Elementary processes during collisions of ions with tryptophan molecules

The relative cross sections of elementary processes occurring in single collisions of tryptophan molecules in the gaseous phase with He²⁺ ions with energy 4 keV/u are measured using time-of-flight mass spectrometry for studying the mechanism of radiation damage of amino acid molecules. The fragmentation channels for intermediate singly and doubly charged tryptophan molecular ions formed during one-electron capture, two-electron capture, and electron capture with ionization are investigated. Significant difference is observed in the mass spectra of fragmentation of intermediate doubly charged ions formed during the capture with ionization and double capture, which is associated with different energies of excitation of {C₁₁H₁₂N₂O₂}²⁺* ions.     

Dissociation of alkane ionized molecules

The subject of investigation is the fragmentation of variously charged molecular ions arising in col-lisions of several kiloelectronvolt H⁺, He²⁺, and Ar⁶⁺ ions with molecules of the simplest alkanes (from methane to butane). Using the method of time-of-flight mass spectrometry, the formation cross sections of dissociation-induced fragment ions are measured. The dissociation takes place when an incident ion captures an electron from a methane, ethane, or propane molecule. The role of additional ionization of the molecule, which accompanies the electron capture by the incident ion, is elucidated. The kinetic energy spectrum for protons resulting from the fragmentation of multiply charged alkane ions is determined. The most plausible kinetic energies of protons depending on the degree of ionization and molecule size fall into the range 1–25 eV. It is shown that, when the molecule loses several electrons, the kinetic energies of protons are governed by Coulomb interaction between all fragment ions and are determined by their flying apart from the relative spatial arrangement of corresponding atoms in a parent molecule.     

Interaction of highly charged ions with carbon-based materials using Kobe EBIS

Interaction of highly charged ions (HCIs) with surfaces produce various specific phenomena as a consequence of the potential energy that HCI possesses. In the present study, we have observed photon emission, structural, magnetic, and electronic modification on various carbon-based materials such as carbon nanotube by the impact of HCIs using an electron beam ion source named Kobe EBIS installed at the Kobe University. In order to study the potential effect, HCIs of Ar^q+ (q = 6–16) with the intensity of 0.1–1 nA are projected on the surface with a constant kinetic energy (16 keV). For photon emission measurements, we observed spatial and spectral distribution of visible light emission from the surface during irradiation with HCIs. On the other hand, the structural modification of multi-walled carbon nanotubes (MWCNTs) irradiated with HCIs has been analyzed using a transmission electron microscopy and Raman spectroscopy. Irradiation effects on the resistivity of single MWCNT supported on micrometer scale bridge pattern were also measured. We have also measured magnetic structure of highly oriented pyrolytic graphite irradiated with HCIs using electron spin resonance at low temperature. At the present paper, we will review our recent experimental results on the interaction of HCI with various carbon-based materials.     

Capture of an electron by ions in methionine and norleucine molecules

The relative cross sections of processes taking place when H⁺ and He²⁺ ions with an energy of 6z keV (z is the ionic charge) capture an electron from molecules of C₅H₁₁NO₂S methionine (proteogenic amino acid) and C₆H₁₃NO₂ norleucine (nonproteogenic amino acid) are measured by time-of-flight mass spectrometry (a methionine molecule transforms into a norleucine molecule by substituting the CH₂ group for the S heteroatom). The fragmentation pattern of resulting molecular ions is established from correlation analysis of the detection times of all fragment ions. The results are compared with experimental data for fragmentation of the same molecules ionized by electrons and photons. In these amino acids, the pattern of molecular ion fragmentation is found to depend on the type of molecule ionization. However, the detachment cross section of the COOH neutral group or residue (neutral or charged) R of a side chain of the amino acid is invariably among the largest. The relative cross sections of capture with single and double ionization of molecules are measured.     

Recent results on multiple ionization and fragmentation of negatively charged fullerene ions by electron impact

Employing the dynamic crossed-beams technique, the absolute cross sections of the electron-impact multiple ionization and fragmentation of mass-selected negatively charged fullerene ions C _m ^? → C _m?n ²⁺ (m=60, 70, 84; q=1, 2, 3; n=0, 2, 4) were measured. The electron energy varied from the respective threshold up to 1 keV. A scaling law was observed for the cross-section magnitude as a function of the fullerene size m and the charge state q of product ions. The data indicate that different mechanisms account for the detachment of an extra electron from the negatively charged fullerene and the formation of a positively charged ion, respectively. Moreover, the multiple ionization of a fullerene anion is found to be a sequential process. A novel ionization mechanism is proposed which might be expected to be valid for all negatively charged molecular or cluster ions able to shield the attached electron from the incident electron.     

Characteristics of highly charged ions produced at Kobe EBIS under modulated operation

The electron beam ion source (Kobe EBIS) has been developed to perform modification of surfaces using highly charged ions (HCIs) at the Kobe University, Japan. Recent study revealed that periodic intermission of electron beam improves charge state distribution of extracted ions. The period of intermission is in the order of 100 ms, and the width of beam-off time is 1 ms or less. This operational mode (pulse mode) makes it possible to produce Ar¹⁵⁺ to Ar¹⁷⁺ effectively, whereas the charge is limited less than 14+ under the ordinary operational mode with direct current (DC) electron beam. A spike of HCIs with a peak current in the order of nA is also observed at each moment of electron beam off. The measurement of the time evolution of Ar¹⁶⁺ intensity around the timing of mode change revealed that the intensity of extracted Ar¹⁶⁺ changes slowly after mode change with a time constant of few seconds.     

Interaction of <Superscript>3</Superscript>He<Superscript>2+</Superscript> and Ar<Superscript>6+</Superscript> ions with acetylene,ethylene, and ethane molecules

Time-of-flight mass spectroscopy methods are employed for studying processes occurring during capture of electrons by ³He²⁺ and Ar⁶⁺ multiply charged ions with energy 6z keV (z is the ion charge) from C₂H _n molecules (n = 2, 4, 6) with different multiplicities of C-C bonds. Fragmentation schemes of the molecular ions formed in such processes are established from analysis of correlations of recording times for all fragment ions. The absolute values of the cross sections of capture of an electron and capture with ionization are measured, as well as the cross sections of formation of fragment ions in these processes. The absolute values of total capture cross sections for several electrons are determined.     

Ionisation and fragmentation of tetraphenyl iron (III) porphyrin chloride induced by slow multiply charged ion impact

Ionisation and ion-induced fragmentation of tetraphenyl iron (III) porphyrin chloride (FeTPPCl) molecules have been studied after slow collisions (v∼ 0.2 a.u.) with multiply charged ions (O³⁺, Ar⁸⁺). Intact molecules and large fragments are observed in charge states up to q=4. For q=1, the intact molecule is the most abundant species, in particular, when projectiles in higher charge states are used. When the internal energy of the singly charged ion is increased by the energy transfer during the collision, the singly charged system de-excites by the emission of a neutral Cl-atom, a free electron or possibly a negative Cl anion. The processes are observed as direct as well as delayed processes on a μs-time scale. For q=2 to 4 the loss of the Cl-atom and some phenyl groups becomes more likely due to the lower stability and the larger energy transfer. The charge state distribution of atomic fragments is found to be very different, in particular, when C^q+ and Cl^q+ ions are compared. In the first case mainly singly charged ions are detected, whereas in the second case ions in charge states up to q=6 are observed with high intensities. These phenomena are discussed in terms of the intramolecular charge mobility.     

Electron Transitions during the Capture of an Electron by a He<Superscript>2+</Superscript> Ion at the Argon Atom

We have measured the absolute values of the total cross section of the one-electron capture by He²⁺ ions in the kinetic energy range 2–30 keV at the Ar atoms. The absolute values of the differential scattering cross sections of He⁺ ions formed during the one-electron capture and the electron capture with ionization at energies of 2.2, 5.4, and 30 keV have been determined. The electronic states of the formed ions have been determined using collision spectroscopy based on analysis of the change in the kinetic energy of He⁺ after the interaction. We have measured doubly differential (with respect to the kinetic energy and the scattering angle) cross sections of the formation of free electrons. The free electron formation channels (direct ionization and electron capture with ionization) have been analyzed by calculating the electron terms of the (HeAr)²⁺ system. The calculated cross section of capture with ionization is in conformity with the cross section measured using collision spectroscopy.     

Ionization and single electron capture in collision of highly charged Ar16+ ions with helium

This paper uses the two-centre atomic orbital close-coupling method to study the ionization and the single electron capture in collision of highly charged Ar^16＋ ions with He atoms in the velocity range of 1.2-1.9 a.u.. The relative importance of single ionization （SI） to single capture （SC） is explored. The comparison between the calculation and experimental data shows that the SI/SC cross section ratios from this work are in good agreement with experimental data. The total single electron ionization cross sections and the total single electron capture cross sections are also given for this collision. The investigation of the partial electron capture cross section shows a general tendency of capture to larger n and l with increasing velocity from 1.2 to 1.9 a.u..     

Review of highly charged ion production with ECR ion source and the future opportunities for HCI physics

In recent years, there is very intense worldwide research and development work on electron cyclotron resonance ion source (ECRIS). Remarkable progress represented by the third generation superconducting ECRIS has been made with regards of intense highly charged ion beam production such as >600 eμA Ar¹⁶⁺, >10 eμA Ar¹⁸⁺, and hundreds of enA He-like Kr³⁴⁺. A low energy heavy ion platform named Low Energy heavy ion Accelerator Facility (LEAF) that features a next generation 45 GHz ECRIS, a 300 kV high voltage platform, a 0.5 MeV/u radio-frequency quadrupole, and several multidisciplinary experimental terminals is under construction at the Institute of Modern Physics (IMP). This paper will report on the recent progress with ECRIS dedicated to highly charged ions and the status of LEAF at IMP that will provide new opportunities for highly charged ion physics in the near future.     

K-shell ionization cross section of aluminium induced by low-energy highly charged argon ions

Al K-shell X-ray yields are measured with highly charged Ar^q+ ions (q=12–16) bombarding against aluminium. The energy range of the Ar ions is from 180 to 380 keV. K-shell ionization cross sections of aluminium are also obtained from the yields data. The experimental data is explained within the framework of 2pπ -2pσ rotational coupling. When Ar ions with 2p-shell vacancies are incident on aluminium, the vacancies begin to reduce. Meanwhile, collisions against Al atoms lead to the production of new 2p-shell vacancies of Ar ions. These Ar 2p-shell vacancies will transfer to the 1s orbit of an Al atom via 2pπ-2pσ rotational coupling leading to the emission of a K-shell X-ray of aluminiun. A model is constructed based on the base of the above physical scenario. The calculation results of the model are in agreement with the experimental results.     

高离化态离子及其光电离过程基本特征的理论研究

在Dirac-Slater相对论理论框架下,研究了HCI(高离化态离子)的基本性质及其光电离过程的基本特征.通常HCI的电场非常强,其电子波函数沿靠近核的径向空间被压缩,这极大地改变了相应的物质的性质,使HCI的光电离过程与一般的原子(离子)的相比较有很大的不同:原子核的尺寸效应和相对论效应变得更加重要,而多极效应对光电离截面的影响却趋于减弱.     

高离化态离子及其光电离过程基本特征的理论研究

在Dirac-Slater相对论理论框架下,研究了HCI（高离化态离子）的基本性质及其光电离过程的基本特征. 通常HCI的电场非常强,其电子波函数沿靠近核的径向空间被压缩,这极大地改变了相应的物质的性质,使HCI的光电离过程与一般的原子（离子）的相比较有很大的不同：原子核的尺寸效应和相对论效应变得更加重要,而多极效应对光电离截面的影响却趋于减弱.     

Electron capture by slow multiply charged Ar and Ne ions from atomic hydrogen

At collision energies below 15 keV total charge transfer cross sections have been measured for multiply charged Ar^ζ+(2≦ζ≦6) and Ne^ζ+(2≦ζ≦4) ions colliding with atomic hydrogen. A Wood discharge was used to provide a hydrogen target with a sufficiently high degree of dissociation. Results are compared with measurements performed at higher energies and with theoretical calculations. For ζ=2 cross sections in atomic hydrogen are much smaller than in the molecular case, for ζ>2 the ratio of these cross sections varies between 0.7 and 1.6.     

H<Superscript>+</Superscript><Emphasis Type="Bold">and He</Emphasis><Superscript>2+</Superscript> impact single and double ionization of lead

H⁺ and He²⁺ impact single and double ionization cross sections of ground state lead atoms have been calculated in the binary encounter approximation. Calculations of direct double ionization cross sections have been performed in the modified double binary encounter model. The accurate expressions of σ_ΔE (cross-section for energy transfer ΔE) and Hartree-Fock velocity distributions for the target electrons have been used throughout the calculations. Contributions to double ionization from Auger effect following ionization of inner shells have been considered in the present work. Our H⁺ impact single and double ionization cross sections are in good agreement with the experimental observations. In calculations of He²⁺ impact cross sections, the present theoretical approach shows limited success in the experimentally investigated region (50–350 keV amu^-1).     

Effect of the target density on the cross section of charge exchange between fast ions and atoms

When fast X^q+ X^{q^ + } ions collide with atomic or molecular targets, the total charge exchange cross section decreases with increasing target density. This is because the excitation levels of resulting X^{(q - 1)+} X^{(q - 1)^ + } ions are suppressed because of ionization by target atoms. The effect of target density on the total charge exchange cross section may amount to one order of magnitude or more depending on the charge and energy of an incident ion, as well as on the density and inner shell configuration of target atoms. Numerical calculations are performed for partial (in the principal quantum number n) cross sections σ(n) and total cross sections σ_tot=Σ_nσ(n) of charge exchange in the case of collisions of fast multiply charged ions having an energy E in the range 100 keV/u-10 MeV/u with gas or solid targets.     

Cross sections for ionization and ionic fragmentation of pyrimidine molecules by electron collisions

The electron impact mass spectroscopy and the total ion collection measurements were used to investigate the ionization and ionic fragmentation of the pyrimidine, C₄H₄N₂, molecules in the gas phase. The cation mass spectra were measured in the 10−85 amu range and the observed mass peaks assigned to corresponding ionic fragments. The most abundant cation in the mass spectra is the parent cation, C₄H₄N \hbox{₂⁺_{\mathrm{2}}^{\mathrm{+}}} + 2 , at 80 amu. The appearance energies of the ionic fragments were determined and the possible fragmentation processes are discussed. The electron impact absolute total and partial ionization cross sections in pyrimidine were obtained over the energy range from the respective ionization thresholds up to 150 eV.     

Secondary ion emission under the bombardment of Si by multiply charged Si q+ ions

The spectra of secondary ion emission under the bombardment of a B-doped Si target by multiply charged Si ^q+ ions (q = 1?C5) have been studied in the energy range of 1 to 10 keV per unit of charge. A multifold increase in the yield of secondary cluster Sk _n ⁺ ions, multiply charged Si ^q/+ ion (q = 1?C3), and H⁺, C⁺, B⁺, Si₂N⁺, Si₂O⁺ is observed as the charge of the multiply charged ions increases. The increase in the yield of secondary ions with increasing charge of the multiply charged-ion charge is most significant for ions with relatively high ionization potentials.     

Electron-impact ionization and dissociation of C<Subscript>2</Subscript>D<Superscript>+</Superscript>

Absolute cross sections for electron-impact single ionization, dissociative excitation and dissociative ionization of the ethynyl radical ion (C₂D⁺)^+) have been measured for electron energies ranging from the corresponding reaction thresholds to 2.5 keV. The animated crossed electron-ion beam experiment is used and results have been obtained for the production of C₂D²⁺, C²⁺, C₂⁺_2^+ , CD⁺, C⁺ and D⁺. The maximum of the cross section for single ionization is found to be (2.01 ± 0.02) × 10^-17 cm², at the incident electron energy of 105 eV. Absolute total cross sections for the various singly charged fragments production are observed to decrease by a factor of almost three, from the largest cross-section measured for C⁺, over C₂⁺_2^+ and CD⁺ down to that of D⁺. The maxima of the cross sections are obtained to be (14.5 ± 0.5) × 10^-17 cm² for C₂⁺_2^+, (12.1 ± 0.1) × 10^-17 cm² for CD⁺, (27.7 ± 0.2) × 10^-17 cm² for C⁺ and (11.1 ± 0.8) × 10^-17 cm² for D⁺. The smallest cross section is measured to be (1.50 ± 0.04) × 10^-18 cm² for the production of the doubly charged ion C²⁺. Individual contributions for dissociative excitation and dissociative ionization are determined for each singly-charged product. The cross sections are presented in closed analytic forms convenient for implementation in plasma simulation codes. Kinetic energy release distributions of dissociation fragments are seen to extend from 0 to 6 eV for the heaviest fragment C₂⁺_2^+, up to 11.0 eV for CD⁺, 14.2 eV for C⁺ and 11.2 eV for D⁺ products.