Study of the magnetism and the magnetic anisotropy of Fe layers in Ni/Fe/Ni(1 1 1) by Mössbauer spectroscopy

The hyperfine field and the magnetic anisotropy of a Fe layer as a function of thickness have been investigated in several Ni/⁵⁷Fe_x/Ni(1 1 1) trilayers with relatively thick Ni layers by Mössbauer spectroscopy. For Fe layers with thickness below 16 Å, the Mössbauer spectra show always the presence of two ferromagnetic phases with high-spin state. In the range between 6 and 8 Å, also a ferromagnetic phase with low-spin state and a paramagnetic phase have been found. The evolution of the mean hyperfine field of the ⁵⁷Fe nuclei is used to study the Fe growth. A structural FCCBCC phase transition is found to begin with an iron thickness of 8 Å. The easy direction of the magnetization is found out-of-plane for Fe interlayer with FCC structure, and perfectly in plane for Fe interlayer with BCC structure.     

Auger electron spectroscopy depth profiling of Fe-oxide layers on electromagnetic sheets prepared by low temperature oxidation

Auger electron spectroscopy depth profiling was applied to characterize the Fe-oxide layers prepared by low temperature oxidation of Fe electromagnetic sheets produced on an industrial line for applications in the field of electrical motors. In addition the surface morphology, layer composition and layer structure were analysed by electron microscopy, energy dispersive X-ray spectroscopy and X-ray diffraction techniques. We found that the oxide layers on Fe-sheets with good adhesion between the oxide layer and Fe-substrate, consist mainly of magnetite and to a smaller extent of haematite; the layers are typically thinner than 1 μm and the interface between the oxide layer and the Fe-substrate is relatively broad, i.e. up to 0.3 μm. On the contrary, a decrease of adhesion between the oxide layer and the Fe-substrate was found when the layer is thicker than 1 μm and the layer/substrate interface is narrow and contaminated by foreign elements.     

Characterization of oxide layers on amorphous Zr-based alloys by Auger electron spectroscopy with sputter depth profiling

Amorphous Zr-Cu-Ni-Al-[Ti, Nb] ribbons prepared by melt spinning under argon atmosphere were subjected to electrochemical investigations. Passive films developed at potentiostatic anodic polarization in sulphuric acid solution were investigated by Auger electron spectroscopy (AES) and sputter depth profiling.Changes in the shape of the Auger peaks have been analyzed by factor analysis of the spectra obtained during depth profiling. Pronounced changes in shape and position occur for the Zr, Al, and Ti Auger transitions, but not for Cu and Ni. At least three different peak shapes for O(KVV) were found and attributed to different oxygen binding states. The alloy composition has no significant effect on the thickness and composition of the oxide layer.In multi-element alloys preferential sputtering is a common phenomenon. In the steady state of sputtering, a significant depletion in Cu is found. At the oxide/metal interface, a distinct enrichment of copper is found for all alloys and treatments. The degree of this Cu enrichment depends on the pretreatment. It is higher for the electrochemically-passivated samples than for samples with oxide layers grown during melt spinning.     

Study of very thin oxide layers by conversion and Auger electrons

Oxidic layers as thin as 20–30 Å on α-Fe and stainless steel are studied by⁵⁷Fe-DCEMS with K-conversion electrons and ICEMS. No indication of a vanishingf-factor could be found. Mössbauer spectra, recorded by use of LMM-Auger electrons (AEMS) and by electrons emitted with energies below 15 eV (LEEMS), contain information on the surface layer as well as on the bulk material, showing that part of these electrons are due to secondary effects and the high escape depths of K-conversion electrons.     

Quantitative analysis of thin film-substrate interdiffusion by GDOS and by Auger electron spectroscopy

Depth profile analysis of the Cu-Ni interdiffusion couple was made by GDOS. Calibration of both the signal intensity and the sputtering rate was used for quantification. The quantified GDOS depth profile was compared with the profile measured by Auger analysis of the bottoms of glow discharge erosion craters with different depths. A reasonable agreement was found between both profiles demonstrating the usefulness of GDOS for this kind of analysis.     

合成反铁磁Ni81Fe19/Co90Fe10/Ru/Co90Fe10/Ni81Fe19的研究

采用直流磁控溅射方法制备了一系列的合成反铁磁及以其为自由层的自旋阀.研究发现,在Ni81,Fe19与Ru层之间插入适当厚度的Co90Fe10层后,可有效地提高合成反铁磁两磁性层间的反铁磁耦合强度,得到具有饱和场日.更高、饱和磁化强度M.更低、热稳定性更好的合成反铁磁.另外,以这种合成反铁磁作自旋阀的自由层时,可有效提高自旋阀的稳定性.     

On the formation of amorphous layers by interdiffusion in zirconium-copper system

Formation of amorphous phase by solid state reaction has been observed in bulk copper-zirconium couples. Transmission electron microscopy (TEM), Auger electron spectroscopy (AES) and differential scanning calorimetry (DSC) techniques have been employed to detect and study the amorphous phase. The experimental observations have been explained with a model, which considers the breakdown of the a-zirconium lattice due to the solute enrichment beyond a certain limit where the nucleation of the amorphous phase becomes thermodynamically possible. The present-experiments convincingly show that amorphous phase can form in bulk diffusion couples made from large-grained well-annealed material and conclusively establish that the presence of crystal defects in high concentrations is not a pre-requisite for the formation of amorphous phase.     

Deconvolution method for composition profiling by Auger sputtering technique

Some of the sputter broadening effects on profile measurements using the Auger sputtering technique have been quantitatively investigated for $\text{Ag}\text{Au}$ and $\text{Cu}\text{Ni}$ systems. Two methods have been used to measure the resolution function as a function of the sputter distance for these two systems. The broadening can be separated into contributions from original surface roughness and sputtering effects, the latter amounting to about 7% of the sputter depth for $\text{Cu}\text{Ni}$ and 14% for $\text{Ag}\text{Au}$ interfaces. Based on the measured resolution function, a deconvolution method has been developed to facilitate the retrieval of the actual profile from the observed profile by reducing the sputter broadening. Using this method, we found that the measured interfacial profile can be substantially sharpened. The implications of using the deconvolution method for interdiffisuion studies in thin films are discussed.     

Auger electron spectroscopy investigation of sputter induced altered layers in SiC by low energy sputter depth profiling and factor analysis

The thickness of the altered layer created by ion bombardment of the 6H–SiC single crystal was determined by means of Auger electron spectroscopy (AES) depth profiling in conjunction with factor analysis. After pre-bombardment of the surface by argon ions with energies 1, 2 and 4 keV until the steady state, the depth profiles of the induced altered layers were recorded by sputtering with low energy argon ions of 300 eV. Since the position and shape of the carbon Auger peak depend on the perfection of the crystalline structure, they were used for depth profile evaluation by factor analysis. In this way the depth profiles of the damaged surface region could be estimated in dependence on the ion energy. As a result, the thickness of the altered layer of SiC bombarded with 1, 2 and 4 keV Ar ions using an incident angle of 80° as well as the corresponding argon implantation profile could be measured.     

Sputter depth profiling by secondary ion mass spectrometry coupled with sample current measurements

Ion-induced secondary electron emission determined via sample current measurements (SCM) was employed as a useful adjunct to conventional secondary ion mass spectrometry (SIMS). This paper reports on the results of 3-6 keV O₂⁺ SIMS-SCM sputter depth profiling through CrN/AlN multilayer coatings on nickel alloy, titanium dioxide films deposited on stainless steel, and corrosion layers formed onto surface of magnesium alloy after long-term interaction with an ionic liquid. For Au/AlNO/Ta films on silicon, in addition to SIMS-SCM profiles, the signal of mass-energy separated backscattered Ne⁺ ions was monitored as a function of the depth sputtered as well. The results presented here indicate that secondary electron yields are less affected by “matrix effect” than secondary ion yields, and at the same time, more sensitive to work function variations and surface charging effects. SCM depth profiling, with suppression of “the crater effect” by electronic gating of the registration system is capable of monitoring interfaces in the multilayer structure, particularly, metal-dielectric boundaries. In contrast to SIMS, SCM data are not influenced by the angle and energy windows of an analyser. However, the sample current measurements provide lower dynamic range of the signal registration than SIMS, and SCM is applicable only to the structures with different secondary electron emission properties and/or different conductivity of the layers. To increase the efficiency, SCM should be accompanied by SIMS measurements or predetermined by proper calibration using other elemental-sensitive techniques.     

Sputter depth profiling of thin films with LEIS and LENRS

Low energy ion scattering spectroscopy (LEIS) and low energy negative recoil spectroscopy (LENRS) have been used to sputter depth profile Fe/Ta thin films on Si. The advantages of the techniques for routine depth profile analysis — good depth resolution and sensitivity to both high and low mass elements through combined LEIS and LENRS are illustrated.     

Structural study of borided layers obtained on synthetic Fe−Ni alloys

Carbon free Fe?Ni alloys (12 and 20 wt.% Ni) have been analysed by X-ray diffraction and surface Mössbauer spectroscopy (CXMS and CEMS) after boriding treatment at 1273 K for 20 hours. Some (Fe _x Ni _l-x )₂B and Fe _x Ni _l-x B samples, with different values ofx, obtained by heating at 1073 K mixtures of elements in powder form, were used as reference. Besides (Fe _x Ni _l-x )₂B and Fe _x Ni _l-x B, a third boride phase rich in boron has been detected in the outer borided layers of the alloy specimens. A third phase appears also in the corresponding X-ray patterns. A comparison between CXMS and CEMS data show that (Fe _x Ni _l-x )₂B is present only in the deeper part of the borided layers and that the outer surface layer is a mixture of a nickel and boron rich boride and of a superparamagnetic oxide.     

High-resolution KLM Auger spectra of Ni metal excited by X-rays

KLM Auger spectra of Ni metal were measured with high energy resolution and high statistical accuracy using monochromatic synchrotron radiation. The spectra were corrected for the background from inelastically scattered electrons using partial intensity analysis where the electron trajectories were calculated by Monte Carlo simulation. Following background correction, the corrected spectra were fitted to model peaks taking into account intrinsic excitations. The measured transition energy of the most intense KL₂M₃ (¹D₂) Auger line is 7388.1 eV (0.4). The obtained relative intensities and energies of the Auger diagram lines are compared to published calculations as well as to experimental data for other 3d transition metals. In addition, the presence of Ni 3s, 3p photoelectron peaks in the spectra excited internally by Ni K X-rays is shown.     

Magnetization process of Fe layers in Fe/Nd multilayered films investigated by57Fe Mössbauer spectroscopy

The magnetization process of Fe and Nd layers at 5K in Fe/Nd multilayered films with strong perpendicular magnetic anisotropy is elucidated from a comparison of⁵⁷Fe Mössbauer spectra in the presence of the external field applied parallel to the film plane with total magnetization. At zero external field, the film has a magnetic multi-domain structure. The Nd layer moment is perpendicular to the film plane and the Fe layer moment points in the out-of-plane direction. The Fe layer moment monotonically rotates to the in-plane direction with increasing external field parallel to the film plane, while the Nd layer moment is oriented to the film normal direction up to the external field of 10kOe, above which the Nd layer moment gradually turns to the direction of the external field.     

Magnetic Properties of Fe/Ni and Fe/Co Multilayer Thin Films

In this work, the magnetic and transport properties of Fe/SiO₂/Ni and Fe/SiO₂/Co multilayers grown on Si/SiO₂ substrates have been studied. The samples have been prepared by two-stage deposition process. In the first stage, Fe layer and SiO₂ interlayer of both samples are grown by ion beam deposition technique at room temperature. Then the samples are taken out to ambient atmosphere and loaded into a pulse laser deposition (PLD) chamber. Prior to the deposition of top layer, the samples are cleaned by annealing at 150 °C. In the second stage, Ni (or Co) layer is prepared by PLD technique at room temperature. The thickness of deposited layers has been measured by Rutherford back scattering (RBS). Magnetic properties of ferromagnetic bilayers have been investigated by room-temperature ferromagnetic resonance (FMR) and vibrating sample magnetometer (VSM) techniques. Standard four-point magneto-transport measurements at various temperatures have been performed. Two-step switching in the in-plane hysteresis loops of Fe/SiO₂/Ni and Fe/SiO₂/Co samples is observed. A crossing in the middle of hysteresis loops of both samples points to a weak antiferromagnetic interaction between the magnetic layers of the stacks. Saturation magnetization values have been obtained from the VSM measurements of samples with DC magnetic field perpendicular to the films surface. Magneto-transport measurements have shown the predominant contribution of anisotropic magnetic resistance both at room and low temperatures. FMR studies of Fe/SiO₂/Ni and Fe/SiO₂/Co samples have revealed additional non-uniform (surface and bulk SWR) modes, which behavior has been explained in the framework of the surface inhomogeneity model. An origin of the antiferromagnetic interaction has been discussed.     

Mössbauer and XRD study of pulse plated Fe–P and Fe–Ni thin layers

⁵⁷Fe conversion electron Mössbauer spectroscopy, X-ray diffraction, electrochemical and magnetic measurements were used to study pulse electroplated Fe–P and Ni–Fe coatings. XRD and ⁵⁷Fe CEMS measurements revealed the amorphous character of the novel pulse plated Fe–P alloys. CEM spectra indicated significant differences in the short range order and in the magnetic anisotropy between the Fe–P deposits pulse plated at medium long deposition time (t _on?=?2 ms), with short relaxation time (t _off?=?9 ms) and low current density (I _p?=?0.05 Acm^?2) or at short deposition time (t _on?=?1 ms) with long relaxation time (t _off?=?250 ms) and high current density (I _p?=?1.0 Acm^?2). The broad peaks centred around the fcc reflections in XRD of the pulse plated Ni-22 wt.% Fe deposit reflected a microcrystalline Ni–Fe alloy with a very fine, 5–8 nm, grain size. The CEM spectrum of the pulse plated Ni-22 wt.% Fe coating corresponded to a highly disordered solid solution alloy containing a minute amount of ferrihydrite. Extreme favourable soft magnetic properties were observed with these Ni–Fe and Fe–P pulse plated thin layers.     

Silicidation in Ni/Si thin film system investigated by X-ray diffraction and Auger electron spectroscopy

Silicide formation induced by thermal annealing in Ni/Si thin film system has been investigated using glancing incidence X-ray diffraction (GIXRD) and Auger electron spectroscopy (AES). Silicide formation takes place at 870 K with Ni₂Si, NiSi and NiSi₂ phases co-existing with Ni. Complete conversion of intermediate silicide phases to the final NiSi₂ phase takes place at 1170 K. Atomic force microscopy measurements have revealed the coalescence of pillar-like structures to ridge-like structures upon silicidation. A comparison of the experimental results in terms of the evolution of various silicide phases is presented.     

ICP-AES测定钛基复合材料中镍、钕和铁的研究

采用ICP－AES法对钛基复合材料中的合金元素镍、钕、铁的测定进行了研究，着重进行了基体元素及待测元素镍、钕、铁之间干扰试验及各元素在测定浓度范围内的线性相关性试验，进行了酸度试验，测定了钛基复合材料中3种元素的含量，得到了较好的精密度和准确度。方法简便、可靠，获得满意的分析结果。     

Magnetic properties of thin Fe layers in Fe/Au artificial superstructured films

Iron layers of monolayer thick are synthesized between thick Au layers by alternate deposition of Fe and Au metals. From⁵⁷Fe Mössbauer absorption spectroscopy, it is found that the Fe monolayer is ferromagnetic at 4.2 k. At higher temperatures, the spectra show a relaxation of the hyperfine field and above 150 K, all Fe atoms are observed as a doublet in the spectra.