Surface topography effects on glow discharge depth profiling analysis

Glow discharge optical emission spectroscopy (GD‐OES) has been shown to be of immense value in elemental depth profiling of thin or thick films on conductive or non‐conductive substrates. For aluminium, GD‐OES has been employed to examine locations of markers and tracers in anodic films, thereby assisting understanding of transport phenomena. In order to investigate the influence of surface topography on depth profiling analysis, anodic aluminium oxide films of various thicknesses, with incorporated electrolyte species, were produced on superpure aluminium substrates of controlled roughnesses. The distributions of incorporated species in the films were subsequently probed. Surface topography modifications and consequent depth resolution degradation were examined during depth profiling analysis performed by GD‐OES. The results reveal that the sputtering process leads to the roughening or smoothing of the surface topography of the specimen for a ratio of the film thickness to the amplitude of the substrate texture less, or greater, than 1 respectively. As a consequence of the surface topography dependence of the ion bombardment, analysis of thin films over rough surfaces suffers from depth resolution limitations due to sputtering‐induced topography changes, thereby limiting quantification of the resultant spectra. Copyright © 2010 John Wiley & Sons, Ltd.     

A combined TEM and SKPFM investigation of the surface layers on rolled AA5050 aluminium alloy using ultra‐microtomy

This article studies the evolution of near‐surface morphology as a function of various thermo‐mechanical treatments along the fabrication line of rolled AA5050 aluminium alloy. Ultra‐microtomy has been used to prepare cross‐sectional thin foils for transmission electron microscopy (TEM) and proper surfaces for scanning Kelvin probe force microscopy (SKPFM) analysis. A slight increase in the Volta potential difference (between the inter‐metallics and the matrix) between the as‐cast surface and the surface obtained after the first hot‐mill pass, emphasized that the changes in surface micro‐structure, which in turn affect the corrosion and electrochemical properties of the finished product, had already occurred at that stage. The Volta potential difference during the subsequent hot‐mill pass remained relatively constant. As far as the near‐surface morphology was concerned, hot‐rolling resulted in the formation of a heavily deformed surface layer. Annealing of the hot‐rolled aluminium sheet resulted in partial re‐crystallization of the surface layer. Subsequent cold‐rolling re‐introduced deformation in the near‐surface region. Copyright © 2008 John Wiley & Sons, Ltd.     

Quantitative determination of carbon concentration profiles by GD‐OES for the study of decarburization in low‐carbon steels

In this study, the quantification of decarburization induced during the annealing process for the fabrication of electrical steels was carried out using glow discharge optical emission spectroscopy (GD‐OES). Different calibration methods, based on external and internal standard references, were examined to optimize the quantification of carbon concentration. Accurate calibration curves for carbon at low concentration ranges were achieved by the use of carbon intensity calibrated by the internal reference, i.e. iron intensity line. This methodology was found to be beneficial for long GD‐OES measurements, providing a better correction over changes in the overall emission intensity with the sputter time. The good depth resolution obtained by the GD‐OES technique enabled the identification of specific features in the steel microstructure related to carbide coarseness. Quantitative carbon concentration profiles were obtained by GD‐OES to evaluate the decarburization effect on the microstructure of low‐carbon steels considering different initial microstructures. The effect of the spatial distribution of carbides in these microstructures on the decarburization kinetics was also studied. Through quantitative determination of carbon elemental profiles by GD‐OES, information about the morphology of the cementite in the microstructure and its development in relation to decarburization was acquired. The depth of decarburization can accurately be determined. On the basis of the global results, GD‐OES thus emerged as being a fast and reliable technique for a better understanding of decarburization kinetics. Copyright © 2015 John Wiley & Sons, Ltd.     

Inter‐diffusion effects in as‐deposited Al/Ni polycrystalline multi‐layers

Al/Ni multi‐layers, deposited by magnetron sputtering at room temperature have been studied by complementary techniques; XPS, sputter depth profiling, electron‐induced X‐ray emission spectroscopy (XES) and X‐ray diffraction (XRD). XPS depth profile technique evidenced an atomic diffusion dominated by Ni atoms. Moreover, the Ni diffusion results in the formation of an amorphous phase with a stoichiometry close to the Al₃Ni aluminide. Copyright © 2008 John Wiley & Sons, Ltd.     

Rapid quantitative analysis of fayalite and silica formed during decarburization of electrical steel

Subscales on surfaces are affected by the temperature and oxidation potential during decarburization annealing of electrical steel containing 3 wt% silicon. Knowledge of the structural and chemical properties of the surface oxide layer subscales permits the control of high‐temperature oxidation processes in the electrical steel. In the present work, the oxide layers were characterized by transmission electron microscopy (TEM), Fourier transform infrared (FTIR) spectrometry, and glow discharge optical emission spectrometry (GD‐OES). The main oxide compounds formed within the subscales during decarburization annealing of the electrical steel were fayalite (Fe₂SiO₄) and silica (SiO₂). The fayalite and silica contents were quantitatively determined by wet analysis via the galvanostatic electrolysis method, and these oxide content measurements were compared with the fayalite content determined by FTIR spectrometry and the silica determined by GD‐OES. The results determined by rapid methods and wet analysis showed good agreement. The present findings show that FTIR spectrometry and GD‐OES measurements may be used for the rapid quantitative analysis of fayalite and silica in surface oxide layers during the manufacture of electrical steel. Copyright © 2011 John Wiley & Sons, Ltd.     

Formation and characterisation of NiAl‐Ti coating on nickel‐based superalloy B1900

Alumina‐former coatings have been known as the best surface engineering approach to combat high temperature corrosion in gas turbine industry. In this investigation, attempts have been made to obtain a titanium‐modified aluminide coating with improved protective properties. Modification has been achieved by introducing titanium in the coating composition by a two‐stage coating treatment; titanium coating and subsequent aluminising. The modified coatings were characterised and compared with simple aluminides by means of electron metallography, depth elemental profiling and x‐ray diffraction techniques. Experimental results indicated that pre‐titanising diffusion treatment is an effective route to modify chemical composition of simple aluminide coating. The final microstructure of the coating was β‐NiAl matrix with titanium‐bearing precipitates mainly distributed in near surface layers. The mechanism of the coating formation is discussed. Copyright © 2009 John Wiley & Sons, Ltd.     

The ubiquitous Beilby layer on aluminium surfaces

In 1996, it was found that the Beilby layer on rolled aluminium sheet could be imaged in the transmission electron microscope (TEM) on ultramicrotomed cross sections of the sheet surface. Following from this observation, we have examined Beilby layers on all types of aluminium surfaces that have been subject to high shear processing treatments such as rolling, grinding or machining. The layers are microcrystalline rather than amorphous, and they strongly influence properties like corrosion resistance and reflectance. Preferential precipitation in these deformed surface layers results in their electrochemical activation and it is responsible for the development of underfilm corrosion in most architectural and automotive alloys. More recently, it has been possible to directly image Beilby layers on ultramicrotomed stubs using the new generation of low kilovoltage high‐resolution scanning electron microscopes and to carry out high‐resolution TEM of sections cut from precisely located surface features. The paper presents an overview of all the recent investigations of high shear induced Beilby layers on aluminium alloys and discusses their control of surface properties. Copyright © 2010 John Wiley & Sons, Ltd.     

Summary of ISO/TC 201 standard: XV. ISO 20341:2003—Surface chemical analysis—secondary ion mass spectrometry—method for estimating depth resolution parameters with multiple delta‐layer reference materials

This International Standard specifies procedures for estimating three depth resolution parameters, via the leading‐edge decay length, the trailing‐edge decay length and Gaussian broadening, in SIMS depth profiling using multiple delta‐layer reference materials. This International Standard is not applicable to delta‐layers where the chemical and physical state of the near‐surface region, modified by the incident primary ions, is not in the steady state. Copyright © 2005 John Wiley & Sons, Ltd.     

Development of B‐doped Si multiple delta‐layer reference materials for SIMS profiling

B‐doped Si multiple delta‐layers (MDL) were developed as certified reference materials (CRM) for secondary ion mass spectrometry (SIMS) depth profiling analysis. Two CRMs with different delta‐layer spacing were grown by ion beam sputter deposition (IBSD). The nominal spacing of the MDL for shallow junction analysis is 10 nm and that for high energy SIMS is 50 nm. The total thickness of the film was certified by high resolution transmission electron microscopy (HR‐TEM). The B‐doped Si MDLs can be used to evaluate SIMS depth resolution and to calibrate the depth scale. A consistency check of the calibration of stylus profilometers for measurement of sputter depth is another possible application. The crater depths measured by a stylus profilometer showed a good linear relationship with the thickness measured from SIMS profiling using the calibrated film thickness for depth scale calibration. The sputtering rate of the amorphous Si thin film grown by sputter deposition was found to be the same as that of the crystalline Si substrate, which means that the sputtering rate measured with these CRMs can be applied to a real analysis of crystalline Si. Copyright © 2005 John Wiley & Sons, Ltd.     

TOF‐SIMS studies of yttria‐stabilised zirconia

The surface of an as‐polished and an as‐sintered yttria‐stabilised zirconia pellet was analysed with XPS and TOF‐SIMS (depth profiling and imaging) in order to study the distribution of impurities. The polished sample was slightly contaminated with Na, K, Mg and Ca. The sintered sample showed a thin surface film of segregated species, especially Na, Si and Al. Below the surface film, it was found that the grain boundaries were filled with impurities. The chemical compositions of the as‐polished and as‐sintered surfaces are very different and the surface state should be considered when performing electrochemical measurements. Copyright © 2006 John Wiley & Sons, Ltd.     

Detection of nanoscale η‐MgZn2 phase dissolution from an Al‐Zn‐Mg‐Cu alloy by electrochemical microtransients

In this article we demonstrate how the dissolution of nanosize intermetallic particles present in Al alloys can be detected using microelectrochemical techniques. The local electrochemical properties of a high‐strength Al‐Zn‐Mg‐Cu alloy, which contains nanoscale η‐MgZn₂ phases, were investigated with a microcapillary cell. At the open‐circuit potential (OCP) with the sample surface in the range of 1000 µm², potential fluctuations (microtransients) can be observed. Under polarization of such small areas, current transients are detected in the passive range of the alloy. An estimation of the size of dissolution events from the charge passed during the current transient leads to the conclusion that the current transients could stem from the dissolution of η‐phase particles, with diameters in the order of 100 nm. This size scale corresponds well with the size of the grain‐boundary MgZn₂. Transmission electron microscopy (TEM) and high‐resolution SEM images provide further insights for possible mechanisms leading either to potential or to current microtransients. Copyright © 2008 John Wiley & Sons, Ltd.     

Organic–inorganic hybrid of anchored dicationic ionic liquid on Al‐MCM‐41‐phosphovanadomolybdate toward selective oxidation of benzene to phenol

A phosphovanadomolybdate hybridized with an anchored dicationic ionic liquid on Al‐MCM‐41 was prepared through the anion exchange and characterized by ¹H and ¹³C NMR, FTIR, UV–Vis, XRD, XPS, TGA, TEM, FESEM, ICP‐OES and BET techniques. The obtained data demonstrated that the composite is a porous material with the high surface area and also having a large pore volume which are 405 m² g^?1 and 0.616 cm³ g^?1 respectively. The prepared composite has shown an acceptable catalytic activity for converting benzene selectively to phenol with hydrogen peroxide as eco‐friendly oxidant. Under the optimized reaction conditions, the hybrid catalyst resulted in phenol yield of 14.8% with 100% selectivity and a TOF value of 20.0 h^?1. The catalyst also revealed a desired recovery and reusability. The efficient performance of the composite is related to the textural and polyoxometalate properties.     

Depth profiling in surface regions of oxidized metal alloys by low energy PIXE

As a nondestructive technique for depth profiling of elements the PIXE-method was applied to determine the concentration profile of elements in the near surface of oxidized metal alloys. The outer region of about 1 m was investigated using low energy protons for X-ray excitation. A set of X-ray yield measurements was carried out at proton energies of 150 to 300 keV. The unfolding of the X-ray yields was performed by calculation of proton energy loss, X-ray production cross section and X-ray attenuation.     

Characterization of solid standards prepared by freeze‐drying

Solid standards prepared by freeze‐drying consistently showed a high degree of homogeneity. The freezing process, completed in fractions of a second, preserves the original homogeneous distribution of the dopants, and the subsequent sublimation step would minimize any disturbance. Compared to those prepared by conventional methods such as blending and spiking, freeze‐dried standards exhibited superior lateral distribution and better uniform depth distribution. There is, however, a concentration constraint for achieving homogeneity. At 5% doping, segregation was observed in both lateral and depth distribution. Many tungsten standards doped with 10–28 elements ranging from 10 to 200 ppm were successfully prepared and used as controls for a number of analytical techniques including glow discharge mass spectrometry (GDMS) and d.c.‐arc optical emission spectroscopy (OES). Copyright © 2009 John Wiley & Sons, Ltd.     

Depth profiling of light elements in PAMBE‐grown GaN and helium‐implanted titanium with heavy ion time‐of‐flight elastic recoil detection

The heavy ion time‐of‐flight elastic recoil detection analysis (HI‐ERDA) technique was used to investigate the possibility of measuring near‐surface elemental depth profiles of light and mid‐Z elements in thin films of plasma‐assisted molecular beam epitaxy (PAMBE)‐grown GaN and helium‐implanted titanium. The great advantage of HI‐ERDA is the ability to measure mass‐separated elemental depth profiles simultaneously. However for some materials it is not certain whether HI‐ERDA can be used successfully because significant sputtering or other beam‐induced damage may occur. The damage to the surfaces by a 77 MeV iodine beam was assessed using RBS, AFM and profilometry. The results show that for thin PAMBE‐grown polycrystalline GaN films and for titanium that has been heavily implanted with helium a significant modification of the near‐surface region is caused by the probing heavy ion beam. For the PAMBE‐grown GaN films the most significant loss trend is observed for nitrogen. Surprisingly this was not accompanied by a change in surface topology. In contrast, an almost complete removal of the heavily helium‐implanted surface layer was measured for the titanium specimens. The investigation shows that reference measurements with additional techniques such as RBS, AFM and profilometry have to be performed to ascertain sample integrity before HI‐ERDA data can be used. Copyright © 2004 John Wiley & Sons, Ltd.     

Critical evaluation of the potential of radiofrequency pulsed glow discharge–time-of-flight mass spectrometry for depth-profile analysis of innovative materials

The combination of radiofrequency pulsed glow discharge (RF-PGD) analytical plasmas with time-of-flight mass spectrometry (TOFMS) has promoted the applicability of this ion source to direct analysis of innovative materials. In this sense, this emerging technique enables multi-elemental depth profiling with high depth resolution and sensitivity, and simultaneous production of elemental, structural, and molecular information. The analytical potential and trends of this technique are critically presented, including comparison with other complementary and well-established techniques (e.g. SIMS, GD–OES, etc.). An overview of recent applications of RF-PGD–TOFMS is given, including analysis of nano-structured materials, coated-glasses, photovoltaic materials, and polymer coatings     

Synthesis of Spiro‐dihydrofuran in the Presence of a Novel and Reusable Nanocatalyst Cu (II)‐Glycerol/MCM‐41

The use of supported Cu complex on mesoporous as a novel, efficient, heterogeneous, reusable and green catalyst for the synthesis of spiro‐dihydrofuran derivatives is reported. This methodology is effective for the reaction of dimedone with a wide range of aldehyde in the presence of BrCN and triethylamine. The structure of catalyst was characterized by different techniques such as EDX, SEM, TGA, ICP‐OES, XRD, TEM, FT‐IR, and BET. The recycled nanocatalyst was used at least five times with no significant loss of its activity.     

The Cross‐Sectional Structure of Vanadium Oxide Nanotubes Studied by Transmission Electron Microscopy and Electron Spectroscopic Imaging

Vanadium oxide nanotubes (VO_x‐NTs) are easily accessible in pure form from vanadium(V) alkoxides and amines by a sol‐gel reaction and a subsequent hydrothermal treatment. The wall structure of VO_x‐NTs containing hexadecylamine or dodecylamine as the structure‐directing template has been characterised by transmission electron microscopy (TEM). A standard method for preparing TEM specimens was modified in order to investigate the cross‐sectional structure of the tubes. The elemental distribution in the layered structure inside the tube walls has been visualised by electron spectroscopic imaging: vanadium oxide builds up the layers that appear with dark contrast in the TEM images while carbon, i. e., the organic template, is present in between. The bent VO_x layers inside the tube walls are preferentially scrolls rather than concentric cylinders. Moreover, some tubes are formed by a combination of both types. The layer structure inside the tube walls is frequently disordered, and several types of defects appear.     

Surface analytical investigation of the electrochemical and corrosion behaviour of nanocrystalline FeAl8

From the higher fraction of grain boundaries in nanocrystalline substances a different corrosion behaviour in comparison to the conventional polycrystalline material can be expected, which may be utilised for the development of new corrosion resistant alloys. Therefore, the oxidation behaviour of these two different crystallisation states of FeAl8 was compared by means of electrochemical and surface analytical experiments. The oxide films formed after electrochemical passivation were investigated by Auger Electron Spectroscopy. The application of inelastic peak shape analysis by the method of Tougaard showed, that for both materials the oxide layer may be described by a model of a (below the contamination) buried layer with a thickness of only a few nanometers depending on the preparation conditions. Factor Analysis was applied for the evaluation of the differentiated low energy Auger electron spectra (20–100 eV) as a function of depth profiling sputtering time. For both, the nanocrystalline and the polycrystalline material, the inner part of the oxide layer was enriched in Al, whereas the very outer part (surface region) was enriched in Fe. No differences concerning the sputtering time for removal of the oxide layers were found for the two alloys.