Surface studies of halloysite nanotubes by XPS and ToF‐SIMS

This report provides detailed experimental results of thermal and surface characterization on untreated and surface‐treated halloysite nanotubes (HNTs) obtained from two geographic areas. Surface characterization techniques, including XPS and time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) were used. ToF‐SIMS surface analysis experiments were performed with both atomic and cluster ion beams. Higher ion yields and more high‐mass ions were obtained with the cluster ion beams. Static ToF‐SIMS spectra were analyzed with principal component analysis (PCA). Morphological diversities were observed in the samples although they mainly contained tubular structures. Thermogravimetric data indicated that aqueous hydrogen peroxide solution could remove inorganic salt impurities, such as alkali metal salts. The amount of grafting of benzalkonium chloride of HNT surface was determined by thermogravimetic analysis. PCA of ToF‐SIMS spectra could distinguish the samples mined from different geographical locations as well as among surface‐treated and untreated samples. Copyright © 2010 John Wiley & Sons, Ltd.     

Data and device protection: A ToF‐SIMS,wetting, and XPS study of an Apple iPod nano

An important aspect of the robustness of an electronic device is its ability to resist water, fingerprints, dirt, and smudges that may compromise its ability to function and/or the information within it. Here, we report a chemical analysis by ToF‐SIMS, wetting, and XPS of the surfaces in a commercially available Apple iPod nano (8GB, MC525LL/A), which showed good resistance to its environment. This analysis reveals that the front panel (touchscreen) of the device is coated with a low free energy fluorinated polymer that may consist of short segments of a fluorinated hydrocarbon connected through ether linkages. No other part of the device appears to have this hydrophobic coating. A plasma treatment of the device leads to a deterioration of its performance. This work demonstrates how different analytical techniques can complement each other and contribute to a better understanding of a surface or a material. Copyright © 2013 John Wiley & Sons, Ltd.     

Layer‐by‐layer deposition of nitrilotris(methylene)triphosphonic acid and Zr(IV): an XPS,ToF‐SIMS,ellipsometry, and AFM study

Layer‐by‐layer assemblies consisting of alternating layers of nitrilotris(methylene)triphosphonic acid (NTMP), a polyfunctional corrosion inhibitor, and zirconium(IV) were prepared on alumina. In particular, a nine‐layer (NTMP/Zr(IV))₄NTMP stack could be constructed at room temperature, which showed a steady increase in film thickness throughout its growth by spectroscopic ellipsometry up to a final thickness of 1.79 ± 0.04 nm. At higher temperature (70 °C), even a two‐layer NTMP/Zr(IV) assembly could not be prepared because of etching of the alumina substrate by the heated Zr(IV) solution. XPS characterization of the layer‐by‐layer assembly showed a saw tooth pattern in the nitrogen, phosphorus, and zirconium signals, where the modest increases and decreases in these signals corresponded to the expected deposition and perhaps removal of NTMP and Zr(IV). Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) confirmed the attachment of the NTMP molecule to the surface through PO^?, PO₂^?, PO₃^?, and CN^? signals. Increasing attenuation of the Al signal from the substrate after deposition of each layer was observed by both XPS and ToF‐SIMS. Essentially complete etching of the alumina by the heated Zr(IV) solution was confirmed by spectroscopic ellipsometry, XPS, and ToF‐SIMS. Atomic force microscopy revealed that all the films were smooth with R_q roughness values less than 0.5 nm. Copyright © 2015 John Wiley & Sons, Ltd.     

Analysis of ToF‐SIMS spectra of poly(2‐vinylpyridine) and poly(4‐vinylpyridine) with density functional theory calculations

The time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) positive and negative ion spectra of poly(2‐vinylpyridine) (P2VP) and poly(4‐vinylpyridine) (P4VP) were analyzed using density functional theory calculations. Most of the ions from these structural isomers shared the same accurate mass, but had different relative abundance. This could be attributed to the fact that from a thermodynamics perspective, the disparity in the molecular structures can affect the ion stability if we assume that they shared the same mechanistic pathway of formation with similar reaction kinetics. The molecular structures of these ions were assigned, and their stability was evaluated based on calculations using the Kohn‐Sham density functional theory with Becke's 3‐parameter Lee‐Yang‐Parr exchange‐correlation functional and a correlation‐consistent, polarized, valence, double‐zeta basis set for cations and the same basis set with a triple‐zeta for anions. The computational results agreed with the experimental observations that the nitrogen‐containing cations such as C₅H₄N⁺ (m/z = 78), C₈H₇N^+· (m/z = 117), C₈H₈N⁺ (m/z = 118), C₉H₈N⁺ (m/z = 130), C₁₃H₁₁N₂⁺ (m/z = 195), C₁₄H₁₃N₂⁺ (m/z = 209), C₁₅H₁₅N₂⁺ (m/z = 223), and C₂₁H₂₂N₃⁺ (m/z = 316) ions were more favorably formed in P2VP than in P4VP due to higher ion stability because the calculated total energies of these cations were more negative when the nitrogen was situated at the ortho position. Nevertheless, our assumption was invalid in the formation of positive ions such as C₆H₇N⁺˙ (m/z = 93) and C₈H₁₀N⁺ (m/z = 120). Their formation did not necessarily depend on the ion stability. Instead, the transition state chemistry and the matrix effect both played a role. In the negative ion spectra, we found that nitrogen‐containing anions such as C₅H₄N^? (m/z = 78), C₆H₆N^? (m/z = 92), C₇H₆N^? (m/z = 104), C₈H₆N^? (m/z = 116), C₉H₁₀N^? (m/z = 132), C₁₃H₁₁N₂^? (m/z = 195), and C₁₄H₁₃N₂^? (m/z = 209) ions were more favorably formed in P4VP, which is in line with our computational results without exception. We speculate that whether anions would form from P2VP and P4VP is more dependent on the stability of the ions.     

Repair of defects created by Ar+ sputtering on graphite surface by annealing as confirmed using ToF‐SIMS and XPS

Defects were created on the surface of highly oriented pyrolytic graphite (HOPG) by sputtering with an Ar⁺ ion beam, then characterized using X‐ray photoelectron spectroscopy (XPS) and time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) at 500°C. In the XPS C1s spectrum of the sputtered HOPG, a sp³ carbon peak appeared at 285.3 eV, representing surface defects. In addition, 2 sets of peaks, the C_x⁻ and C_xH⁻ ion series (where x = 1, 2, 3...), were identified in the ToF‐SIMS negative ion spectrum. In the positive ion spectrum, a series of C_xH₂^+• ions indicating defects was observed. Annealing of the sputtered samples under Ar was conducted at different temperatures. The XPS and ToF‐SIMS spectra of the sputtered HOPG after 800°C annealing were observed to be similar to the spectra of the fresh HOPG. The sp³ carbon peak had disappeared from the C1s spectrum, and the normalized intensities of the C_xH⁻ and C_xH₂^+• ions had decreased. These results indicate that defects created by sputtering on the surface of HOPG can be repaired by high‐temperature annealing.     

Fluorine plasma treatment of bare and nitrilotris(methylene)triphosphonic acid (NP) protected aluminum: an XPS and ToF‐SIMS study

Nitrilotris(methylene)triphosphonic acid (NP) is a technologically important molecule that has been used for years as a corrosion inhibitor and/or adhesion promoter on aluminum and other metal surfaces. However, to the best of our knowledge, the detailed surface characterization of NP adsorbed on aluminum, or on any other surface, has not been reported. Herein, we report an X‐ray photoelectron spectroscopy and time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) analysis of a series of untreated and NP‐coated aluminum substrates that were exposed to the downstream products of a fluoroalkane + oxygen plasma for different amounts of time (from 0 to 20 s). As indicated by P 2p, N 1s, Al 2p, O 1s, and F 1s narrow scans, even a 4‐s plasma treatment significantly damages the NP protective layer and converts the native aluminum oxide into aluminum oxyfluoride. Heat treatment of the fluorine plasma‐treated samples in the air substantially converts the aluminum oxyfluoride back to aluminum oxide, while similar heating under vacuum results in little change to the materials. A slow loss of fluorine from the samples occurs over the course of weeks when they are stored in the air. A ToF‐SIMS analysis reveals sets of signals that are consistent with no surface treatment, NP treatment, or fluorine plasma treatment. A principal component analysis of the negative ion ToF‐SIMS spectra from the samples shows the expected differentiation of the samples. Copyright © 2014 John Wiley & Sons, Ltd.     

ToF‐SIMS observation of PTFE surfaces modified by α‐particle irradiation

The surface structure of polytetrafluoroethylene (PTFE) upon α‐particle irradiation has been investigated at doses in the range of 1 × 10⁷ to 1 × 10¹¹ Rad and compared with the surface structure of the unirradiated polymer. Both neat and 25% fiberglass content PTFE were studied. The samples, maintained at nominal room temperature, were irradiated in vacuum by 5.5 MeV ⁴He²⁺ ions generated in a tandem accelerator beam line. Static time‐of‐flight SIMS (ToF‐SIMS) was employed to probe chemical changes at the surface as a function of the irradiation level. In general, the data are indicative of increased cross‐linking at α‐doses less than 1 × 10⁹ Rad, followed by increased fragmentation and unsaturation at α‐doses greater than 1 × 10⁹ Rad. Throughout the irradiation regime, scission is a constant factor promoting cross‐linking, branching, and unsaturation. However, at α‐doses greater than 1 × 10¹⁰ Rad, extreme structural degradation of the polymer becomes evident and is accompanied by conversion to oxygen‐functionalized and aliphatic compounds. Thus, for PTFE in an α‐particle field, an upper exposure limit of ～10¹⁰ Rad is essential for nominal retention of molecular structure. Finally, a quantitative relationship between α‐dose and characteristic fragment ion intensity is developed. Copyright © 2005 John Wiley & Sons, Ltd.     

Multi‐instrument characterization of poly(divinylbenzene) microspheres for use in liquid chromatography: as received,air oxidized,carbonized, and acid treated

We report a multi‐instrument characterization of the carbon particles in carbon/polymer/nanodiamond core‐shell materials used for high‐performance liquid chromatography. These particles are prepared by the carbonization/pyrolysis of poly(divinylbenzene) (PDVB) microspheres. Scanning electron microscopy showed that the particles (4.9 µm initially) decreased in size after air oxidation (to 4.4 µm) and again after carbonization (down to 3.5 µm) but remained highly spherical. Brunauer–Emmett–Teller measurements showed low surface areas initially (as received: 1.6 m²/g, after air oxidation: 2.6 m²/g) but high values after carbonization (445 m²/g). Fourier transform infrared spectroscopy revealed the changes in the functional groups after air oxidation (C = O and C–O stretches appear), carbonization (carbon‐oxygen containing moieties disappear), and acid treatment (reintroduction of carbon‐oxygen containing moieties). X‐ray photoelectron spectroscopy (XPS) and elemental analysis revealed the surface and bulk oxygen contents before and after treatments. By XPS, the atom percent oxygen for the as received, air oxidized, carbonized, and acid treated particles are 8.7, 16.6, 3.7, and 13.8, respectively, and by elemental analysis, the percent oxygen in the materials is 0.6, 8.1, 0.9, 16.9, respectively. A principal components analysis of time‐of‐flight secondary ion mass spectrometry data identified ions that were enhanced in the different materials, where almost 90% of the variation in the analyzed peak areas was captured by two principle components. X‐ray diffraction and Raman spectroscopy suggested that the carbonized PDVB was disordered. Thermogravimetric analysis showed significant differences between the differently treated PDVB microspheres. This work applies directly to a commercial product and the process for preparing it. Copyright © 2015 John Wiley & Sons, Ltd.     

Study of the end‐group contribution to ToF‐SIMS and G‐SIMS spectra of poly (lactic acid) using deuterium labelling

In this study, polymeric (MW 50 000) and oligomeric (MW 2000) poly (lactic acid) (PLA), both with and without end‐group deuterium exchange, were analysed using static secondary ion mass spectrometry (SSIMS) to investigate the contribution of end‐group‐derived secondary ions to the SSIMS spectra. By monitoring the SSIMS intensities between the non‐deuterated and deuterated PLA, it is evident that the only significant end‐group‐derived secondary ions are [nM + H]⁺ (n > 1) and C₄H₉O₂⁺. The gentle‐SIMS (G‐SIMS) methodology was employed to establish that deuterated fragments were produced through low energy processes and were not the result of substantial rearrangements. It was noted that end‐group‐derived secondary ions had higher G‐SIMS intensities for oligomeric PLA than polymeric PLA, showing that these secondary ions are simple fragment products that are not the result of rearrangement or degraded product ions. Copyright © 2007 John Wiley & Sons, Ltd.     

Novel biomimetic composite based on collagen and poly(γ‐benzyl L‐glutamate)‐co‐poly(glutamic acid)

Novel biomimetic composite was prepared by the reaction of collagen and poly(γ‐benzyl L ‐glutamate)‐co‐poly(glutamic acid) (PBLG‐co‐PGA), which were crosslinked by non‐toxic crosslinking reagents 1‐ethyl‐(dimethylaminopropyl) carbodiimide (EDC) and N‐hydroxysuccinimide (NHS). The composite was characterized by FTIR and DSC. FTIR results confirmed that the collagen in the composite was successfully crosslinked with PBLG‐co‐PGA. DSC results showed that the composites possessed higher shrinkage temperature and higher thermal stability than the collagen. The water absorption test showed that the water absorbency of the composites increased with the increase in PBLG‐co‐PGA content in the composite. The studies of collagenase degradation and the tensile strength showed that the biostability and the tensile strength of the composites were significantly improved in comparison with that of the collagen. According to the investigations of cell adherent ratio and cell proliferation in vitro, the composite possessed good biocompatibility. Copyright © 2007 John Wiley & Sons, Ltd.     

Degradation of poly(acrylates) under SF5+ primary ion bombardment studied using time‐of‐flight secondary ion mass spectrometry. 3. Poly(hydroxyethyl methacrylate) with chemical derivatization

Molecular depth profiling of polymers by secondary ion mass spectrometry (SIMS) has focused on the use of polyatomic primary ions due to their low penetration depth and high damage removal rates in some polymers. This study is the third in a series of systematic characterizations of the effect of polymer chemistry on degradation under polyatomic primary ion bombardment. In this study, time‐of‐flight SIMS (ToF‐SIMS) was used to assess 5 keV SF₅⁺‐induced damage of ～90 nm thick spin‐cast poly(2‐hydroxyethyl methacrylate) (PHEMA) and ～130 nm thick trifluoroacetic anhydride‐derivatized PHEMA (TFAA‐PHEMA) films. The degradation of these polymers under extended SF₅⁺ bombardment (～2 × 10¹⁴ ions cm^?2) was compared to determine the effect of the pendant group chemistry on their degradation. The sputter rate and ion‐induced damage accumulation rate of PHEMA were similar to a poly(n‐alkyl methacrylate) of similar pendant group length, suggesting that the addition of a terminal hydroxyl group to the alkyl pendant group does not markedly change the stability of poly(n‐alkyl methacrylates) under SF₅⁺ bombardment. The sputter rate and ion‐induced damage accumulation rate of TFAA‐PHEMA were much higher than a poly(n‐alkyl methacrylate) of similar pendant group length, suggesting that derivatization of the terminal hydroxyl group can significantly reduce degradation of the polymer under SF₅⁺ bombardment. This result is in good agreement with the literature on the thermal and radiation‐induced degradation of fluorinated poly(alkyl methacrylates), which suggests that the electron‐withdrawing fluorinated pendant group increases the probability of depolymerization. Copyright © 2004 John Wiley & Sons, Ltd.     

ToF‐SIMS for the characterization of hyperbranched aliphatic polyesters: probing their molecular weight on surfaces based on principal component analysis (PCA)

A series of 2,2‐bis(hydroxymethyl)propionic acid (Bis‐MPA) hyperbranched aliphatic polyesters with different molecular weights (generations) is analysed for the first time by time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS). The main negative and positive low‐mass fragments are identified in the fingerprint part of the spectra (m/z < 400) and are principally assigned to fragmentation of the Bis‐MPA repeating units. In addition, it is shown that the fragmentation pattern is highly affected by the functional end‐groups. This is illustrated for a phthalic acid end‐capped hyperbranched polymer and for an acetonide‐terminated dendrimer analog. Also, typical fragments assigned to the ethoxylated pentaerythritol core molecule are detected. These ions show decreasing intensities with increasing molecular weight. This intensity dependency on the generation is used to calibrate the molecular weight of hyperbranched polyesters on the surface. To obtain quantitative information, a principal component analysis (PCA) multivariate statistical method is applied to the ToF‐SIMS data. The influence of different normalization procedures prior to PCA calculation is tested, e.g. normalization to the total intensity, to the intensities of ions assigned to the Bis‐MPA repeating unit or to intensities of fragments due to the core molecule. It is shown that only one principal component (PC1) is needed to describe most of the variance between the samples. In addition, PC1 takes into account the generation effect. However, different relationships between the PC1 scores and the hyperbranched mass average molecular weights are observed depending on the normalization procedure used. Normalization of data set ion intensities by ion intensities from the core molecule allows linearization of the SIMS intensities versus the molecular weight and allows the hyperbranched polymers to be discriminated up to the highest generations. In addition, PCA applied to ToF‐SIMS data provides an extended interpretation of the spectra leading to further identification of the correlated mass peaks, such as those of the Bis‐MPA repeating unit (terminal, dendritic and linear) and those of the core molecule. Finally, the work presented demonstrates the extreme potential of the static ToF‐SIMS and PCA techniques in the analysis of dendritic molecules on solid surfaces. Copyright © 2003 John Wiley & Sons, Ltd.     

Crystallographic report: Bis(indole‐3‐acetato)(1,10‐phenanthroline)lead(II)

The lead atom in Pb(phen)(IA)₂ is in a heavily distorted square pyramidal geometry surrounded by an N₂O₃ donor set with Pb? O distances ranging from 2.354(5) to 2.726(5) Å. Copyright © 2005 John Wiley & Sons, Ltd.     

Photodegradation of poly(ether sulphone) Part 1. A time‐of‐flight secondary ion mass spectrometry study

An extensive study of the surface chemical changes to poly(ether sulphone) (PES) ultrafiltration membranes is made for the first time by the use of time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) after photoirradiation at 254 nm with irradiances varying from 10 to 300 mJ cm^?2 in a nitrogen atmosphere. Complementary information is provided by analysis with x‐ray photoelectron spectroscopy (XPS) and attenuated total reflectance Fourier transform infrared spectroscopy (ATR‐FTIR). The versatility, superior specificity and sensitivity of using ToF‐SIMS to investigate degradation phenomena are highlighted. The combined results demonstrate that photoirradiation causes a number of chemical changes to the surface: incorporation of oxygen; degradation of the benzene rings and formation of oxidized carbon species; depletion of carbon; reduction of ? SO₂? to some extent; formation of ? OH, C?O and ? SO₃H groups; and probable formation of ? C₆H₄? O? C₆H₅ end‐groups. In addition, no ? OSO₃H groups are formed and no formation of SO₂ is detected. Also, it is shown that chain scission dominates below an irradiation dose of ～200 mJ cm^?2 (at 254 nm in a nitrogen atmosphere). At higher doses, cross‐linking becomes dominant. Copyright © 2004 John Wiley & Sons, Ltd.     

Crystallographic report: Bis(indole‐3‐acetato)(1,10‐phenanthroline) cadmium(II)

The structure of Cd(phen)(indole‐3‐acetato)₂ has twofold symmetry and features a six‐coordinated distorted octahedral geometry around cadmium(II), defined by an N₂O₄ donor set, with Cd–O distances ranging from 2.214(3) to 2.526(3) Å. Copyright © 2003 John Wiley & Sons, Ltd.     

Reaction of α,β‐unsaturated ketones using cerium (IV) sulfate tetrahydrate in acetic acid

The reaction of α,β‐unsaturated ketones with cerium (IV) sulfate tetrahydrate [Ce(SO₄)₂·4H₂O, CS] in acetic acid gave the corresponding β‐acetoxy ketones. In the case of 2‐cyclohexen‐1‐one with CS in acetic acid, benzobicyclo[2.2.2]octen‐2‐one was obtained. The reaction mechanism also was proposed. Moreover, we report the aromatization and esterification of (R)‐(?)‐carvone by CS in acetic acid. Copyright © 2007 John Wiley & Sons, Ltd.     

Investigating Pb diffusion across buried interfaces in Pb(Zr0.2Ti0.8)O3 thin films via time‐of‐flight secondary ion mass spectrometry depth profiling

The diffusion of Pb through Pb(Zr_0.2Ti_0.8)O₃(PZT)/Pt/Ti/SiO₂/Si thin film heterostructures is studied by using time‐of‐flight secondary ion mass spectrometry depth profiling. The as‐deposited films initially contained 10 mol% Pb excess and were thermally processed at temperatures ranging from 325 to 700°C to promote Pb diffusion. The time‐of‐flight secondary ion mass spectrometry depth profiles show that increasing processing temperature promoted Pb diffusion from the PZT top film into the buried heterostructure layers. After processing at low temperatures (eg, 325°C), Pb⁺ counts were low in the Pt region. After processing at elevated temperatures (eg, 700°C), significant Pb⁺ counts were seen throughout the Pt layer and into the Ti and SiO₂ layers. Intermediate processing temperatures (400, 475, and 500°C) resulted in Pb⁺ profiles consistent with this overall trend. Films processed at 400°C show a sharp peak in PtPb⁺ intensity at the PZT/Pt interface, consistent with prior reports of a Pt₃Pb phase at this interface after processing at similar temperatures.     

Nonisothermal crystallization kinetics of poly(ε‐caprolactone) blocks in double crystalline triblock copolymers containing poly(3‐hydroxybutyrate‐co‐3‐hydroxyvalerate) and poly(ε‐caprolactone) units

The poly(3‐hydroxbutyrate‐co‐3‐hydroxyvalerate)/poly(ε‐caprolactone) block copolymers (PHCLs) with three different weight ratios of PCL blocks (38%, named PHCL‐38; 53%, named PHCL‐53; and 60%, named PHCL‐60) were synthesized by using PHBV with two hydroxyl end groups to initiate ring‐opening polymerization of ε‐caprolactone. During DSC cooling process, melt crystallization of PHCL‐53 at relatively high cooling rates (9, 12, and 15 °C min^?1) and PHCL‐60 at all the selected cooling rates corresponded to PCL blocks so that PHCL‐53 and PHCL‐60 were used to study the nonisothermal crystallization behaviors of PCL blocks. The kinetics of PCL blocks in PHCL‐53 and PHCL‐60 under nonisothermal crystallization conditions were analyzed by Mo equation. Mo equation was successful in describing the nonisothermal crystallization kinetics of PCL blocks in PHCLs. Crystallization activation energy were estimated using Kissinger's method. The results of kinetic parameters showed that both blocks crystallized more difficultly than corresponding homopolymers. With the increase of PCL content, the crystallization rate of PCL block increased gradually. © 2010 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys, 2010     

Controlled sub‐10‐nanometer poly(N‐isopropyl‐acrylamide) layers grafted from silicon by atom transfer radical polymerization

Surface‐initiated atom transfer radical polymerization (SI‐ATRP) was used to graft poly(N‐isopropylacrylamide) (PNIPAM) brush layers with a controllable thickness in the 10‐nm range from silicon substrates. The rate of polymerization of N‐isopropylacrylamide was tuned by the [Cu(II)]₀/[Cu(I)]₀ ratio between the deactivating and activating species. The polymer layer thickness was characterized by atomic force microscopy (AFM) and ellipsometry. PNIPAM layers with a dry thickness between 5.5 and 16 nm were obtained. Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) confirmed that the chemical structure is PNIPAM brushes. Analysis of the AFM data showed that our procedure leads to polymer grafts in the “mushroom‐to‐brush” transition regime.     

Preparation and physical properties of poly(4,4′‐diamino‐3′‐carbamoylbenzanilide terephthalamide) and poly(4,4′‐diamino‐3′‐carbamoylbenzanilide isophthalamide) films

To prepare thermally stable and high‐performance polymeric films, new solvent‐soluble aromatic polyamides with a carbamoyl pendant group, namely poly(4,4′‐diamino‐3′‐carbamoylbenzanilide terephthalamide) (p‐PDCBTA) and poly(4,4′‐diamino‐3′‐carbamoylbenzanilide isophthalamide) (m‐PDCBTA), were synthesized. The polymers were cyclized at around 200 to 350 °C to form quinazolone and benzoxazinone units along the polymer backbone. The decomposition onset temperatures of the cyclized m‐ and p‐PDCBTAs were 457 and 524 °C, respectively, lower than that of poly(p‐phenylene terephthalamide) (566 °C). For the p‐PDCBTA film drawn by 40% and heat‐treated, the tensile strength and Young's modulus were 421 MPa and 16.4 GPa, respectively. The film cyclized at 350 °C showed a storage modulus (E′) of 1 × 10¹¹ dyne/cm² (10 GPa) over the temperature range of room temperature to 400 °C. © 2000 John Wiley & Sons, Inc. J Polym Sci A: Polym Chem 38: 775–780, 2000