Manifestation of interaction effects in Raman spectra of CdTe quantum-dot layers with ZnTe narrow barriers

The Raman spectra of superlattices consisting of layers of CdTe self-assembled quantum dots separated by ZnTe narrow barriers with thicknesses of 10 and 5 monolayers are investigated. It is found that, apart from the bands previously observed at frequencies of ～120 and ～140 cm^?1 for samples with thicker barriers (25 and 12 monolayers), the Raman spectra exhibit a band at ～147 cm^?1 in the frequency range of CdTe vibrational modes. This band is attributed to a symmetric vibrational mode of a pair of quantum dots with oppositely directed oscillations of the dipole moments. It is this type of vibrational mode in the material surrounding the ZnTe quantum dot that accounts for the shift of the band at ～200 cm^?1 near the LO mode of ZnTe vibrations toward lower frequencies.     

Raman study of InAs/GaAs quantum dot solar cells

We report polarized and resonant Raman study of InAs/GaAs quantum dot solar cell (QDSC) structures. Raman spectra obtained from the top surfaces of the samples suggested that the formation of InAs QDs induced tensile strain in the overgrown GaAs layers. Furthermore, a longitudinal optical phonon-plasmon (LPP) coupled modes were observed in the p-type GaAs layers. The tensile strain was increased with an increase in the QD size. The hole concentrations estimated by fitting the individual LPP coupled modes were in the range of 2.4–3.5 × 10¹⁸ cm^?3. Resonant Raman spectra obtained from the cleaved sides, where the QDs were located, showed a 225 cm^?1 mode in parallel polarization configurations. Based on accurate analysis, this mode was identified as the LA(X) phonon of GaAs.     

静压下(CdTe)_2(ZnTe)_4-ZnTe多量子阱结构的多声子共振拉曼散射

用加静高压的方法改变光学能隙来实现共振条件。在以(CdTe)_2(ZnTe)_4短周期超晶格为阱层,(ZnTe)_(4)为垒层的多量子阱结构中观察到高达四阶的类 ZnTe 纵光学声子模的多声子共振拉曼散射。通过对拉曼位移随压力变化的分析,发现在与(CdTe)_2(ZnTe)_4短周期超晶格共振时测得的类ZnTe 纵光学声子模的频率比与 ZnTe 势垒层共振时测得的 ZnTe 纵光学声子模的频率低4cm~(-1)。并将它归结为在短周期超品格中纵光学声子模的限制效应。在与短周期超品格严格的2LO 声子出射共振条件下观察到了类 CdTe 的2LO 声子的共振拉曼峰。     

Nanotwinning in CdS quantum dots

High resolution transmission electron microscopy, X-ray diffraction and photoluminescence measurements are carried out in order to study the defects in CdS quantum dots (QDs), synthesized in cubic phase by chemical co-precipitation method. The nanotwinning structures in CdS quantum dots (∼2.7 nm) are reported for the first time. Mostly CdS QDs are characterized by existence of nanotwin structures. The twinning structures are present together with stacking faults in some QDs while others exist with grain boundaries. Raman spectroscopy analysis shows intense and broad peaks corresponding to fundamental optical phonon mode (LO) and the first over tone mode (2LO) of CdS at 302 cm⁻¹ and 605 cm⁻¹ respectively. A noticeable shift is observed in Raman lines indicating the effect of phonon confinement. Fourier transform infrared spectroscopy analysis confirms the presence of Cd–S stretching bands at 661 cm⁻¹ and 706 cm⁻¹. The photoluminescence spectrum shows emission in yellow and red regions of visible spectrum. The presence of stacking faults and other defects are explained on the basis of X-rays diffraction patterns and are correlated with photoluminescence spectrum. These nanotwinning and microstructural defects are responsible for different emissions from CdS QDs.     

Multiphonon resonant Raman scattering in N‐doped ZnO

Multiphonon resonant Raman scattering in N‐doped ZnO films was studied, and an enhancement of the resonant Raman scattering process as well as longitudinal optical (LO) phonon overtones up to the sixth order were observed at room temperature. The resonant Raman scattering intensity of the 1LO phonon in N‐doped ZnO appears three times as strong as that of undoped ZnO, which mainly arises from the defect‐induced Raman scattering caused by N‐doping. The nature of the 1LO phonon at 578 cm⁻¹ is interpreted as a quasimode with mixed A₁ and E₁ symmetry because of the defects formed in the ZnO lattice. In addition, the previously neglected impurity‐induced two‐LO‐phonon scattering process was clearly observed in N‐doped ZnO. Copyright © 2009 John Wiley & Sons, Ltd.     

Resonance Raman study of He+ ion implanted nanostructured ZnS

ZnS nanocrytsals of size ∼2.5 nm were prepared by chemical precipitation technique. Pressed pellets of nanostructured ZnS were implanted with He⁺ ions at doses of 5 × 10¹⁴, 1 × 10¹⁵ and 5 × 10¹⁵ ions/cm². Raman spectra of both unimplanted and He⁺ ion implanted samples were recorded with ultraviolet (UV) excitation. LO, 2LO, 2TO, (LO + TA) and (2TO − TA) modes of ZnS were observed in the resonance Raman spectra of the unimplanted nanostructured ZnS samples. In addition, a surface mode was observed at 294 cm⁻¹. With the implantation of He⁺ ions, the 2TO mode disappeared and 2LO mode became prominent and this observation was attributed to the decrease in band gap of ZnS nanocrytsals due to ion implantation. The exciton–LO phonon coupling strength was determined from the intensity ratio of 2LO to LO modes and it was observed that the exciton–LO phonon coupling strength increases with increase in implantation dose. In the present work, we report for the first time the observation of 2TO mode in the resonance Raman spectrum of nanostructured ZnS and also the modification of exciton–LO phonon coupling strength of semiconductor nanoparticles by ion implantation. Copyright © 2008 John Wiley & Sons, Ltd.     

Raman scattering in multilayer structures with CdTe quantum dots in ZnTe

Raman spectra in superlattices composed of layers of self-assembled CdTe quantum dots separated by ZnTe barriers are investigated. As the barrier thickness increases, a high-frequency shift of all peaks is observed, which is explained by a decrease in the lattice constant averaged over the volume of the entire structure. Peaks are found at a CdTe TO mode frequency of 140 cm^?1 and also at 120 cm^?1. The first peak is assigned to the symmetric Coulomb (interface) mode of the quantum dot material, and the low-frequency peak is assigned to the symmetric mode of the phonons captured in the quantum dot. This combination of modes in structures with quantum dots has not been observed previously.     

Photoluminescence and exciton resonances over the scattered light in multiphonon spectra of resonant scattering in the CdTe/ZnTe superlattices with narrow quantum wells

Photoluminescence and Raman scattering spectra in CdTe/ZnTe heterostructures and superlattices with narrow quantum wells (4.8–9.2 Å) in a temperature range of 5–300 K have been measured. The temperature dependences of the intensity of exciton luminescence in isolated quantum wells have been studied, and the thermal activation energies associated with the effective barriers for electrons and holes have been determined. In CdTe/ZnTe heterostructures, the binding energies of an exciton with a heavy hole have been determined as functions of the quantum well width. The multiphonon Raman spectra that exhibit distinctive features, such as the weak intensity of nLO phonon lines of ZnTe (n < 8), the absence of their dependence on the number n (n > 2), and the multiple participation in scattering of acoustic LA phonons with large wave vector, have been investigated. The results have been explained based on the concept of the relaxation of hot excitons over the exciton band.     

Formation of InAs quantum dots at ultrahigh growth rates

We fabricated quantum dot (QD) structures at ultrahigh growth rates. Smaller fluctuations in QD size were observed when they were grown at a rate of 1.0 ML/s under conventional growth conditions (growth temperature of 500 °C and As₄ flux of 9×10⁻⁶ Torr). For QDs grown at high rates, growth interruption played an important role in the fabrication of QD structures; this was confirmed by carrying out reflection high-energy electron diffraction. Photoluminescence for QDs grown at high and low growth rates, with growth interruption and with low-temperature capping was observed at around 1250 nm at room temperature, indicating that high-quality QDs can be fabricated by employing high growth rates.     

All‐optical modulation based on silicon quantum dot doped SiOx:Si‐QD waveguide

All‐optical modulation based on silicon quantum dot doped SiO_x:Si‐QD waveguide is demonstrated. By shrinking the Si‐QD size from 4.3 nm to 1.7 nm in SiO_x matrix (SiO_x:Si‐QD) waveguide, the free‐carrier absorption (FCA) cross section of the Si‐QD is decreased to 8 × 10⁻¹⁸ cm² by enlarging the electron/hole effective masses, which shortens the PL and Auger lifetime to 83 ns and 16.5 ps, respectively. The FCA loss is conversely increased from 0.03 cm⁻¹ to 1.5 cm⁻¹ with the Si‐QD size enlarged from 1.7 nm to 4.3 nm due to the enhanced FCA cross section and the increased free‐carrier density in large Si‐QDs. Both the FCA and free‐carrier relaxation processes of Si‐QDs are shortened as the radiative recombination rate is enlarged by electron–hole momentum overlapping under strong quantum confinement effect. The all‐optical return‐to‐zero on‐off keying (RZ‐OOK) modulation is performed by using the SiO_x:Si‐QD waveguides, providing the transmission bit rate of the inversed RZ‐OOK data stream conversion from 0.2 to 2 Mbit/s by shrinking the Si‐QD size from 4.3 to 1.7 nm.     

InGaN薄膜的紫外共振喇曼散射

利用325nm紫外光激发,对不同组分的In_xGa_1-xN薄膜的喇曼散射谱进行了研究.在光子能量大于带隙的情况下,观察到显著增强的二阶A₁(LO)声子散射峰.二阶LO声子峰都从一阶LO声子的二倍处向高能方向移动,移动量随样品In组分的增加而增大,认为是带内Frhlich相互作用决定的多共振效应引起的.分析了一阶LO声子散射频率和峰型与In组分的关系.在喇曼谱中观察到样品存在相分离现象,并与X射线衍射的实验结果进行 关键词： xGa_1-xN合金')" href="#">In_xGa_1-xN合金 紫外共振喇曼散射 二阶声子 相分离     

Surface polariton dispersion measurement by Raman scattering excited in total reflection condition

We report the first measurement of phonon surface polariton (s.p.) dispersion by a non-forward Raman scattering geometry. The Raman scattering from surface modes was excited by the evanescent electromagnetic wave produced by total reflection at the interface between two transparent media. This Raman Scattering excited in condition of Total Reflection, RSTR, has been applied to the NaClO₃-sapphire interface for studying the surface polariton dispersion in the gap between the TO frequency at 966 cm^-1 and the LO frequency at 983 cm^-1 of sodium chlorate. Comparison is made between the experimental and theoretical dispersion curves.     

Structural modifications of GaN after cerium implantation

Among the family of rare earth (RE) dopants, the doping of first member Ce into GaN is the least studied system. This article reports structure properties of Ce‐doped GaN realized by technique of ion implantation. Ce ions were implanted into metal organic chemical vapor deposition grown n‐ and p‐GaN/sapphire thin films at doses 3 × 10¹⁴ and 2 × 10¹⁵ cm⁻². X‐ray diffraction scans and Raman scattering measurements exhibited expansion of lattice in the implanted portion of the samples. First order Raman scattering spectra show appearance of several disorder‐activated Raman scattering modes in addition to typical GaN features. A dose‐dependent decrease in intensity of E₂ mode was observed in Raman the spectra of the implanted samples. Ultraviolet Raman spectra of implanted samples show complete quenching of photoluminescence emission and appearance of multiple A₁(LO) phonon scattering modes up to fifth order. Moreover, a decrease in intensity and an increase in line width of LO modes as a function of wavenumber were observed for implanted samples. Copyright © 2012 John Wiley & Sons, Ltd.     

One-phonon-assisted resonant electron Raman scattering of GaAs quantum dots in an AlAs matrix

We have presented a theoretical calculation of the differential cross section (DCS) for the electron Raman scattering (ERS) process associated with the bulk-like longitudinal optical (LO) and interface optical (IO) phonon modes in semiconductor quantum dots (QDs). Electron states are considered to be confined within the QDs. We consider the Fröhlich electron-phonon interaction in the framework of the dielectric continuum approach. We study selection rules for the processes. Some singularities in the Raman spectra are found and interpreted. A discussion of the phonon behavior for QDs with large and small size is presented. The numerical results are also compared with that of experiments.     

Resonance Raman scattering of excitonic polaritons by LO and acoustic phonons in ZnTe

We have observed dispersive two-phonon Raman scattering of polaritons by LO and acoustic phonons near the lowest exciton state of ZnTe. From the Stokes shifts of these Raman lines, it has been found that the scattering process switches from an acoustic phonon followed by one LO phonon to the reversed one: a LO phonon followed by an acoustic one.     

Electronic states and vibration spectra of CdTe/ZnTe quantum dot superlattices

Electronic and vibrational states in CdTe/ZnTe quantum dot superlattices are studied using optical spectroscopy techniques (photoluminescence in a wide temperature range, IR reflection, and Raman scattering). The effect of the ZnTe barrier layer thickness on the luminescence spectra of the structures is discussed. The luminescence from electronically coupled islands is assumed to be due to spatially indirect excitons because of the specific features of the CdTe/ZnTe heterostructure band structure. A combination of quantum-dot vibrational modes, which has not been observed earlier, is detected in the Raman spectra. Analysis of the lattice IR reflection spectra shows that, in the case of large barrier thicknesses between the quantum-dot planes, elastic stresses are concentrated in the Zn_1?xCd_xTe layers, whereas in structures with lower barrier thicknesses the elastic-strain distribution exhibits a more complicated pattern.     

半导体超晶格的多声子拉曼散射研究

半导体超晶格的多声子拉曼散射研究／张树霖，杨昌黎，侯勇田（北京大学物理系北京１００８７１）彭中灵，李杰，袁诗鑫（中科院上海技物所上海２０００８３）Ｒ．Ｐｌａｎｅｌ（ＭｉｃｒｏｓｔｒｕｃｔｕｒｅｓａｎｄＭｉｃｒｏｅｌｅｃｔｒｏｎｉｃｓＬａｂｏｒａｔｏｒ...     

Morphology of InN nanorods using spectroscopic Raman imaging

We report the vibrational properties of vertical and oblique InN nanorods (NRs) grown by molecular beam epitaxy (MBE). Surface optical (SO) Raman mode at 561 cm⁻¹, belonging to E₁ symmetry [SO(E₁)], is identified along with symmetry allowed Raman modes of E₂(low), E₂(high), and E₁(LO) at 87, 489, and 589 cm⁻¹, respectively, corresponding to wurtzite InN phase. Usually, SO phonon modes arise due to breakdown of translational symmetry of surface potential at surface defects, which are attributed by the surface roughness. Intensity distribution of E₁(LO) and SO(E₁) phonon modes over a specified area have been analysed using Raman area mapping with an optical resolution of 400 nm. Imaging with E₁(LO) phonon mode, originating from the bulk of the sample, distinguishes the vertical NRs alone. We are able to resolve NR morphologies in both vertical and oblique cases with additional Raman mapping analysis of SO(E₁) phonon mode, emerging from the surface irregularities, which are confined to the tip of MBE grown NRs. Copyright © 2013 John Wiley & Sons, Ltd.     

Electronic Raman scattering and infrared absorption by arsenic acceptors in ZnTe

We have measured electronic Raman scattering spectra and infrared absorption spectra of arsenic doped ZnTe. Electronic transitions from the ground state to the excited states in the arsenic acceptor and also vibronic transitions accompanying 1 LO phonon have been observed in both spectra. Experimentally determined acceptor levels are compared with the theoretical calculation.     

First order Raman scattering analysis of transition metal ions implanted GaN

Transition Metal (TM) ions V, Cr, Mn and Co were implanted into GaN/sapphire films at fluences 5×10¹⁴, 5×10¹⁵ and 5×10¹⁶ cm⁻². First order Raman Scattering (RS) measurements were carried out to study the effects of ion implantation on the microstructure of the materials, which revealed the appearance of disorder and new phonon modes in the lattice. The variations in characteristic modes 1GaN i.e. E₂(high) and A₁(LO), observed for different implanted samples is discussed in detail. The intensity of nitrogen vacancy related vibrational modes appearing at 363 and 665 cm⁻¹ was observed for samples having different fluences. A gallium vacancy related mode observed at 277/281 cm⁻¹ for TM ions implanted at 5×10¹⁴ cm⁻² disappeared for all samples implanted with rest of fluences. The fluence dependent production of implantation induced disorder and substitution of TM ions on cationic sites is discussed, which is expected to provide necessary information for the potential use of these materials as diluted magnetic semiconductors in future spintronic devices.