原位能量色散X射线荧光分析中岩样基体效应及其修正研究

原位能量色散X射线荧光现场分析岩样矿物成分时,岩样基体效应会对测量结果产生影响。本文以Cu元素作为待测元素,研究了17种不同岩样基体对原位能量色散X射线荧光分析Cu元素特征X射线强度的影响及其修正方法。采用蒙特卡罗方法模拟获得了Cu元素含量相同的17种不同岩样测量谱线,综合各类岩石元素构成的相似性,并依据模拟谱线Cu元素Kα射线强度与谱线参数之间的相关性,反映了原位能量色散X射线荧光分析岩样Cu元素的基体效应并不完全受岩体元素构成或岩石分类的控制,需要依据岩石样分析谱线参数的相关性进行归类讨论。针对基体影响Cu元素特征射线强度相似的15种岩样进一步研究,并对Cu元素特征X射线与谱线主要参数的主成分进行分析,发现散射本底、X光管靶材料特征X射线及其非相干散射峰强度能够很好的描述Cu元素特征X射线强度受岩样基体影响的变化,据此可以对基体效应影响相似的岩体进行Cu元素测量结果修正。采用本文方法同样也能为不同岩性岩体其他待测元素基体效应的修正提供参考。     

金属表面碳涂层对激光等离子体辐射的影响

 阐述了激光诱导击穿光谱技术的基本原理,分析了金属材料表面光学性质与激光诱导等离子体辐射强度的关系,建立了空气中进行等离子辐射研究的试验装置,测量了不同厚度碳层下激光等离子体的发射光谱强度。实验结果表明：当一束近红外高能量脉冲激光（能量为5 J）作用于覆盖有约18 μm厚度碳层的标钢样品时,激光等离子体的发射光谱强度提高了16%～22%;证明了金属样品表面覆盖碳层能够提高激光等离子体辐射强度。     

The determination of thin layer thicknesses with an electron microprobe

Electron microprobe analysis has been performed on W, Nb, Mo, and Al layers of 2 to 300A?thickness deposited on refractory metals. For this thickness range a linear relation is found between layer thickness and characteristic X-ray intensity. The importance of a correct background measurement and its influence on the accuracy of the determination of the layer thickness is demonstrated. Additional effects arising from the backscatter coefficient of the substrate material and the fluorescence excitation within the layer are investigated. It is found that the highest sensitivity in the thickness measurement occurs at primary electron energies of 2.5 to 3 times the excitation energy of the used characteristic X-ray line of the layer material. This experimental finding is discussed in terms of the dependence of the X-ray background intensity and the ionization probability on the energy of the primary electrons.     

Searching for evidences of the surface plasmon nature of the thermal radiation emitted from the facet edge of a metal bar

Thermal radiation emitted from flat facet edges of an aluminum bar has been experimentally investigated. It is established that the radiation is predominantly p-polarized and has the pattern with a pronounced maximum oriented at an angle of a few degrees to the plane of the facet. In addition, the magnitude of this maximum increases with the facet length size and tends to saturation as the length increases. The facts suggest that this phenomenon occurs due to diffraction of infrared surface plasmon-polaritons (SPPs) generated by phonons of the sample. This assumption is supported by a cubic dependence of the radiation intensity on temperature, which is typical for thermally generated SPPs (TSPPs). The analytical model for computing the spectrum and the integral intensity of the entire set of TSPPs arriving to the edge of their sources line has been developed as well.     

高压覆膜制样X射线荧光光谱法测定土壤和水系沉积物中的氯研究

氯是化探样品分析中的重要元素,而X射线荧光光谱法是测定卤族元素的重要技术手段。已有研究表明,X射线荧光光谱法在测定氯时,同一样片中氯的测定值随重复测定次数的增加而逐渐增大或减小。采用高压覆膜制样技术制片,测定土壤和水系沉积物中的氯,氯（24～40 000 μg·g-1）校准曲线的相关系数明显改善,RMS（均方根）由未贴膜的0.009 63,改善为贴膜后的RMS 0.001 98。氯的检出限由未贴膜的30 μg·g-1,改善为贴膜后的21 μg·g-1。且高压覆膜制样,同一样片连续测定10次,还是10 d内隔天测定1次,氯的测定值都保持不变或略有下降。从抽真空时间,X光管应用功率,烘样和不烘样,氯元素存在形式等角度解释了氯的测定值随重复测定次数的增加而逐渐增大或略减小的原因。高压覆膜制样,样品表面的聚酯膜,可以阻止在抽真空过程中氯随水分向样片表面迁移扩散或分解损失。高压未覆膜的样片在测定过程中,因样片表面吸附了水及空气分子,因而随抽真空时间的增加及解吸附作用,真空度下降明显,氯的强度变化明显。而高压覆膜样片在测定过程中,真空度下降不明显,氯的测定值基本不变或略有下降。高压制样（1 600 kN）可以将不同类型的地质样品压制成型,高压覆膜制样技术,完全消除了粉尘效应,对下照射的X射线荧光光谱仪具有重要意义。测过的样片可以重复测定氯,标准样片可长期保存,避免了标准样品的浪费。用该方法可以准确测定土壤和水系沉积物中32个组分。该样品制备方法也适用于测定其他难以成型的样品及其荧光强度由于真空和长时间辐射而强度变化的元素分析。     

X-ray diffraction in KDP crystal in the presence of temperature gradient

We investigate the effect of temperature gradient on the intensity of X-ray radiation reflected from different atomic planes of a KDP crystal, depending on the crystal thickness. We have studied the phenomenon of transfer of the X-ray beam intensity for x- and z-cuts of the KDP crystal in the presence and in the absence of temperature gradient. It is shown that the intensities of reflected radiations do not saturate because in conditions of the experiment the further increase in temperature gradient leads to destruction of the sample. It is revealed that in some cases at small values of temperature gradient the intensity of reflected radiation decreases initially by more than 10%, then increases monotonically with the increase in temperature gradient.     

Evolution Characteristics of the Laser-Plasma Electron Temperature of Heavy Metal Cr in Liquid Matrix

Using the nanosecond single-pulse laser-induced breakdown-spectroscopy (LIBS) technique, we determine the LIBS spectrum of a mixed solution of soluble compounds as a sample. Based on the LIBS measurement system established and the best experimental parameters, we measure the plasma emission spectrum of some lines of the Cr element. When the ICCD gate delay is measured from 500 to 2500 ns every 500 ns, and the liquid sample flow rate is set in the range of 35 ml · min^?1?55 ml · min^?1 with an interval of 5 ml · min^?1, the partial emission line of the Cr element in the laser plasma is measured, and the Boltzmann oblique line is drawn after the integrated intensity obtained. We calculate the evolution characteristics of the laser-plasma electron temperature with experimental parameters. The results show that the electron temperature values obtained from the intensity of the spectral lines of different elements are consistent with each other, indicating the reliability of the experimental measurement data. The range of electron temperature is obtained from the intensity of the Cr element line in the plasma range from 4071.0 K to 5628.4 K. As the flow rate continues to increase, the plasma electron temperature also increases but gradually becomes gentle. We select Cr 357.87 nm as the analytical line in the experiment and measure the particle density ratios of the Cr element in the ground state at different ICCD gate delays and sample flow rates. It provides experimental parameter support for further LIBS quantitative analysis of trace heavy metal elements in a liquid matrix.

     

The use of parallel and monochromatic beams for determining the composition of pseudobinary alloys by X-ray fluorescence

A simple X-ray fluorescence method using nearly parallel and monochromatic beams is analyzed and discussed in connection with the determination of the alloy fraction in pseudobinary A_1−x B _x C solid solutions. Applications to optoelectronic materials are considered. The reliability of the method has been analyzed and discussed for both bulk and thin film samples. Errors due to small angular divergence in the accepted beam are seen to be neglibile. Deviations from a symmetrical alignment of the sample can strongly influence the measured fluorescence intensity. The experimental analysis of this effect can be used for a perfect symmetrical orientation of thick samples. The measurement of the fluorescence intensity as a function of the glancing angle can give both thickness and composition in solid-solution thin-film samples. The contributions of the fluorescence radiation excited by the characteristic X-ray lines of atoms within the substrate is shown to be important in thin epitaxial layers. An approximate formula for calculating these contributions is given and discussed in the light of experimental results. Bulk crystals and thin-film samples, vapourphase grown Cd_1−x Zn _x S solid solutions, have been used for experiments in which the ZnK _α radiation excited by a MoK _α primary beam was measured.     

X射线荧光在地质材料卤族元素分析中的应用评介

卤族元素氟、氯、溴、碘广泛分布在地圈、水圈和生物圈,它们是矿产资源,也是许多地学研究的信息载体,更与人类生活紧密相关.卤族元素分析是地质分析的重要组成部分,而X射线荧光光谱分析方法在当今的卤族元素分析中占有重要地位.本文收集我国1988年—2020年间X射线荧光光谱分析地质材料氟、氯、溴、碘的文献126篇,在简述卤族元...     

Anomalous scattering,transport, and spatial distribution of X-ray fluorescence at the exit of polycapillary structures

The angular distribution of the X-ray intensity at the exit of microchannel plates at grazing incidence of monochromatic radiation on the walls of microcapillaries has been investigated. The angles and energies of the primary radiation quanta at which the synchrotron beam excites X-ray fluorescence propagating inside polycapillary structures have been determined. The angular dependences of the intensity distribution of X-rays transmitted through the microcapillaries have been studied theoretically and experimentally for energies corresponding to the region of anomalous dispersion near the L _2,3 absorption edges of silicon. The propagation of waves in hollow polycapillary waveguides, the excitation of X-ray fluorescence, and the X-ray diffraction at the exit of microchannel plates have been modeled mathematically. The mathematical model takes into account the presence of a transition layer on the microchannel surface.     

X射线荧光光谱检测多层薄膜样品的增强效应研究

研究了X射线荧光光谱检测多层薄膜样品的增强效应。根据多层膜中的X荧光强度理论计算公式编写了计算机程序,并计算了Zn/Fe和Fe/Zn双层膜样品中不同薄膜厚度时Fe Kα的一次荧光强度、二次荧光强度、二次荧光与一次荧光强度比以及二次荧光在总荧光强度中比例。研究发现,在多层膜样品的X射线荧光分析中,激发条件不变的情况下,元素谱线的一次荧光相对强度、二次荧光相对强度和二次荧光在总荧光强度中所占比例都随薄膜厚度及位置的变化而变化。当Fe和Zn层厚度相同时,随厚度的变化,对于Fe/Zn样品,Fe Kα二次荧光强度占总荧光强度最高为9％,而对于Zn/Fe样品这一比例最高可达35％。     

Brittle-plastic relaxation of misfit stresses in the Si(001)/Si1 ? xGex system

It is found that stressed luminescent samples of Si(001)/Si_{1 − x} Ge _x /Si with a germanium concentration of up to 16% contain microcracks. In contrast to ordinary cracks, microcracks are characterized by partial cracks of the substrate that are not perpendicular to the plane of the plate and are detected by specially designed X-ray analysis techniques. In a 60-nm-thick layer of SiGe with a germanium concentration of 5%, individual microcracks arise in samples near the edges of the same type, and the traces of these microcracks coincide with the ripple profiles of the corrugated growth surface. As the germanium concentration increases, first, the number of microcracks near the edges of a sample increases, while the corrugated growth relief nearly completely disappears, and then microcracks appear even in the central region of the sample, thus leading to the vanishing of the curvature of the structure in this region without visible signs of plastic relaxation. At the same time, even a thin (20 nm) layer of SiGe exhibits a layered structure, and diffuse scattering near the peak of the SiGe layer increases, which points to the presence of fragments of the layer that are misoriented by ±0.015°; the intensity of the diffuse scattering may amount to 0.5% of the layer intensity. A spatial analysis of the luminescence of samples with microcracks shows that the emergence of microcracks hardly affects the peak position and the half-width of the emission line of the SiGe layer. At the same time, the intensity of exciton emission from both the SiGe layer and the bulk of silicon is significantly (several times) changed when passing to the regions with microcracks. All the phenomena observed can be accounted for under the assumption that, between the stages of the loss of the plane crystallization front and the development of plastic relaxation of misfit stresses, there exists an earlier unknown stage of growth in which the concentration of nonequilibrium vacancies increases by four to five orders of magnitude and then the vacancies condensate into micropores.     

Spectral characteristics of water clusters in the interaction with ozone molecules and bromide ions

The molecular dynamics method is used to study the interaction of the (Br⁻) _i (H₂O)_{50 − i} clusters in a medium of water vapor with ozone molecules. The clusters absorb O₃ molecules and retain them, along with Br⁻ ions, for a 25-ps-long calculation procedure. The presence of bromide ions results in significant increases in the values of the real and imaginary parts of the relative permittivity. The addition of bromide ions causes a significant increase in the integrated IR radiation absorption intensities and in the radiant power emitted by the clusters. The addition of Br⁻ ions only slightly affects the intensity of the Raman spectra until the number of Br⁻ reaches six, when a dramatic decrease of the integrated intensity of this spectrum occurs. Bromide ions absorbed by water clusters produce a much more lasting impact on the ozone molecules trapped by the cluster than chlorine ions do, all other things being equal.     

ICP-AES法测定磷矿浆烟气脱硫剂固液相中硫含量的研究

SO₂是大气主要污染物,与雾霾的形成有直接关系,烟气脱硫是保护环境、减少雾霾的有效措施。磷矿浆法烟气脱硫是一种以磷矿浆为吸收剂的新型脱硫方法。采用电感耦合等离子体原子发射光谱(ICP-AES)法测定磷矿浆烟气脱硫剂固液相(磷矿粉、磷矿浆脱硫液和脱硫渣)中硫含量。在选定了较灵敏的硫分析线后,探讨了ICP光谱仪工作条件对分析结果的影响,同时研究了样品预处理方法以及共存元素对硫测定结果的影响。分别用三种不同的方式对磷矿粉、磷矿浆脱硫液和脱硫渣样品进行前处理,确保样品溶解完全。选用181.973 nm光谱线为分析线,避免共存元素的光谱干扰。选择仪器的入射功率为1 300 W,观测高度为12 mm,雾化气流量为0.65 L·min-1,泵进样量为1.5 mL·min-1。在光谱仪最佳分析条件下,利用该方法测定磷矿粉、磷矿浆脱硫液及脱硫渣中硫的含量,其检出限为0.000 38%,加标回收率在89.5%～104.5%之间,相对标准偏差(RSD)≤2.30%,同时与硫酸钡重量法进行对比实验,结果基本吻合,相对偏差≤3.88%,该方法简便快捷,精密度和准确度较高,适用于磷矿浆脱除烟气SO₂的科研及生产中。     

薄膜法X射线荧光测量中样品检测位置及防护铅板内衬材料的选择研究

(1)以型号316不锈钢金属板为研究对象,对薄膜法X射线荧光光谱测量中,样品检测位置的选择进行研究,确定了最佳的样品检测位置为样品距离X射线管和探测器水平基线1 cm处,并且与X射线管和探测器水平基线成16°角度。(2)以工业环境空气重金属污染物Pb,Cd,Cr为主要分析对象,在有铅板防护情况下进行薄膜法X射线荧光光谱测量研究,发现X射线会穿透样品薄膜而继续激发防护铅板,使得滤膜背景光谱中有较强的铅谱线干扰,会对实际样品中铅元素的测量产生影响。在薄样和防护铅板之间加上一层隔离材料,可有效避免防护铅板中铅谱线对样品测量产生的干扰。(3)以型号316不锈钢、黄铜、铝材、紫铜和聚四氟乙烯几种硬质隔离材料作为铅板内衬材料进行选择研究,结果表明：紫铜的X射线荧光光谱中所含元素的谱线最少,谱图中没有出现重金属Cr,Cd,Pb的谱峰,并且能量较高部分靶材散射光谱强度较弱,对实际样品中重金属元素Cr,Cd和Pb的测量不会产生干扰,作为铅板的内衬金属材料可以避免防护铅板中铅元素谱线的干扰,是最佳的薄膜法X射线荧光光谱分析中铅板的内衬金属材料。该研究为组装及搭建便携式大气及水体重金属X射线荧光光谱分析仪提供了重要的理论依据。     

~(129)Xe~(q+)激发Mo表面产生的X射线谱

研究了高电荷态离子129Xeq+(q=25,26,27)入射金属Mo表面产生的特征X射线谱.实验结果表明,在束流强度小于120nA条件下,高电荷态离子129Xeq+可以激发Mo的L壳层特征X射线谱.单离子X射线相对产额可达10-8量级,特征X射线的相对产额随入射离子的动能和电荷态(势能)的增加而增加.通过Mo原子的Lα1特征X射线谱,利用Heisenberg不确定关系对Mo原子的第M能级寿命进行了估算.     

高电荷态Krq+与Al表面碰撞发射可见光的研究

利用低速(V≈0.01 V_Bohr)高电荷态Kr^q+ (q=8, 10, 13, 15, 17)离子轰击金属Al表面, 获得了碰撞过程产生的300–600 nm的光谱. 实验结果表明: 低能大流强(μA/cm²量级)离子束入射金属表面, 可产生溅射原子、离子和入射离子中性化后发射的可见光. 随着入射离子势能(电荷态)增加, 碰撞过程中发射谱线的强度增强. 与激发态3d能级相比, 较高的势能可以有效地激发Al原子的电子到较高4s能级. 关键词： 高电荷态离子 可见光发射 离子与表面作用     

X‐ray‐induced alteration of specimens as crucial obstacle in XRF spectrometry of fluorine in rocks and soils

Occasionally suggested yet rarely performed X‐ray fluorescence (XRF) spectrometry of fluorine seems to fail systematically in yielding reliable quantitative results for rocks and soils. Repeated analyses reveal continuously drifting fluorescence intensities for fluorine, boron and chlorine. Typically, an increase, but in few cases also a decrease, over X‐ray exposure time is observed. For instance, fluorine concentrations in a soil standard appear to increase steadily from below the detection limit in the first run to nearly 850 mg/kg F more than 10 h later in the last. In contrast, cryolite is characterised by drastically decreasing intensities for fluorine. Although fluorescence intensities may be affected by preparation methods, specimen surface conditions and dynamic contamination, it is shown that none of these influencing factors is responsible for the observed trends. In fact, there is evidence that X‐radiation impact mobilises fluorine, boron and chlorine. Diffusion of radiolysis products towards the specimen's surface as well as the kinetics of adsorption and desorption or chemical reactions are believed to control the analyte concentration in the analysed layer decisively. Furthermore, during analysis, the latter is altered by considerable losses of binder or flux – if applicable – thus enhancing XRF intensities of boron and fluorine because of reduced absorption. In any case, signal stability appears to be limited by insufficient sample and specimen stability. It is concluded that for many soil and rock samples, XRF spectrometry is inappropriate to quantify fluorine, although the crucial obstacle is neither the analytical method nor the spectrometer sensu strictu. Copyright © 2012 John Wiley & Sons, Ltd.     

Spatial distribution of defects produced by boron ion implantation of silicon

A simple technique for the study of the spatial distribution of the damage produced by ion implantation of silicon has been developed. The damage depth distribution for 40 keV boron ions in silicon has been studied at irradiation doses from 7 × 10¹¹ to 3.9 × 10¹⁴ ions/cm² and the relative defect peak depth R _d/R _p = 0.85 determined. An increase of layer conductivity as the surface part of the implanted layer is removed has been revealed. This effect is caused by the presence of radiation defects in the surface region of the layer. The “electrical” cluster diameter is about 28 A and the overlapping cluster dose is close to 1 × 10¹³ ions/cm².     

样品电流模式下外磁场引起的X射线吸收谱强度变化

在用样品电流模式的测量过程中发现，磁场强度、磁场与样品表面的夹角以及光斑在样品表面的位置都会对吸收谱强度产生影响；在光斑、磁场和样品的不同几何配置下,测量并分析了表面均匀氧化的铝箔中氧的K边吸收谱，指出外磁场下吸收谱强度随各种条件变化的趋势，并对实验结果给出了合理解释；结果表明所用的模型分析与实验数据符合得很好；所得到的信息对于XMCD实验的设计安排、相应数据的分析以及物理信息的提取具有重要意义.