Effects of thermal light source properties in two-photon subwavelength coincidence interference experiments

We perform two-photon coincidence subwavelength interference experiments from double slit using independent photons obtained from a pseudo-thermal light source produced by (i) slowly rotating ground glass (RGG) with turbid solution of a different density and (ii) RGG. The turbid solution is water solution containing 3 μm diameter polystyrene microspheres. It is found that the visibility of the obtained interference pattern decreases in first experiment with increasing the density of the turbid solution from N = 10¹⁰ spheres m⁻³ to N = 10¹⁴ spheres m⁻³. However, the results are reported here for the density of N = 10¹⁴ spheres m⁻³. The visibility obtained with RGG with turbid solution having N = 10¹⁴ spheres m⁻³is 23% which increases to 27% with RGG but the resolution decreases. The effect of coherence width of source in two-photon interference pattern is also studied with pseudo-thermal light obtained by RGG. It was observed that on increasing the coherence width the visibility of interference fringes increased and quality of the fringe reduced and when the coherence width was more then slit separation, in coincidence measurements, no interference pattern appeared. The results are used to explore the classical subwavelength interference nature with thermal light.     

Pockels effect of water in the electric double layer at the interface between water and transparent electrode

We have obtained the first experimental evidence for the Pockels effect of water, which is induced by a high electric field in the electric double layer (EDL) on the water-transparent electrode interface. The electric-field induced energy shift of the visible interference fringes of a 300 nm indium-tin-oxide (ITO) electrode layer is observed, indicating a negative refractive index change at the interface. Numerical calculation reproduces well the experimental observation, showing that the signal mainly originates from water in the EDL. The Pockels constants of water are estimated to be r₃₃ = 5.1 × 100 pm/V and r₁₃ = 1.7 × 100 pm/V. The large anisotropy of the Pockels effect of water is deduced from the incidence angle dependence of the p-polarization signal. At the same time, the ITO shows a blue shift of the band gap in the UV due to the band population effect in the space charge layer. The plasma frequency in the near IR is also expected to increase due to the band population effect, since the ITO has a high doped carrier population close to metal. A negative refractive index change in the ITO space charge layer is induced from both effects, but its effect on the signal is estimated to be much smaller than that of the negative refractive index change of water in the EDL.     

The discovery of nanometer fringes in laser self-mixing interference

We demonstrate the influences of optical feedback from an external mirror with high reflectivity in a He-Ne laser on self-mixing interference fringes and laser polarization states. When the external mirror is tilted to a certain level, the stable and uniform nanometer resolution fringes are generated. The fringe density is 40 times than that of the conventional self-mixing interference or two beam interference, and has still potential to be improved. Each self-mixing interference fringe corresponds to λ/80 displacement of the external mirror, i.e. 7.91 nm displacement of the external mirror. Moreover, when the movement direction of the external mirror is changed, the polarization flipping between two eigenstates will happen. The potential applications of the results are also discussed.     

Rapid computation of acoustic impulse scattering for rough penetrable surfaces

Chu’s theory for the impulse response of a point source to an isovelocity density contrast wedge [Chu D. Impulse response of density contrast wedge using normal coordinates. J Acoust Soc Am 1989;86:1883-96] enables wedge-assemblage rough surface scattering models to be extended to a broad range of penetrable seafloors, but is computationally intensive since it necessitates finding the multifold roots of a characteristic eigenvalue equation, and summing a power series, for each wedge apex. This present work considers the properties and relationships of the direct, reflected, and diffracted field components of a density contrast wedge. In particular, an analysis of the physical origin and behavior of diffractions associated with specular reflections of the source in the wedge faces leads to a simple extension of the Biot-Tolstoy theory [Biot MA, Tolstoy I. Formulation of wave propagation in infinite media by normal coordinates with an application to diffraction. J Acoust Soc Am 1957;29:381-91] to density contrast wedges with reflectivity ∣R∣ < 1, for wedge angles within the range 150 ? θ_w ? 210°, where the diffractions are predominantly associated with a single reflection in each wedge face. This facilitates rapid time domain calculations of acoustic bottom scattering and penetration for complex multilayered seafloors.     

Measurement of nonlinear refractive index of ethyl red by interference of capillary

Using the intensity distribution of interference fringes formed by a capillary filled with transparent liquid, the variations in refractive index (RI) of nonlinear optical materials, corresponding to change of the intensity at the centre of fringes for a period, were deduced. With this conclusion, we measured variations in RI of ethyl red (ER) solution excited by a 535-nm-15 mW-laser, and found that the change of RI is 0.00504 and the corresponding effective index of refraction is −1.06 × 10⁻⁹, for which the order of magnitude is same as that measured by Z-scan. The influences on the accuracy of the method, such as temperature, beam and fringe contrast, were analyzed. This is a novel and simple method for measuring the RI of nonlinear optical materials.     

Analysis on the laser beam pointing instability induced fringe shift and contrast dilution from different interferometers used for writing fiber Bragg grating

This paper presents an analysis on the effect of laser beam pointing instability on the fringe shift and hence the contrast dilution of superposed fringes from two beam interferometers. The interferometers analyzed are those commonly used in writing fiber Bragg grating (FBG) such as phase mask, bi-prism and phase mask based Talbot/Holographic type. The beam pointing instability is incorporated as slight change in the angle between two interfering beams. The relative immunity of different interferometers to laser beam pointing is discussed vs location of FBG writing plane from the beam splitter. The effect of the beam pointing was minimum in proximity FBG writing by phase mask. The effect, in terms of fringes contrast dilution, was worst in case of large length interferometers e.g. phase mask based-Talbot interferometer. For intermediate length prism interferometers, the effect was moderate. For a given length interferometer, the fringe shift was directly proportional to beam pointing angle and inversely proportional to fringe separation. Theoretical analysis is verified experimentally by studying the fringe instability of interference pattern formed by a bi-prism of angle 2^o with the copper vapour laser (CVL, λ = 510 nm) beams of different beam pointing instabilities.     

Determination and analysis of dispersive optical constants of CuIn3S5 thin films

CuIn₃S₅ thin films were prepared from powder by thermal evaporation under vacuum (10⁻⁶ mbar) onto glass substrates. The glass substrates were heated from 30 to 200 °C. The films were characterized for their optical properties using optical measurement techniques (transmittance and reflectance). We have determined the energy and nature of the optical transitions of films. The optical constants of the deposited films were determined in the spectral range 300-1800 nm from the analysis of transmission and reflection data. The Swanepoel envelope method was employed on the interference fringes of transmittance patterns for the determination of variation of refractive index with wavelength. Wemple-Di Domenico single oscillator model was applied to determine the optical constants such as oscillator energy E₀ and dispersion energy E_d of the films deposited at different substrate temperatures. The electric free carrier susceptibility and the ratio of the carrier concentration to the effective mass were estimated according to the model of Spitzer and Fan.     

Control of polarization deviation at two separate wavelength by using all dielectric thin film materials

Two separate wavelength 1315 nm and 1550 nm were most widely used in near-infrared spectrum region. Based on a four-layer structure and a symmetry structure, a initial thin film stack system was constructed. Then it was optimized alternately by simplex and conjugate graduate algorithm, a beam splitter with splitting ratio R:T = 50:50 at this two wavelength was gained. The design result showed that the difference between reflectivity of P and S light around wavlength range 1300?1330 nm and 1535?1565 nm at incident angle 40°?50° was all below 2%. That indicated our design controlled the polarization deviation well at two separate wavelength with a reasonable range for both wavelength and incident angle.     

Wedge plate interferometry: a new dual field configuration for collimation testing

A method of deriving a dual field fringe pattern from a single wedge plate for collimation testing is presented. The proposed technique uses a wedge plate and a 90° prism retroreflector to form two interference fields. With the two sets of fringes, the technique provides twofold increase in sensitivity and has its own reference.     

Wavelength shift determination using a dual-path heterodyne Mach-Zehnder interferometer

This paper introduces a dual-path heterodyne Mach-Zehnder interferometer adopted for wavelength shift determinations. In this interferometer, two parallel incident beams are separated into two interference pairs which are then recombined to generate two interference signals. A parallel plate is placed on the path of one wave of an interference pair, so the phase difference of the interference signals is a function of the plate and beam wavelength, and the interferometer is thus able to determine the wavelength shift of the incident beam. A setup constructed to realize the proposed interferometer is described, it shows that the interferometer has a resolution up to 1.1 × 10⁻¹⁰ (λ²/nm), and the experimental results of applying this setup not only agree the validity of the interferometer but also indicate that the interferometer has a stability of 6.5 × 10⁻¹⁰ (λ²/nm).     

Modified grating-based external cavity diode laser for simultaneous dual-wavelengths operation

We have reported a modified V-shaped external cavity, which is constructed around a commercial diode laser operating at a center wavelength of λ=785 nm by adding a new coated glass plate with about 50% reflectivity to the cavity. This allows simultaneous dual-wavelengths operation in the vicinity of Δν_min=0.18 THz to Δν_max=0.22 THz, which can be used as laser source for terahertz generation either for semiconductor devices or nonlinear schemes.     

Fabrication of waveguides in Yb:YCOB crystal by MeV oxygen ion implantation

Oxygen ions with energies of 6.0 or 3.0 MeV were implanted into y-cut Yb:YCOB crystals at fluences ranging from 5.0 × 10¹³ to 2.0 × 10¹⁵ ions/cm² at room temperature, forming optical planar waveguide structures. Dark-mode line spectroscopy was applied at two wavelengths, 633 and 1539 nm, in various excitation configurations, showing strong enhancement of one of the indices (n_x) in the implanted near surface. The n_x refractive index profile is reconstructed by a reflectivity calculation method and compared to the ion energy losses profiles deduced from SRIM-code simulation. Moreover, the near-field patterns were imaged by an end-fire coupling arrangement.     

Tunneling magnetoresistance in exchange-biased CoFeB/AlOx/Co/IrMn junctions

A series of exchange-biased magnetic tunneling junctions (MTJs) were made in an in-plane deposition field (h) = 500 Oe. The deposition sequence was Si(1 0 0)/Ta(30 Å)/CoFeB(75 Å)/AlO_x(d Å)/Co(75 Å)/IrMn(90 Å)/Ta(100 Å), where d was varied from 12 Å to 30 Å. The MTJ was formed by the cross-strip method with a junction area of 0.0225 mm². The tunneling magnetoresistance (ΔR/R) of each MTJ was measured. The high-resolution cross-sectional transmission electron microscopic (HR X-TEM) image shows the very smooth interface and clear microstructure. X-ray diffraction (XRD) demonstrates that the IrMn layer of the MTJ exhibits a (1 1 1) texture. From the results (ΔR/R) increases from 17% to 50%, as d increases from 12 Å to 30 Å. The tunneling resistance (R_o) of these junctions ranges from 150 Ω to 250 Ω. The exchange-biasing field (H_ex) of the MTJ is 50-95 Oe. Finally, the saturation resistance (R_s) was measured as a function of the angle (α) of rotation, where α is the angle between h and the in-plane saturation field (H_s) = 1.1 kOe. The following figure presents the dependence of R_s on α, instead of originally expected independence, the curve actually varies with a period of π.     

Sol–gel based anti-reflection coatings on wedged laser rods using a spin coater

Anti-reflection (AR) sol–gel coatings are deposited on wedge glass optics for high-power lasers using spin coating technique. Characterization of these coatings on BK-7 glass substrates is carried out in terms of thickness profile across the surface, thickness variation w.r.t. wedge angle, and its effect on AR coating reflectivity, at different wedge angles from 1° to 7°. Results of the study are used to deposit AR coatings on inclined end faces of Nd:phosphate glass laser rods.     

Synthesis and characterisation of Gd-doped BaTiO3 thin films prepared by laser ablation for optoelectronic applications

The results of gadolinium (Gd)-doped barium titanate (BaTiO₃) thin films prepared by laser ablation on glass and silicon substrates are reported. Rutherford backscattering (RBS) analyses carried out on glass samples indicated the substitution of barium (Ba) by gadolinium (Gd) after annealing, leading to a film with composition Ba_0.76TiGd_0.01O_2.5. There is a reduction in the thickness from 2.21 to 2.02 microns for as-deposited and annealed films. The films on silicon showed a higher degree of crystallinity compared to that of glass substrates due to increased annealing temperature. The average grain size calculated using the X-ray diffraction (XRD) pattern from silicon substrates was 30 nm. The film has a tetragonal structure with a “c/a” ratio of 1.03 signifying that the incorporation of Gd in BaTiO₃ led to the elongation of the c-axis. The percentage transmittance reduced from 80 to 50% due to annealing and this is probably due to structural changes in the film. Swanepoel envelope method employed on the interference fringes of the transmittance pattern led to the determination of the variation of the refractive index with wavelength. Sellmier single oscillator model was applied to determine the optical constants of the films on glass substrates. Bandgap analyses carried out showed the reduction in bandgap with annealing and also the possibility that Gd incorporation has modified the film chemistry leading to the existence of direct (4.35 eV) and indirect (3.88 eV) allowed transitions in the annealed films. Dielectric property measurement carried out under ambient conditions gave a relaxation time τ of 1.6×10⁻⁴ s and conduction by small polaron with the onset of polaron conduction set at about 7 kHz. It is conjectured that these properties, especially the high refractive index and the high bandgaps, can make Gd-doped BaTiO₃ a good candidate for optoelectronic applications.     

Optical measurements of silicon wafer temperature

An optical technique for precise, non-contact, and real time measurement of silicon wafer temperature that uses the polarized reflectivity ratio R_p/R_s is described. The proposed method is based on temperature dependence of the optical functions of silicon. Expected strong temperature sensitivity is obtained near band gap. Simultaneous monitoring of temperature and oxide layer thickness is discussed using measurements at four wavelength 365 nm, 405 nm, 546 nm, and 820 nm.     

Fabrication of 550 nm gratings in fused silica by laser induced backside wet etching technique

A series of 550 nm spacing gratings were fabricated in fused silica by laser induced backside wet etching (LIBWE) method using the fourth harmonic of a Q-switched Nd:YAG laser (wavelength: λ = 266 nm; pulse duration: FWHM = 10 ns). During these experiments we used a traditional two-beam interference method: the spatially filtered laser beam was split into two parts, which were interfered at a certain incident angle (2θ = 28°) on the backside surface of the fused silica plate contacting with the liquid absorber (saturated solution of naphthalene-methyl-methacrylate c = 1.85 mol/dm³). We studied the dependence of the quality and the modulation depth of the prepared gratings on the applied laser fluence and the number of laser pulses. The surface of the etched gratings was characterized by atomic force microscope (AFM). The maximum modulation depth was found to be 180-200 nm. Our results proved that the LIBWE procedure is suitable for production of submicrometer sized structures in transparent materials.     

Surface plasmon polaritons maskless lithography of metal–dielectric multilayers with tunable resolution

We report the design of surface plasmon polaritons maskless lithography based on metal–dielectric multilayers. The interference pattern is generated by the interference of the counter-propagating bulk plasmon polariton (BPP) modes, which are excited by the attenuated total reflection method. The resolution of the interference fringes can be tuned with the incident angles, because different BPP modes are excited in the metal–dielectric multilayers. The feature size as small as 34 nm (about λ/13) can be realized under the 436 nm TM-polarized illumination, which is suitable for deep-subwavelength lithography. The exposure depth decreases with increasing the resonant angle. Electromagnetic simulations by a finite difference time-domain method on the two-dimensional and three-dimensional examples have been performed to validate the designs.     

光的干涉法测金属线胀系数

当用两块平板玻璃制作出的空气劈尖顶角发生变化时 ,应用 CCD可观察到劈尖表面移动的干涉条纹。移过某一点的干涉条纹数决定劈尖项角的变化。若劈尖项角的变化是由金属受热膨胀引起的 ,则可导出金属受热膨胀的绝对伸长量与移过的条纹数之间的关系 ,并通过它计算金属的线胀系数。通过对黄铜棒的测量 ,结果表明该方法是可行的     

Measurement of residual wedge angle with a reversal shear interferometer

A technique for determination of residual wedge angle of high optical quality transparent parallel plate using a reversal shear interferometer-based optical system has been discussed. In this technique the parallel plate to be tested is used to introduce angular tilt in the preset two-beam interference fringes of a reversal shear interferometer. The parallelism is calculated from the angular tilt of the fringes. The technique is more sensitive compared to techniques using Fizeau interferometer and is most suitable for highly parallel transparent plate with very low residual wedge angle.