Random and localized resistive switching observation in Pt/NiO/Pt

Resistive memory switching devices based on transition metal oxides are now emerging as a candidate for nonvolatile memories. To visualize nano‐sized (10 nm to 30 nm in diameter) conducting filamentary paths in the surface of NiO thin films during repetitive switching, current sensing–atomic force microscopy and ultra‐thin (<5 nm) Pt films as top electrodes were used. Some areas (or spots), which were assumed to be the beginning of the conducting filaments, appeared (formation) and disappeared (rupture) in a localized and random fashion during the switching and are thought to contribute to resistive memory switching. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Insulator–semiconductor–metallic state transition induced by electric fields in Mn‐doped NaNbO3

The electro‐forming procedure was applied to NaNbO₃:Mn and NaNbO₃ insulator crystals. The electric current flow induced a transition to the metallic‐type temperature dependence of the resistance. The Mn dopant shortened the time needed for the transition. The LC‐AFM measurement showed a non‐homogeneous distribution in local resistance resulting from the electric field via the AFM tip. We ascribe this effect to percolation in the network of the highly conducting filaments, whose formation is facilitated by the Mn ions. We conclude that the insulator–metal transition is induced within a subsystem of extended defects already existing in the NaNbO₃:Mn crystal lattice host. (© 2009 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Controlled local filament growth and dissolution in Ag–Ge–Se

Memory cells based on the cation migration and filament formation and rupture in a solid electrolyte have attracted much interest due to low switching voltages and a prospective high scalability. In this study we indirectly visualized the growth and dissolution of the conductive filament in Ag–Ge–Se samples with Ag bottom electrodes by surface analysis with Conductive Atomic Force Microscopy (CAFM). By application of a negative voltage to the inert CAFM tip, conductive filaments were grown on the scanned area and they were dissolved under reversed bias. The local conductivity changes directly corresponded to changes in the topography, i.e. to the filament protrusion and dissolution. Topography changes could be circumvented by limiting the maximum current. By placing the CAFM tip on a random spot on the sample, filaments with a diameter as low as 20 nm were grown by local current–voltage measurements. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Piezoresponse imaging and local characterization of ferroelectric domains in Pb(Zn1/3Nb2/3)O3–7%PbTiO3 single crystals

Ferroelectric domain structures of (001)‐oriented Pb(Zn_1/3Nb_2/3)O₃–7%PbTiO₃ (PZN‐7%PT) single crystals were visualized and characterized by piezoresponse force microscopy (PFM). Locally regular domain configurations are found to be possibly related to the stable macroscopic properties in the PZN‐7%PT single crystals. Nanoscale piezoresponse hysteresis loops measured by PFM tip revealed no evidence of local domain switching behavior in the PZN‐7%PT single crystal. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Epitaxial strain effects on the metal-insulator transition in V2O3 thin films

Effects of epitaxial stress on the metal-insulator transition of V₂O₃ have been studied for in the form of epitaxial thin films grown on α-Al₂O₃ (0001) and LiTaO₃ (0001) substrates. A metallic phase is stabilized down to 2 K in the V₂O₃ thin film on α-Al₂O₃ (0001), where the a-axis is compressed by 4% owing to large epitaxial stress. On the other hand, the transition temperature T_MI is raised by 20 K from the value of 170 K in bulk samples in the film on LiTaO₃ (0001), where the a-axis is expanded. These results suggest an intimate relationship between the a-axis length and T_MI in V₂O₃. The conductivity of the metallic ultrathin films shows logarithmic temperature dependence below 20 K, probably due to the Anderson localization in two-dimensional systems.     

Magnetic field induced metal-insulator transitions in p-SiGe

Low density modulation doped p-SiGe, where the holes lie in a strained SiGe quantum well, frequently exhibits anomalous insulating behaviour between filling factors ν=2 and 1. There is also anomalous metallic behavior with a metal-insulator transition between the two. It is shown that in these samples exchange effects are sufficiently large to induce the paramagnetic-ferromagnetic phase transition predicted by Giuliani and Quinn in 1985, also that the metallic and insulating behavior is associated with the coincidence of two Landau levels of opposite spin. A model calculation shows that while a ferromagnetic polarization may occur at integer filling factors screening suppresses it for non-integer filling factors. It is argued the Landau levels then stick-together and allow a spin-density instability to form. Because of the strong spin-orbit coupling in p-SiGe the transport properties of this state differ from those of other systems where a similar quantum Hall ferromagnet probably forms.     

Metal-insulator transition induced by the magnetic field in n-type GaSb

The metal-insulator (MI) transition induced by a magnetic field was evidenced for the first time in compensated n-type GaSb layers grown by molecular beam epitaxy. The free electron densities were in the low 10¹⁶ cm⁻³ range or even slightly lower, so that the zero-field 3D electron gas was degenerate and, at the B_MI magnetic field of the MI transition, it populates only the spin-split 0⁽⁺⁾ Landau level (extreme quantum limit). On the metallic side of the MI transition a T^1/3 dependence of the conductivity was assumed to fit the low-T data and to estimate the B_MI value, which resulted of 9.1 T in the purest sample. The MI transition manifests in a strong increase of the diagonal resistivity with the magnetic field, but not of the Hall coefficient, suggesting that the apparent electron density is practically constant, whereas the mobility varies strongly. The evidence of a maximum in the temperature dependence of the Hall coefficient has been explained through a two channels transport mechanism involving localized and extended states.     

Structural,magnetic, and transport properties in La(2+4x)/3Sr(1−4x)/3Mn1−xCuxO3 (0⩽x⩽0.20) system

A series of the double-doping samples La_(2+4x)/3Sr_(1−4x)/3Mn_1−xCu_xO₃(0?x?0.2)$(0?x?0.2)$ with the Mn³⁺/Mn⁴⁺ ratio fixed at 2:1 have been prepared. The structural, magnetic, transport properties and magnetoresistance of the series samples have been investigated. It is found that no apparent crystal structure change is introduced by Cu doping up to x=0.20$x=0.20$. But the Curie temperature _TC$T_{\mathrm{C}}$ and magnetization M   are strongly affected by Cu substitution. A remarkable magnetotransport behavior, characterized by double bumps, is observed, and an obvious low-temperature upturn is found in the range of 0.07?x?0.12$0.07?x?0.12$. As a result, the temperature range of colossal magnetoresistance (CMR) is greatly broadened. Moreover, it is found that the room temperature magnetoresistance (MR) of double-doping samples is obviously larger that the undoped La_2/3Sr_1/3Mn_1−xCu_xO₃ at 300 K, which can give a guide for the adequate selection of the room temperature CMR materials.     

Screen charge transfer by grounded tip on ferroelectric surfaces

We have investigated polarization reversal and charge transfer effects by a grounded tip on 50 nm thick ferroelectric thin films using piezoelectric force microscopy and Kelvin force microscopy. We observed the polarization reversal in the center of written domains, and also identified another mechanism, which is the transfer of screen charges toward the grounded tip. In order to overcome these phenomena, we successfully applied a modified read/write scheme featuring a bias voltage. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Preexponential factor in variable-range hopping conduction in CuInTe2

We study the temperature dependence of the electrical resistivity in a single crystal of p-type uncompensated CuInTe₂ on the insulating side of the metal-insulator transition down to 0.4 K. We observe a crossover from Mott to Efros-Shklovskii variable-range hopping conduction. In Efros-Shklovskii-type conduction, the resistivity is best described by explicitly including a preexponential temperature dependence according to the general expression ρ=ρ₀T^αexp(T_ES/T)^1/2, with α≠0. A theory based on the resistor network model was developed to derive an explicit relation between α and the decay of the wavefunction of the localized states. A consistent correspondence between the asymptotic extension of the wavefunction and the conduction regime is proposed. The results indicate a new mechanism for a local resistivity maximum in insulators, not involving magnetic effects.     

Ultra-Fast Decay Process of Electrons in LiNbO3 Crystal Induced by Femtosecond Pulse

Temporal evolution of absorption induced by single femtosecond pulse （13Ors, 800nm） with high intensity in LiNbO3 is obtained using the probe shadow imaging technique in order to investigate light-induced electron relaxation processes. By saturating the polaron density with a high intensity laser pulse, ultra-fast decay process on picosecond time scale is observed. The decay time constant is about 141 ps and it is attributed to the direct interband electron-hole recombination process.     

Electrocaloric effect in antiferroelectric PbZrO3 thin films

Antiferroelectric PbZrO₃ thin films have been deposited on Pt(111)/Ti/SiO₂/Si substrate by polymer modified sol–gel route. Temperature dependent P –E hysteresis loops have been measured at 51 MV/m within a temperature range of 40 °C to 330 °C. The maximum electrocaloric effect ～0.224 × 10^–6 K mV^–1 has been observed near the dielectric phase transition temperature (235 °C) of the thin films. The electrocaloric effect and its strong temperature dependence have been attributed to nearly first‐order phase transition. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Preparation and characterisation of compositionally graded BaxSr1-xTiO3 thin films

Ba_xSr_1-xTiO₃ thin films with a compositional gradient of x=0.3 to 1 (in 0.1 mole fraction increments) were fabricated on Pt/Ti/SiO₂/Si substrates using a modified sol–gel technique. The graded film crystallised in a perovskite structure and consists of a uniform microstructure with comparatively larger grains. The room-temperature relative dielectric constant (ε_r) and dielectric loss (cosδ) at 100 kHz were found to be 305 and 0.03 respectively. Dielectric peaks were not observed in the temperature range from -20 °C to 120 °C. The dielectric constant and dielectric loss were almost independent of temperature. Polarisation–electric field measurements at room temperature revealed a saturated but slim hysteresis loop with a remanent polarisation (P_r) of 0.6 μC/cm² and a coercive field (E_c) of 2.4 kV/mm. The graded film behaves as a stack of Ba_xSr_1-xTiO₃ capacitors connected in series and hence the dielectric Curie peaks are removed. Received: 4 October 2001 / Accepted: 17 October 2001 / Published online: 23 January 2002     

Analytic expression for the appearance of the Slater mode in ferroelectric perovskites

An analytic expression for the appearance of the Slater mode in ferroelectric perovskites has been proposed through the application of a configuration-interaction problem discussed by Zaanen and Sawatzky. In ferroelectric perovskite oxides ABO₃, the appearance of the Slater mode is found to be closely related to the p-d hybridization between B and O as well as the p-d energy gap and on-site Coulomb energy in the B d state. Numerical estimations using the proposed expression are consistent with the experimental results of ATiO₃ (A=Ca, Sr, Ba and Pb).     

Domain wall thickness variations of ferroelectric BaMgF4 single crystals in the tip fields of an atomic force microscope

The ferroelectric domain wall thickness of a fluoride BaMgF₄ single crystal was investigated by piezoresponse force microscopy. It was found that the domain wall thickness shows a strong spatial variation in the as‐grown crystal and the polarization reversal process. The original wall thickness is greater (about two to seven times) than that switched by the tip fields of the atomic force microscope. A significantly narrower domain wall was obtained in the higher tip‐field. The trapped defects at the domain wall play an important role in the spatial variation of the polarization width of 180° domain wall in the BaMgF₄ single crystal. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Influence of substrate temperature on the chemical and microstructural properties of MO-CVD ZrTiO<Subscript>4</Subscript> thin films

In the last few years, intensive research activity has been focused on the development of suitable synthesis methods for high-permittivity materials, used for the realization of next-generation microdevices able to fulfil the previsions of the Technology Roadmap of Semiconductors. The use of high-permittivity materials can overcome the difficulties concerning the production of SiO₂-based ultra-thin dielectrics, such as the generation of pinholes and the non-uniformity of the film, which may result in a malfunction in high-density systems. Recently, zirconium titanate thin films were discovered to have very interesting dielectric properties, which suggests a use for them in microwave integrated systems, such as receivers or DRAMs, since they are monophasic, have little dissipation and show a good thermal stability and a high value for the dielectric constant, independent of frequency in the range from kilohertz to a few gigahertz. Real application is possible only in strict connection with the development of a suitable preparation method which allows production with controlled and reproducible characteristics. In this work, the synthesis and characterization of Zr_xTi_1-xO₄ (ZT) thin films grown via MO-CVD is described, studying the influence of growth parameters on their structural, chemical and physical properties. Received: 17 June 2002 / Accepted: 24 June 2002 / Published online: 4 November 2002 RID="*" ID="*"Corresponding author. Fax: +39-06/9067-2445, E-mail: Pad@mlib.cnr.it     

Spin-state transition, magnetic, electrical and thermal transport properties of the perovskite cobalt oxide Gd0.7Sr0.3CoO3

The magnetization, resistivity ρ, thermoelectric power (TEP) S, and thermal conductivity κ in perovskite cobalt oxide Gd_0.7Sr_0.3CoO₃ have been investigated systematically. Based on the temperature dependence of susceptibility χ_g(T) and Seebeck coefficient S(T), a combination of the intermediate-spin (IS) state for Co³⁺ and the low-spin (LS) state for Co⁴⁺ can be suggested. A metal-insulator transition (MIT) caused by the hopping of σ* electrons (localized or delocalized e_g electrons) from the IS Co³⁺ to the LS Co⁴⁺ is observed. Meanwhile, S(T) curve also displays an obvious phonon drag effect. In addition, based on the analysis of the temperature dependence of S(T) and ρ(T), the high-temperature small polaron conduction and the low-temperature variable-range-hopping conduction are suggested, respectively. As to thermal conduction κ(T), rather low κ values in the whole measured temperature range is attributed to unusually large local Jahn-Teller (JT) distortion of Co³⁺O₆ octahedra with IS state.     

Numerical analysis of the transport processes in manganite-titanate Schottky junctions

A numerical study is presented on the transport processes in the manganite-titanate Schottky junction by using the Poisson equation, the drift-diffusion formulas, the direct and thermally assisted tunneling model. Comparing with the experimental data, it is found that the non-monotonically temperature-dependent I-V curves under reverse bias is caused by the competition between the direct and thermally assisted tunneling processes. In addition, it is also found that the electric field dependence of the permittivity in Nb-doped SrTiO₃ plays an important role on the transport properties of the manganite-titanate Schottky junctions based on our calculation.     

Electric current-induced giant electroresistance in epitaxial La0.67Sr0.33MnO3 thin films

The electronic transport behavior of La_0.67Sr_0.33MnO₃ epitaxial thin films with different thicknesses has been investigated under various applied DC currents. The 20 and 70 nm thick films show a giant negative electroresistance (ER). In contrast, the films with 100 nm thickness show unusual giant positive ER, which can reach 30% with the current density of 1.8×10⁸ A/cm² at room temperature. It is interesting that the electric current can also change the magnetoresistance of the films. The results were explained by considering the spin polarized current induced increase of ferromagnetic metallic phase and current-induced lattice distortion via electron wind force under high current density.     

Investigation of FIB irradiation damage in La0.7Sr0.3MnO3 thin films

In this work we analyse systematically how morphological and magnetotransport properties of manganite thin films are affected by the damage induced by focused ion beam (FIB) irradiation. We irradiate different areas of the same sample with doses ranging from 5×10¹² to 3×10¹⁷ ions/cm² and we find that the film becomes swollen for doses up to 10¹⁶ ions/cm² and is eventually eroded by ion milling for further irradiation. On the other hand, transport properties are much more sensitive to FIB irradiation: the metal–insulator transition temperature is found to decrease monotonically with increasing doses up to 1.8×10¹³ ions/cm². At doses higher than 5.6×10¹³ ions/cm² the metallic state is completely suppressed and likely, also ferromagnetism.