Surface chemical and geometrical properties of pure copper powder intended for binder jetting and sintering

One novel important application of sinter-based additive manufacturing involving binder jetting is copper-based products. Three different variants of nominally pure copper powder having particle size distributions with D90 < 16, 22, or 31 μm were investigated in this study. The packing behavior and the flow properties using dynamic test and shear cell, as well as specific surface area were evaluated. The analyses employed illustrate the multidimensional complexity. Because different measurements capture different aspect of the powder, it is imperative to apply a characterization approach involving different methods. Surface chemical analysis by means of X-ray photoelectron spectroscopy (XPS) showed that all powder variants were covered by Cu₂O, CuO, and Cu (OH)₂, with Cu₂O being dominant in all cases. The finest powder with D90 < 16 μm tended to have higher relative amount of copper in divalent state. The average apparent oxide thickness estimated by XPS depth profiling showed that the two coarser variants had similar overall average oxide thickness, whereas the finest one possessed smaller oxide thickness. The surface chemistry of the powder grades is found to be related to their rheological behavior in dynamic condition. Considering the specific surface areas in combination with the average oxide thicknesses, the amount of surface bound oxygen was estimated to be about ~220 ppm for all three variants. Specific concerns need to be taken during the sintering of powder to keep oxygen level below that of electrolytic pitch copper (400 ppm).     

玻璃表面特性的XPS研究

本文用XPS表征了玻璃表面铜、铅和锡离子的价态,并测定在浮法玻璃底表面锡离子价态的深度分布。对沾锡现象与锡离子价态之间的关系进行了讨论。     

Effect of atomization on surface oxide composition in 316L stainless steel powders for additive manufacturing

The initial oxide state of powder is essential to the robust additive manufacturing of metal components using powder bed fusion processes. However, the variation of the powder surface oxide composition as a function of the atomizing medium is not clear. This work summarizes a detailed surface characterization of three 316L powders, produced using water atomization (WA), vacuum melting inert gas atomization (VIGA), and nitrogen atomization (GA). X-ray photoelectron spectroscopy (XPS) and scanning electron microscopy analyses were combined to characterize the surface state of the powders. The results showed that the surface oxides consisted of a thin (~4 nm) iron oxide (Fe₂O₃) layer with particulate oxide phases rich in Cr, Mn, and Si, with a varying composition. XPS analysis combined with depth-profiling showed that the VIGA powder had the lowest surface coverage of particulate compounds, followed by the GA powder, whereas the WA powder had the largest fraction of particulate surface oxides. The composition of the oxides was evaluated based on the XPS analysis of the oxide standards. Effects of Ar sputtering on the peak positions of the oxide standards were evaluated with the aim of providing an accurate analysis of the oxide characteristics at different etch depths.     

XPS and XAES analysis of copper,arsenic and sulfur chemical state in enargites

Enargite, a copper arsenic sulfide with the formula Cu₃AsS₄ is of environmental concern due to its potential to release toxic arsenic species. The oxidation and dissolution of enargite are governed by the composition and chemical state of the outermost surface layer. Qualitative and quantitative analysis of the enargite surface can be initially obtained on the basis of X‐ray photoelectron spectroscopy (XPS) binding energy and intensity data. However, a more precise determination of the chemical state of the principal elements of enargite (copper, arsenic and sulfur) in the altered surface layer and in the bulk of the mineral requires a combined analysis based on XPS photoelectron lines and the corresponding X‐ray excited Auger lines. On the basis of results obtained on natural and synthetic enargite samples and on standards of sulfides and oxides, the Auger parameter α′ of different compounds was calculated and the Wagner chemical state plots were drawn for arsenic, copper and sulfur. Arsenic in enargite is found to be in a chemical environment similar to that of arsenides or elemental arsenic, whereas copper in enargite is in a chemical state that corresponds to copper sulfide, Cu₂S, for all samples irrespective of surface treatment (natural or freshly cleaved). Only sulfur changed from a chemical state similar to that of copper or iron sulfide in freshly cleaved samples to another state in natural enargite in the as‐received state. Thus, it is the sulfur atom at the surface of enargite that is most susceptible to changes in the enargite surface state and composition. A more detailed interpretation of this behavior, based on differences in the initial and final state effects, is proposed here. The concept of Auger parameter and chemical state plot, used here for the first time for investigating enargite, has proved to be a method to unambiguously assign the chemical state of the principal elements copper, arsenic and sulfur in these minerals. Copyright © 2006 John Wiley & Sons, Ltd.     

Combined analysis methods for investigating titanium and nickel surface contamination after plasma deep etching

Plasma etching techniques can result in damage and contamination of materials, which, if not removed, can interfere with further processing. Therefore, characterisation of the etched surface is necessary to understand the basic mechanisms involved in the etching process and enable process control and cleaning procedures to be developed. A detailed investigation by means of the combined use of scanning electron microscopy coupled with energy-dispersive X-ray spectrometry (SEM/EDS), X-ray photoelectron spectroscopy (XPS) and optical microscopy (OM) has been carried out on deep titanium trenches etched by plasma. This innovative approach has provided a further insight into the microchemical structure of the surface contamination layer on both the titanium and the nickel hard mask surfaces. The described experiments were conducted on 25 to 100-μm wide trenches, first etched in bulk titanium by an optimised Cl₂/SF₆/O₂-based inductively coupled plasma process, through an electroplated nickel hard mask. The results allow to identify chlorine, fluorine and carbon as the main contaminating agents of the nickel mask and to associate three oxidation states around the etched trenches highlighting certain specific aspects related to the passivation mechanism. These observations reinforce the scientific relevance of the combined use of complementary optical and imaging analytical techniques.     

Surface characterization on graphitization of nanodiamond powder annealed in nitrogen ambient

A nanodiamond thin film is deposited on a single crystal silicon substrate by dip‐coating technique. Surface characterization of the unannealed nanodiamond sample, and the samples annealed at various temperatures in nitrogen ambient, is conducted by XPS and Raman spectroscopy. The fitting data of the C1s core level XPS peak reveal that the sp²/sp³ ratio in the unannealed sample and the sample annealed at 900 °C and 1500 °C are 0.44, 0.55 and 6.08 respectively. All spectra including the C1s core level XPS spectrum, the plasmon energy‐loss spectrum associated with C1s peak, C KVV Auger spectrum of the sample annealed at 900 °C are similar to those of the unannealed sample. However, the spectra of the sample annealed at 1500 °C are very different. Annealing at 900 °C fails to produce appreciable graphitization, and an onion‐like carbon structure with a small diamond core is formed when the nanodiamond is heated to 1500 °C. Copyright © 2010 John Wiley & Sons, Ltd.     

Surface properties of fluorinated single-walled carbon nanotubes

Single-walled carbon nanotubes (SWCNTs) were fluorinated at several different temperatures. The change of atomic and electronic structures of fluorinated SWCNTs was investigated using X-ray photoelectron spectroscopy (XPS), electrical resistivity measurements and transmission electron microscopy (TEM). The amount of doped fluorine increases with increasing doping temperature, and the fluorine atoms are covalently attached to the side-wall of the SWCNTs. From Raman spectra and HRTEM study, the strong fluorination on the SWCNTs leads to the breaking of carbon–carbon bonds and the disintegration of tube structure. Several intermediate phases of fluorinated SWCNTs are observed during e-beam irradiation in HRTEM.     

Surface modification of a liquid‐crystalline polymer for copper metallization

The effects of different surface modifications on the adhesion of copper to a liquid‐crystalline polymer (LCP) were investigated with X‐ray photoelectron spectroscopy, scanning electron microscopy, atomic force microscopy, contact‐angle measurements, and pull tests. High pull‐strength values were achieved when copper was sputter‐deposited onto plasma and reactive‐ion‐etching (RIE)‐pretreated LCP surfaces. The values were comparable to the reference pull strengths obtained with laminated copper on the LCP. The adhesion was relatively insensitive to the employed feed gas in the pretreatments. The surface characterizations revealed that for RIE and plasma treatments, the enhanced adhesion was attributable to the synergistic effects of the increased surface roughness and polar component of the surface free energy of the polymer. However, if the electroless copper deposition was performed on RIE‐ or plasma‐treated surfaces, very poor adhesion was measured. Good adhesion between the LCP substrate and electrolessly deposited copper was achieved only in the case of wet‐chemical surface roughening as a result of the creation of a sufficient number of mechanical interlocking sites, together with a significant loss of oxygen functionalities, on the surface. © 2003 Wiley Periodicals, Inc. J Polym Sci Part B: Polym Phys 41: 623–636, 2003     

Quantitative elemental analysis of nutritional,hazardous and pharmacologically active elements in medicinal Rhatany root using laser induced breakdown spectroscopy

Rhatany roots (RRs) have been used in indigenous systems of medicines to treat many common illnesses due to the presence of highly active astringent and antiviral biochemical constituents that possess strong therapeutic and pharmacological properties. Due to its widespread use, the accurate knowledge on the elemental composition of this medicinal plant can set a pharmacological research platform to investigate the effect of certain elements, and their ions in mediating the human metabolism and therapy. In this work calibration-free laser-induced breakdown spectroscopy (CF-LIBS) is used to detect the elements present in RRs sample, by analyzing the characteristic emission wavelengths and their respective intensities in the laser induced plasma, without the need for using any calibration standards or methods. Many nutritional elements, which are of human health significance and instrumental in mediating the established biological activities of RRs, were identified in a relative abundance. In addition to this, our analysis identified the trace level of a few toxic elements, whose overdose due to reckless intake wreaks havoc to human health and wellbeing. The reliability of qualitative and quantitative detection of the elements in RR by LIBS were validated by the standard inductively coupled plasma optical emission spectroscopy (ICP OES), the results of which are in good agreement with LIBS data with better relative accuracy. Also, in order to discriminate, and single out any two elements with the overlapping emission wavelength in LIBS, X-ray photoelectron spectroscopy was also carried out, which in its own right is in good agreement with the elemental analysis of LIBS in general.     

Multi-instrument characterization of HiPIMS and DC magnetron sputtered tungsten and copper films

In this work, copper and tungsten were sputtered onto silicon wafers by direct current magnetron sputtering (DCMS) and high-power impulse magnetron sputtering (HiPIMS). The resulting films were characterized by energy dispersive X-ray spectroscopy (EDX), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM), atomic force microscopy (AFM), spectroscopic ellipsometry (SE), and X-ray diffraction (XRD). By EDX and XPS, all the sputtered films showed only the expected metal peaks. By XPS, the surfaces sputtered by DCMS were richer in oxygen than those produced by HiPIMS. By AFM, the surfaces were quite smooth. The root mean square (RMS) roughness values are as follows: 0.83 nm (W, HiPIMS), 1.10 nm (W, DCMS), 0.85 nm (Cu, HiPIMS), and 1.78 nm (Cu, DCMS). By SEM, the HiPIMS films exhibited smaller grain sizes, which was confirmed by XRD. The crystallite sizes estimated by XRD are as follows: 4 nm (W, body-centered cubic, HiPIMS), 13 nm (W, body-centered cubic, DCMS), 7 nm (W, cubic, HiPIMS), 14 nm (W, cubic, DCMS), 25 nm (Cu, HiPIMS), and 35 nm (Cu, DCMS). By SE, the HiPIMS surfaces showed higher refractive indices, which suggested that they were denser and less oxidized than the DCMS surfaces.     

高活性多羟基结构态亚铁FHC(Cl~-)去除Se(Ⅳ)的性能与机制

通过慢速滴定法合成了高活性的多羟基结构亚铁FHC(Cl~-),对FHC(Cl~-)去除Se(Ⅳ)的动力学进行了研究,并对体系中的投加量、pH值、溶解氧和氯化钠浓度进行了响应面分析.研究结果表明,FHC(Cl~-)去除Se(Ⅳ)的表观速率常数k_(obs)=0.60 min~(-1),约为纳米零价铁的4倍和零价铁的16倍.由Box-Benhnken设计拟合得出响应值对编码自变量的二次多项回归方程为Y(c/c_0)=0.14-0.20A+0.017B-0.27C-0.019D-0.047AB-0.095AC+0.13AD-0.010BC-0.082BD+0.33A~2+0.023B~2+0.097C~2+0.065D~2,最优条件为:FHC(Cl~-)投加量98 mg/L,溶液的pH=7.5,氯化钠浓度1 mmol/L,体系为封闭.产物XPS分析结果表明,Se(Ⅳ)最终被FHC(Cl~-)还原为Se(0)或Se(-Ⅱ).     

XPS Analysis of the Aging of Thin,Adhesion Promoting,Fluorocarbon Treatments of DC Plasma Polymers

Plasma polymer treatment of aluminum alloys has recently been shown to improve adhesion of primer coatings, thereby reducing the corrosion of thusly protected panels to the levels afforded by conventional chromate conversion coating. One particular plasma polymer system, comprised of a 50 nm trimethylsilane DC plasma polymer capped by an ultrathin layer modified by DC hexafluoroethane plasma treatment, has shown tremendous adhesion increases to a wide variety of primers, yielding a coating that is virtually unremovable with conventional stripping applications. An application window was empirically deduced regarding this improved adhesion, indicating that the primer needed to be applied within 5 days of plasma treatment to display the tenacious adhesion to panels. In an effort to elucidate the differences between fresh and aged panels, an X-ray photoelectron spectroscopy (XPS) time study of this system was undertaken. Some direct correlation to this time frame was observed in the XPS data, indicating that a particular fluorocarbon structure in the films modified upon continued atmospheric exposure, rearranging the local bonding environment by introducing additional C—C bonding with an increase in oxygen incorporation.     

Understanding the Buoy Effect of Surface-Enriched Pt Complexes in Ionic Liquids: A Combined ARXPS and Pendant Drop Study**

Recently, we demonstrated that Pt catalyst complexes dissolved in the ionic liquid (IL) [C₄C₁Im][PF₆] can be deliberately enriched at the IL surface by introducing perfluorinated substituents, which act like buoys dragging the metal complex towards the surface. Herein, we extend our previous angle-resolved X-ray photoelectron spectroscopy (ARXPS) studies at complex concentrations between 30 and 5 %_mol down to 1 %_mol and present complementary surface tension pendant drop (PD) measurements under ultraclean vacuum conditions. This combination allows for connecting the microscopic information on the IL/gas interface derived from ARXPS with the macroscopic property surface tension. The surface enrichment of the Pt complexes is found to be most pronounced at 1 %_mol. It also displays a strong temperature dependence, which was not observed for 5 %_mol and above, where the surface is already saturated with the complex. The surface enrichment deduced from ARXPS is also reflected by the pronounced decrease in surface tension with increasing concentration of the catalyst. We furthermore observe by ARXPS and PD a much stronger surface affinity of the buoy-complex as compared to the free ligands in solution. Our results are highly interesting for an optimum design of IL-based catalyst systems with large contact areas to the surrounding reactant/product phase, such as in supported IL phase (SILP) catalysis.     

胶原蛋白-葡甘聚糖-壳聚糖(CKCS)共混膜的表面性质

生物材料植入人体后,其生物学性能主要由人体组织和体液等与材料表面的相互作用决定。本文通过对CKCS-2的CKCS-5膜的X-射线光电子能谱分析和静态接触角测定,考察胶原蛋白-葡甘聚糖-壳聚糖共混膜的表面性质,为共混膜在生物医学领域的应用提供理论依据。     

XPS investigations of the electrochemical double layer on silver in alkaline chloride solutions

The electrochemical double layer on Ag in alkaline NaCl solutions was examined ex situ with X-ray photoelectron spectroscopy (XPS). The specimens were removed from the electrolyte with hydrophobic surfaces and under potential control. The potential dependent surface concentrations of the adsorbed anions (Cl⁻, OH⁻), cations (Na⁺), the surface excess charge and the amount of adsorbed water were determined and compared to the results obtained for acidic NaCl solutions. The distinct differeness found between both electrolytes were discussed in terms of a specific adsorption of hydroxide ions in the basic Cl⁻-electrolyte; i.e., the OH⁻-surface concentration has to be considered for a proper determination of the cationic excess charge and the potential of zero charge. In addition, the initial stages of silver (1) oxide formation were examined with XPS.     

Direct Correlation of Surface Tension and Surface Composition of Ionic Liquid Mixtures—A Combined Vacuum Pendant Drop and Angle-Resolved X-ray Photoelectron Spectroscopy Study

We investigated the surface tension and surface composition of various mixtures of the two ionic liquids (ILs) 1-methyl-3-octyl-imidazolium hexafluorophosphate [C₈C₁Im][PF₆] and 1,3-bis(polyethylene glycol)imidazolium iodide [(mPEG₂)₂Im]I in the temperature range from 230 to 370 K under ultraclean vacuum conditions. The surface tension was measured using a newly developed apparatus, and the surface composition was determined by angle-resolved X-ray photoelectron spectroscopy (ARXPS). In the pure ILs, the alkyl chains of [C₈C₁Im][PF₆] and the PEG chains of [(mPEG₂)₂Im]I are enriched at the IL/vacuum interface. In the mixtures, a strong selective surface enrichment of the alkyl chains occurs, which is most pronounced at low [C₈C₁Im][PF₆] contents. For the surface tension, strong deviations from an ideal mixing behaviour take place. By applying a simple approach based on the surface composition of the mixtures as deduced from ARXPS, we are able to predict and reproduce the experimentally measured temperature-dependent surface tension values with astonishingly high accuracy.     

XPS研究单壁碳纳米管(SWNTs)上碳与碘形成的共价键

采用简单的氯胺-T反应制备了碘化的多羟基单壁碳纳米管(SWNTols)，发现碘与SWNTols的碳形成共价键.用同步辐射光电子能谱(SRXPS)和光电子能谱(XPS)测量发现,样品的碘的电子结合能与两个具有C－I共价键的参考物——苯的衍生物，完全一致，而与具有离子性质的NaI的结合能不同.这个结果对单壁碳纳米管今后的生物医学应用研究有实际意义.     

Summary of ISO/TC 201 Standard: ISO 14701:2011 – Surface chemical analysis – X‐ray photoelectron spectroscopy—measurement of silicon oxide thickness

This International Standard specifies several methods for measuring the oxide thickness at the surfaces of (100) and (111) silicon wafers as an equivalent thickness of silicon dioxide when measured using X‐ray photoelectron spectroscopy. It is only applicable to flat, polished samples and for instruments that incorporate an Al or Mg X‐ray source, a sample stage that permits defined photoelectron emission angles and a spectrometer with an input lens that may be restricted to less than a 6° cone semiangle. For thermal oxides in the range 1‐ to 8‐nm thickness, using the best method described in this International Standard, uncertainties at a 95% confidence level around 2% may be typical and around 1% at optimum. A simpler method is also given with slightly poorer, but often adequate, uncertainties. Copyright © 2012 Crown copyright.     

Temperature-Dependent Surface-Enrichment Effects of Imidazolium-Based Ionic Liquids

We present the first systematic study of the influence of temperature on the degree of surface enrichment of 1-alkyl-3-methylimidazolium-based ionic liquids (ILs). Using angle-resolved X-ray photoelectron spectroscopy, we demonstrate that the degree of surface enrichment strongly decreases with increasing temperature for all the studied ILs. For ILs with the same cation, but different anions, [C₈C₁Im]Br, [C₈C₁Im][TfO] and [C₈C₁Im][Tf₂N], no significant differences of the temperature-induced partial loss of surface enrichment are found. Measurements for [C₄C₁Im][TfO], [C₈C₁Im][TfO] and [C₁₈C₁Im][TfO] indicate a small effect of the chain length. For [C₁₈C₁Im][TfO], a continuous decrease of alkyl surface enrichment is found with increasing temperature, with no abrupt changes at the phase-transition temperature from the smectic A to the isotropic phase, indicating that the surface enrichment is not affected by this phase transition.     

In-Situ/Operando X-ray Characterization of Metal Hydrides

In this article, the capabilities of soft and hard X-ray techniques, including X-ray absorption (XAS), soft X-ray emission spectroscopy (XES), resonant inelastic soft X-ray scattering (RIXS), X-ray photoelectron spectroscopy (XPS), and X-ray diffraction (XRD), and their application to solid-state hydrogen storage materials are presented. These characterization tools are indispensable for interrogating hydrogen storage materials at the relevant length scales of fundamental interest, which range from the micron scale to nanometer dimensions. Since nanostructuring is now well established as an avenue to improve the thermodynamics and kinetics of hydrogen release and uptake, due to properties such as reduced mean free paths of transport and increased surface-to-volume ratio, it becomes of critical importance to explicitly identify structure-property relationships on the nanometer scale. X-ray diffraction and spectroscopy are effective tools for probing size-, shape-, and structure-dependent material properties at the nanoscale. This article also discusses the recent development of in-situ soft X-ray spectroscopy cells, which enable investigation of critical solid/liquid or solid/gas interfaces under more practical conditions. These unique tools are providing a window into the thermodynamics and kinetics of hydrogenation and dehydrogenation reactions and informing a quantitative understanding of the fundamental energetics of hydrogen storage processes at the microscopic level. In particular, in-situ soft X-ray spectroscopies can be utilized to probe the formation of intermediate species, byproducts, as well as the changes in morphology and effect of additives, which all can greatly affect the hydrogen storage capacity, kinetics, thermodynamics, and reversibility. A few examples using soft X-ray spectroscopies to study these materials are discussed to demonstrate how these powerful characterization tools could be helpful to further understand the hydrogen storage systems.