Fractal analysis and atomic force microscopy measurements of surface roughness for Hastelloy C276 substrates and amorphous alumina buffer layers in coated conductors

In coated conductors, surface roughness of metallic substrates and buffer layers could significantly affect the texture of subsequently deposited buffer layers and the critical current density of superconductor layer. Atomic force microscopy (AFM) is usually utilized to measure surface roughness. However, the roughness values are actually relevant to scan scale. Fractal geometry could be exerted to analyze the scaling performance of surface roughness. In this study, four samples were prepared, which were electro polished Hastelloy C276 substrate, mechanically polished Hastelloy C276 substrate and the amorphous alumina buffer layers deposited on both the substrates by ion beam deposition. The surface roughness, described by root mean squared (RMS) and arithmetic average (R_a) values, was analyzed considering the scan scale of AFM measurements. The surfaces of amorphous alumina layers were found to be fractal in nature because of the scaling performance of roughness, while the surfaces of Hastelloy substrates were not. The flatten modification of AFM images was discussed. And the calculation of surface roughness in smaller parts divided from the whole AFM images was studied, compared with the results of actual AFM measurements of the same scan scales.     

An approach to achieve lateral superresolution for small probe confocal measurement system and its element

A shaped annular beam superresolution approach is proposed to improve a lateral resolution of a small probe laser confocal measurement system (LCMS). The approach proposed enables lateral superresolution measurement of LCMS to be achieved by using a binary optical diffractive element to shape a He–Ne Gaussian laser beam into an annular beam with an inner diameter of 0.87 mm and an outer diameter of 1.8 mm required for superresolution measurement, and shift the beam spatial frequency from low to high. And a binary optical element (BOE) with 16 phase levels is designed and fabricated to shape a Gaussian laser beam into an annular beam. Preliminary experimental results indicate that an intensity distribution of a shaped annular beam is in agreement with simulation results, the diffractive efficiency is 87.2%; LCMS lateral and axial resolutions of 0.2 μm and 3 nm are achieved, respectively, and its measurement range is expanded nearly to double, when BOE is used in LCMS and , NA=0.85.     

Understanding tapping-mode atomic force microscopy data on the surface of soft block copolymers

In this paper, we focus on better understanding tapping-mode atomic force microscopy (AFM) data of soft block copolymer materials with regard to: (1) phase attribution; (2) the relationship between topography and inside structure; (3) contrast-reversal artifacts; (4) the influence of annealing treatment on topography. The experiments were performed on the surface of poly(styrene–ethylene/butylene–styrene) (SEBS) triblock copolymer acting as a model system. First, by coupling AFM with transmission electron microscopy (TEM) measurements, the phase attribution for AFM images was determined. Secondly, by imaging an atomically flat SEBS surface as well as an AFM tip-scratched SEBS surface, it was confirmed that the contrast in AFM height images of soft block copolymers is not necessarily the result of surface topography but the result of lateral differences in tip-indentation depth between soft and hard microdomains. It was also found that there is an enlarging effect in AFM images on the domain size of block copolymers due to the tip-indention mechanism. Thirdly, based on the tip-indention mechanism, tentative explanations in some detail for the observed AFM artifacts (a reversal in phase image followed by another reversal in height image) as function of imaging parameters were given. Last, it was demonstrated that the commonly used annealing treatments in AFM sample preparation of block copolymers may in some cases lead to a dramatic topography change due to the unexpected order-to-order structure transition.     

Microphase separation behavior on the surfaces of PEG-MDI-PDMS multiblock copolymer coatings

A series of poly(ethylene glycol)(PEG)-4,4′-diphenylmethanediisocyanate(MDI)-poly(dimethylsiloxane) (PDMS) multiblock copolymers were synthesized by employing two-step growth polymerization technique. Atomic force microscopy (AFM) observed nanoscopically well-organized phase-separated surfaces consisting of hydrophilic domain from PEG and MDI segments and hydrophobic domain from PDMS segments even with 50 wt.% PDMS in the copolymer, and the multiblock copolymer coatings presented a surface free energy of as low as 6-8 mN m⁻¹.     

Step dynamics in relaxation of sharp corners on crystal surfaces

The dynamic behavior of steps involved in the relaxation of sharp corners in microfabricated structures on crystalline surfaces have been studied. We find that during the early stages of relaxation of slightly tapered trenches on Si(0 0 1), wide (1 1 0) terraces perpendicular to the substrate are formed near the corners of the trench sidewalls. The evolution of a step profile around the corner region, where step density abruptly changes, is analyzed using one-dimensional step models. It is found that, in case that mass transport occurs through surface diffusion, the preexisting steps on the trench sidewall are accumulated in the corner region, and extensive terraces are formed near the corners.     

Modification in etching characteristics and surface topography of some electron irradiated polymers

Track formation in polymers is a complex phenomenon in which not only primary but also secondary processes, such as formation of radicals and chemical processes, are involved. In the present work, the influence of 2 MeV electrons on the etching properties and the surface topography of polyethylene terephthalate (PET) and polyimide (PI) are studied. The increase in the bulk etch-rate and a decrease in the activation energy of etching were observed for both the polymers. The surface roughness of both polymers was reduced due to electron irradiation.     

Anomalous scaling in surface roughness evaluation of electrodeposited nanocrystalline Pt thin films

Atomic force microscopy (AFM) is used to measure the surface roughness of crystalline Pt thin films as a function of film thickness and growth rate. Our films were electrodeposited on Au/Cr/glass substrates, under galvanostatic control (constant current density), from a single electrolyte containing Pt⁴⁺ ions. Crystalline structure of the films was confirmed by X-ray diffraction (XRD) technique. The effect of growth rate (deposition current density) and film thickness (deposition time) on the kinetic roughening of the films were studied using AFM and roughness calculation. The data is consistent with a rather complex behaviour known as “anomalous scaling” where both local and large scale roughnesses show power law dependence on the film thickness.     

In situ observation on Au(1 0 0) surface in molten EMImBF4 by electrochemical atomic force microscopy (EC-AFM)

The Au(1 0 0) surface structure in contact with 1-ethyl-3-methylimidazolium tetrafluoroborate (EMImBF₄) has been observed using electrochemical atomic force microscopy (EC-AFM) under an electrochemically controlled potential. The AFM images, taken in EMImBF₄ in the potential range from −0.6 to 0.2 V vs. Ag/Ag(I), shows a fourfold symmetry with the distance between protrusions of ≈0.30-0.32 nm. This structure agrees well with the ideal surface structure of Au(1 0 0)-(1 × 1) and it is very similar to that previously obtained in a sulfuric acid aqueous solution.     

XPS characterization of the surface immobilization of antibacterial furanones

Brominated furanones have attracted recent interest as antibacterial compounds. To utilize them as protective coatings in biomedical device applications, they must be covalently immobilized onto solid surfaces; however, interfacial coupling protocols developed for other biomolecules are not applicable to furanones. An azide reaction scheme has enabled covalent immobilization onto fluorinated ethylene propylene copolymer but its chemistry is less predictable, requiring detailed characterization by XPS and tapping mode AFM after each step of the immobilization sequence. XPS curve fitting resolved components in the C 1s, N 1s and Br 3d regions. Angle dependent XPS was used to assess the depth distributions and layer thicknesses. The results indicated successful covalent immobilization of furanones; however, side reactions occurred. In addition to the expected CBr, a contribution from bromine ion (Br⁻) was detected, indicating that photo-degradation of furanones took place during UV illumination, and this reaction was found to increase with illumination time. The Br⁻ was removed by washing with water, whereas the CBr signal from immobilized furanone remained. Spectroscopic characterization will assist in elucidating the structure of furanone coatings, understanding their mode of action when covalently immobilized on surfaces, and rationally designing and optimizing an effective antibacterial coating for biomedical applications.     

Oxidation and adhesion on the quasicrystalline AlPdMn surface studied by nanolithography

We present the novel application of a relatively new technique (nanolithography) to the study of quasicrystalline surface oxidation. The 5-fold surface of an AlPdMn alloy was oxidized using a metallized AFM tip. The electrochemical nature of this process was confirmed by investigating the influence of humidity and polarity of the applied voltage on the quasicrystalline oxide. Oxides of different thickness and adhesive properties were created by altering the applied voltage and the humidity during the lithographic process. The technique can be used in an exhaustive study of properties of the various types of oxides that form on the AlPdMn surface and the preliminary results of one such study are reported.     

Multilayering of a pseudo polyelectrolyte (PVPh) with a strong polyelectrolyte (PDMAC) from aqueous media

The introduction of pseudo polyelectrolytes (pPE) into the field of multilayer thin films has recently been achieved with the successful combination of poly(4-vinylphenol) (PVPh) with the weak polyelectrolyte (WPE), polyallylamine hydrochloride (PAH). This paper examines the stretching of this limit by exploring the extremes of using the pPE with the strong polyelectrolyte (SPE), poly(diallyldimethylammonium chloride) (PDMAC). UV-Vis absorbance and atomic force microscopy (AFM) topography data reveal a linear growth trend in film thickness that depends critically upon the assembly pH. At an assembly pH of 11.0 the multilayer was five times thicker compared to that assembled at pH 12.0. AFM topography images also show that the surface roughness of the films increases as the assembly pH decreases.     

Behavior of the (0 0 0 1) surface of sapphire upon high-temperature annealing

Evolution of the (0 0 0 1) α-Al₂O₃ surface morphology upon annealing was studied using atomic force microscopy. The annealing protocol included temperatures of 1200 and 1500 °C and different time. Vicinal Al₂O₃ (0 0 0 1) surfaces annealed at 1200 °C exhibit initial localized step coalescence that evolves into terrace-and-step with island morphology that persists for several hours. Annealing at 1500 °C results in initial step coalescence on a global scale, and yields a terrace-and-step morphology with an indication of step bunching after longer annealing times.     

Observing the effect of water vapor on post-irradiated surface morphology of SiO2 and Si3N4 insulators by atomic force microscopy

In this work, we investigated the effect of water-vapor treatment on the surface morphology of SiO₂ and Si₃N₄ insulators before and after Co⁶⁰ gamma-ray irradiation by using the atomic force microscopy (AFM) operated under non-contact mode. Before irradiation, no apparent surface morphology change was found in SiO₂ samples even they were water vapor treated. However, bright spots were found on post-irradiated water-vapor-treated SiO₂ sample surfaces but not on those without water-vapor treatment. We attributed the bright spots to the negative charge accumulation in the oxide due to charge balancing between hydroxyl (OH⁻) ions adsorbed on SiO₂ surface and electron-hole pairs (ehps) generated during irradiation since they can be annealed out after low temperature annealing process. On the contrary, no bright spots were observed on post-irradiated Si₃N₄ samples with and without water-vapor treatment. This result confirms that Si₃N₄ is a better water-resist passivation layer than SiO₂ layer.     

透明基底表面双向反射分布函数及粗糙度特性研究

采用双向反射分布函数定量分析透明基底表面粗糙度,考虑到透明基底第二个界面的影响,从不透明基底双向反射分布函数入手,推导了实际测量的透明基底表面双向反射分布函数的表达式.依据此理论提出了通过分别测量两个表面的散射强度来联立求解透明基底实际表面反射分布函数和表面粗糙度谱的新方法.并将此结果与用原子力显微镜测量所获得的结果进行了比较,两者吻合较好.     

Evidence for diffusion-limited kinetics during electromigration-induced step bunching on Si(1 1 1)

We have measured how the initial terrace width l₀ on vicinal Si(1 1 1) surfaces influences the rate of step bunching and the minimum terrace width within a bunch when direct-current heated at 940-1290 °C. A comparison of this data with analytic solutions and numerical simulations of the conventional “sharp-step” model give strong evidence that the kinetic length d is relatively small (d < ∼20 nm) in both temperature regime I (∼850-950 °C) and regime III (∼1200-1300 °C), in which step-down current is required for step bunching. This indicates that surface mass transport is diffusion-limited in both regimes I and III when l₀ > 20 nm, and hence that the adatom attachment- and terrace diffusion-hopping rates are of comparable magnitude. We also observe similar scaling with initial terrace width in temperature regime II (∼1040-1190 °C), in which step-up current is required for bunching, suggesting a similar step bunching mechanism in all three temperature regimes.     

Crystallization and surface morphology of Au/SiO2 thin films following furnace and flame annealing

A crystallization and surface evolution study of Au thin film on SiO₂ substrates following annealing at different temperatures above the eutectic point of the Au/Si system are reported. Samples were prepared by conventional evaporation of gold in a high vacuum (10⁻⁷ mbar) environment on substrates at room temperature. Thermal treatments were performed by both furnace and flame annealing techniques. Au thin films can be crystallized on SiO₂ substrates by both furnace and flame annealing. Annealing arranges the Au crystallites in the (1 1 1) plane direction and changes the morphology of the surface. Both, slow and rapid annealing result in a good background in the XRD spectra and hence clean and complete crystallization which depends more on the temperature than on the time of annealing. The epitaxial temperature for the Au/SiO₂ system decreases in the range of 350-400 °C. Furnace and flame annealing also form crystallized gold islands over the Au/SiO₂ surface. Relaxation at high temperatures of the strained Au layer, obtained after deposition, should be responsible for the initial stages of clusters formation. Gold nucleation sites may be formed at disordered points on the surface and they become islands when the temperature and time of annealing are increased. The growth rate of crystallites is highest around 360 °C. Above this temperature, the layer melts and gold diffuses from the substrate to the nucleation sites to increase the distance between islands and modify their shapes. Well above the eutectic temperature, the relaxed islands have hexagonally shaped borders. The mean crystallite diameters grow up to a maximum mean size of around 90 nm. The free activation energy for grain boundary migration above 360 °C is 0.2 eV. Therefore the type of the silicon substrate changes the mechanism of diffusion and growth of crystallites during annealing of the Au/Si system. Epitaxial Au(1 1 1) layers without formation of islands can be prepared by furnace annealing in the range of 300-310 °C and by flame annealing of a few seconds and up to 0.5 min.     

Kinetic effects in the self-assembly of pure and mixed tetradecyl and octadecylamine molecules on mica

The self-assembly of tetradecylamine (C14) and of mixtures of tetradecyl and octadecylamine (C18) molecules from chloroform solutions on mica has been studied using atomic force microscopy (AFM). For pure components self-assembly proceeds more slowly for C14 than for C18. In both cases after equilibrium is reached islands of tilted molecules cover a similar fraction of the surface. Images of films formed by mixtures of molecules acquired before equilibrium is reached (short ripening time at room temperature) show only islands with the height corresponding to C18 with many pores. After a long ripening time, when equilibrium is reached, islands of segregated pure components are formed.     

Microtribological and electrochemical corrosion behaviors of polydopamine coating on APTS-SAM modified Si substrate

A polydopamine coating (coded as PDAc) was prepared successfully on a Si substrate through a two-step process. Briefly, to improve the adhesion of PDAc on the Si substrate, a self-assembled monolayer of 3-aminopropyl triethoxysilane (coded as APTS-SAM) was firstly generated on the bare Si wafer. Thereafter, the PDAc with different thickness was fabricated through the chemical adsorption and autopolymerization of the dopamine hydrochloride on the APTS-SAM coated Si substrate. The formation of PDAc on the APTS-SAM modified Si substrate was proved by the characterizations of contact angle measurement, attenuated total reflectance Fourier transform infrared (ATR-FTIR) analysis, and X-ray photoelectron spectroscope (XPS), etc. The ellipsometric thickness measurement and atomic force microscopy (AFM) image analysis showed that the PDAc became thicker and rougher with the deposition time prolongation. Microtribological study showed that the thickness and roughness of the PDAc played a significant role in the tribological properties. In comparison with the bare Si substrate, the PDAc with thinner thickness possessed lower friction and was anticipated to be used as protecting coating in the field of boundary lubrication. The electrochemical corrosion behaviors of the prepared PDAc were investigated using the electrochemical station and a low corrosion current density was revealed, implying that the PDAc had good anti-corrosion capability and might find potential applications in the field of corrosion resistance.     

Atomic force microscopy study on surface morphology of {0 0 1} faces of [MnHg(SCN)4(H2O)2]·2C4H9NO crystals

The growth morphologies of the {0 0 1} faces of [MnHg(SCN)₄(H₂O)₂]·2C₄H₉NO (MMTWD) crystals grown at 17 °C at a supersaturation of σ = 0.5 have been investigated by ex situ atomic force microscopy (AFM).Various spiral growth hillocks are described and discussed. Surface morphology changes as a result of dissolving the surface materials by absorbed moisture in air are also detected. The microcrystals are suggested to be as a result of the reconstruction of amorphous aggregates on the surfaces.     

粗糙波面光学传递函数像质评价准则和粗糙度公式理论

建立了包含波面像差和粗糙度影响的粗糙波面光学传递函数及其像质评价准则，讨论了粗糙度公差的理论和标准。