ¹³²Xe in CN-85 polycarbonate have been determined. The ranges of these ions in these detectors have also been computed theoretically using the Henke-Benton program. A reasonably good agreement has been observed between the experimentally and theoretically computed values.      

Measurement of the track etch rates along proton and alpha particle trajectories in CR-39 and calculation of the detection efficiency

Computation of the neutron response of CR-39 detectors needs to simulate the track formation by neutron induced charged particles taking into account the bulk etch rate and the track etch rate varying along the particle trajectories. The latter one was determined experimentally by track length measurement. The results allowed to derive the relationship between the track etch rate and the restricted energy loss of the charged particles. On this basis, the geometrical track parameters and track etch rates as well as the critical angle of particle incidence could be determined for protons and alpha particles in the energy range from 0.2 to 8.8 MeV. The energy dependence of the critical angle enabled to determine the detection efficiency for a charged particle of given energy and direction.     

On the question of nuclear track formation in plastic material

A review is given about nuclear track formation in plastic track detectors. The radiation damage of heavy ions around the latent tracks is studied using measurements of radial track etch rates in Å-dimensions.     

Applicability of the polyimide films as an SSNTD material

Track registration properties in polyimide films, KAPTON, for heavy ions have been examined by means of FT-IR spectrometry and the chemical etching in sodium hypochlorite solution. The effective track core size for the loss of CO and C–N–C composing imide bonds, and diphenyl ethers of C–O–C have been evaluated under the irradiations by Ne, Fe and Xe ions at energies less than 6 MeV/n. On the other hand, the etching property of the polyimide films has been examined in the sodium hypochlorite solution at temperature of 55 °C. Before the etchings, the films were exposed to H, C, Ne, Fe and Xe ions, at incident energies below 6 MeV/n. The etch pits are found only on the films exposed to Fe and Xe ions, indicating significant difference on the etch pit size between them. This implies that the polyimide film has charge or energy resolution for these relatively heavy ions. The threshold level of the etchable track registration is inferred to be around 2500 keV/μm. The effective track core radius at this stopping power for the loss of diphenyl ether is 1.6 nm, which is equivalent to the length between the adjacent diphenyl ether bonds in the polyimide chains. Breakings at two adjacent diphenyl ethers in radial direction of latent tracks may produce etchable tracks in KAPTON.     

Dosimetry of 40 and 70 MeV/n O beams

Using CR-39 plastic track detectors the range values of ¹⁶O ions at two different energies (initially in the beam line, 39.97 MeV/n and 69.98 MeV/n) were measured after escaping the beam pipe and found to be (3050 ± 40) μm and (8210 ± 90) μm, respectively. The longitudinal and projected angular spread of oxygen ions of an initial energy of 69.98 MeV/n in the region of the Bragg peak was derived from the measured geometrical parameters of tracks. Based on a calibration curve (etch rate ratio vs total linear energy transfer in CR-39) and the measured track length distribution at the range end of oxygen ions, the complete depth dose profile of a 67.7 MeV/n ¹⁶O beam in CR-39 (plateau, extended Bragg peak and residual ionization caused by projectile like fragments) was obtained.     

Inter-comparison of geometrical track parameters and depth dependent track etch rates measured for Li-7 ions in two types of CR-39

The depth dependent track etch rates of two types of CR-39, TASTRAK and BARYOTRAK, for Li-7 ions with incident energies of 4.82, 6.75 and 10.77 MeV have been evaluated from track length measurements. The pit lengths versus the etching time obtained by three different laboratories have the same trend, but did not agree completely. The differences can be attributed to an error margin of less than one decimal point in the etching temperature. Significant deviations were also present for the assessed track etch rates. Most of the deviation was attributed to the derivation step of the growth curves. A sufficient amount of data and reasonably smooth growth curves were required near the Bragg peak in order to make a precise estimation.     

FT-IR spectroscopy of carbon dioxide in CR-39 and SR-90 track detectors irradiated with ions and gamma-rays at different energies and fluences

Two types of polymeric track detectors CR-39 and SR-90 were irradiated with protons, alpha particles, heavy ions and gamma-rays at different energies and fluences. After irradiation these detectors were analyzed with an FT-IR spectrometer of Jasco type 5300 in transmission and ATR modes. We have found that CO₂ is produced not only by irradiation but also by polymerization. The amount of CO₂ in the detector material is closely related to the latent track formation.     

Annealing of heavy ion tracks in cellulose nitrate plastic track detectors

The effect of heat treatment on the latent tracks in cellulose nitrate plastic track detectors has been studied. The bulk etch rate increases with annealing temperature while the track diameters of different ions in cellulose nitrate decrease with increase in annealing time and temperature. Experimental results show that for heavier ions higher temperatures are needed for their complete erasure. The track length and track etch rate are decreased by the application of heat. Experiments reveal that annealing reduces track density. The vertical tracks are more stable than the oblique tracks and require higher temperature for their complete erasure.     

CR-39 and Lexan calibrated as low-LET radiation dosimeter, for three Mexican irradiation facilities

An experimental calibration of two common nuclear track detectors, CR-39 and Lexan, for gamma and electrons radiation, was performed using various irradiation facilities. The dose response was obtained as a function of two parameters, the bulk etch rate and the UV absorbance for a wide dose range from 10 to 1000 kGy. The bulk etch rate sensitivity, for gamma and electrons, in CR-39 detector is higher than for Lexan detector. Lexan has a well-defined UV absorbance spectrum, but presents saturation for doses higher than 500 kGy, the same saturation characteristic is observed for the corresponding bulk etch rate response. For electron and gamma radiation, CR-39 shows a good response for doses from 10 kGy up to 1000 kGy, where data fit well an exponential curve for electrons and a lineal curve for gamma radiation.     

Intercomparative study of the detection characteristics of the CR-39 SSNTD for light ions: Present status of the besancon-dresden approaches

For the last few years, the Besançon and Dresden teams have been working in a parallel way on light ion (protons and alphas) registration characteristics for the CR-39 SSNTD. Even if the two groups use different approaches, the main part of both investigations concerns the study of the track etch rate (V_T) and the consequences of the obtained results, which have provided us with greater understanding of detection limits.

After recalling the methods used to determine the V_T from both teams, will show how fundamental datal related to the registration properties of the CR-39 detector can be extracted. Indeed, the knowledge of an analytical relation for the V_T enables the relationship between this velocity and the primary deposited energy to the examined with respect to the same spatial variable (the instantaneous depth of penetration (x) of the incoming particle). According to experimental uncertainties, the Bragg peak of the primary ionization coincides within a very close range with the maximum of the V_T. Moreover, if increasing the etching parameters (C, T) increases the maximum V_T value, these changes do not affect its position with respect to the instantaneous depth of penetration.

Taking into account the reduced etch rate, the Dresden team found that both protons and alphas exhibit the same behavior when this rate is plotted versus the primary energy deposition rate. As a consequence, the corresponding reduced etch rate is always identical no matter what type of particle deposits a given amount of energy (e.g. proton or alpha). The Besançon team has corroborated the results obtained by the Dresden group for alphas and have extended the study to various etching conditions. From these results, the sensitivity of the CR-39 SSNTD is obtained in terms of critical LET and leads to a very low energy threshold for alpha particles. We will see throughout this paper that the lower threshold does not seem to depend on the etching parameters.     

Studies on the variation of the track etch rate along alpha particle trajectories in CR-39

At the beginning of the etching process a constant track etch rate can be assumed. In deeper detector layers, however, the etch rate varies drastically along the particle trajectories. Consequently, the indirect determination of the track etch rate by measuring the etch pit diameters on the detector surface does not yield correct results. Therefore, a method for the direct measurement of the track etch rate as a function of the depth within the detector was developed. Applying this method, the relationship between the track etch rate and the energy loss in CR-39/PATRAS could be derived.     

DIP angle dependence on track formation sensitivity in antioxidant doped CR-39 plates

Recently, space radiation dosimetry measurements were made by passive and active detectors inside the Spacelab [STS-47 (FMPT): 300km, 57°, STS-65 (IML-2 mission): 300km, 28.5°]. The LET distributions obtained by antioxidant doped CR-39 inside the Spacelab were compared with those measured by the tissue equivalent proportional counter (TEPC) and the real time radiation monitoring device (RRMD) consisting of eight silicon detectors. While both distributions by CR-39 are in good agreement with those obtained by active detectors over the region of LET of several tens to 200 keV/μm, a significant difference in the LET region of smaller than several tens keV/μm is seen. It is considered to be caused by the dip angle dependence of track formation sensitivity in CR-39. The track formation sensitivity for different dip angle were measured for several high heavy energy ions. Using these results, the correction for the dip angle was made for the LET distribution. The corrected result is consistent with the results obtained by active detectors.     

On the effect of cure cycle parameters and dopants on pre and post irradiation annealing response of CR-39 track detectors

The effect of additives and cure cyle parameters on pre and post irradiation annealing characteristics of CR-39 detectors has been investigated. Effect of pre and post irradiation annealing on bulk etch rate, sensitivity, track diameter and etching behaviour of various CR-39 detectors has been investigated.