Application of integrated SECM ultra-micro-electrode and AFM force probe to biosensor surfaces

The integration of scanning electrochemical ultra-micro-electrode (UME) with atomic force microscope cantilever probe have been achieved by using a homemade photolithography system. A gold-film-coated AFM cantilever was insulated with photo resist coating and a pointed end of the AFM probe was opened by illuminating with maskless arbitrary optical micro-pattern generator. To realize precise control of probe sample distance constantly, the resulting scanning electrochemical microscopy (SECM)-AFM probe was operated using a dynamic force microscopy (DFM) technique with magnetic field excitation. From a steady-state voltammetric experiment, the effective electrode diameters of the probes thus prepared were estimated to be from 0.050 to 6.2 microm. The capability of this SECM-AFM probe have been tested using gold comb in the presence of Fe(CN)(6)(3-). The simultaneous imaging of the topography and electrochemical activity of the strip electrode was successfully obtained. We also used the SECM-AFM to examine in situ topography and enzymatic activity measurement. Comparison of topography and oxidation current profiles above enzyme-modified electrode showed active parts distribution of biosensor surface.     

肿瘤细胞的原子力显微术成像及表征研究

本文简单介绍了原子力显微镜的发展史,以及原子力显微镜的工作原理、工作模式、活细胞在生理状态下的成像方式等,特别介绍了生物型原子力显微镜、高速原子力显微镜在生物学领域的研究及应用。原子力显微镜在扫描速度、扫描范围、扫描精度方面的不断改进将为肿瘤细胞学研究提供源源不断的动力。本文着重阐述了原子力显微术在肿瘤领域的研究进展,包括原子力显微镜在肿瘤细胞形貌学特性、硬度、粘弹性方面的研究现状,并对原子力显微镜在肿瘤诊断及抗肿瘤药物研发方面的应用前景进行了展望。     

ToF-SIMS measurements with topographic information in combined images

In 2D and 3D time-of-flight secondary ion mass spectrometric (ToF-SIMS) analysis, accentuated structures on the sample surface induce distorted element distributions in the measurement. The origin of this effect is the 45° incidence angle of the analysis beam, recording planar images with distortion of the sample surface. For the generation of correct element distributions, these artifacts associated with the sample surface need to be eliminated by measuring the sample surface topography and applying suitable algorithms. For this purpose, the next generation of ToF-SIMS instruments will feature a scanning probe microscope directly implemented in the sample chamber which allows the performance of topography measurements in situ. This work presents the combination of 2D and 3D ToF-SIMS analysis with topographic measurements by ex situ techniques such as atomic force microscopy (AFM), confocal microscopy (CM), and digital holographic microscopy (DHM). The concept of the combination of topographic and ToF-SIMS measurements in a single representation was applied to organic and inorganic samples featuring surface structures in the nanometer and micrometer ranges. The correct representation of planar and distorted ToF-SIMS images was achieved by the combination of topographic data with images of 2D as well as 3D ToF-SIMS measurements, using either AFM, CM, or DHM for the recording of topographic data.     

In situ scanning tunneling microscopy: New insight for electrochemical electrode-surface investigations

The successful expansion which the scanning tunneling microscopy (STM) has had is dependent on its ability to examine surfaces on a sub-nanometric scale and on providing in situ (i.e. in the presence of bulk electrolyte) sample examination. In addition to the ability to study metals and semiconductors in vacuo, the application of the technique to surfaces in contact with an electrolytic solution has prompted increased interest amongst electrochemists. We discuss herein the technique, with particular reference to advances in electrochemical applications. A new scanning tunneling microscope for operation in electrolytic environments is described. Atomic force microscopy, scanning electrochemical microscopy and scanning ion-conducting microscopy are compared with the STM.     

Enhanced feature analysis using wavelets for scanning probe microscopy images of surfaces

In this work we develop wavelet theory for the analysis of surface topography images obtained by scanning probe microscopy (SPM) such as atomic force microscopy (AFM). Wavelet transformation is localized in space and frequency, which can offer an advantage for analyzing information on surface morphology and topography. Wavelet transformation is an ideal tool to detect trends, discontinuities, and short periodicities on a surface. Additionally, wavelets can be used to remove artifacts and noise from scanning microscopy images. In terms of 3-D image analysis, discrete wavelet transform can capture patterns at all relevant frequency scales, thus providing a level of image analysis that is not possible otherwise. It is also possible to use the methodology for analyzing surface structures at the molecular level. The results demonstrate superior capabilities of wavelet approach to scanning probe microscopy image analysis compared to traditional analysis techniques.     

Scanning force microscopy experiments probing micromechanical properties on polymer surfaces using harmonically modulated friction techniques I. Principles of operation

Applying a high-frequency lateral vibration between the sample surface and the tip of a scanning force microscope (SFM), a harmonically modulated lateral (friction) force image can be obtained using lock-in techniques. The principles of operation are explained, in particular the dramatic decrease of image artefacts generally caused by topography cross-talk and laser beam interference. Flat interfaces between the two immiscible polymers, poly(methyl methacrylate) (PMMA) and polystyrene (PS), are prepared on a sodium chloride single crystal from the melt. These samples are used to evaluate the appropriate model for the tip-sample interaction geometry. The relationship between frictional and normal force does not follow Amonton's law. This shows that a single-asperity interaction between the tip and sample surface can be considered. Using the new technique, local measurements of shear strength and Young's modulus can be performed.     

Surface structure analysis of thin dewetted polymer blend films

The surface structure of thin polymer blend films of deuterated polystyrene (dPS) and polyparamethylstyrene (PpMS) after annealing above the glass transition temperature was investigated. With scanning force microscopy (SFM) the surface topography originated by a dewetting process is detected. The sample surface is covered with small droplets consisting of several polymer molecules. Utilizing grazing incidence small angle neutron scattering (GISANS) the topographical information as well as the in‐plane composition is probed. For thin confined blend films a substructure of the droplets resulting from an additional phase separation process at different length scales is detected.     

Mapping molecular adhesion sites inside SMIL coated capillaries using atomic force microscopy recognition imaging

Capillary zone electrophoresis (CZE) is a powerful analytical technique for fast and efficient separation of different analytes ranging from small inorganic ions to large proteins. However electrophoretic resolution significantly depends on the coating of the inner capillary surface. High technical efforts like Successive Multiple Ionic Polymer Layer (SMIL) generation have been taken to develop stable coatings with switchable surface charges fulfilling the requirements needed for optimal separation. Although the performance can be easily proven in normalized test runs, characterization of the coating itself remains challenging. Atomic force microscopy (AFM) allows for topographical investigation of biological and analytical relevant surfaces with nanometer resolution and yields information about the surface roughness and homogeneity. Upgrading the scanning tip to a molecular biosensor by adhesive molecules (like partly inverted charged molecules) allows for performing topography and recognition imaging (TREC). As a result, simultaneously acquired sample topography and adhesion maps can be recorded. We optimized this technique for electrophoresis capillaries and investigated the charge distribution of differently composed and treated SMIL coatings. By using the positively charged protein avidin as a single molecule sensor, we compared these SMIL coatings with respect to negative charges, resulting in adhesion maps with nanometer resolution. The capability of TREC as a functional investigation technique at the nanoscale was successfully demonstrated.     

Scanning force microscopy experiments probing micromechanical properties on polymer surfaces using harmonically modulated friction techniques II. Investigations of heterogeneous systems

Applying a high-frequency lateral vibration between tip and sample in a scanning force microscope (SFM), a harmonically modulated lateral (friction) force image can be obtained using lock-in techniques. Harmonically modulated lateral force microscopy (HM-LFM) offers several advantages compared with standard lateral force microscopy (LFM). After a brief investigation of the scan velocity dependence of LFM and HM-LFM, two samples were investigated. First, the surface of a poly(acrylonitrile-co-styrene)/polybutadiene blend (ABS) was used to demonstrate the ability of the new technique to decrease the stick effects of the SFM tip. Second, an interface between two chemically very similar polymers was prepared by melting polypropylene (PP) and poly(propene-block-ethene) (PP-block-PE) films on each other. After cutting, the surface roughness of this sample was very high. It is shown that only HM-LFM clearly resolves the local micromechanical properties without artefacts.     

Time-resolved ultrathin cobalt film growth on a colloidal polymer template

Cobalt (Co) sputter deposition onto a colloidal polymer template is investigated using grazing incidence small-angle X-ray scattering (GISAXS), scanning electron microscopy (SEM), and atomic force microscopy (AFM). SEM and AFM data picture the sample topography, GISAXS the surface and near-surface film structure. A two-phase model is proposed to describe the time evolution of the Co growth. The presence of the colloidal template results in the correlated deposition of an ultrathin Co film on the sample surface and thus in the creation of Co capped polystyrene (PS) colloids. Well below the percolation threshold, the radial growth is restricted and only height growth is observed.     

EC STM investigations of corrosion due to chloride solutions on thin CrN coatings

The focus of the investigations presented is to evaluate local alterations caused by chloride ions affecting thin, magnetron-sputtered CrN layers. Scanning-probe microscopy and analysis techniques are used for this estimation. Thin CrN layers were deposited by reactive magnetron sputtering. They were investigated in electrochemical scanning tunnelling microscopy (EC STM) by cyclic voltammetry in 1 mol L(-1) NaCl. Simultaneously, the surface topography changes were recorded with STM.Above 100 mV the anodic oxidation leads to formation of chromium(III) hydroxide and at sample potentials above 350 mV oxidation of Cr(OH)(2) and Cr(OH)(3) towards chromium(VI) as a soluble chromate starts. Transpassive dissolution of the coating takes place above 900 mV. Yellow colour of the electrolyte is a visible sign for the formation of chromium(VI). Changes of the surface topography indicate the formation of surface layers at anodic potentials. At cathodic potentials increase in current is measured due to the reduction of chromium(III) hydroxide to divalent chromium and metallic chromium. Roughness of surface topography increases.Follow-up explorations with scanning electron microscopy (SEM), energy-dispersive X-ray spectroscopy (EDX), atomic-force microscopy (AFM), scanning tunnelling microscopy/scanning tunnelling spectroscopy (STM/STS) and X-ray photoelectron spectroscopy (XPS) not only evidence the formation of various chromium oxides, but also indicate the existence of chromium hydroxide.     

Polypropylene film chemical and physical modifications by dielectric barrier discharge plasma treatment at atmospheric pressure

Dielectric barrier discharge (DBD) technologies have been used to treat a polypropylene film. Various parameters such as treatment speed or electrical power were changed in order to determine the treatment power impact at the polypropylene surface. Indeed, all the treatments were performed using ambient air as gas to oxidize the polypropylene surface. This oxidation level and the surface modifications during the ageing were studied by a wetting method and by X-ray photoelectron spectroscopy (XPS). Moreover polypropylene film surface topography was analyzed by atomic force microscopy (AFM) in order to observe the surface roughness modifications. These topographic modifications were correlated to the surface oxidation by measuring with a lateral force microscope (LFM) the surface heterogeneity. The low ageing effects and the surface reorganization are discussed.     

Comparison of scanning ion conductance microscopy with atomic force microscopy for cell imaging

We present the first direct comparison of scanning ion conductance microscopy (SICM) with atomic force microscopy (AFM) for cell imaging. By imaging the same fibroblast or myoblast cell with both technologies in series, we highlight their advantages and disadvantages with respect to cell imaging. The finite imaging force applied to the sample in AFM imaging results in a coupling of mechanical sample properties into the measured sample topography. For soft samples such as cells this leads to artifacts in the measured topography and to elastic deformation, which we demonstrate by imaging whole fixed cells and cell extensions at high resolution. SICM imaging, on the other hand, has a noncontact character and can provide the true topography of soft samples at a comparable resolution.     

Dielectrophoretic force microscopy of aqueous interfaces

A novel scanning probe microscopy technique has allowed dielectrophoretic force imaging with nanoscale spatial resolution. Dielectrophoresis (DEP) traditionally describes the mobility of polarizable particles in inhomogeneous alternating current (ac) electric fields. Integrating DEP with atomic force microscopy allows for noncontact imaging with the image contrast related to the local electric polarizability. By tuning the ac frequency, dielectric spectroscopy can be performed at solid/liquid interfaces with high spatial resolution. In studies of cells, the frequency-dependent dielectrophoretic force is sensitive to biologically relevant electrical properties, including local membrane capacitance and ion mobility. Consequently, dielectrophoretic force microscopy is well suited for in vitro noncontact scanning probe microscopy of biological systems.     

Chemical force microscopy: applications in surface characterisation of natural hydroxyapatite

Detailed mapping of surface chemistry with nanometer resolution has application throughout the physical and life sciences. The atomic force microscope (AFM) has provided a tool that, when using functionalised probes, is capable of providing chemical information with this level of spatial resolution. Here, we describe the technique of chemical force microscopy (CFM) and demonstrate the sensitivity of the technique using chemical force titrations against pH. We describe in detail the specific application of mapping the surface charge on natural hydroxyapatite from skeletal tissue and show that this new information leads to a better understanding of the binding of matrix proteins to the mineral surface.     

Constant-distance mode scanning electrochemical microscopy (SECM)--Part I: Adaptation of a non-optical shear-force-based positioning mode for SECM tips

A non-optical shear-force-based detection scheme for accurately controlling the tip-to-sample distance in scanning electrochemical microscopy (SECM) is presented. With this approach, the detection of the shear force is accomplished by mechanically attaching a set of two piezoelectric plates to the scanning probe. One of the plates is used to excite the SECM tip causing it to resonate, and the other acts as a piezoelectric detector of the amplitude of the tip oscillation. Increasing shear forces in close proximity to the sample surface lead to a damping of the vibration amplitude and a phase shift, effects that are registered by connecting the detecting piezoelectric plate to a dual-phase analogue lock-in amplifier. The shear force and hence distance-dependent signal of the lock-in amplifier is used to establish an efficient, computer-controlled closed feedback loop enabling SECM imaging in a constant-distance mode of operation. The details of the SECM setup with an integrated piezoelectric shear-force distance control are described, and approach curves are shown. The performance of the constant-distance mode SECM with a non-optical detection of shear forces is illustrated by imaging simultaneously the topography and conductivity of an array of Pt-band microelectrodes.     

EDX depth profiling by means of effective layers

A new approach is described for depth profiling in stratified multilayer samples by recording energy dependent characteristic x-ray EDX(E ₀ ) curves in a scanning electron microscope. An effective layer technique replaces the x-ray excitation function of the heterogeneous target by an equivalent function of a homogeneous sample. First results of thickness determination are shown and compared to direct measurements of film thickness monitoring (FTM) and atomic force microscopy (AFM).     

Au-Ag template stripped pattern for scanning probe investigations of DNA arrays produced by dip pen nanolithography

We report on DNA arrays produced by dip pen nanolithography (DPN) on a novel Au-Ag micropatterned template stripped surface. DNA arrays have been investigated by atomic force microscopy (AFM) and scanning tunneling microscopy (STM) showing that the patterned template stripped substrate enables easy retrieval of the DPN-functionalized zone with a standard optical microscope permitting multi-instrument and multitechnique local detection and analysis. Moreover the smooth surface of the Au squares ( approximately 5-10 A roughness) allows AFM/STM to be sensitive to the hybridization of the oligonucleotide array with label-free target DNA. Our Au-Ag substrates, combining the retrieving capabilities of the patterned surface with the smoothness of the template stripped technique, are candidates for the investigation of DPN nanostructures and for the development of label-free detection methods for DNA nanoarrays based on the use of scanning probes.     

AFM investigations on the influence of CO2 exposure on Ba0.5Sr0.5Co0.8Fe0.2O3–δ

In this work, fresh and CO₂-exposed specimens of Ba_0.5Sr_0.5Co_0.8Fe_0.2O_3–δ (BSCF) are examined by atomic force microscopy (AFM) using amplitude-modulated Kelvin probe force microscopy (KPFM) and also electrostatic force microscopy (EFM) to characterize the early stages of the formation of reaction products due to reaction with gaseous CO₂. A comparison is made with results from electron microscopy on the same samples. BSCF specimens exposed for 24 and 240 h to an atmosphere of 99.9 % CO₂ at 900 °C, respectively, were analyzed and compared with non-exposed specimens. The observation of interconnected carbonate islands on BSCF forming a continuous carbonate layer after some exposure to CO₂ indicates a Stranski–Krastanov or Volmer–Weber growth mechanism of the carbonate layer. Our results demonstrate that the measurement of surface potential variations by means of KPFM and EFM constitutes a very sensitive technique to detect the formation of reaction layers on gas permeation membranes such as BSCF. In contrast to electron microscopy techniques, scanning probe techniques permit the investigation of the topography and of electrochemical characteristics of the sample surface as received and without further preparation.     

扫描离子电导显微镜的原理及应用

扫描离子电导显微镜(SICM)是一种扫描探针显微技术,通过测定超微玻璃管探针的离子电流,它能够非接触地扫描样品表面,进而研究样品的形貌及性质。SICM具有成像分辨率高、探针易于制备和对被成像物体无损伤等特点,特别适用于研究生理条件下的活体细胞,是一种与扫描电化学显微镜及原子力显微镜互补的扫描探针显微镜技术。SICM能够对软界面及表面,如活细胞表面的显微结构,进行高分辨率成像;并能够与其它技术联用,研究细胞形貌与功能的关系;还能控制沉积特定分子,实现纳米尺度的显微操作与加工。本文对SICM的发展历史、仪器构造、基本原理及应用进行了综述。