一种估计半导体激光器1/f噪声参数的新方法

对含白噪声的1/f分形信号小波变换系数的方差随尺度变化的关系进行适当的变换,提出了一种基于最小二乘法的估计半导体激光器1/f噪声参数的新方法.实验表明,该方法可以有效地提取出淹没在白噪声中的激光器1/f噪声,而且估计出的噪声信号的功率谱与对比仪器的测量结果有较好的一致性. 关键词： 半导体激光器 f噪声')" href="#">1/f噪声 参数估计 小波分析     

金属氧化物半导体场效应管热载流子退化的1/fγ噪声相关性研究

研究了金属氧化物半导体(MOS)器件在高、中、低三种栅压应力下的热载流子退化效应及其1/f^γ噪声特性.基于Si/SiO₂界面缺陷氧化层陷阱和界面陷阱的形成理论,结合MOS器件1/f噪声产生机制,并用双声子发射模型模拟了栅氧化层缺陷波函数与器件沟道自由载流子波函数及其相互作用产生能级跃迁、交换载流子的具体过程.建立了热载流子效应、材料缺陷与电参量、噪声之间的统一物理模型.还提出了用噪声参数Sf ^{关键词： 金属氧化物半导体场效应管 热载流子 fγ噪声')" href="#">1/fγ噪声}     

一种估计半导体激光器1/f噪声参数的新方法

对含白噪声的1/f分形信号小波变换系数的方差随尺度变化的关系进行适当的变换,提出了一种基于最小二乘法的估计半导体激光器1/f噪声参数的新方法.实验表明,该方法可以有效地提取出淹没在白噪声中的激光器1/f噪声,而且估计出的噪声信号的功率谱与对比仪器的测量结果有较好的一致性.     

基于辐照前1/f噪声的金属-氧化物-半导体场效应晶体管辐照退化模型

基于金属-氧化物-半导体场效应晶体管(MOSFET)噪声的载流子数涨落和迁移率涨落理论,建立了MOSFET辐照前1/f噪声参量与辐照后分别由氧化层陷阱和界面陷阱诱使阈值电压漂移之间的定量数学模型,并通过实验予以验证.研究结果表明,辐照诱生的氧化层陷阱通过俘获和发射过程与沟道交换载流子,在引起载流子数涨落的同时也通过库仑散射导致沟道迁移率的涨落,因此辐照前的1/f噪声幅值正比于辐照诱生的氧化层陷阱数.利用该模型对MOSFET辐照前1/f噪声与辐照退化的相关性从理论上 关键词： f噪声')" href="#">1/f噪声 辐照 金属-氧化物-半导体场效应晶体管 陷阱     

石墨片作辅助热沉的高功率半导体激光器热传导特性

为使边发射高功率单管半导体激光器有源区温度降低,增加封装结构的散热性能,降低器件封装成本,提出一种采用高热导率的石墨片作为辅助热沉的高功率半导体激光器封装结构。利用有限元分析研究了采用石墨片作辅助热沉后,封装器件的工作热阻更低,散热效果更好。研究分析过渡热沉铜钨合金与辅助热沉石墨的宽度尺寸变化对半导体激光器有源区温度的影响。新型封装结构与使用铜钨合金作为过渡热沉的传统结构相比,有源区结温降低4.5 K,热阻降低0.45 K/W。通过计算可知,激光器的最大输出功率为20.6 W。在研究结果的指导下,确定铜钨合金与石墨的结构尺寸,以达到最好的散热效果。     

60Co γ-射线辐照对肖特基二极管1/f噪声的影响

在肖特基二极管(Schottky barrier diode,SBD)辐照损伤机理和总剂量效应分析的基础上,利用1/f噪声的迁移率涨落和载流子数涨落模型,深入研究辐照损伤对器件1/f噪声的影响. 研究结果表明,辐照诱生新的界面态,改变界面态密度分布,进而调制了肖特基势垒高度,增大表面复合速度是引起器件性能退化主要原因,也是1/f噪声剧烈增加的主要原因. 正因为如此,噪声与器件退化存在相关性,即噪声拟合参数B越大,偏离标准值越多,器件可靠性越差,抗辐照 关键词： 肖特基二极管 f噪声')" href="#">1/f噪声 60Co γ射线')" href="#">⁶⁰Co γ射线 界面态     

存在外部光反馈的半导体激光器的相位噪声

本文在理论上研究了由于外部光反馈引起的半导体激光器的相位噪声.理论分析是通过引入一个反馈耦合率K和线性化速率方程,导出了半导体激光器相位噪声功率谱密度的表达式.这表明相位噪声功率谱密度随外腔长度而周期性地漂移,且功率谱密度的峰值随外部反馈耦合率而发生很大的变化.     

InGaN/GaN多量子阱结构发光二极管发光机理转变的低频电流噪声表征

本文对InGaN/GaN多量子阱结构发光二极管开启后的电流噪声进行了测试, 结合低频电流噪声的特点和载流子之间的复合机理, 研究了低频电流噪声功率谱密度与发光二极管发光转变机理之间的关系. 结论表明, 当电流从0.1 mA到10 mA逐渐增大的过程中, InGaN/GaN发光二极管的电流噪声行为从产生-复合噪声逐渐接近于低频1/f噪声, 载流子的复合机理从非辐射复合过渡为电子与空穴之间载流子数的辐射复合, 并具有标准1/f噪声的趋势, 此时多量子阱中的电子和空穴之间的复合趋向于稳定. 本文的结论提供了一种表征InGaN/GaN多量子阱发光二极管发光机理转变的有效方法, 为进一步研究发光二极管中载流子的复合机理、优化和设计发光二极管、提高其发光量子效率提供理论依据.     

新型宽温区高热稳定性微波功率SiGe 异质结双极晶体管

宽温区大电流下的热不稳定性严重制约着功率SiGe 异质结双极晶体管 (HBT) 在射频和微波电路中的应用.为改善器件的热不稳定性, 本文利用SILVACO TCAD建立的多指功率SiGe HBT模型, 分析了器件纵向结构中基区Ge组分分布对微波功率SiGe HBT电学特性和热学特性的影响. 研究表明, 对于基区Ge组分为阶梯分布的HBT, 由于Ge组分缓变引入了少子加速电场, 使它与均匀基区Ge组分HBT相比, 具有更高的特征频率f_T, 且电流增益β和f_T随温度变化变弱, 这有利于防止器件在宽温区工作时电学特性的漂移.同时, 器件整体温度有所降低, 但器件各指温度分布均匀性较差.考虑多指HBT各发射极指散热能力存在差异, 在器件纵向结构设计为基区Ge组分阶梯分布的同时, 对其横向版图进行发射极指间距渐变结构设计, 用于改善器件各指温度分布的均匀性, 进而提高HBT的热稳定性.结果表明, 与基区Ge组分为均匀分布的等发射极指间距结构HBT相比, 新器件各指温度分布均匀性明显改善, f_T保持了较高的值, 且β和f_T 随温度变化不敏感, 热不稳定性得到显著改善, 显示了新器件在宽温区大电流下工作的优越性. 关键词： SiGe 异质结双极晶体管 Ge组分分布 发射极指间距渐变技术 热稳定性     

半导体激光器热弛豫时间测试技术研究

利用脉冲工作状态下半导体激光器激射光谱随结温升高发生红移的原理,用Boxcar扫描在一定波长下的半导体激光器光功率随脉冲时间的变化信号,测得其时间分辨光谱;根据对应的峰值光功率出现时刻随波长变化的曲线,计算得到热弛豫时间参量值.利用此方法对一种半导体激光器进行了测试,得到其热弛豫时间为1.2 ms.     

1/f Noise in dye-sensitized solar cells and NIR photon detectors

All electronic devices are plagued with 1/f noise originating from many causes. The most important factors contributing to 1/f noise in a semiconductor is believed to be recombination of carriers and their trapping at defects and impurity sites. Adsorption of moisture and electron acceptor molecules enhances the intensity of 1/f noise. Amazingly, some molecular species that strongly chelate to the semiconductor surface, suppress 1/f noise owing to passivation of the recombination sites. Thus in addition to sensitization, the dye adsorbed on the nanocrystallites plays a key role in mitigation of recombinations. For this reason dye-sensitized heterojunctions could also find application as low noise NIR photon detectors. Experiments conducted with oxide semiconductors (TiO₂, ZnO, SnO₂) indicate that the mode of binding of dyes at specific sites determines the extent to which the recombination and 1/f noise are suppressed. The transport of electrons in a nanocrystalline matrix is diffusive with a diffusion coefficient D depending on the trapping and detrapping processes. Thus passivation of trapping sites by the adsorbed dye is expected to increase the response time which can be expressed as τ  L²/D, where L = thickness of the nanocrystalline film. Measurement techniques and construction of a dye-sensitized NIR photon detector will be discussed.     

Noise behavior of amorphous GexSi1−xOy for microbolometer applications

High resistivity sputtered a-Ge_xSi_1−xO_y compound was investigated for application to microbolometer fabrication for thermal imaging. Noise behavior of the fabricated bolometers was measured, showing no evidence of random telegraph switching (RTS) noise. 1/f noise was measured at several measuring currents, resulting in a 1/f noise factor of 2.9 × 10⁻¹¹ that can be used for further design and modeling.     

Effect of stripe width on junction temperature of stripe-geometry semiconductor laser diodes

When a laser diode (LD) is operated at high current densities, the junction temperature can rise significantly above the heat sink temperature. Generally, rise in junction temperature is a direct consequence of inability of different layers in a laser diode to dissipate heat efficiently due to finite thermal resistance. Usually, thermal resistance increases with a reduction in stripe width. Hence, the issue of thermal management becomes very important in modern days narrow stripe-geometry lasers. In this paper, the effect of stripe width on the junction temperature of a stripe-geometry semiconductor LD is analyzed by originating different heat sources. This has been accomplished using a simple technique for the measurement of junction temperature of a LD.     

Noise characteristics in low-impedance NiFe/Al2O3/NiFe tunnel junctions

We have studied the low-frequency voltage noise in micron-scale magnetic tunnel junctions. Random telegraph noise (RTN) dominates over 1/f noise in the switching region of magnetic hysteresis loops, suggesting that RTN comes mostly from local magnetization fluctuations. The temperature dependence of the 1/f noise and the size of the magnetic fluctuators responsible for the RTN are discussed.     

1/f-type fluctuation of electron transmission in one-dimensional disordered systems

A universal feature of 1/f-type fluctuation is numerically observed in the system-size n dependence of the transmission amplitude t_n in various one-dimensional disordered systems. The power spectrum P(f) of the transmission coefficient T(n)=|t_n|² exhibits the power law of 1/f², irrespective to the type of disorder of the system whether it is of short-range or of long-range correlation. That of the phase θ_t(n) of t_n also does the universal power law of 1/f^1.4.     

10 W级主控振荡放大半导体激光芯片封装实验研究

结温升高是影响主控振荡放大(MOPA)半导体激光芯片输出功率的重要因素,为解决MOPA芯片的多电极封装和高效散热问题,提出了一种正装和热扩散辅助次热沉相结合的封装结构。建立了该封装结构的3D热模型,对比研究了倒装封装结构、正装无辅助次热沉结构与正装有辅助次热沉结构对MOPA半导体激光器结温的影响。计算结果表明,采用正装有辅助次热沉结构与倒装封装结构散热性能接近,且显著优于正装无辅助次热沉结构,结温降低幅度最高可达40%。另外,采用正装有辅助次热沉封装结构的MOPA半导体激光芯片在连续工作条件下输出功率为10.5 W,谱宽可实现半高全宽小于0.1 nm,中心波长随电流的变化约14 pm/A,实现了10 W级MOPA芯片的封装,验证了该封装结构的有效性。     

Current-influenced voltage noise in bulk polycrystalline high-Tc superconductors

The 1/f voltage noise in bulk polycrystalline high-temperature superconductors (HTSC) under bias current and magnetic field has its origin in the noise current-dependence of the grain boundary junctions (GBJs), due in turn to the correlated effects of junction critical current and normal resistance fluctuations. The analogy between the results obtained by varying the bias current through the specimen and those performed with temperature as variable is evidenced. The noise maxima obtained in both sets of measurements turn out to be caused by the junction critical current fluctuations, which dominate when the currents flowing through the GBJs are close to the Josephson critical current. The anti-phase correlation between the normal resistance and the critical current fluctuations is responsible for the monotonical decrease of the noise at constant bias current, with the temperature exceeding the value corresponding to the noise maximum. In contrast, varying the bias current at fixed temperature, the voltage noise exhibits a local minimum followed by an increasing tendency after passing through the maximum.     

1/f conduction noise in the high-temperature superconductor Bi-Sr-Ca-Cu-O system

Conduction noise was investigated in the normal state of the 2212 phase of the Bi-Sr-Ca-Cu-O system for polycrystals, highly oriented thin films, and single crystals. It was found that large noise with 1/f spectrum in this material is generated as a bulk effect. The magnitude of the noise power is 7–10 orders of magnitude larger than in normal metals even in single crystals. Several possible origins are discussed.