Measurement of modal damping by electronic speckle shearing interferometry

A time-average electronic speckle shearing interferometer (ESSI) has been used for modal damping measurement. This is effected by a new fringe enhancement technique. The damping factor of a cantilever measured by using this technique agrees well with the value measured by using the accelerometer method. The study shows that time-average speckle interferometry can be used as a convenient tool for modal damping measurement.     

Applications of electronic speckle interferometry (ESI) techniques for spacecraft structural components

Laser-based electronic speckle interferometry (ESI) techniques, viz., electronic speckle pattern interferometry (ESPI) and electronic speckle shearographic interferometry (ESSI) are used for testing of spacecraft structural components. The combined ESPI and ESSI system developed in house was successfully used for the non-destructive evaluation (NDE) of honeycomb sandwich panels and propellant tanks of Indian Space Research Organization (ISRO). Debonds between face sheet and the honeycomb core were identified using (i) thermal and (ii) dual vacuum stressing methods. On-line NDE of the propellant tanks under internal pressure loading for identification of the minute cracks and thickness reduction areas were successfully implemented by ESI.     

One-wavelength in-plane rotation analysis in electronic speckle pattern interferometry

The analysis of in-plane rigid-body rotations requires phase-shifting methods to determine the direction of rotation in conventional electronic speckle pattern interferometry (ESPI). The phase-shifting procedure makes the real-time measurements impossible. A quasi-real-time method is published recently, where the usual symmetric illumination is combined with a wavelength change before the second exposure. The present paper proposes a device sparing an alternative to this. The symmetric illumination is retained but the wavelength change is replaced by simple illumination direction changes.     

Measurement of in-plane motions and rotations using a simple electronic speckle pattern interferometer

We describe the construction and operation of a simple electronic speckle pattern interferometer which is sensitive to in-plane motions and rotations. The interferometer is extremely simple and easy to use. It uses a commercial digital still camera for image acquisition, and a personal computer for image storage and analysis. The interferometer was used to measure very small in-plane rotations of a rough surface, and the results were found to be in good agreement with the expected values. We propose to use this system as an instrument for the measurement of small-angle rotations.     

用于多参数同时测量的散斑干涉仪

本文描述了一种新的散斑干涉仪,它可以同时对表面应变物体的面内位移、离面位移、位移梯度和莫尔曲率进行测量;由于利用了取向滤波方法,在滤波系统输出平面同时得到了与这些参数对应的散斑条纹.还利用散斑空间运动规律较好地解释了散斑干涉与散斑剪切干涉之间的关系.     

Noise reduction in electronic speckle pattern interferometry fringes by merging orthogonally polarised speckle fields

The noise in sawtooth fringes generated by electronic speckle pattern interferometry (ESPI) is investigated. When deformations of depolarising objects are studied, the scattered object light can be decomposed into two orthogonal linearly polarised speckle patterns which are partially decorrelated. Their correlation coefficient decreases with increasing depolarisation coefficient of the object. By suitable merging of the phase distributions of these two speckle fields on the basis of a modulation depth analysis, the rms phase error in the ESPI sawtooth fringes can be reduced significantly.     

Construction and operation of a simple electronic speckle pattern interferometer and its use in measuring microscopic deformations

The construction and operation of a simple electronic speckle pattern interferometer (ESPI) is described. The underlying theory behind the operation of the interferometer, which is sensitive to out-of-plane displacements, is given. The interferometer uses a commercial digital still camera for image acquisition and a personal computer for image storage and analysis. The interferometer was used to measure microscopic deformations of a steel plate caused by small loads. The results were found to be in good agreement with the predictions of the elastic theory. Various possible applications of the interferometer are mentioned.     

剪切散斑干涉术的统计分析

本文用统计光学方法分析了剪切散斑图的成象过程;散斑图的频谱分布以及全场滤波干涉条纹的形成.发现剪切散斑干涉条纹不仅与三维位移微分有关,而且与面内位移量有关.在此基础上又讨论了影响干涉条纹质量的有关因素,并作了实验验证.     

Improved evaluation of electronic speckle pattern interferograms by photogrammetric image analysis

Electronic speckle pattern interferometry (ESPI) is a well-established tool for non-destructive testing. It allows the quantitative determination of surface deformations and micro-movements with a sub-micrometer resolution. In the case of objects which are extended in depth, however, the evaluation and interpretation of the resulting correlation fringe patterns can be affected by perspective image distortions as well as by a varying image size. In this paper a method for combination of ESPI with a photogrammetric 3D coordinate measurement is presented. In this way, interferogram data are precisely allocated in 3D-space. Furthermore, it is possible to take into account a spatially varying sensitivity vector. The utilizability of the method is demonstrated by a deformation measurement on a stone sculpture.     

光源编码的白光散斑剪切干涉计量术

本文提出了一种用非相干光源照明进行剪切干涉计量的方法—光源编码的白光散斑剪切干涉计量术.它采用光栅对光源进行编码以提高空间相干性,使物体的两个剪切像的波面部分相干叠加,以实现剪切干涉.     

Measurement of the off-plane displacement of carbon steel corrosion with twin-object-beam electronic speckle interferometry

In this paper, twin-object-beam electronic speckle interferometry is used to study the longitudinal corrosion of carbon steel. The displacement expression of this technique is deduced and optical fibers are used to reduce the influence of the optical system and improve the quality of speckle pattern. Twin-object-beam electronic speckle interferometry cannot only quantitatively cipher out off-plane displacement as a result of corrosion, but also estimate the change of corrosion speed.     

用电子散斑干涉法测量材料热膨胀系数

 利用双光束电子散斑干涉法（ESPI）对试件受热变形进行了实时观测，针对一次实验过程中得到的图片较多（300～500幅）的特点，在图像处理时摒弃了以往的手动识别等位移线的办法，用MATLAB语言编写了批处理程序，能够在采集的大量散斑图片中自动快速准确地标定等位移线，得到相应的位移和应变，并结合实时测量的温度值，获得了45钢和LY12铝合金在不同温升率下的热膨胀系数及其随温度的变化。实验结果表明，在涉及的温升率范围内，温升率的改变对材料热膨胀系数的影响不明显，材料的热膨胀系数随温度的升高略有上升。     

Wavelet analysis of digital shearing speckle patterns with a temporal carrier

Shearography is an optical technique allows direct measurement of deflection derivatives. This paper presents a novel temporal phase analysis technique based on wavelet transform when shearography is applied to measure a continuously deforming object. A series of shearing speckle patterns is captured by a high-speed camera during the deformation. To avoid the phase ambiguity problem, a temporal carrier is generated by a piezoelectrical transducer (PZT) stage in one beam of the modified Michelson interferometer. The intensity variation of each pixel on recorded images is then analyzed along time axis by a robust mathematical tool - complex Morlet wavelet transform. After the temporal carrier is removed, the absolute phase change representing the first-order derivative of the continuous deformation is obtained without the need of temporal or spatial phase unwrapping process. The results obtained by wavelet transform are compared with those from temporal Fourier transform.     

Sound field monitoring by tomographic electronic speckle pattern interferometry

Time-averaging electronic speckle pattern interferometry (ESPI) allows to record the phase modulation of light that has propagated through a sound field. When such data are collected from different projection directions the three-dimensional spatial distribution of amplitude and phase of the sound are obtained by tomographic back projection. The performance of such a setup increases with the number of projection directions, the number of effective resolution elements in the detector, and the number of recordings taken in averaging. These efforts, however, compete with the need for acceptable recording and processing times. Recent improvements in time-averaging ESPI enable even demanding applications in sound field monitoring. This is demonstrated in the design of a 38.5 kHz ultrasound source composed of a large number of individual piezoelectric transducer elements and intended to generate highly directive audio sound by nonlinear mixing in air (parametric array). The success of this method relies essentially on a non-intrusive control of the spatial homogeneity of the ultrasound field. Tomographic ESPI data have guided in a delicate alignment of the transducer elements yielding the expected narrowing of the angular radiation of the audio sound.     

A microprism array as shearing device for speckle shearing interferometry

In most speckle shearing interferometers image shearing is performed by means of a Michelson interferometer or by means of a wedge prism covering half of the aperture of the camera objective. We present a speckle shearing interferometer which utilizes a microprism array for this purpose. It is placed between the test specimen and the camera. In comparision with a wedge prism it exhibits some advantages: it needs no exact alignment, it works with any camera lens, the shearing distance and direction of shearing can be easily changed by changing position (resp. angular orientation) of the element. Phase stepping for computer evaluation of the speckle shearing interferograms is performed by the translation of the shearing element. A special translation stage was developed. Experimental results are presented. The interferometer is suited for microcomponent and microsystem testing.     

载频调制大剪切电子散斑干涉系统

大剪切电子散斑干涉技术不需要引入参考光，具有条纹质量好等特点。提出将干涉场的载频调制技术引入到大剪切电子散斑干涉中，可形成具有载频调制功能的新的电子散斑干涉系统。该系统具有对测量环境的隔振振动要求低，能方便定量求解物体的变形场等优点。首先讨论大剪切载频的调制机理，然后利用中心加载、周边固定的圆盘进行典型实验，设计了可用计算机控制且可对参考物进行精确偏转的步进电机系统，进而实现了对电子散斑干涉场的自动控制调制。最后，利用傅里叶变换法对调制条纹进行解调，解调出变形场的相位，并通过相位与位移的转换计算，得到精确的物体变形场。实验结果证明，该系统能够调制电子散斑干涉场，求解物体的位移场。     

Full field and microregion deformation measurement of thin films using electronic speckle pattern interferometry and array microindentation marker method

Thin films now are widely used in micro devices and structures, such as MEMS, electronic packaging, micro sensors, and so on. Their performances highly affect the reliability of the devices. Therefore, it is important to investigate the deformation and the failure mechanism of thin films. In this paper, we present two experimental methods to measure the mechanical properties of thin films. In the first method, a double-field-of-view electronic speckle pattern interferometry system (ESPI) and an integrated deformation and load measurement system are employed, which allows in situ and real-time measurements of full-field deformations of the thin films and microforces under uniaxial tensile test. In the second method, the array microindentation markers were indented on the surface of the thin film using a nanoindenter and the microregion deformations of the tested thin films were measured. In the proposed methods, the tested thin films can be made of metals, oxide ceramics, and multi-layer composites of thickness from several tens micrometers to less than a micron, and the tensile loads from 88 μN to 15 N for the first method or up to 100 N to the second one. The underlying principle of the methods and the experimental set-ups are presented. The deformations of Au and Au/Cr multi-layer films, and the pure Ni films are measured. The performance of the methods and the testing systems are also discussed.     

An in-plane insensitive multiaperture speckle shear interferometer for slope measurement

A modified two-aperture speckle shear interferometer that eliminates the contribution of the in-plane component and its derivative to the phase change, and yields a fringe pattern corresponding to the first-order partial derivatives of the out-of-plane displacement component, is reported in this note. In this method, two laterally sheared object points are viewed axially. The wave fields from these points are independently combined at the image plane of the imaging system.     

The design of a non-cube beam-splitter used for electronic speckle pattern interferometry

A non-cube beam-splitter (NCBS) is proposed, by which an incident beam can be separated largely in a direction and then the lights from the test object and the lights from a reference surface placed adjacently to the test object can be combined to construct a simple electronic speckle pattern interferometry (ESPI) system. Two mainly useful quantitative ways, to calculate the phase change of the test object, the phase-shift and the fringe carrier method with Fourier transform, can be achieved in the ESPI system with the NCBS. Experiments with phase-shifting and fringe carrier method are completed. The experimental results show that the monolithic design of the proposed NCBS is effective in ESPI measurement and immunity to vibrations.