Picosecond‐resolved X‐ray absorption spectroscopy at low signal contrast using a hard X‐ray streak camera

A picosecond‐resolving hard‐X‐ray streak camera has been in operation for several years at Sector 7 of the Advanced Photon Source (APS). Several upgrades have been implemented over the past few years to optimize integration into the beamline, reduce the timing jitter, and improve the signal‐to‐noise ratio. These include the development of X‐ray optics for focusing the X‐rays into the sample and the entrance slit of the streak camera, and measures to minimize the amount of laser light needed to generate the deflection‐voltage ramp. For the latter, the photoconductive switch generating the deflection ramp was replaced with microwave power electronics. With these, the streak camera operates routinely at 88 MHz repetition rate, thus making it compatible with all of the APS fill patterns including use of all the X‐rays in the 324‐bunch mode. Sample data are shown to demonstrate the performance.     

Development of new apertures for coherent X‐ray experiments

When one performs a coherent small‐angle X‐ray scattering experiment, the incident beam must be spatially filtered by slits on a length scale smaller than the transverse coherence length of the source which is typically around 10 µm. The Fraunhofer diffraction pattern of the slit is one of the important sources of background in these experiments. New slits which minimize this parasitic background have been designed and tested. The slit configuration apodizes the beam by the use of partially transmitting inclined slit jaws. A model is presented which predicts that the high wavevector tails of the diffraction pattern fall as the inverse fourth power of the wavevector instead of the inverse second power that is observed for standard slits. Using cleaved GaAs single‐crystal edges, Fraunhofer diffraction patterns from 3 and 5.5 keV X‐rays were measured, in agreement with the theoretical model proposed. A novel phase‐peak diffraction pattern associated with phase variations of the transmitted electric field was also observed. The model proposed adequately accounts for this phenomenon.     

Polarization control of an X‐ray free‐electron laser with a diamond phase retarder

A diamond phase retarder was applied to control the polarization states of a hard X‐ray free‐electron laser (XFEL) in the photon energy range 5–20 keV. The horizontal polarization of the XFEL beam generated from the planar undulators of the SPring‐8 Angstrom Compact Free‐Electron Laser (SACLA) was converted into vertical or circular polarization of either helicity by adjusting the angular offset of the diamond crystal from the exact Bragg condition. Using a 1.5 mm‐thick crystal, a high degree of circular polarization, 97%, was obtained for 11.56 keV monochromatic X‐rays, whereas the degree of vertical polarization was 67%, both of which agreed with the estimations including the energy bandwidth of the Si 111 beamline monochromator.     

Fabrication and testing of a newly designed slit system for depth‐resolved X‐ray diffraction measurements

A new system of slits called `spiderweb slits' have been developed for depth‐resolved powder or polycrystalline X‐ray diffraction measurements. The slits act on diffracted X‐rays to select a particular gauge volume of sample, while absorbing diffracted X‐rays from outside of this volume. Although the slit geometry is to some extent similar to that of previously developed conical slits or spiral slits, this new design has advantages over the previous ones in use for complex heterogeneous materials and in situ and operando diffraction measurements. For example, the slits can measure a majority of any diffraction cone for any polycrystalline material, over a continuous range of diffraction angles, and work for X‐ray energies of tens to hundreds of kiloelectronvolts. The design is generated and optimized using ray‐tracing simulations, and fabricated through laser micromachining. The first prototype was successfully tested at the X17A beamline at the National Synchrotron Light Source, and shows similar performance to simulations, demonstrating gauge volume selection for standard powders, for all diffraction peaks over angles of 2–10°. A similar, but improved, design will be implemented at the X‐ray Powder Diffraction beamline at the National Synchrotron Light Source II.     

Beamline BL‐07 at Indus‐2: a facility for microfabrication research

The X‐ray lithography beamline on Indus‐2 is now operational, with two modes of operation. With a pair of X‐ray mirrors it is possible to tune the energy spectrum between 1 and 20 keV with a controlled spectral bandwidth. In its `no optics' mode, hard X‐rays up to 40 keV are available. Features and performance of the beamline are presented along with some example structures. Structures fabricated include honeycomb structures in PMMA using a stainless steel stencil mask and a compound refractive X‐ray lens using a polyimide–gold mask in SU‐8.     

Three‐dimensional coherent diffractive imaging on non‐periodic specimens at the ESRF beamline ID10

The progress of tomographic coherent diffractive imaging with hard X‐rays at the ID10 beamline of the European Synchrotron Radiation Facility is presented. The performance of the instrument is demonstrated by imaging a cluster of Fe₂P magnetic nanorods at 59 nm 3D resolution by phasing a diffraction volume measured at 8 keV photon energy. The result obtained shows progress in three‐dimensional imaging of non‐crystalline samples in air with hard X‐rays.     

Multimodal hard X‐ray imaging of a mammography phantom at a compact synchrotron light source

The Compact Light Source is a miniature synchrotron producing X‐rays at the interaction point of a counter‐propagating laser pulse and electron bunch through the process of inverse Compton scattering. The small transverse size of the luminous region yields a highly coherent beam with an angular divergence of a few milliradians. The intrinsic monochromaticity and coherence of the produced X‐rays can be exploited in high‐sensitivity differential phase‐contrast imaging with a grating‐based interferometer. Here, the first multimodal X‐ray imaging experiments at the Compact Light Source at a clinically compatible X‐ray energy of 21 keV are reported. Dose‐compatible measurements of a mammography phantom clearly demonstrate an increase in contrast attainable through differential phase and dark‐field imaging over conventional attenuation‐based projections.     

Grazing‐incidence small‐angle X‐ray scattering from Ge nanodots self‐organized on Si(001) examined with soft X‐rays

Grazing‐incidence small‐angle X‐ray scattering (GISAXS) measurements with soft X‐rays have been applied to Ge nanodots capped with a Si layer. Spatially anisotropic distribution of nanodots resulted in strongly asymmetric GISAXS patterns in the q_y direction in the soft X‐ray region, which have not been observed with conventional hard X‐rays. However, such apparent differences were explained by performing a GISAXS intensity calculation on the Ewald sphere, i.e. taking the curvature of Ewald sphere into account.     

Tuning the phase transition of ZnO thin films through lithography: an integrated bottom‐up and top‐down processing

An innovative approach towards the physico‐chemical tailoring of zinc oxide thin films is reported. The films have been deposited by liquid phase using the sol–gel method and then exposed to hard X‐rays, provided by a synchrotron storage ring, for lithography. The use of surfactant and chelating agents in the sol allows easy‐to‐pattern films made by an organic–inorganic matrix to be deposited. The exposure to hard X‐rays strongly affects the nucleation and growth of crystalline ZnO, triggering the formation of two intermediate phases before obtaining a wurtzite‐like structure. At the same time, X‐ray lithography allows for a fast patterning of the coatings enabling microfabrication for sensing and arrays technology.     

On easily tunable wide‐bandpass X‐ray monochromators based on refraction in arrays of prisms

Refractive lenses focus X‐rays chromatically owing to a significant variation of the refractive index of the lens material with photon energy. Then, in combination with an exit slit in the focal plane, such lenses can be used as monochromators. The spectral resolution obtainable with refractive lenses based on prism arrays was recently systematically investigated experimentally. This contribution will show that a wide‐bandpass performance can be predicted with a rather simple analytical approach. Based on the good agreement with the experimental data, one can then more rapidly and systematically optimize the lens structure for a given application. This contribution will then discuss more flexible solutions for the monochromator operation. It will be shown that a new monochromator scheme could easily provide tuning in a fixed‐exit slit.     

Characteristics of a tapered undulator for the X‐ray absorption fine‐structure technique at PLS‐II

An in‐vacuum undulator (IVU) with a tapered configuration was installed in the 8C nanoprobe/XAFS beamlime (BL8C) of the Pohang Light Source in Korea for hard X‐ray nanoprobe and X‐ray absorption fine‐structure (XAFS) experiments. It has been operated in planar mode for the nanoprobe experiments, while gap‐scan and tapered modes have been used alternatively for XAFS experiments. To examine the features of the BL8C IVU for XAFS experiments, spectral distributions were obtained theoretically and experimentally as functions of the gap and gap taper. Beam profiles at a cross section of the X‐ray beam were acquired using a slit to visualize the intensity distributions which depend on the gap, degree of tapering and harmonic energies. To demonstrate the effect of tapering around the lower limit of the third‐harmonic energy, V K‐edge XAFS spectra were obtained in each mode. Owing to the large X‐ray intensity variation around this energy, XAFS spectra of the planar and gap‐scan modes show considerable spectral distortions in comparison with the tapered mode. This indicates that the tapered mode, owing to the smooth X‐ray intensity profile at the expense of the highest and most stable intensity, can be an alternative for XAFS experiments where the gap‐scan mode gives a considerable intensity variation; it is also suitable for quick‐XAFS scanning.     

High‐efficiency coherence‐preserving harmonic rejection with crystal optics

This work reports a harmonic‐rejection scheme based on the combination of Si(111) monochromator and Si(220) harmonic‐rejection crystal optics. This approach is of importance to a wide range of X‐ray applications in all three major branches of modern X‐ray science (scattering, spectroscopy, imaging) based at major facilities, and especially relevant to the capabilities offered by the new diffraction‐limited storage rings. It was demonstrated both theoretically and experimentally that, when used with a synchrotron undulator source over a broad range of X‐ray energies of interest, the harmonic‐rejection crystals transmit the incident harmonic X‐rays on the order of 10^?6. Considering the flux ratio of fundamental and harmonic X‐rays in the incident beam, this scheme achieves a total flux ratio of harmonic radiation to fundamental radiation on the order of 10^?10. The spatial coherence of the undulator beam is preserved in the transmitted fundamental radiation while the harmonic radiation is suppressed, making this scheme suitable not only for current third‐generation synchrotron sources but also for the new diffraction‐limited storage rings where coherence preservation is an even higher priority. Compared with conventional harmonic‐rejection mirrors, where coherence is poorly preserved and harmonic rejection is less effective, this scheme has the added advantage of lower cost and footprint. This approach has been successfully utilized at the ultra‐small‐angle X‐ray scattering instrument at the Advanced Photon Source for scattering, imaging and coherent X‐ray photon correlation spectroscopy experiments. With minor modification, the harmonic rejection can be improved by a further five orders of magnitude, enabling even more performance capabilities.     

Direct nano‐scale patterning of Ag films using hard X‐ray induced oxidation

The morphological change of silver nano‐particles (AgNPs) exposed to an intense synchrotron X‐ray beam was investigated for the purpose of direct nano‐scale patterning of metal thin films. AgNPs irradiated by hard X‐rays in oxygen ambient were oxidized and migrated out of the illuminated region. The observed X‐ray induced oxidation was utilized to fabricate nano‐scale metal line patterns using sectioned WSi₂/Si multilayers as masks. Lines with a width as small as 21 nm were successfully fabricated on Ag films on silicon nitride. Au/Ag nano‐lines were also fabricated using the proposed method.     

Hard X‐ray microbeam lithography using a Fresnel zone plate with a long focal length

Focused hard X‐ray microbeams for use in X‐ray nanolithography have been investigated. A 7.5 keV X‐ray beam generated at an undulator was focused to about 3 µm using a Fresnel zone plate fabricated on silicon. The focused X‐ray beam retains a high degree of collimation owing to the long focal length of the zone plate, which greatly facilitates hard X‐ray nanoscale lithography. The focused X‐ray microbeam was successfully utilized to fabricate patterns with features as small as 100 nm on a photoresist.     

Focused ion beam preparation of samples for X‐ray nanotomography

The preparation of hard material samples with the necessary size and shape is critical to successful material analysis. X‐ray nanotomography requires that samples are sufficiently thin for X‐rays to pass through the sample during rotation for tomography. One method for producing samples that fit the criteria for X‐ray nanotomography is focused ion beam/scanning electron microscopy (FIB/SEM) which uses a focused beam of ions to selectively mill around a region of interest and then utilizes a micromanipulator to remove the milled‐out sample from the bulk material and mount it on a sample holder. In this article the process for preparing X‐ray nanotomography samples in multiple shapes and sizes is discussed. Additionally, solid‐oxide fuel cell anode samples prepared through the FIB/SEM technique underwent volume‐independence studies for multiple properties such as volume fraction, average particle size, tortuosity and contiguity to observe the characteristics of FIB/SEM samples in X‐ray nanotomography.     

Coherence and wavefront characterization of Si‐111 monochromators using double‐grating interferometry

A study of the coherence and wavefront properties of a pseudo‐channel‐cut monochromator in comparison with a double‐crystal monochromator is presented. Using a double‐grating interferometer designed for the hard X‐ray regime, the complex coherence factor was measured and the wavefront distortions at the sample position were analyzed. A transverse coherence length was found in the vertical direction that was a factor of two larger for the channel‐cut monochromator owing to its higher mechanical stability. The wavefront distortions after different optical elements in the beam, such as monochromators and mirrors, were also quantified. This work is particularly relevant for coherent diffraction imaging experiments with synchrotron sources.     

Windowless transition between atmospheric pressure and high vacuum via differential pumping for synchrotron radiation applications

A differential pump assembly is introduced which can provide a windowless transition between the full atmospheric pressure of an in‐air sample environment and the high‐vacuum region of a synchrotron radiation beamline, while providing a clear aperture of approximately 1 mm to pass through the X‐ray beam from a modern third‐generation synchrotron radiation source. This novel pump assembly is meant to be used as a substitute for an exit vacuum window on synchrotron beamlines, where the existence of such a window would negatively impact the coherent nature of the X‐ray beam or would introduce parasitic scattering, distorting weak scattering signals from samples under study. It is found that the length of beam pipe necessary to reduce atmospheric pressure to below 10 mbar is only about 130 mm, making the expected photon transmission for hard X‐rays through this pipe competitive with that of a regular Be beamline window. This result is due to turbulent flow dominating the first pumping stage, providing a mechanism of strong gas conductance limitation, which is further enhanced by introducing artificial surface roughness in the pipe. Successive reduction of pressure through the transitional flow regime into the high‐vacuum region is accomplished over a length of several meters, using beam pipes of increasing diameter. While the pump assembly has not been tested with X‐rays, possible applications are discussed in the context of coherent and small‐angle scattering.     

Characterization of spatial coherence of synchrotron radiation with non‐redundant arrays of apertures

A method to characterize the spatial coherence of soft X‐ray radiation from a single diffraction pattern is presented. The technique is based on scattering from non‐redundant arrays (NRAs) of slits and records the degree of spatial coherence at several relative separations from 1 to 15 µm, simultaneously. Using NRAs the spatial coherence of the X‐ray beam at the XUV X‐ray beamline P04 of the PETRA III synchrotron storage ring was measured as a function of different beam parameters. To verify the results obtained with the NRAs, additional Young's double‐pinhole experiments were conducted and showed good agreement.     

Sapphire hard X‐ray Fabry–Perot resonators for synchrotron experiments

Hard X‐ray Fabry–Perot resonators (FPRs) made from sapphire crystals were constructed and characterized. The FPRs consisted of two crystal plates, part of a monolithic crystal structure of Al₂O₃, acting as a pair of mirrors, for the backward reflection (0 0 0 30) of hard X‐rays at 14.3147 keV. The dimensional accuracy during manufacturing and the defect density in the crystal in relation to the resonance efficiency of sapphire FPRs were analyzed from a theoretical standpoint based on X‐ray cavity resonance and measurements using scanning electron microscopic and X‐ray topographic techniques for crystal defects. Well defined resonance spectra of sapphire FPRs were successfully obtained, and were comparable with the theoretical predictions.     

Three Dimensional Angular Distributions of X‐Rays in a 4 kJ Plasma Focus Device for Different Anode Tips Using TLD‐100 Dosimeters

Time and energy integrated measurements of the 3‐D angular distribution of X‐rays emission within the chamber of a 4 kJ Mather‐type plasma focus is investigated employing four different anode shapes and using nitrogen as the filling gas by the TLD‐100 thermoluminescence dosimeters. The distributions of X‐ray radiation in the energy range of 5 keV to several hundred keV were bimodal for all of the anode tips, peaked approximately at ±15°. The intensity of X‐rays decreased abruptly along the central axis of the device where the quasi cylindrical plasma pinch was formed. High intensity of X‐ray was observed in the case of a tapered ?at‐end anode, whereas less was obtained with the cylindrical hollow‐end anode. The maximum nitrogen X‐rays were for the tapered flat‐end anode at 4.5 mbar and 13 kV. (© 2014 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)