首页 | 本学科首页   官方微博 | 高级检索  
相似文献
 共查询到20条相似文献,搜索用时 640 毫秒
1.
《Applied Surface Science》1986,26(4):550-560
Progress in the use of Auger electron spectroscopy is discussed. Specifically limits to spatial resolution in the scanning Auger microprobe resulting from backscattered electrons is illustrated. Determination of chemical state by peak shapes and energies are discussed along with the use of correction factors in quantitating Auger electron data. Finally, the use of inverse Laplace transforms of angle-resolved electron spectroscopy data to generate composition depth profiles of sputtered GaAs is illustrated. It is concluded that Gibbsian surface segregation during sputtering caused depletion of As near the surface of GaAs.  相似文献   

2.
In this review of the application of deconvolution in electron spectroscopy the operations of convolution and deconvolution are first defined. The theoretical background to direct methods, Fourier Transform techniques and iterative approaches to deconvolution is given. The use of smoothing techniques, the removal of secondary electron background and the determination of broadening functions are then considered. Examples of deconvolution in electron spectroscopy are discussed. These include valence and core levels in XPS, gas-phase UPS studies and resolution enhancement in Auger spectroscopy. Deconvolution of Auger spectra to yield density of states curves is examined. The likely future status of deconvolution in electron spectroscopy is considered.  相似文献   

3.
建立一套基于超高真空俄歇电子能谱的原位加热系统,对GaN薄膜进行热效应研究.随着温度的增加,Ga LMM和Ga MVV的动能减小.利用第一性原理计算,获得理论的GaMVV俄歇谱.加热过程由于晶格热膨胀以及表面原子再构引起价电子态密度发生变化,从而导致价带俄歇谱负移.  相似文献   

4.
We have observed the direct L(2,3)MMM double Auger transition after photoionization of the 2p shell of argon by angle-resolved electron-electron coincidence spectroscopy. The process is responsible for about 20% of the observed Auger electron intensity. In contrast to the normal Auger lines, the spectra in double Auger decay show a continuous intensity distribution. The energy and angular distributions of the emitted electrons allow one to obtain information on the electron correlations giving rise to the double Auger process as well as the symmetry of the associated two-electron continuum state.  相似文献   

5.
The satellite line profile in the C–VV Auger electron spectroscopy spectrum depends upon how the initial core hole state and the final multiple hole state are created. Even if the numbers of the holes in the satellite states are the same, the Auger electron spectroscopy spectral profiles of the final multiple hole states are different. The localization of the three hole satellite state is discussed.  相似文献   

6.
Auger and direct electron spectra from Zn, ZnO, Ga and Ga2O3 have been studied with X-ray photoelectron spectroscopy (ESCA). The chemical shift between zinc electron binding energies in Zn and ZnO is very small, whereas the zinc Auger electron signals are separated by 4.3 eV. In gallium, the oxide and metal signals are separated by 1.9 eV, but the Auger electron energy shift is three times as large. Thus the Auger signals are more sensitive to the chemical environment than the direct electron signals, which is the same relation as earlier observed for copper and copper oxides.  相似文献   

7.
N C Jain 《Pramana》1989,33(6):677-683
A new method which takes into account the separate matrix correction factors for bulk and surface has been tried out for quantitative Auger electron spectroscopy analysis of binary alloys. The calculations use an iteration scheme. It has been applied to the Fe-Cr alloys studied at this Centre and the Auger electron spectroscopy data for the other alloy systems available in literature. The results are now more compatible with the expectation that the surface composition is different from the bulk.  相似文献   

8.
In the scanning electron microscope the electron channeling patterns allow us to determine the orientation and quality of single crystal objects. If the Auger spectrometer is equipped with a scanning sample positioner, the electron channeling patterns can be observed with primary energies used in Auger spectroscopy, i.e. 0.5–5 keV.  相似文献   

9.
A magnetic bottle spectrometer of the type recently developed by Eland et al. [Phys. Rev. Lett. 90, 053003 (2003).] has been implemented for use with synchrotron radiation, allowing multidimensional electron spectroscopy. Its application to the Xe 4d double Auger decay reveals all the energy pathways involved. The dominant path is a cascade process with a rapid (6 fs) ejection of a first Auger electron followed by the slower (>23 fs) emission of a second Auger electron. Weaker processes implying 3 electron processes are also revealed, namely, direct double Auger and associated Rydberg series.  相似文献   

10.
The processes accompanying the formation of ytterbium films on the Si(111) surface at room temperature are investigated by the contact potential difference method, Auger electron spectroscopy, low-energy electron diffraction, and thermal desorption spectroscopy. It is shown that the grown metal films are uniform in thickness and that Si atoms virtually do not dissolve in the films. The atoms of the silicon substrate can diffuse in limited amounts into the Yb metal film only when the surface is bombarded by high-energy primary electron beams employed in Auger electron spectroscopy. The results obtained permit the conclusion that the previously observed oscillations of the work function in Yb-Si(111) thin-film structures cannot originate from dissolution of silicon atoms in the ytterbium film.  相似文献   

11.
A simple and efficient method to deduce the true Auger spectrum from the raw data is presented. This method is an application to Auger spectroscopy derived from signal processing procedures employed in different fields. It appears particularly promising when complex spectra are analyzed as it avoids spurious information to be introduced. The method is also compared with the more-standard van Cittert's approach. An experimental check of the common assumption that an Auger electron experiences almost the same energy-loss mechanisms as a nearly elastically reflected primary electron at the same energy is given.  相似文献   

12.
Auger electron spectroscopy was used to detect calcium and phosphorus of cortical bone from rat femoral neck and rear tibia. Spectra were taken from bone pieces as well as from disks prepared from grinded bone material. Experimental conditions were found whereby the samples could be analyzed without conductive coatings. The results of this preliminary investigation demonstrate that Auger electron spectroscopy can be used to study bone mineral elements.  相似文献   

13.
The interaction of oxygen and nitrogen with a clean polycrystalline iron surface was investigated using Auger electron spectroscopy, photoelectron spectroscopy and electron energy loss spectroscopy. Further evidence for the dissociative nature of adsorbed nitrogen on iron is shown by the photoelectron spectroscopy data in conjunction with preliminary thermal desorption work. The first electron energy loss data for the nitrided iron surface is presented and shown to be very similar to that for the clean and oxidized surfaces.  相似文献   

14.
《Applied Surface Science》1986,27(2):235-246
The surface segregation in an Ir-2%Pt alloy has been studied using Auger electron spectroscopy. The variation of the probing depth with Auger electron energy was utilized for estimating the in-depth segregation profile. After annealing at 950°C and cooling to room temperature, Auger spectra were recorded in five different kinetic energy regions. The quantitative analysis of four of these spectra was performed using computer added spectra from pure Ir and Pt. A strong segregation of Pt to the surface layer was observed.  相似文献   

15.
Auger electron spectroscopic studies of cylindrical copper single crystals show large variations with surface orientation in Auger yield from both the clean surface and oxygen adsorbed to saturation on the surface which can be attributed to incident beam effects and “inverse Kikuchi” phenomena. Ways are discussed of minimising the effect of these anisotropies to obtain true comparative surface coverages from Auger electron spectroscopy of different crystal surface orientations.  相似文献   

16.
A calibration is presented for the measurement, by Auger electron spectroscopy, of sulphur adsorbed on nickel. The Auger emission from the metal is used as a reference. The use of radioactive sulphur permits a direct measurement of the quantity of adsorbed sulphur.  相似文献   

17.
Technical Physics - Using the methods of Auger electron spectroscopy, electron energy loss spectroscopy, and UV photoelectron spectroscopy, the influence of Ba+ ion implantation on the...  相似文献   

18.
Yong Liang  Dawn A. Bonnell   《Surface science》1994,310(1-3):128-134
Surface structures and chemistry of the annealed SrTiO3(001) have been studied by scanning tunneling microscopy and Auger electron spectroscopy. Our STM results show that islands arc formed on an originally smooth surface after annealing in ultra high vacuum at a temperature of 1300°C. Tunneling spectra show that the islands exhibit a different electronic structure than that of SrTiO3, with an apparent bandgap of 6 eV rather than 3.2 eV. Auger electron spectroscopy indicates that annealing yields strontium enrichment at the surface. The nature of the islands and change of surface chemistry are discussed in terms of correlation of the STM and Auger results.  相似文献   

19.
Graphene films were prepared by sublimation epitaxy of SiC under vacuum. The films were studied by Auger electron spectroscopy, reflection high-energy electron diffraction, atomic force microscopy, and Raman spectroscopy. It is concluded that the films prepared are polycrystalline and consist of graphene single crystals about 50 nm in size.  相似文献   

20.
The time evolution of the surface electric field in a dielectric system during Auger electron spectroscopy is calculated. It is shown that steady electric fields are very quickly attained. Their steady value is connected to primary electron mobility.  相似文献   

设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号