Static TOF‐SIMS. A VAMAS interlaboratory study. Part II — accuracy of the mass scale and G‐SIMS compatibility

An interlaboratory study involving 32 time‐of‐flight static SIMS instruments from 13 countries has been conducted. In Part I of the analysis of data, we showed that 84% of instruments have excellent repeatabilities of better than 1.9% and that a relative instrument spectral response (RISR) can be used to evaluate variations between different generic types of instrument. Use of the RISR improves comparability between instruments by a factor of 33. Here, in Part II, we study the accuracy of the mass scale calibration in TOF‐SIMS and evaluate instrument compatibility with G‐SIMS. We show that the accuracy of calibration of the mass scale is much poorer than generally expected (?60 ppm for peaks <200 u and ?150 ppm for a large molecular peak at 647 u). This is a major issue for analysts. Elsewhere, we have developed a detailed study of the factors affecting the mass calibration and have developed a generic protocol that improves accuracy by a factor of 5. Here, this framework of understanding is used to interpret the results presented. Furthermore, we show that eight out of the ten participants submitting data for G‐SIMS could use operating conditions that generated G‐SIMS spectra of the PC reference material. This demonstrates that G‐SIMS may be conducted with a wide variety of instrument designs. © Crown Copyright 2007. Reproduced by permission of the Controller of HMSO. Published by John Wiley & Sons, Ltd.     

Static SIMS–VAMAS interlaboratory study for intensity repeatability,mass scale accuracy and relative quantification

An interlaboratory study involving 19 time‐of‐flight static secondary ion mass spectrometer (TOF‐SSIMS) instruments from 12 countries has been conducted. Analysts were supplied, by the National Physical Laboratory, with a protocol for analysis together with three reference materials: poly(tetrafluoroethylene), a thin layer of polycarbonate on a silicon wafer and a patterned sample with different amounts of Irganox 1010 in each of four quadrants on a silicon wafer. The objectives of the study are (i) to determine the repeatability and constancy of the relative intensity scale achievable using the draft ISO standard (DIS 23830), (ii) to evaluate the effectiveness of mass scale calibration and optimisation procedure and (iii) to evaluate the current capability of relative quantification using SSIMS. The results of this study show that the constancy of the relative intensity scale has an approximate scatter standard deviation of only 5%. This is excellent and demonstrates that SSIMS measurements are significantly more stable than often thought by analysts. The draft ISO standard (DIS) CD 13084 for calibration of the mass scale in TOF‐SIMS was evaluated and found to be consistent with our previous study. Four laboratories optimised the instrument mass calibration accuracy using this procedure leading to improvements in mass scale calibration by factors of 1.8, 2.2, 2.3 and 8.6. Using a novel patterned Irganox sample it is shown that the precision of relative quantification may be as good as a standard deviation of only 5% for 16 instruments—this is a remarkable result. Further work is required to develop more robust reference materials. © Crown copyright 2010. Reproduced with the permission of Her Majesty's Stationery Office. Published by John Wiley & Sons, Ltd.     

TOF‐SIMS study of cystine and cholesterol stones

Two different human stones, cystine and cholesterol from the kidney and gall bladder, were examined by time‐of‐flight secondary ion mass spectrometry using Ga⁺ primary ions as bombarding particles. The mass spectra of kidney stone were compared with those measured for the standard compounds, cystine and cysteine. Similar spectra were obtained for the stone and cystine. The most important identification was based on the existence of the protonated molecules [M + H]⁺ and deprotonated molecules [M‐H]^‐. The presence of cystine salt was also revealed in the stone through the sodiated cystine [M + Na]⁺ and the associated fragments, which might be due to the patient treatment history. In the gallstone, the deprotonated molecules [M‐H]⁺ of cholesterol along with relatively intense characteristic fragments [M‐OH]⁺ were detected. Copyright © 2012 John Wiley & Sons, Ltd.     

Reduction of matrix effects in TOF‐SIMS analysis by metal‐assisted SIMS (MetA‐SIMS)

We investigated reduction of the matrix effect in time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) analysis by the deposition of a small amount of metal on the sample surfaces (metal‐assisted SIMS or MetA‐SIMS). The metal used was silver, and the substrates used were silicon wafers as electroconductive substrates and polypropylene (PP) plates as nonelectroconductive substrates. Irganox 1010 and silicone oil on these substrates were analyzed by TOF‐SIMS before and after silver deposition. Before silver deposition, the secondary ion yields from the substances on the silicon wafer and PP plate were quite different due to the matrix effect from each substrate. After silver deposition, however, both ion yields were enhanced, particularly the sample on the PP plate, and little difference was seen between the two substrates. It was therefore found that the deposition of a small amount of metal on the sample surface is useful for reduction of the matrix effect. By reducing the matrix effect using this technique, it is possible to evaluate from the ion intensities the order of magnitude of the quantities of organic materials on different substrates. In addition, this reduction technique has clear utility for the imaging of organic materials on nonuniform substrates such as metals and polymers. MetA‐SIMS is thus a useful analysis tool for solving problems with real‐world samples. Copyright © 2005 John Wiley & Sons, Ltd.     

TOF‐SIMS studies of yttria‐stabilised zirconia

The surface of an as‐polished and an as‐sintered yttria‐stabilised zirconia pellet was analysed with XPS and TOF‐SIMS (depth profiling and imaging) in order to study the distribution of impurities. The polished sample was slightly contaminated with Na, K, Mg and Ca. The sintered sample showed a thin surface film of segregated species, especially Na, Si and Al. Below the surface film, it was found that the grain boundaries were filled with impurities. The chemical compositions of the as‐polished and as‐sintered surfaces are very different and the surface state should be considered when performing electrochemical measurements. Copyright © 2006 John Wiley & Sons, Ltd.     

Evaluation and comparison of layered titanate nanosheets using TOF‐SIMS and g‐ogram analysis

The evaluation of nanostructure is important to develop the highly controlled nanomaterials. In this study, two kinds of layered titanate nanosheets, which were produced by using hexylamine and laurylamine, respectively, as surfactants were investigated by Gentle Secondary Ion Mass Spectrometry Gentle‐SIMS (G‐SIMS) and g‐ogram, which is the latest Time‐of‐Flight Secondary Ion Mass Spectrometry (TOF‐SIMS) data analysis method for detecting more intact ions and obtaining the information on original chemical structures of samples precisely from complicated TOF‐SIMS spectra. As a result, molecular related ions of the surfactants were detected from each sample, and the structural information of samples was obtained. From both samples, surfactant molecular ions connected with hydrocarbon were detected as more intact ions rather than molecular ions of themselves. It was suggested that hydrophobic domains of their lamellar mesostructure are formed robustly by more than two surfactant molecules connected with each other linearly. After all, important information on the chemical structure of the layered titanate nanosheets, which would be difficult to be found by using typical structural analysis methods such as X‐ray diffraction and transmission electron microscopy, were obtained using G‐SIMS and g‐ogram. Therefore, it was shown that g‐ogram and G‐SIMS are helpful to evaluate the nanostructured materials. And it was also shown that g‐ogram is applicable to organic–inorganic materials which contain long hydrocarbon structures. Copyright © 2015 John Wiley & Sons, Ltd.     

A comparison of the static SIMS and G‐SIMS spectra of biodegradable homo‐polyesters

Static SIMS (SSIMS) is a surface analytical technique capable of providing molecular chemical information from solids. A major barrier to the wider take‐up of the technique is the complexity associated with the interpretation of SSIMS spectra. Quality of the interpretation depends on the expertise of analysts and making references to the limited mass spectral libraries. For many materials, there are no SSIMS library spectra. A new library‐independent method, G‐SIMS, is capable of facilitating the interpretation of SSIMS data. G‐SIMS spectra contain parent fragments, which are formed without substantial degradation or rearrangements, and highlight molecular fragments, which are directly related to the surface. In our study, G‐SIMS has been tested on medically relevant biodegradable polyester series, including poly (glycolic acid) (PGA), poly‐l‐(lactic acid) (PLA), poly‐β‐(hydroxybutyrate) (PHB) and poly‐ε‐(caprolactone) (PCL). The polyester series chosen here have closely related structures, which allow us to explore the capabilities of G‐SIMS. The G‐SIMS spectra have facilitated the identification of different polyesters by exhibiting mainly characteristic ions, representative of the polymers' molecular structures. The results also indicated that for the chosen polyester series, the larger the repeating monomer structures, the smaller the maximum number of repeat units were seen in the G‐SIMS spectra. The G‐SIMS spectra for the homologous polyester series have provided an insight into the fragmentation mechanisms as a function of repeating monomer molecular weights and structures. Copyright © 2008 John Wiley & Sons, Ltd.     

Linearity of the instrumental intensity scale in TOF‐SIMS—a VAMAS interlaboratory study

A VAMAS interlaboratory study involving 21 time‐of‐flight SIMS instruments from nine countries has been conducted to evaluate the linearity of the instrumental intensity scale and procedures for intensity correction. Analysts were supplied, by National Physical Laboratory (NPL), with a protocol for analysis (closely aligned with ISO 23830) together with a reference material of polytetrafluoroethylene (PTFE) tape. The primary ion beam current is varied to provide secondary ion intensities that span the linear to nonlinear regime. The natural carbon isotope ratios ¹²C_xF_y⁺/¹³C¹²C_x?1F_y⁺ for five peaks are used to evaluate the linearity, without a need to measure the ion beam current. A method is given for determining the linearity as a function of secondary ion intensity, with and without dead time correction. It is found that single ion counting statistics is closely obeyed, and the linearity achievable is generally excellent with careful application of dead time correction. Three quarters of instruments in the study achieved better than 95% linearity at a count rate of 0.8 measured counts per pulse, equivalent to 1.6 secondary ions impinging the detector per primary ion pulse. We discuss factors affecting linearity and the precise application of dead time correction and give guidance for practical analysis. This includes suboptimal detector efficiency, inhomogeneous intensities across the rastered area, inadequate charge compensation, and the choice of peak integration limits. The interlaboratory study shows that the method to determine linearity is generally applicable, robust and provides an excellent basis for the development of an ISO standard. © Crown copyright 2011. Reproduced with the permission of Her Majesty's Stationery Office. Published by John Wiley & Sons, Ltd.     

TOF‐SIMS characterization of an aluminovanadate oxide catalyst

Time‐of‐flight Secondary Ion Mass Spectrometry (TOF‐SIMS) has been employed to characterize the surface physical and chemical state of aluminovanadate oxide catalyst precursors (‘V? Al? O’) precipitated at different pH values in the range of 5.5…10. The reference oxide V₂O₅ has also been studied for comparison purposes. It is shown that the analysis of molecular ion emission yields valuable information on the surface elemental and phase composition. Increasing pH values while precipitating from aqueous precursor solutions are found to result in a monotonic variation of the surface composition, in a progressive hydroxylation of aluminium and vanadium and in an increasing dispersion of vanadium oxide species. SIMS data evaluated on the basis of Plog's valence model of molecular ion emission reveal reduced V⁴⁺ states, the fraction of which is dependent on the pH value. The SIMS results are supported by XPS data. The enhancement of the catalytic activity in oxidative propane dehydrogenation over V? Al? O prepared at high precipitation pH is in good correlation with the measured surface characteristics. Copyright © 2007 John Wiley & Sons, Ltd.     

Mapping Dicorynia guianensis Amsh. wood constituents by submicron resolution cluster‐TOF‐SIMS imaging

The preparation of tropical wood surface sections for time‐of‐flight secondary ion mass spectrometry imaging is described, and the use of delayed extraction of secondary ions and its interest for the analysis of vegetal surface are shown. The method has been applied to the study by time‐of‐flight secondary ion mass spectrometry imaging with a resolution of less than one micron of a tropical wood species, Dicorynia guianensis, which is one of the most exploited wood in French Guiana for its durable heartwood. The heartwood of this species exhibits an economical importance, but its production is not controlled in forestry. Results show an increase of tryptamine from the transition zone and a concomitant decrease of inorganic ions and starch fragment ions. These experiments lead to a better understanding of the heartwood formation and the origin of the natural durability of D. guianensis. Copyright © 2016 John Wiley & Sons, Ltd.     

Cluster TOF‐SIMS imaging of human skin remains: analysis of a South‐Andean mummy sample

A skin sample from a South‐Andean mummy dating back from the XI^th century was analyzed using time‐of‐flight secondary ion mass spectrometry imaging using cluster primary ion beams (cluster‐TOF‐SIMS). For the first time on a mummy, skin dermis and epidermis could be chemically differentiated using mass spectrometry imaging. Differences in amino‐acid composition between keratin and collagen, the two major proteins of skin tissue, could indeed be exploited. A surprising lipid composition of hypodermis was also revealed and seems to result from fatty acids damage by bacteria. Using cluster‐TOF‐SIMS imaging skills, traces of bio‐mineralization could be identified at the micrometer scale, especially formation of calcium phosphate at the skin surface. Mineral deposits at the surface were characterized using both scanning electron microscopy (SEM) in combination with energy‐dispersive X‐ray spectroscopy and mass spectrometry imaging. The stratigraphy of such a sample was revealed for the first time using this technique. More precise molecular maps were also recorded at higher spatial resolution, below 1 µm. This was achieved using a non‐bunched mode of the primary ion source, while keeping intact the mass resolution thanks to a delayed extraction of the secondary ions. Details from biological structure as can be seen on SEM images are observable on chemical maps at this sub‐micrometer scale. Thus, this work illustrates the interesting possibilities of chemical imaging by cluster‐TOF‐SIMS concerning ancient biological tissues. Copyright © 2012 John Wiley & Sons, Ltd.     

TOF‐SIMS matrix effects in mixed organic layers in Ar cluster ion depth profiles

Matrix effects are crucial for analyses using time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) in terms of quantitative analysis, depth profiling and imaging. It is often difficult to predict how co‐existing materials will influence each other before such analysis. However, matrix effects need to be curtailed in order to assume the appropriate amount of a target material in a sample. First, matrix effects on different types of organic mixed samples, including a sample composed of Irganox 1010 and Irganox 1098 (MMK sample) and another composed of Irganox 1010 and Fmoc‐pentafluoro‐L‐phenylalanine (MMF sample), were observed utilizing ToF‐SIMS and the dependence of the secondary ion polarity of the matrix effects on the same sample was evaluated. Next, the correction method for the ToF‐SIMS matrix effects proposed by Shard et al. was applied to a comparison of the positive secondary ion results to the negative ones. The matrix effects on the positive ion data in both samples were different from those on the negative ion data. The matrix effect correction method worked effectively on both the negative and positive depth profiles. Copyright © 2017 John Wiley & Sons, Ltd.     

Adsorption of genetically engineered proteins studied by time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS). Part A: data acquisition and principal component analysis (PCA)

Recent progress in the adaptation of combinatorial biology selection protocols to materials science has created a new class of polypeptides with specific affinity to inorganics. Here, we use one of the genetically engineered proteins, a gold binding protein (GBP‐1), to assess quantitatively its binding specificity to Au, Ag and Pd surfaces by using time‐of‐flight secondary ion mass spectroscopy (TOF‐SIMS). The GBP‐1, originally selected using cell‐surface display techniques, consisting of 14 amino acids with a sequence of MHGKTQATSGTIQS, was used in this study. Three‐repeat and single‐repeat forms of GBP‐1 were prepared. In earlier studies, GBP‐1 was shown to bind to Au particles and self‐assemble on flat Au surfaces. Through the fingerprint analysis of these specific peptides, their role in binding can be investigated in terms of their contribution to surface interaction possibly forming the right molecular architecture for binding. To achieve this purpose, a large‐sized data matrix produced by TOF‐SIMS must be properly treated for analysis. In Part A, we use principal component analysis (PCA) to visualize the spectral variations for a variety of adsorption conditions and suggest possible contribution of the specific types of amino acids (binding site) to the interactions. Copyright © 2007 John Wiley & Sons, Ltd.     

Adsorption of genetically engineered proteins studied by time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS). Part B: hierarchical cluster analysis (HCA)

In Part A, we adopted principal component analysis (PCA) for the analysis of TOF‐SIMS data to assess the binding specificity of GBP‐1 to metallic Au, Ag and Pd. Within a given set of data, PCA aids in the interpretation of the TOF‐SIMS spectra by capitalizing on the differences from one spectrum to another. In Part B, we introduce another multivariate statistical method called ‘hierarchical cluster analysis (HCA)’, where visualization of the similarity and difference in data is readily observed, from which a variety of adsorption conditions of GBP‐1 were characterized. Copyright © 2007 John Wiley & Sons, Ltd.     

Identification of a lipid‐related peak set to enhance the interpretation of TOF‐SIMS data from model and cellular membranes

Principal component analysis (PCA) of time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) data enables differentiating structurally similar molecules according to linear combinations of multiple peaks in their spectra. However, in order to use PCA to correctly identify variations in lipid composition between samples, the discrimination achieved must be based on chemical differences that are related to the lipid species, and not sample‐associated contamination. Here, we identify the positive‐ion TOF‐SIMS peaks that are related to phosphatidylcholine lipid headgroups and tail groups by PCA of spectra acquired from lipid isotopologs. We demonstrate that restricting PCA to a contaminant‐free lipid‐related peak set reduces the variability in the spectra acquired from lipid samples that is due to contaminants, which enhanced differentiating different lipid standards, but adversely affected the contrast in PC scores images of phase‐separated lipid membranes. We also show that PCA of a restricted data set consisting of the peaks related to lipids and amino acids increases the likelihood that the discrimination of TOF‐SIMS data acquired from intact cells is based on differences in the lipids and proteins on the cell surface, and not sample‐specific contamination without compromising sample discrimination. We expect that the lipid‐related peak database established herein will facilitate interpreting the TOF‐SIMS data and PCA results from studies of both model and cellular membranes, and enhance identifying the origins of the peaks that contribute to discriminating different types of cells. Copyright © 2011 John Wiley & Sons, Ltd.     

Peak‐fitting of high resolution ToF‐SIMS spectra: a preliminary study

Peak‐fitting has been performed on a series of peaks obtained by time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) analysis in order to assess whether information may be obtained from this procedure on the samples' characteristics. A variety of samples were examined including a range of treatments for aluminium leading to different surface roughnesses, polymer films with a range of polydispersities, molecular weight (MW) and thicknesses as well as aluminium samples with adsorbed adhesion promoters on the surface. Variation of peak‐fitting was assessed by varying the peak intensity, full width at half maximum (FWHM) and peak asymmetry. Although further studies are needed it is possible to say that the peak width increases with roughness whereas peak asymmetry seems to be related to oxide thickness. Polymer characteristics do not seem to influence the width whereas the peak asymmetry increases either versus MW or polydispersity. A possible assumption is that the peak asymmetry relates to the ion formation processes. Additional work with varying polymer films thickness indicates that both FWHM and peak asymmetry may be related to sample charging and this could be used for assessment of film thicknesses. Finally, peak‐fitting was used to obtain a more reliable peak area when peaks are too close in mass to use current methods. Copyright © 2009 John Wiley & Sons, Ltd.     

High mass and spatial resolution mass spectrometry imaging of Nicolas Poussin painting cross section by cluster TOF‐SIMS

Time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) imaging using cluster primary ion beams is used for the identification of the pigments in the painting of Rebecca and Eliezer at the Well by Nicolas Poussin. The combination of the high mass resolution of the technique with a sub‐micrometer spatial resolution offered by a delayed extraction of the secondary ions, together with the possibility to simultaneously identifying both minerals and organics, has proved to be the method of choice for the study of the stratigraphy of a paint cross section. The chemical compositions of small grains are shown with the help of a thorough processing of the data, with images of specific ions, mass spectra extracted from small regions of interest, and profiles drawn along the different painting layers. Copyright © 2016 John Wiley & Sons, Ltd.     

Differentiating calcium carbonate polymorphs by surface analysis techniques—an XPS and TOF‐SIMS study

Calcium carbonate has evoked interest owing to its use as a biomaterial, and for its potential in biomineralization. Three polymorphs of calcium carbonate, i.e. calcite, aragonite, and vaterite were synthesized. Three conventional bulk analysis techniques, Fourier transform infrared (FTIR), X‐ray diffraction (XRD), and SEM, were used to confirm the crystal phase of each polymorphic calcium carbonate. Two surface analysis techniques, X‐ray photoelectron spectroscopy (XPS) and time‐of‐flight secondary ion mass spectroscopy (TOF‐SIMS), were used to differentiate the surfaces of these three polymorphs of calcium carbonate. XPS results clearly demonstrate that the surfaces of these three polymorphs are different as seen in the Ca(2p) and O(1s) core‐level spectra. The different atomic arrangement in the crystal lattice, which provides for a different chemical environment, can explain this surface difference. Principal component analysis (PCA) was used to analyze the TOF‐SIMS data. Three polymorphs of calcium carbonate cluster into three different groups by PCA scores. This suggests that surface analysis techniques are as powerful as conventional bulk analysis to discriminate calcium carbonate polymorphs. Copyright © 2008 John Wiley & Sons, Ltd.     

Enhancement of the positive secondary ion yield during low‐energy,dual‐beam depth profiling of polytetrafluoroethylene with 1‐keV Cs+

This work documents the behaviour of the positive secondary ion yield of bulk polytetrafluoroethylene (PTFE) under dual‐beam depth profiling conditions employing 1 keV Ar⁺, Cs⁺ and SF₅⁺. A unique chemical interaction is observed in the form of a dramatic enhancement of the positive secondary ion yield when PTFE is dual‐beam profiled with 1 keV Cs⁺. The distinct absence of such an enhancement is noted for comparison on two non‐fluorinated polymers, polyethylene terephthalate (PET) and polydimethylsiloxane (PDMS). The bulk PTFE was probed using 15‐keV, ⁶⁹Ga⁺ primary ions in dual beam mode under static conditions; 1‐keV Ar⁺ (a non‐reactive, light, noble element), Cs⁺ (a heavier metallic ion known to form clusters) and SF₅⁺ (a polyatomic species) served as the sputter ion species. The total accumulated primary ion dose was of the order of 10¹⁵ ions/cm², which is well beyond the static limit. The enhancement of the positive secondary yield obtained when profiling with 1‐keV Cs⁺ far exceeds that obtained when SF₅⁺ is employed. An explanation of this apparent reactive ion effect in PTFE is offered in terms of polarisation of C? F bonds by Cs⁺ in the vicinity of the implantation site thereby predisposing them to facile scission. The formation of peculiar, periodic Cs_xF_y⁺ (where y = x ? 1) and Cs_xC_yF_z⁺ clusters that can extend to masses approaching 2000 amu are also observed. Such species may serve as useful fingerprints for fluorocarbons that can be initiated via pre‐dosing a sample with low‐energy Cs⁺ prior to static 15‐keV Ga⁺ analysis. Copyright © 2005 John Wiley & Sons, Ltd.