TXRF法测定松花粉中的9种生命元素

建立了微波消解前处理,全反射X射线荧光法(TXRF)同时测定松花粉中K、Ca、Ti、Mn、Fe、Ni、Cu、Zn和Rb9种生命元素含量的分析方法.松花粉原料经过微波消解前处理后,采用全反射X射线荧光光谱净计数、QXAS分析软件解谱和单一内标法进行定量分析.比较了干灰化法、湿消解法和微波消解法3种前处理方法的效果,并确立微波消解法作为样品前处理方法.用微波消解- TXRF法测定了花粉标准物质中的上述9种元素,并计算得到其仪器检出限(LLD)为0.002～0.054 mg/L,方法检出限(LDM)为0.004～0.122 mg/kg.TXRF法测定各元素的相对标准偏差(RSDs)为1.0％～5.5％.该方法操作简单、样品用量少、检出限低,对实际样品松花粉的测定结果与ICP - MS法无显著性差异.     

Optimization of TXRF measurements by variable incident angles

Variable incident angles in TXRF instrumentation open up new possibilities in the field of analytical quality assurance of TXRF measurements as well as the possibility of optimizing the measurement angle with respect to the sample carrier. Measurements on the same sample with different incident angles allow a check to be made on the behavior of the internal standard and the elements under investigation within the sample, which makes quantification more reliable, even for difficult samples. This is demonstrated on the example of standard reference material NIST 1633a comparing the relative fluorescence intensities of the elements K, Ti and Fe obtained from a sample prepared from a suspension and a digestion of the SRM material, respectively. Furthermore, it will be shown how the measurement conditions for different sample carrier materials such as quartz and acrylic glass can be optimized by measuring angular-dependent signal and background intensities.     

Electro-deposition as a sample preparation technique for total-reflection X-ray fluorescence analysis

A one-step sample preparation by electro-deposition for total-reflection X-ray fluorescence (TXRF) analysis has been developed using a common three-electrode arrangement with a rotating disc as the working electrode. Several elements such as Cr, Mn, Fe, Co, Ni, Cu, Zn, Ag, Cd, Pb, As and U have been determined simultaneously in saline matrix. A special electrode tip has been constructed as a holder for the TXRF sample carrier, which consists of polished glassy carbon. The influence of parameters such as time, pH value, and trace element concentration on the deposition yield has been examined for 14 elements. From repeatability studies, the uncertainty in deposition yields at the 95% confidence level has been found to be less than 20% for most of these elements. Typical detection limits range from 5 to 20 ng/l under the experimental conditions applied here. By an appropriate choice of the reference element and by calculation of yield factors, reliable quantification can be achieved directly by internal standardization. First results obtained for the standard reference material CRM 505 are presented.     

A method for trace element determination of single Daphnia specimens using total reflection X-ray fluorescence spectrometry

Two new preparation techniques for total-reflection X-ray fluorescence (TXRF) element determination of single freshwater crustacean specimens (dry weight: 3–40 μg ind⁻¹) have been developed and tested using Daphnia pulex from a deep, oligotrophic freshwater lake located in southern Chile. Dry method: Specimens were washed with 0.2 μm filtered lake water and frozen in liquid nitrogen. The freeze-dried Daphnia specimens were weighed using an ultra-fine microbalance and placed on quartz glass carriers for TXRF analysis. Wet method: Specimens were washed with 0.2 μm filtered lake water and placed on quartz glass carriers for TXRF analysis and dried in air. The dry weight was determined using the previously established body length–dry weight relationship. Method validation for both the dry and the wet preparation method in combination with TXRF spectrometry for the element determination in small single freshwater crustaceans showed that both methods can be used for routine investigations. There were no significant differences between the dry and the wet methods concerning the elements Ca, K, Fe, Zn, Br, P, Cu, but the determination of Mn, S and Sr revealed significant differences between the two methods. It seems that the dry method yields more precise results, but the wet method is easier to handle in the field when samples cannot be fixed with liquid nitrogen.     

An electrochemical enrichment procedure for the determination of heavy metals by total-reflection X-ray fluorescence spectroscopy

An electrolytic separation and enrichment technique was developed for the determination of trace elements by total-reflection X-ray fluorescence spectroscopy (TXRF). The elements of interest are electrodeposited out of the sample solution onto a solid, polished disc of pure niobium which is used as sample carrier for the TXRF measurement. The electrochemical deposition leads to a high enrichment of the analytes and at the same time to a removal of the matrix. This results in substantially improved detection limits in the lower picogram per gram region. The deposited elements are directly measured by TXRF without any further sample preparation step. The homogeneous thin layer of the analytes is an ideal sample form for TXRF, because scattered radiation from the sample itself is minimized. The proposed sample preparation method is useful particularly for the analysis of heavy metals in liquid samples with for TXRF disturbing matrices, e.g. sea water.     

Size-fractionated sampling and chemical analysis by total-reflection X-ray fluorescence spectrometry of PMx in ambient air and emissions

PM 10 and PM 2.5 (PMx) have been recently introduced as new air quality standards in the EU (Council Directive 1999/30/EC) for particulate matter. Different estimates and measurements showed that the limit values for PM 10 will be exceeded at different locations in Europe, and thus measures will have to be taken to reduce PMx mass concentrations. Source apportionment has to be carried out, demanding comparable methods for ambient air and emission sampling and chemical analysis. Therefore, a special ambient-air sampler and a specially designed emission sampler have been developed. Total-reflection X-ray fluorescence analysis (TXRF) was used for multi-element analyses as a fast method with low detection limits. For ambient air measurements, a sampling unit was built, impacting particle size classes 10–2.5 μm and 2.5–1.0 μm directly onto TXRF sample carriers. An electrostatic precipitator (ESP) was used as back-up filter to also collect particles <1 μm directly onto the TXRF sample carriers. Air quality is affected by natural and anthropogenic sources, and the emissions of particles <10 μm and <2.5 μm, respectively, have to be determined to quantify their contributions to the so-called coarse (10–2.5 μm) and fine (<2.5 μm) particle modes in ambient air. For this, an in-stack particle sampling system was developed, according to the new ambient air quality standards and in view of subsequent analysis by TXRF. These newly developed samplers, in combination with TXRF analyses, were employed in field campaigns to prove the feasibility and capabilities of the approach. Ambient air data show the quantification of a wide spectrum of elements. From those concentrations, PMx ratios were calculated as an indicator for different sources of elements. Results useful for source apportionment are also the elemental day/night ratios calculated to determine local contributions to PMx mass concentrations. With regard to the emission measurements, results of mass and elemental concentrations obtained in two different processes (steel industry) show that the new PM 10/PM 2.5 cascade impactor and measurements with TXRF give characteristic fingerprints for different sources. Size-fractionated ambient air and emission sampling, together with multi-element analysis, prove to be a useful approach to derive information for source–receptor modeling, a method necessary to set up effective abatement strategies to reduce PMx mass concentrations.     

Sapphire sample carriers for silicon determination by total-reflection X-ray fluorescence analysis

Sapphire is presented as a new sample carrier material for total-reflection X-ray fluorescence spectrometry (TXRF). A comparison with conventional sample carrier materials such as quartz glass, Perspex®, glassy carbon and boron nitride demonstrates that sapphire has all the physical and chemical properties required for TXRF micro and trace analysis. Moreover, sapphire sample carriers allow the determination of silicon in many matrices in a comparatively simple way. Especially for airborne particulate matter, acid digestion can be avoided by cool-plasma ashing of suitable filter materials directly on the sample carrier. This technique has been successfully applied to environmental samples.     

ICP-MS法测定聚酯纤维中TiO2含量

采用湿法和微波法对聚酯纤维样品进行消解,利用电感耦合等离子体质谱联用仪(ICP-MS)对样品中TiO2含量进行了测定,得到湿法消解样品测定值2 857.46μg/g(相对标准偏差为1.08%),微波消解样品测定值2599.21μg/g(相对标准偏差为2.76%).分别测定了两种消解方法的检出限,湿法消解检出限为4.0 ...     

微波消解样品-电感耦合等离子体原子发射光谱法测定铅精矿中铅、砷、镉、汞

采用微波消解样品-电感耦合等离子体原子发射光谱法同时测定铅精矿中主体元素铅及有毒有害元素砷、镉、汞的含量。0.20g试样置于消解罐中,先后加入硝酸9mL、盐酸3mL、氟硼酸2mL及过氧化氢2.5mL,密闭罐盖按设定的微波消解程序进行消解。试验选择铅、砷、镉和汞的分析线分别为220.351,189.042,228.802,184.950nm以消除基体干扰。铅、砷、镉、汞的检出限分别为16.0,2.2,0.4,0.8μg.g-1。方法用于铅精矿标准样品(GBW 07617)和铅精矿实际样品分析,此方法的测定值与认定值及原子吸收光谱法或原子荧光光谱法的测定值相一致。方法的相对标准偏差(n=10)在0.15%～3.9%之间。     

Investigation of element distribution and homogeneity of TXRF samples using SR-micro-XRF to validate the use of an internal standard and improve external standard quantification

Total reflection X-ray fluorescence analysis (TXRF) offers a nondestructive qualitative and quantitative analysis of trace elements. Due to its outstanding properties TXRF is widely used in the semiconductor industry for the analysis of silicon wafer surfaces and in the chemical analysis of liquid samples. Two problems occur in quantification: the large statistical uncertainty in wafer surface analysis and the validity of using an internal standard in chemical analysis. In general TXRF is known to allow for linear calibration. For small sample amounts (low nanogram (ng) region) the thin film approximation is valid neglecting absorption effects of the exciting and the detected radiation. For higher total amounts of samples deviations from the linear relation between fluorescence intensity and sample amount can be observed. This could be caused by the sample itself because inhomogeneities and different sample shapes can lead to differences of the emitted fluorescence intensities and high statistical errors. The aim of the study was to investigate the elemental distribution inside a sample. Single and multi-element samples were investigated with Synchrotron-radiation-induced micro X-ray Fluorescence Analysis (SR-μ-XRF) and with an optical microscope. It could be proven that the microscope images are all based on the investigated elements. This allows the determination of the sample shape and potential inhomogeneities using only light microscope images. For the multi-element samples, it was furthermore shown that the elemental distribution inside the samples is homogeneous. This justifies internal standard quantification.     

Possibilities and limitations of the total reflection X-ray fluorescence spectrometry for the determination of low Z elements in biological samples

The analytical capability of the laboratory scale vacuum total reflection X-ray fluorescence (TXRF) spectrometer (Wobistrax) was studied for the determination of the Z elements (Na, Mg, P, S, K and Ca) in different biological matrices represented by the following certified reference materials: MURST-ISS-A2 Antarctic krill, IAEA-331 spinach, NIST 1577a bovine liver, and SERONORM™ Trace Elements Serum Level 1.First, the stability of the response factors (relative sensitivity) against Ti internal standard was checked in the concentration range of 1 to 1000 mg/L in a diluted nitric acid matrix. It has been found that the upper limit of the analytical concentration range for K and Ca can be as high as 1000 mg/L; on the other hand, the remaining elements cannot be determined above a concentration of some tens mg/L.The established response factors were used for the elemental analysis of the four certified reference materials after normal-volume microwave assisted acid digestion. In the case of the serum sample, different preparation methods were compared as follow: direct analysis, microwave assisted acid digestion in normal-volume and micro-vessels, as well as the vapor-phase digestion directly on the TXRF carrier plates.On the basis of the results, the normal-volume digestion results in rather high dilution of the samples; thus, elements at low concentration could not be detected in some of the samples. On the other hand, this method offers the highest rate of both organic matrix decomposition and inorganic matrix dilution; thus, the background and the standard deviation of the results were the lowest. In general, this method was found to be useful for the analysis of samples with high dissolved (organic + inorganic) content if the analytes are present at a concentration considerable above the quantification limit.In the case of the microscale and the vapor-phase digestion, both the organic and inorganic matters remain at elevated concentration; thus, higher background and self-absorption of the fluorescent radiation occurred, deteriorating the analytical performance.     

Total reflection X-ray fluorescence analysis of pollen as an indicator for atmospheric pollution

The viability of pollen is affected by environmental pollution and its use as a bio-indicator is proposed. Such effects can be observed and quantified by biological tests. However, a more accurate identification of the agents affecting the viability is required in order to validate the biological assay for environmental monitoring. The chemical analysis of pollen is meant to ascertain the existence of a correlation between its reduced biological functions and the presence of pollutants. Moreover, such biological systems act as accumulators and allow the detection and quantification of species present in the environment at low concentrations. Total reflection X-ray fluorescence analysis (TXRF) has been chosen for the investigation due to its high sensitivity, multielement capability and wide dynamic range. Corylus avellana L. (hazel) pollen has been collected in areas with different anthropic impact in the province of Trento, Italy. For the TXRF measurements, a liquid sample is needed, especially if a quantitative analysis is required. In the present work, the analysis after a microwave digestion has been compared with the analysis of a suspension of the pollen samples. In both cases, an internal standard has been used for the quantification. The concentrations of 17 elements ranging from Al to Pb have been determined in 13 samples. Analysis of the suspensions showed to be comparable to that of digested samples in terms of spectral quality, but the latter preparation method gave better reproducibility. Sub-ppm lowest limits of detection were obtained for iron and heavier elements detected.     

Development and application of a micro-digestion device for elemental analysis of biological samples

A commercially available piece of equipment for high pressure ashing was adapted for the digestion of micro-samples of biological origin by a supplementary device. This attachment is shown to be suitable for solids with a sample amount of some micrograms and for liquids with a volume of a few microliters. In addition, the homogeneity of two reference materials NBS SRM 1571 “Orchard Leaves” and BCR CRM 414 “Plankton” is tested. For that purpose, the results of elemental analysis of small portions down to the level of 1 mg are compared with those for larger portions recommended by the supplier. Elements are found to be homogeneously distributed in test portions down to 100 mg but a few elements show an inhomogeneous distribution in portions ≤3 mg. For multi-element determinations, total reflection X-ray fluorescence spectrometry was used after addition of an internal standard to the digestion solutions.     

Optimizing total reflection X-ray fluorescence for direct trace element quantification in proteins I: Influence of sample homogeneity and reflector type

Total reflection X-ray fluorescence (TXRF) is a very promising method for the direct, quick and reliable multi-elemental quantification of trace elements in protein samples. With the introduction of an internal standard consisting of two reference elements, scandium and gallium, a wide range of proteins can be analyzed, regardless of their salt content, buffer composition, additives and amino acid composition. This strategy also enables quantification of matrix effects. Two potential issues associated with drying have been considered in this study: (1) Formation of heterogeneous residues of varying thickness and/or density; and (2) separation of the internal standard and protein during drying (which has to be prevented to allow accurate quantification). These issues were investigated by microbeam X-ray fluorescence (μXRF) with special emphasis on (I) the influence of sample support and (II) the protein / buffer system used. In the first part, a model protein was studied on well established sample supports used in TXRF, PIXE and XRF (Mylar, siliconized quartz, Plexiglas and silicon). In the second part we imaged proteins of different molecular weight, oligomerization state, bound metals and solubility.     

Determination of fluorine by total reflection X-ray fluorescence spectrometry

There is a growing interest in determination of low Z elements, i.e. carbon to phosphorus, in various samples. Total reflection X-ray fluorescence spectrometry (TXRF) has been already established as a suitable trace element analytical method with low sample demand and quite good quantification limits. Recently, the determinable element range was extended towards Z = 6 (carbon).     

A portable total reflection X-ray fluorescence spectrometer with a diamond-like carbon coated X-ray reflector

A diamond-like carbon (DLC) coated quartz glass sample holder is used in a portable total reflection X-ray fluorescence (TXRF) spectrometer. A spot area of a water sample on the DLC sample holder becomes smaller than that on a quartz glass sample holder usually used in TXRF analysis because DLC is more hydrophobic. Therefore, the use of the DLC sample holder enhances fluorescent X-rays reaching a detector compared with the use of a quartz glass sample holder, leading to improvement in detection sensitivity. A detection limit of 28 pg is achieved for Cr in a river water sample when using the DLC sample holder.     

Elemental analysis of airborne dust samples with TXRF: Comparison of oxygen-plasma ashing on sapphire carriers and acid digestion for sample preparation

The concentrations of 13 elements (As, Ca, Co, Cd, Cr, Fe, Ga, Ni, Pb, Pt, Ti, V and Zn) were determined in air particulate matter using total reflection X-ray fluorescence spectrometry (TXRF). For silicon analysis synthetic sapphire was chosen as a new sample carrier material – it is silicon-free, resistant to oxygen-plasma, microwaves and concentrated acids. The dust samples were collected on cellulose acetate filters. The decomposition of the filters was carried out by oxidation in a microwave-generated low-pressure oxygen-plasma directly on the TXRF sample carriers. The recovery of the investigated elements was verified with the standard reference material SRM 1648 (urban particulate matter) and ranged from 90 to 97%. The oxygen-plasma method was compared with conventional sample preparation by acid digestion. Received: 9 April 1999 / Revised: 18 May 1999 / Accepted: 3 June 1999     

Elemental analysis of airborne dust samples with TXRF: Comparison of oxygen-plasma ashing on sapphire carriers and acid digestion for sample preparation

The concentrations of 13 elements (As, Ca, Co, Cd, Cr, Fe, Ga, Ni, Pb, Pt, Ti, V and Zn) were determined in air particulate matter using total reflection X-ray fluorescence spectrometry (TXRF). For silicon analysis synthetic sapphire was chosen as a new sample carrier material – it is silicon-free, resistant to oxygen-plasma, microwaves and concentrated acids. The dust samples were collected on cellulose acetate filters. The decomposition of the filters was carried out by oxidation in a microwave-generated low-pressure oxygen-plasma directly on the TXRF sample carriers. The recovery of the investigated elements was verified with the standard reference material SRM 1648 (urban particulate matter) and ranged from 90 to 97%. The oxygen-plasma method was compared with conventional sample preparation by acid digestion. Received: 9 April 1999 / Revised: 18 May 1999 / Accepted: 3 June 1999     

Total-reflection X-ray fluorescence study of electrochemical deposition of metals on a glass-ceramic carbon electrode surface

The features of electrochemical deposition and co-deposition of copper, cadmium and lead from aqueous solutions on disc glass-ceramic carbon (GCC) electrode surfaces were studied by total-reflection X-ray fluorescence analysis (TXRF). This method was found to be highly sensitive to the varieties of electrodeposit morphology and depth distribution of elements on the electrode surface. It allows identification of the mechanisms of metal nucleation and growth of thin film electrodeposits. The results of the TXRF study are in good agreement with the recent data of a number of spectroscopic and microscopic methods of solid surface analysis. The polished GCC was shown to be an excellent material for preparation of the sample carriers for TXRF analysis.     

Considerations on the ideal sample shape for Total Reflection X-ray Fluorescence Analysis

Total Reflection X-ray Fluorescence analysis (TXRF) is widely used in semiconductor industry for the analysis of silicon wafer surfaces. Typically an external standard is used for the calibration of the spectrometer. This is sensitive to errors in quantification. For small sample amounts the thin film approximation is valid, absorption effects of the exciting and the detected radiation are neglected and the relation between sample amount and fluorescence intensity is linear. For higher total sample amounts deviations from linearity have been observed (saturation effect). These deviations are one of the difficulties for external standard quantification.A theoretical determination of the ideal TXRF sample shape is content of the presented work with the aim to improve the calibration process and therefore the quantification.The fluorescence intensity emitted by different theoretical sample shapes was calculated, whereby several parameters have been varied (excitation energy, density, diameter/height ratio of the sample). It was investigated which sample shape leads to the highest fluorescence intensity and exhibits the lowest saturation effect. The comparison of the different sample shapes showed that the ring shape matches the ideal TXRF sample shape best.