共查询到20条相似文献,搜索用时 156 毫秒
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实验采用射频磁控溅射法在玻璃衬底上沉积了ZnS多晶薄膜,研究了沉积气压、退火温度和衬底温度对ZnS薄膜质量的影响.利用X射线衍射(XRD)分析了薄膜的微结构,并计算了内应力值.通过紫外-可见光分光光度计测量了薄膜的透过谱,计算了Urbach能量和禁带宽度.利用扫描电子显微镜(SEM)观察了薄膜的表面形貌.结果表明: 衬底温度为室温时沉积的ZnS薄膜具有较大的压应力,并且内应力值随着工作气压增大而增大,在300 ℃下进行退火处理后内应力松弛,衬底温度为350 ℃时制备的ZnS薄膜内应力小,透过率高,经300 ℃退火处理后结晶质量有所提高.
关键词:
ZnS薄膜
射频磁控溅射
内应力 相似文献
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采用晶体相场法模拟了纳米尺度下小角度对称倾斜晶界的结构和位错运动,针对弛豫过程和附加外应力过程,观察了晶界上位错运动的位置变化和体系自由能变化,分析了温度对小角度对称倾斜晶界的结构和晶界上位错运动的影响规律.研究表明,弛豫过程中体系温度越低,体系自由能下降速率越大,原子规则排列速率增加,体系自由能达到稳定状态所需的时间越短,晶界达到稳定状态时位错对排列愈发整齐,呈现直线规则排列.外应力作用下,温度越低,晶体位错对首次相遇时间越长,晶体形成单个晶粒时间越长,位错对首次相遇到晶体内位错对完全消失过程时间越长;随着温度的降低,体系自由能出现多段上升下降,位错对反应也愈加复杂,趋向于逐对抵消. 相似文献
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采用非平衡分子动力学方法(NEMD)研究了室温(300 K)下厚度为2~32 nm的单晶硅薄膜的沿膜平面方向的热导率,并使用Debye-Einstein模型对模拟温度进行了量子修正。模拟表明薄膜面向热导率小于相应的大体积值,并随膜厚度减小而减小,具有显著的尺寸效应。在模拟范围内膜面向热导率略大于其法向热导率;与声子气动力论的定性结果一致。晶体的表面弛豫和表面重构现象导致了MD模拟中体系总内能的升高。 相似文献
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A. Yu. Mester A. N. Trofimov M. V. Zamoryanskaya A. M. D’yakonov 《Technical Physics》2014,59(10):1536-1539
The rate of formation of a hydrocarbon film on the surface of a sample subjected to the action of an electron beam is studied at room temperature and in cooling a sample to the liquid nitrogen temperature. The thickness and the optical radiation transmission of such films are measured as functions of the electron beam radiation time, the sample temperature, and the level of vacuum. The film thickness is measured with atomic force microscopy. The absorption of the films is determined by comparing the cathodoluminescence intensities from a pure sample surface and from the surface covered with a film. The experimental results can be used to estimate the film formation rate as a function of the sample temperature and the vacuum and to determine the optical radiation absorption at a wavelength of 300, 360, 550, and 665 nm. 相似文献
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采用高温X射线原位衍射和变温介电谱对SrTiO3基底上外延生长的BaTiO3(嵌埋Ni颗粒)薄膜进行了相变特性分析。从X射线衍射和介电谱的分析结果得出,BaTiO3的相变温度点转变为弥散的温度区间。在这个弥散的相变温度区间内,由于基底和薄膜之间的失配,以及嵌埋Ni颗粒的应力作用,薄膜的介电响应弥散剧烈,并偏离德拜弛豫。分析Cole-Cole图获知,BaTiO3薄膜在四方相转变为立方相的相变过程中同时存在几种极化机制,在高温状态下介电损耗随温度增大而增大。降温过程中,薄膜没有立即恢复四方相,可能是基底和Ni颗粒的共同作用影响了相变弛豫。 相似文献
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A three-dimensional molecular dynamics (MD) simulation is proposed to study the film growth, roughness and stress evolution during atom deposition on the (100) plane of a fcc regular crystal. We use the cubic system with an x–y periodic boundary condition. At the bottom we have an atomic surface and at the top a reflecting wall. The model uses the Lennard-Jones potential to describe the interatomic forces. The simulation results show that the film grows with the Volmer–Weber mode and exhibits specific curve shape of the stress evolution. The mean biaxial stress obtained during the simulation attains a local tension maximum at a coverage of two monolayers. The stress in the normal direction is smaller than the biaxial stress. The main contribution to the stress in the film arises from the first monolayer. The curves describing roughness possess maximum values at the same substrate coverage. The dependence of the roughness on the temperature is examined. 相似文献
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A realistic kinetic Monte Carlo (KMC) simulation model with physical parameters is developed, which well reproduces the heteroepitaxial growth of multilayered Ni thin film on Cu(100) surfaces at room temperature. The effects of mass transport between interlayers and edge diffusion of atoms along the islands are included in the simulation model, and the surface roughness and the layer distribution versus total coverage are calculated. Specially, the simulation model reveals the transition of growth mode with coverage and the difference between the Ni heteroepitaxy on Cu(100) and the Ni homoepitaxy on Ni(100). Through comparison of KMC simulation with the real scanning tunneling microscopy (STM) experiments, the Ehrlich-Schwoebel (ES) barrier Ees is estimated to be 0.18±0.02 eV for Ni/Cu(100) system while 0.28 eV for Ni/Ni(100). The simulation also shows that the growth mode depends strongly on the thickness of thin film and the surface temperature, and the critical thickness of growth mode transition is dependent on the growth condition such as surface temperature and deposition flux as well. 相似文献