Kelvin probe force microscopy and its application

Kelvin probe force microscopy (KPFM) is a tool that enables nanometer-scale imaging of the surface potential on a broad range of materials. KPFM measurements require an understanding of both the details of the instruments and the physics of the measurements to obtain optimal results. The first part of this review will introduce the principles of KPFM and compare KPFM to other surface work function and potential measurement tools, including the Kelvin probe (KP), photoemission spectroscopy (PES), and scanning electron microscopy (SEM) with an electron beam induced current (EBIC) measurement system. The concept of local contact potential difference (LCPD), important for understanding atomic resolution KPFM, is discussed. The second part of this review explores three applications of KPFM: metallic nanostructures, semiconductor materials, and electrical devices.     

Monitoring of mechanical properties of serially passaged bovine articular chondrocytes by atomic force microscopy

Atomic force microscopy (AFM) is a powerful tool in imaging cells and tissues and probing their mechanical properties. Articular chondrocytes, the cells responsible for the production and maintenance of cartilaginous extracellular matrix in the knee joint, change their morphology and dedifferentiate during in vitro expansion culture. It was unclear if the mechanical properties of chondrocytes change accompanying phenotype variation. The elasticity of in vitro serially cultured bovine articular chondrocytes was investigated using AFM. The chondrocytes changed their morphology from round to spindle-like. The freeze-dried P0 chondrocytes showed significantly higher modulus than did the serially passaged (P1–P4) chondrocytes. The change of chondrocyte morphology was accompanied with a decrease of elastic modulus.     

Study of nitrogen ion implantation and diffusion phenomena on thin chromium layers followed by the atomic force microscopy and secondary ion mass spectroscopy techniques characterization

This research investigates the effect of ion implantation dosage level and further thermal treatment on the physical characteristics of chromium coatings on Si(1 1 1) substrates. Chromium films had been exposed to nitrogen ion fluencies of 1 × 10¹⁷, 3 × 10¹⁷, 6 × 10¹⁷ and 10 × 10¹⁷ N⁺ cm⁻² with a 15 keV energy level. Obtained samples had been heat treated at 450 °C at a pressure of 2 × 10⁻² Torr in an argon atmosphere for 30 h. Atomic force microscopy (AFM) images showed significant increase in surface roughness as a result of nitrogen ion fluence increase. Secondary ion mass spectroscopy (SIMS) studies revealed a clear increased accumulation of Cr₂N phase near the surface as a result of higher N⁺ fluence. XRD patterns showed preferred growth of [0 0 2] and [1 1 1] planes of Cr₂N phase as a result of higher ion implantation fluence. These results had been explained based on the nucleation-growth of Cr₂N phase and nitrogen atoms diffusion history during the thermal treatment process.     

Carrier density distribution in silicon nanowires investigated by scanning thermal microscopy and Kelvin probe force microscopy

The use of scanning thermal microscopy (SThM) and Kelvin probe force microscopy (KPFM) to investigate silicon nanowires (SiNWs) is presented. SThM allows imaging of temperature distribution at the nanoscale, while KPFM images the potential distribution with AFM-related ultra-high spatial resolution. Both techniques are therefore suitable for imaging the resistance distribution. We show results of experimental examination of dual channel n-type SiNWs with channel width of 100 nm, while the channel was open and current was flowing through the SiNW. To investigate the carrier distribution in the SiNWs we performed SThM and KPFM scans. The SThM results showed non-symmetrical temperature distribution along the SiNWs with temperature maximum shifted towards the contact of higher potential. These results corresponded to those expressed by the distribution of potential gradient along the SiNWs, obtained using the KPFM method. Consequently, non-uniform distribution of resistance was shown, being a result of non-uniform carrier density distribution in the structure and showing the pinch-off effect. Last but not least, the results were also compared with results of finite-element method modeling.     

Interpretation of scanning tunneling microscopy and atomic force microscopy images of 1T-TiS2

The surface of 1T-TiS₂ was examined by scanning tunneling microscopy (STM) and atomic force microscopy (AFM). The STM and AFM images of this compound were interpreted on the basis of the partial electron density ρ(r,E_F) and total electron density ρ(r) of a slab which consists of six (001) 1T-TiS₂ layers. Electronic structure calculations were performed using the ab-initio Hartree–Fock program crystal. It was found that the bright spots in experimental STM images correspond to sulfur atoms at both positive and negative bias voltages. The AFM image showed a periodicity which can be explained by the atomic corrugation at the surface. Structural defects on the surface were also investigated, and their interpretation constitutes experimental proof that only sulfur atoms were detected by scanning probe microscopies.     

Atomistic simulations of fluid structure and solvation forces in atomic force microscopy

We describe results of atomistic molecular dynamics simulations modelling an atomic force microscope (AFM) tip immersed in a fluid. Both the tip and the surface are modelled by rigid arrays of atoms. The tip is pyramidal and the surface is the (100) face of a fcc crystal. The focus is on the solvation forces acting on the tip and on the surface and their relation to the structural and dynamic properties of the fluid. Fluid particles in the neighborhood of the tip-surface junction are found to be highly ordered compared to the bulk, as shown by localized variations in the average fluid density. The atomistic nature of the model gives rise to several effects related to the discrete sizes of the fluid, tip, and surface particles which are not observed in continuum-based theories. A number of simulated force-distance curves are presented, along with an analysis of the effect of changing fluid particle size, tip (lateral) position, tip shape, and the lyocompatability of the tip and surface materials. The atomic-scale distribution of fluid-surface forces is examined for various positions of the tip, and the extent to which the fluid can act as a “cushion” by increasing the effective area of the tip-surface interaction is studied. The effect of a fluid on AFM imaging is investigated by generating “fluid images”, which are shown to be comparable in magnitude to the direct tip-surface interaction in the noncontact mode. We compare images generated by defective and defect-free surfaces, and analyse the fluid-tip forces acting in a lateral direction. An image formed from fluid forces acting in the direction of the surface normal does not show the presence of a vacancy, but an image formed from lateral fluid forces does.     

Thermal transitions of polymers measured by atomic force microscopy

A new method has been developed to measure thermal transitions by atomic force microscopy in the non-contact mode, using it as a dynamic mechanical analyser on a local scale. In this method the cantilever is oscillating above the polymer surface and the resonance frequency is measured as a function of the temperature. Thermal transitions of a polymer are clearly visible as a change in the characteristic-frequency behaviour of the cantilever. This paper introduces a simple model to explain the response of the cantilever caused by the transitions in the polymer and the related form of the frequency/temperature curves. This new technique adds a new dimension to the standard thermal analysis techniques, with which the thermal transitions of different polymer phases can be resolved individually for polymer blends or copolymers, for example in structured multiphase polymers. Received: 1 November 2001 / Accepted: 7 November 2001 / Published online: 23 January 2002     

Imaging and tracking an electrostatic charge micro-domain by Kelvin force microscopy as evidence of water adsorption on mica surface

Muscovite mica is a widely accepted substrate for scanning probe microscopy (SPM) investigations. However, mica has intrinsic properties that alter samples and obstruct their analysis due to free charges build-up, ionic exchange and water adsorption taking place at the surface. In addition to interfacial phenomena, there is a growing interest in electrostatic charges on insulators as they are crucial in diverse applications. Despite the high demand for studies of this nature, experimental set-ups capable of resolving charge build-up at the micro-scale are still scarce and technically limited. Here, we report the imaging of surface charge dissipation on freshly cleaved mica by Kelvin-probe Force Microscopy (KPFM). A local electrostatic charge micro-domain was generated by friction between an atomic force microscope (AFM) tip and mica, and its decay was tracked by two-dimensional mapping using KPFM. We found time-dependent charge dissipation, which is attributed to the adsorption of water molecules on mica surface.     

Formation and disruption of current paths of anodic porous alumina films by conducting atomic force microscopy

Anodic porous alumina (APA) films have a honeycomb cell structure of pores and a voltage-induced bi-stable switching effect. We have applied conducting atomic force microscopy (CAFM) as a method to form and to disrupt current paths in the APA films. A bi-polar switching operation was confirmed. We have firstly observed terminals of current paths as spots or areas typically on the center of the triangle formed by three pores. In addition, though a part of the current path showed repetitive switching, most of them were not observed again at the same position after one cycle of switching operations in the present experiments. This suggests that a part of alumina structure and/or composition along the current paths is modified during the switching operations.     

Lattice constants of Langmuir-Blodgett films measured by atomic force microscopy

Langmuir-Blodgett (LB) films are examples of soft organic and related biological samples. Therefore it is essential to make sure that the mechanical scanning process does not disturb the specimen. We describe atomic force microscopy measurements of the lattice constants of Cd arachidate LB films. A lattice constant d_hk is revealed correctly by scanning parallel to the corresponding lattice line [hk]. Scanning in deviating directions enlarges the lattice spacing. The phenomena are explained with a simple model. Previous studies where such artefacts have not been reported are discussed.     

新型AFM探针的制备及应用

采用熔拉 -腐蚀复合方法 ,将普通单模石英光纤制成直锥形光纤探针。利用自制工具将探针打弯 ,制成悬臂式光纤探针 ,在AFM上取得了较理想的测试结果。将自制光纤探针和商用硅材料探针获得的两种扫描图像进行了对比 ,分析了悬臂式光纤探针的特点     

原子力显微术研究进展

原子力显微术是微纳米尺度实空间形貌成像与结构表征的关键技术之一。近些年,原子力显微术衍生发展出了一系列令人瞩目的功能化探测模式和新技术。文章从以下两个方面论述了原子力显微术的前沿进展：(1)原子力显微术的功能化探测模式及其在微纳米尺度物性研究与测量以及微纳加工等领域的应用;(2)原子力显微术自身在更高精度、更高分辨率、更快速度、更多功能等方面的进展及在基础和应用研究领域中的应用。文章还展望了原子力显微术的下一步发展方向和正在不断扩展的研究领域。     

Elastic modulus of supercooled liquid and hot solid silicon measured by inelastic X-ray scattering

The dynamical structure factors of supercooled-liquid and hot-solid silicon are measured by inelastic X-ray scattering at the same temperature, 1620 K. Two significant changes in the averaged longitudinal sound velocities and in the longitudinal modulus are observed. First, we observe a different longitudinal modulus in the polycrystalline hot-solid silicon compared to the extrapolated value obtained from the single-crystal measurement. This reduction of the modulus may be a precursor of the semiconductor-to-metal transition. Second, the increase in the longitudinal modulus in the liquid upon supercooling is consistent with an increase in the degree of the directional bonding.     

Determination of silicone coating Young's modulus using atomic force microscopy

The polymerisation degree of thin polymer coatings was checked by following the variation of their local mechanical properties. Atomic force microscope (AFM) was used in an indentation mode to investigate the mechanical characteristics of silicone coatings on polycarbonate substrates. The evolution of Young's modulus of the silicone coatings was determined as a function of the polymer annealing time. We have used a relative method to measure Young's moduli, which involves a calibration step with a set of reference polymers. No variation was observed for the modulus of silicone coatings annealed during more than 40 min at 130 °C. This result indicates that over-heating does not modify the mechanical properties of the coating.     

Novel mesoscale defect structure on NiO(1 0 0) surfaces by atomic force microscopy

Cleaved NiO(1 0 0) surfaces were imaged with atomic force microscopy (AFM) to determine defect concentrations and morphology. Random 〈0 1 0〉 and 〈0 0 1〉 oriented steps, which have been previously characterized, were the most common defect observed on the cleaved surface and formed with step heights in multiples of 2.1 Å, the Ni-O nearest-neighbor distance, and terrace widths in the range of 25-100 nm. In addition, the surface showed novel mesoscale (∼0.5-2 μm) square pyramidal defects with the pyramid base oriented along 〈1 0 0〉 symmetry related directions. Upon etching, the pyramidal defects converted to more stable cubic pits, consistent with (1 0 0) symmetry related walls. The square pyramidal pits tended to cluster or to form along step edges, where the weakened structure is more susceptible to surface deformations. Also, a small concentration of square pyramidal pits, oriented with the base of the pyramid along 〈0 1 1〉, was observed on the cleaved NiO surfaces. For comparison purposes, chemical mechanical polished (CMP) NiO(1 0 0) substrates were imaged with AFM. Defect concentrations were of comparable levels to the cleaved surface, but showed a different distribution of defect types. Long-ranged stepped defects were much less common on CMP substrates, and the predominant defects observed were cubic pits with sidewalls steeper than could be accurately measured by the AFM tip. These defects were similar in size and structure to those observed on cleaved NiO(1 0 0) surfaces that had been acid etched, although pit clustering was more pronounced for the CMP surfaces.     

Water-solid interfaces probed by high-resolution atomic force microscopy

Water-solid interfaces play important roles across a broad range of scientific and application fields. In the past decades, atomic force microscopy (AFM) has significantly deepened our understanding of water-solid interfaces at molecular scale. In this review, we describe the recent progresses on probing water-solid interfaces by noncontact AFM, highlighting the imaging of interfacial water with ultrahigh spatial resolution. In particular, the recent development of qPlus-based AFM with functionalized tips has made it possible to directly image the H-bonding skeleton of interfacial water under UHV environment. Based on high-order electrostatic forces, such a technique even enables submolecular-level imaging of weakly bonded water structures with negligible disturbance. In addition, the three-dimensional (3D) AFM using low-noise cantilever deflection sensors can achieve atomic resolution imaging at liquid/solid interfaces, which opens up the possibility of probing the hydration layer structures under realistic conditions. We then discuss the application of those AFM techniques to various interfacial water systems, including water clusters, ion hydrates, water chains, water monolayers/multilayers and bulk water/ice on different surfaces under UHV or ambient environments. Some important issues will be addressed, including the H-bonding topology, ice nucleation and growth, ion hydration and transport, dielectric properties of water, etc. In the end, we present an outlook on the directions of future AFM studies of water at interfaces and the challenges faced by this field, as well as the development of new AFM techniques.     

原子力显微镜扫描成像DNA分子

采用Mg2+处理DNA、APTES或戊二醛修饰云母表面、DNA拉直方法制备了λ-DNA及DNA-组蛋白复合物样品.室温下原子力显微镜以轻敲模式在空气中扫描样品成像.实验结果表明:AFM扫描成像的效果与样品的制备方法有关,同时也受操作因素影响.     

Compliance profile of the human cornea as measured by atomic force microscopy

The ability to accurately determine the elastic modulus of each layer of the human cornea is a crucial step in the design of better corneal prosthetics. In addition, knowledge of the elastic modulus will allow design of substrates with relevant mechanical properties for in vitro investigations of cellular behavior. Previously, we have reported elastic modulus values for the anterior basement membrane and Descemet's membrane of the human cornea, the surfaces in contact with the epithelial and endothelial cells, respectively. We have completed the compliance profile of the stromal elements of the human cornea by obtaining elastic modulus values for Bowman's layer and the anterior stroma. Atomic force microscopy (AFM) was used to determine the elastic modulus, which is a measure of the tissue stiffness and is inversely proportional to the compliance. The elastic response of the tissue allows analysis with the Hertz equation, a model that provides a relationship between the indentation force and depth and is a function of the tip radius and the modulus of the substrate. The elastic modulus values for each layer of the cornea are: 7.5±4.2 kPa (anterior basement membrane), 109.8±13.2 kPa (Bowman's layer), 33.1±6.1 kPa (anterior stroma), and 50±17.8 kPa (Descemet's membrane). These results indicate that the biophysical properties, including elastic modulus, of each layer of the human cornea are unique and may play a role in the maintenance of homeostasis as well as in the response to therapeutic agents and disease states. The data will also inform the design and fabrication of improved corneal prosthetics.     

Analysis of the structure of block copolymer films by atomic force microscopy

The structure of thin films of the polysterene-polymethylacrylate-polysterene triblock copolymer was studied. Universal algorithms to analyze atomic-force-microscopy images of thin block-copolymer films were developed.     

Observation of multicellular spinning behavior of Proteus mirabilis by atomic force microscopy and multifunctional microscopy

This study aimed to observe the multicellular spinning behavior of Proteus mirabilis by atomic force microscopy (AFM) and multifunctional microscopy in order to understand the mechanism underlying this spinning movement and its biological significance. Multifunctional microscopy with charge-coupled device (CCD) and real-time AFM showed changes in cell structure and shape of P. mirabilis during multicellular spinning movement. Specifically, the morphological characteristics of P. mirabilis, multicellular spinning dynamics, and unique movement were observed. Our findings indicate that the multicellular spinning behavior of P. mirabilis may be used to collect nutrients, perform colonization, and squeeze out competitors. The movement characteristics of P. mirabilis are vital to the organism's biological adaptability to the surrounding environment.