共查询到20条相似文献,搜索用时 15 毫秒
1.
Plasmonic field enhancement in a fully coated dielectric near field scanning optical microscope (NSOM)probe under radial polarization illumination is analyzed using an axially symmetric three-dimensional (3D)finite element method (FEM) model. The enhancement factor strongly depends on the illumination spot size, taper angle of the probe, and the metal film thickness. The tolerance of the alignment angle is investigated. Probe designs with different metal coatings and their enhancement performance are studied as well. The nanometric spot size at the tip apex and high field enhancement of the apertureless NSOM probe have important potential application in semiconductor metrology. 相似文献
2.
We present experimental results of an imaging technique that uses as a local probe the optical field enhanced at the junction of a scanning tunneling microscope illuminated by a p-polarized laser beam. Images of highly oriented pyrolithic graphite, recorded at a constant height mode, show a lateral optical resolution of as much as 10 nm. Approach curves exhibit sensitivity on a subnanometer scale of the optical signal to the tip-sample distance, yielding the ultrahigh vertical resolution reached in the images. 相似文献
3.
A scanning optical microscope in which an image is produced from the generation of optical second harmonics within the specimen has been constructed. Pictures have been obtained from various crystals which show high contrast levels and detail not visible with the conventional microscope. 相似文献
4.
《中国物理 B》2015,(5)
Phase is one of the most important parameters of electromagnetic waves. It is the phase distribution that determines the propagation, reflection, refraction, focusing, divergence, and coupling features of light, and further affects the intensity distribution. In recent years, the designs of surface plasmon polariton(SPP) devices have mostly been based on the phase modulation and manipulation. Here we demonstrate a phase sensitive multi-parameter heterodyne scanning near-field optical microscope(SNOM) with an aperture probe in the visible range, with which the near field optical phase and amplitude distributions can be simultaneously obtained. A novel architecture combining a spatial optical path and a fiber optical path is employed for stability and flexibility. Two kinds of typical nano-photonic devices are tested with the system. With the phase-sensitive SNOM, the phase and amplitude distributions of any nano-optical field and localized field generated with any SPP nano-structures and irregular phase modulation surfaces can be investigated. The phase distribution and the interference pattern will help us to gain a better understanding of how light interacts with SPP structures and how SPP waves generate, localize, convert, and propagate on an SPP surface. This will be a significant guidance on SPP nano-structure design and optimization. 相似文献
5.
M. G. Petrova G. V. Mishakov E. I. Demikhov A. I. Sharkov 《Bulletin of the Lebedev Physics Institute》2010,37(9):276-279
An optical scanning near-field microscope was developed. A cryostat for obtaining low temperatures in the range of 1.8–300
K was designed. The microscope control unit and software were advanced taking into account the temperature range. A room-temperature
measurement technique was refined on test aluminum gratings on glass with a period of 4 μm. An optimum size of the scan field,
which makes it possible to neglect piezoceramics nonlinearities, was determined. 相似文献
6.
M. Sigrist S. Gustavsson T. Ihn K. Ensslin D. Driscoll A. Gossard M. Reinwald W. Wegscheider 《Physica E: Low-dimensional Systems and Nanostructures》2006,32(1-2):5
Few-electron quantum dots with integrated charge read-out have been fabricated by layered local anodic oxidation of a Ga[Al]As heterostructure and a thin Titanium top gate. The additional set of gates provided by the metallic film is used to tune the quantum dots into the few-electron regime. Current through the quantum dots and the quantum dot charge have been simultaneously measured for electron numbers varying between zero and two. The singlet–triplet splitting varies in two different samples between 0.5 and 1.5 meV. The Zeeman splitting of the first conductance resonance is observed in parallel magnetic field. The high tunability and straightforward implementation of these structures are promising for future nanostructure design. 相似文献
7.
为满足机载光电系统的成像作用距离要求,对机载光学整流罩以及扫描反射镜的设计尺寸进行了理论仿真分析计算,并对研制的样机进行了试验研究。以实例形式给出了整流罩设计的作用距离与相关参量的计算结果,讨论了整流罩扫描系统的渐晕大小。装备该整流罩系统的样机,在近万米高空对音速某战机的红外长波扫描搜索距离可达到86 km,红外中波跟踪达到180 km,激光测距达到47 km。结果表明:根据探测作用距离理论模型分析计算,研制的机载光学整流罩及扫描反射镜光学系统达到了设计要求。 相似文献
8.
Compact electrostatic micromirror structures for use in the scanning arm of an optical coherence tomography (OCT) system are described. These devices consist of millimeter-scale mirrors resting upon micrometer-scale polyimide hinges that are tilted by a linear micromachine actuator, the integrated force array (IFA). The IFA is a network of deformable capacitor cells that electrostatically contract with an applied voltage. The support structures, hinges, and actuators are fabricated by photolithography from polyimide-upon-silicon wafers. These devices were inserted into the scanning arm of an experimental OCT imaging system to produce in vitro and in vivo images at frame rates of 4 to 8 Hz. 相似文献
9.
A scanning optical microscope is used to measure directly the refractive-index profile of an optical fibre. The effects of illuminating the fibre end with a highly convergent beam of light are considered. 相似文献
10.
In this paper, we study the dynamic modes of a scanning near-field optical microscope (SNOM) which uses an optical fiber probe; and the sensitivity of flexural and axial vibration modes for the probe were derived and the closed-form expressions were obtained. According to the analysis, as expected each mode has a different sensitivity and the first mode is the most sensitive mode of flexural and axial vibration for the SNOM probe. The sensitivities of both flexural and axial modes are greater for a material surface that is compliant with the cantilever probe. As the contact stiffness increases, the high-order vibration modes are more sensitive than the lower-order modes. Furthermore, the axial contact stiffness has a significant effect on the sensitivity of the SNOM probe, and this should be noted when designing new cantilever probes. 相似文献
11.
Use of a scanning near-field optical microscope architecture to study fluorescence and energy transfer near a metal 总被引:1,自引:0,他引:1
Fluorescence intensity depends strongly on the distance between the emitting molecule and a metallic interface. We show that a scanning near-field optical microscope (SNOM) is a simple and versatile tool for studying such an effect. The fluorescent molecules are embedded in a layer upon a silica substrate, and metal is coated on the SNOM tip. We present variations of fluorescence intensity versus tip-sample distance from 800 to ~80 nm . A simple model is used to explain the experimental results. The proposed setup could be used to study nonradiative transfer at a nanometric scale. It could also yield to a new type of optical near-field profiler that uses fluorescent signal. 相似文献
12.
<正>A method for local magneto-optical Kerr effect imaging based on a home-made scanning near-field optical microscope working in reflection mode is presented.Shear force detection is carried out by using a symmetric piezoelectric bimorph sensor,which provides an easy way not only for probe-surface distance control but also for imaging.Polarization-preserving fiber probes used as a local optical detector are fabricated with a heating-pulling technique and the probes' polarization properties are measured.Shear force topographic and near-field magneto-optical images of magneto-optical disk taken with the proposed method are shown. 相似文献
13.
In a scanning electron microscope the influence of electronic beam parameters on the electron-mirror images has been investigated. A simple theoretical model for scanning electron beam behavior in terms of beam and surface potentials is presented. The derived expression relates the scanning beam parameters and parameters of an irradiation region. Influence of a beam (the size and current), scanning potential, working distance, trapped charge and the irradiated area on electron mirror images are defined. Results show that the electron beam current has a considerable effect on the deduced mirror images in comparison with the other beam parameters. So it could be adapted for adjusting the phenomena of mirror effect. Moreover, the trapped charges have been calculated and the results examined in comparison with experimental data. 相似文献
14.
We have developed a scanning near-field optical microscope with an optically trapped metallic particle that has a small diameter compared to the wavelength of visible light. In this microscope we employed spot illumination to enhance the intensity of light scattered from a probe particle so we could reduce the diameter of the probe particle to 40nm. We detected slight irregularities of the surface of the cover glass near 10-nm depth. Also, we observed gold colloidal particles on the surface of the cover glass. 相似文献
15.
A near-field scanning optical microscope has been developed to yield optical images with various gap distances between the probe and the sample surface. The microscope uses an apertureless metallic probe, the position of which is controlled by regulation of the tunneling-electron current from the probe to the sample and by computer-generated bias voltage. Experimental results of near-field optical imaging with the developed microscope at different gap distances are shown. Thirteen images at gap distances of 0 to 500nm demonstrate that the near-field image depends strongly on the gap distance. The imaging characteristics of a near-field imaging system are shown with the spatial-frequency spectra of images. Future investigation of the developed microscope is also discussed. 相似文献
16.
Direct-write laser micromachining of diamond on a submicrometer scale with a near-field scanning optical microscope with an uncoated tapered fiber tip has been demonstrated. Micromachined structures can be imaged in situ immediately after modification of the sample. An early stage of the ablation process, which is believed to be conversion of diamond into graphite, has been visualized. 相似文献
17.
A split detector is used in a scanning optical microscope to produce high-quality differential amplitude contrast images. A slight lateral offset in the detector position is shown to introduce information about object height variations to the image. These results are compared with images obtained by electrical differentiation. 相似文献
19.
By using mercaptopropyltrimethoxysilane (MPTS) self-assembled monolayers (SAMs), electroless silver plating is developed for the metallization of near-field optical fiber probes. 相似文献
20.
Tom Neuman Pablo Alonso‐Gonzlez Aitzol Garcia‐Etxarri Martin Schnell Rainer Hillenbrand Javier Aizpurua 《Laser \u0026amp; Photonics Reviews》2015,9(6):637-649
Near‐field optical microscopy techniques provide information on the amplitude and phase of local fields in samples of interest in nanooptics. However, the information on the near field is typically obtained by converting it into propagating far fields where the signal is detected. This is the case, for instance, in polarization‐resolved scattering‐type scanning near‐field optical microscopy (s‐SNOM), where a sharp dielectric tip scatters the local near field off the antenna to the far field. Up to now, basic models have interpreted S‐ and P‐polarized maps obtained in s‐SNOM as directly proportional to the in‐plane ( or ) and out‐of‐plane () near‐field components of the antenna, respectively, at the position of the probing tip. Here, a novel model that includes the multiple‐scattering process of the probing tip and the nanoantenna is developed, with use of the reciprocity theorem of electromagnetism. This novel theoretical framework provides new insights into the interpretation of s‐SNOM near‐field maps: the model reveals that the fields detected by polarization‐resolved interferometric s‐SNOM do not correlate with a single component of the local near field, but rather with a complex combination of the different local near‐field components at each point (, and ). Furthermore, depending on the detection scheme (S‐ or P‐polarization), a different scaling of the scattered fields as a function of the local near‐field enhancement is obtained. The theoretical findings are corroborated by s‐SNOM experiments which map the near field of linear and gap plasmonic antennas. This new interpretation of nanoantenna s‐SNOM maps as a complex‐valued combination of vectorial local near fields is crucial to correctly understand scattering‐type near‐field microscopy measurements as well as to interpret the signals obtained in field‐enhanced spectroscopy.