Surface potential images of polycrystalline organic semiconductors obtained by Kelvin probe force microscopy

P-type copper phthalocyanine (CuPc) and n-type hexadecafluorophthalocyanina-tocopper (F₁₆CuPc) polycrystalline films were investigated by Kelvin probe force microscopy (KPFM). Topographic and corresponding surface potential images are obtained simultaneously. Surface potential images are related with the local work function of crystalline facets and potential barriers at the grain boundaries (GBs) in organic semiconductors. Based on the spatial distribution of surface potential at GBs, donor- and acceptor-like trapping states in the grain boundaries (GBs) of p-CuPc and n-F₁₆CuPc films are confirmed respectively. In view of spatial energy spectrum in micro-scale provided by KPFM, it is going to be a powerful tool to characterize the local electronic properties of organic semiconductors.     

Local current–voltage behaviors of preferentially and randomly textured Cu(In,Ga)Se2 thin films investigated by conductive atomic force microscopy

Electrical transport properties on polycrystalline Cu(In,Ga)Se₂ (CIGS) (Ga/(In+Ga) ≈35%) thin films were examined by conductive atomic force microscopy. The CIGS thin films with a (112) preferential or random texture were deposited on Mo-coated glass substrates. Triangular pyramidal grain growths were observed in the CIGS thin films preferentially textured to the (112) planes. Current maps of the CIGS surface were acquired with a zero or non-zero external voltage bias. The contrast of the images on the grain boundaries and intragrains displayed the conduction path in the materials. Local current–voltage measurements were performed to evaluate the charge conduction properties of the CIGS thin films.     

Ga梯度分布对Cu(In,Ga)Se_2薄膜及太阳电池的影响

传统制备Cu(In,Ga)Se2(CIGS)手段之一是共蒸发三步法,工艺中通过Cu,In,Ga,Se 4种元素相互扩散、作用形成抛物线形的Ga梯度分布.本文通过调整Ga源温度制备了Ga梯度分布不同的CIGS薄膜及电池.利用多种测试方法,研究了Ga梯度分布不同对CIGS薄膜表面及背面结构性质及电性质的影响,计算分析了表面导带失调值及背面电场对电池性能的影响,从而获得了合适的Ga梯度分布,提高了电池光谱相应,获得了较好的电池性能参数.     

Nanoscale determination of surface orientation and electrostatic properties of ZnO thin films

Scanning force microscopy related techniques are applied to study surface nanoscale properties. We show that nanogoniometry can be combined with local electrostatic measurements – electrostatic force microscopy and Kelvin probe microscopy – to identify surface planes families and to study their local electrical properties. The scanning force microscopy techniques employed are analyzed and the correct way of acquiring and interpreting data is discussed in detail. The experiments performed on ZnO films grown along the nonpolar [112̄0] direction show that these films completely facet into {101̄1} and {101̄1̄} planes, which follow a well defined pattern of surface potential along the [0001] direction. This pattern is explained in terms of the different ionic termination – Zn or O ions – of the exposed facets. Finally, the presence of inversion domain boundaries is discussed. PACS 68.47.Gh; 73.30.+y; 68.37.-d; 73.63.-b     

低温超薄高效Cu(In,Ga)Se2太阳电池的实现

衬底温度保持恒定, 在Se气氛下按照一定的元素配比顺序蒸发Ga, In, Cu制备厚度约为0.7 μrm的Cu(In_0.7Ga_0.3)Se₂ (CIGS)薄膜. 利用X射线衍射仪分析薄膜的晶体结构及物相组成, 扫描电子显微镜表征薄膜形貌及结晶质量, 二次离子质谱仪测试薄膜内部元素分布, 拉曼散射谱 分析薄膜表面构成, 带积分球附件的分光光度计测量薄膜光学性能. 研究发现在Ga-In-Se预制层内, In主要通过晶界扩散引起Ga/(Ga+In)分布均匀化. 衬底温度高于450 ℃时, 薄膜呈现单一的Cu(In_0.7Ga_0.3)Se₂相; 低于400℃, 薄膜存在严重的Ga的两相分离现象, 且高含Ga相主要存在于薄膜的上下表面; 低于300 ℃, 薄膜结晶质量进一步恶化. 薄膜表层的高含Ga相Cu(In_0.5Ga_0.5)Se₂以小晶粒形式均匀分布于薄膜表面, 增加了薄膜的粗糙度, 在电池内形成陷光结构, 提高了超薄电池对光的吸收. 加上带隙值较小的低含Ga相的存在, 使电池短路电流密度得到较大改善. 衬底温度在550 ℃–350 ℃变化时, 短路电流密度J_SC是影响超薄电池转换效率的主要因素; 而衬底温度T_sub低于300 ℃时, 开路电压V_OC和填充因子FF降低已成为电池性能减退的主要原因. T_sub为350 ℃时制备的0.7 μm左右的超薄CIGS电池转换效率达到了10.3%. 关键词： 2薄膜')" href="#">Cu(In,Ga)Se₂薄膜 衬底温度 超薄 太阳电池     

Adjusting the sodium diffusion into CuInGaSe2 absorbers by preheating of Mo/SLG substrates

We propose a very simple method to adjust the supply of Na from a Mo/soda-lime glass (SLG) substrate into the overgrown CuInGaSe₂(CIGS) layer. Mo/SLG substrates for CIGS solar cells were heated in vacuum (=preheated) before use. Na composition in the finished CIGS films were measured by electron probe microanalysis, in association with the preheating temperature and thickness of the Mo layers. The Na concentration at the surface of the CIGS layers decreased with higher preheating temperature, while the cell performance improved.     

硒化前后电沉积贫铜和富铜的Cu(In1-xGax)Se2薄膜成分及结构的比较

采用电沉积法获得了接近化学计量比的贫铜和富铜的Cu（In_1-xGa_x）Se₂（CIGS）预置层,研究比较了两种预置层及其硒化处理后的成分和结构特性.得到了明确的实验证据证明,硒化后富铜薄膜中的Cu_xSe相会聚集凝结成结晶颗粒分散在表面.研究表明：在固态源硒化处理后,薄膜成分基本不变;当预置层中原子比Cu/（In+Ga）<11时,硒化后薄膜表面存在大量的裂纹;而当Cu/（In+Ga） >12时,可以消除裂纹的产生,形成等轴状小晶粒;富铜预置层硒化时蒸发沉积少量In,Ga和Se后,电池效率已达到68%;而贫铜预置层硒化后直接制备的电池效率大于2%,值得进一步深入研究. 关键词： 1-xGa_x）Se₂薄膜')" href="#">Cu（In_1-xGa_x）Se₂薄膜 电沉积 硒化处理 贫铜或富铜薄膜     

Comparison of Cu(In,Ga)Se2 thin films deposited on different preferred oriented Mo back contact by RF sputtering from a quaternary target

The Cu(In, Ga)Se₂ (CIGS) thin films were deposited on bare glass and DC sputtered preferential oriented Mo-coated glass by RF sputtering from a single quaternary target. The structural and morphological properties of the films were characterized by X-ray diffraction (XRD), Raman spectroscope, energy dispersive X-ray spectrometer (EDS) and atomic force microscope (AFM). Preferred orientation of the Mo back contact was tuned between (110) and (211) plane by controlling the thickness. All the deposited CIGS thin films show (112) preferred oriented chalcopyrite structures. The films prepared on Mo-coated glass show higher quality crystallinity, better stoichiometry composition and more smooth surface morphology. Especially, the film on (211) oriented Mo-coated glass with the best integrated performance is expected to be a candidate absorber for high-efficiency CIGS solar cell device.     

Improved growth of solution‐deposited thin films on polycrystalline Cu(In,Ga)Se2

CdS and Zn(O,S) grown by chemical bath deposition (CBD) are well established buffer materials for Cu(In,Ga)Se₂ (CIGS) solar cells. As recently reported, a non‐contiguous coverage of CBD buffers on CIGS grains with {112} surfaces can be detected, which was explained in terms of low surface energies of the {112} facets, leading to deteriorated wetting of the chemical solution on the CIGS surface. In the present contribution, we report on the effect of air annealing of CIGS thin films prior to the CBD of CdS and Zn(O,S) layers. In contrast to the growth on the as‐grown CIGS layers, these buffer lay‐ ers grow densely on the annealed CIGS layer, even on grains with {112} surfaces. We explain the different growth behavior by increased surface energies of CIGS grains due to the annealing step, i.e., due to oxidation of the CIGS surface. Reference solar cells were processed and completed by i‐ZnO/ZnO:Al layers for CdS and by (Zn,Mg)O/ZnO:Al for Zn(O,S) buffers. For solar cells with both, CdS and Zn(O,S) buffers, air‐annealed CIGS films with improved buffer coverage resulted in higher power‐conversion efficiencies, as compared with the devices containing as‐grown CIGS layers. (© 2016 WILEY‐VCH Verlag GmbH &Co. KGaA, Weinheim)     

Impregnation of Polycarbonate by Paramagnetic Probe 2,2,6,6-Tetramethyl-4-Hydroxy-Piperidine-1-Oxyl (TEMPOL) in Supercritical CO<Subscript>2</Subscript>

The aim of the research was to test the advantages of spin probe electron paramagnetic resonance approach in studying polymers impregnation with organic molecules in supercritical CO₂ (scCO₂) The impregnation of bisphenol A polycarbonate with the spin probe TEMPOL was carried out at 307–343 K and 11.6–35 MPa. The mean and local concentrations of the spin probe in the polymer were evaluated. An increase in temperature and pressure resulted in a more even distribution of the dopant in the polymer matrix. It was observed that, at 307 K and 19.6 MPa, the spin probe was located only near the surface of the sample. Local mobility of the spin probe molecules was found to be similar in polycarbonate films impregnated in scCO₂ and cast from dichloroethane solution. It was shown that changes in the structure of the surface and bulk of the polymer detected by the atomic force and optical polarization microscopy are not directly related with the distribution of the dopant molecules and their average content in the polymer.     

Zn1−xMgxO/ZnO heterostructures studied by Kelvin probe force microscopy conjunction with probe characterizer

The surface potential of Zn_1−xMg_xO/ZnO heterostructure grown by radical source molecular beam epitaxy was measured by Kelvin force microscopy (KFM). A clear correlation was observed between the topographic image and the surface potential of Zn_0.56Mg_0.44O/ZnO heterostructure. The potential area around the surface pits was about 60 mV lower than that of the surrounding region, which suggests the effects of the pits on the electrical properties of the potential layer. In order to guarantee the accuracy of measurement, the probe shape was analyzed by probe characterizer and using Au thin films as a potential standard.     

Rapid treatment of CIGS particles by intense pulsed light

Intense pulsed light (IPL) technique has been proposed to make large grains Cu(In_0.7Ga_0.3)Se₂ (CIGS) film using CIGS particles. The proposed process is non-vacuum based and performed at room temperature without selenization treatment. Melting and recrystallization of CIGS particles to larger grains without structural deformation and phase transformation are proved with adequate characterization evidences. X-ray powder diffraction (XRD), scanning electron microscopy (SEM) and energy dispersion analysis (EDS) were used to characterize the prepared films. Melting of the CIGS particles and recrystallization to larger grains by light energy in 20 ms short reaction time could be the reason for no structural deformation and secondary phase generation during the process. The CIGS film prepared from its constituent nanoparticles by IPL treatment has great potential for use as absorber layer for solar cell application and is expected to have large impact on cell fabrication process in terms of cost reduction and simplified processing.     

Grain-boundary physics in polycrystalline CuInSe2 revisited: experiment and theory

Current studies have attributed the remarkable performance of polycrystalline CuInSe2 (CIS) to anomalous grain-boundary (GB) physics in CIS. The recent theory predicts that GBs in CIS are hole barriers, which prevent GB electrons from recombining. We examine the atomic structure and chemical composition of (112) GBs in Cu(In,Ga)Se2 (CIGS) using high-resolution Z-contrast imaging and nanoprobe x-ray energy-dispersive spectroscopy. We show that the theoretically predicted Cu-vacancy rows are not observed in (112) GBs in CIGS. Our first-principles modeling further reveals that the (112) GBs in CIS do not act as hole barriers. Our results suggest that the superior performance of polycrystalline CIS should not be explained solely by the GB behaviors.     

Spin domain mapping of a CrO2 thin film using spin-polarized current microscopy

We investigate spin domain mapping of a CrO₂ thin film using spin-polarized current microscopy at room temperature, where conductive atomic force microscopy (CAFM) with a CrO₂-coated tip is used. The nanoscale spin domains of the CrO₂ thin film were crosschecked by magnetic force microscopy (MFM). Notably, the CAFM exhibits the spin domains of the CrO₂ thin film with higher resolution than the MFM, which may result from a local point contact between the nanoscale CrO₂-coated tip and surface of the CrO₂ thin film.     

Nanoscale imaging of surface piezoresponse on GaN epitaxial layers

Surfaces of GaN films were investigated by atomic force microscopy (AFM) with implemented piezoelectric force microscopy technique. A model of PFM based on the surface depletion region in GaN films is discussed. The local piezoelectric effect of the low frequency regime was found to be in phase with the applied voltage on large domains, corresponding to a Ga-face of the GaN layer. Low piezoresponse is obtained within the inter-domain regions. The use of frequencies near a resonance frequency enhances very much the resolution of piezo-imaging, but only for very low scanning speed the piezo-imaging can follow the local piezoelectric effect. An inversion of the PFM image contrast is obtained for frequencies higher than the resonance frequencies. The effect of a chemical surface treatment on the topography and the piezoresponse of the GaN films was also investigated. Textured surfaces with very small domains were observed after the chemical treatment. For this kind of surfaces, piezo-induced torsion rather than bending of the AFM cantilever dominates the contrast of the PFM images. A small memory effect was observed, and explained by surface charging and confinement of the piezoelectric effect within the carrier depletion region at the GaN surface.     

Composition and morphology of partially selenized CuIn1−XGaXSe2 thin films prepared using diethylselenide (DESe) as selenium source

CuIn_1−xGa_xSe₂ (CIGS) thin films are being prepared by selenization of Cu-In-Ga precursors using diethylselenide, (C₂H₅)₂Se, (DESe) as selenium source in place of H₂Se gas because of lower toxicity and ease of handling. Rough estimates indicate that selenization process using DESe would cost approximately same or slightly less compared to that using H₂Se. Price of DESe per mole is approximately five times that of H₂Se. However, partial pressure of DESe, which reflects source material consumption, is approximately three to four times less than that of H₂Se, due to higher decomposition rate of DESe compared to that of H₂Se. The actual DESe consumption would be four to ten times less compared to that of H₂Se. A selenization set-up using DESe as selenium source has been designed, fabricated and installed at FSEC Photovoltaic Materials Lab. Initial characterization of CIGS thin films have been carried out using electron probe microanalysis (EPMA), X-ray diffraction (XRD), scanning electron microscopy, secondary ion mass spectroscopy and Auger electron spectroscopy. EPMA showed elemental ratios of film to be near stoichiometric composition CuInSe₂ with very low gallium content mainly because of tendency of gallium to diffuse towards back contact. XRD data shows formation of high crystalline CuInSe₂ phase consistent with the EPMA data.     

CIGS solar cell devices on steel substrates coated with Na containing AlPO4

Flexible copper indium gallium diselenide (CIGS)-based solar cells are developed on stainless steel (STS) substrates covered with an insulating layer. The Na containing AlPO₄ (“Na-AlPO₄”) material is processed using the slot-die coating method. The coated film is analyzed using various spectroscopic methods including scanning electron microscopy, energy dispersive X-ray spectrometry, transmission electron microscopy, secondary-ion mass spectrometry, X-ray diffraction, and 3D profiler. The characteristics of the solar cells fabricated on these insulating films are also evaluated. The application of the Na-AlPO₄ layer on the STS substrates is compared with the electrical performance of the CIGS solar cells fabricated on metal foil. Although the insertion of the insulating layer does not influence the formation of the CIGS film and solar cell performance, a better uniformity in the current–voltage curve is obtained.     

铜铟镓硒薄膜的拉曼和可见-近红外光谱表征

采用恒电位电沉积法在ITO上制备了铜铟镓硒(CIGS)前驱体薄膜,该前驱体薄膜在充氩气管式炉中经过高温硒化可得到结晶良好的CIGS薄膜。采用X-射线衍射(XRD)、拉曼光谱(Raman)、扫描电子显微镜(SEM)和紫外-可见光-近红外光谱仪分别表征了CIGS薄膜的结构、形貌、成分以及可见-近红外光谱(Vis-NIR)吸收特性。XRD结果表明前驱体薄膜高温硒化后所得的CIGS薄膜具有(112)择优取向,薄膜中CIGS晶粒的平均尺寸为24.7nm,Raman光谱表明薄膜中的CIGS是具有黄铜矿结构的四元纯相,没有其他二元三元杂相存在。Vis-NIR测量结果表明CIGS的禁带宽度随薄膜中镓含量的增加而增加,当Ga含量达5.41%时,通过吸收光谱测得CIGS的禁带宽度为1.11eV,通过理论计算得到镓铟比为Ga/(In+Ga)=16.3%,小于SEM测量所得的镓铟比Ga/(In+Ga)=21.4%,这表明还需进一步提高CIGS薄膜的结晶度。所有测量表明优化后的ITO/CIGS非常适合用来制作高质量的双面太阳能电池。该研究提出了制备低成本CIGS前驱体薄膜及高温硒化的新方法,通过这些方法在ITO上制备了均匀、致密、附着力好的CIGS薄膜。通过上述表征可知,在新工艺下制备的CIGS薄膜结晶度高,成分合理,无杂相,光吸收性质好。与磁控溅射法类似,电沉积法非常适合大面积工业化生产,该工作对CIGS的规模化生产具有重要的借鉴意义。     

Annealing induced transformations in structural and optical properties of Ge30Se70−xBix thin films

ABSTRACT

Thin films of Ge₃₀Se_70?xBi_x (x?=?5, 15, 20) were prepared by thermal evaporation method on glass substrates with thickness 800?nm. The films were annealed at 250°C and 320°C for 2?h to study the annealing-induced structural and optical change. The X-ray diffraction characterization revealed the amorphous to crystalline phase transformation with annealing. The indirect optical band gap decreased with annealing which is explained on the basis of phase transformation and density of localized states. The formation of surface dangling bonds around the crystallites during crystallization process reduced the band gap. The Tauc parameter and Urbach energy change show the degree of chemical disorderness in the films. The transmitivity decreased while the absorption coefficient increased with the annealing process. The microstructural study done by Field emission scanning electron microscopy shows the formation of crystallites upon annealing. Atomic force microscopy investigation on these films shows the influence of annealing on surface topography.     

Scanning-probe-induced local decomposition of solid germanium monoxide films: The nano-pattering of germanium

The possibility of forming the Ge-based wires with the nanoscale’s lateral resolution using the local modification of GeO_(sol) films by a scanning probe microscope was demonstrated for the first time. The property of the solid germanium monoxide films, namely, their metastability, was used to decompose the GeO film on Ge and GeO₂ by running the high-density electric current under the probe of the atomic force microscope.