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1.
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The spectral dependences of the absorption coefficient are investigated in (Pb0.78Sn0.22)1–x In x Te at T = 300 K, with the content of indium in the mix x = 0.001–0.050. Two additional-absorption lines exhibiting sharp red margins are found in the () spectra from all the specimens examined. It is shown that they are associated with the optical ionization of the sites, whose energy levels E 0 and E 1are located in the forbidden band. It is established that the energy parameters of the E 0 and E 1 bands (position of the maxima of the state density function and the half width) do not depend on x. It is demonstrated that the E 0 band is accounted for by indium located in the sublattice sites. It is found out that the indium concentration in the sites differs from its content in the mix. No changes testifying to the hopping conduction via the impurity states of indium are found in the energy spectrum from (Pb0.78Sn0.22)1–x In x Te.  相似文献   

3.
The results of the investigation of the quadratic electro-optic effect in Sr1–x Ca x TiO3 with x = 0.014 (SCT) and in nominally pure SrTiO3 (STO) at room temperature in applied direct-current (dc) and alternating-current (ac) electric fields have been presented. It has been shown that the quadratic (in polarization) electro-optic coefficients of STO and SCT crystals coincide within the accuracy of the determination (±5%). It has been found that, in nominally pure STO measured in a dc electric field, there is a relaxation of the electro-optic effect with a relaxation time τ ≈ 30 s due to the formation of a space charge in the sample. No similar effect in SCT has been observed. A possible mechanism for the formation of a space charge in STO and SCT has been discussed.  相似文献   

4.
The paper reports on surface morphology, structure and microhardness of TiSi–N films formed by cosputtering from two target-facing unbalanced magnetrons, equipped with pure Ti and Si targets, on an unheated substrate rotating in front of both targets. The ratio Si/Ti in the TiSi–N film was achieved by modifying the magnitude of currents in the individual magnetrons and by the addition of nitrogen to the film. The rotation of the substrate has a strong effect on the film deposition rate and its morphology. The deposition rate is 3 times lower than that of the film deposited on a stationary substrate. The surface roughness of a polycrystalline Ti film deposited on the rotating substrate is considerably higher than that on a stationary substrate. On the contrary, the surface of an amorphous Si film is smooth and there is no difference between the roughness of Si films sputtered on stationary and on rotating substrates. The hardness of the film increases with increasing Si content and with the addition of nitrogen to the TiSi film. The Ti(26 at.%)Si(8.5 at.%)N(65 at.%)-film sputtered on an unheated rotating steel substrate, held at a floating potential, exhibited the best result with a hardness of 29 GPa.  相似文献   

5.
The magnetic susceptibility of Hg1–x Mn x Se1–y S y and Hg1–x Mn x Te1–y S y crystals is investigated by the Faraday method at H = 3 kOe in the temperature interval T = 77–300 K. It is established that the specific features of are due to Mn–S–Mn–S, Mn–Se–Mn–Se, and Mn–Te–Mn–Te clusters and mixed Mn–Se–Mn–S and Mn–Te–Mn–S clusters of different sizes in which the indirect exchange antiferromagnetic interaction between Mn atoms is realized through chalcogen atoms. Based on the dependences 1/Mn = f(T), the magnetic parameters are determined and their dependences on the crystal composition (x and y) are established.  相似文献   

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The Se alloying (x)- and the pressure (P)-induced metal–insulator transitions on the strongly correlated NiS2?x Se x system have been investigated through Raman and infrared (IR) spectroscopies. Raman and IR responses of NiS2 to lattice compression are correlated to a metallization transition, occurring at ~4 GPa. This result suggests a strong interaction between lattice and electronic degrees of freedom. In particular, IR measurements carried out by applying P on NiS2 (i.e. lattice contraction) and on Se alloying (i.e. lattice expansion) reveal that in both cases a metallic state is obtained. Our optical spectroscopy results deviate from the idea of a simple scaling factor between P and x previously claimed by transport measurements, but, on the contrary, point out the substantially different microscopic origin of the two transitions.  相似文献   

8.
A GaAs/Al x Ga1? x As semiconductor structure is proposed, which is predicted to superconduct at T c?≈?2?K. Formation of an alternating sequence of electron- and hole-populated quantum wells (an electron–hole superlattice) in a modulation-doped GaAs/Al x Ga1? x As superlattice is considered. This superlattice may be analogous to the layered electronic structure of high-T c superconductors. In the structures of interest, the mean spacing between nearest electron (or hole) wells is the same as the mean distance between the electrons (or holes) in any given well. This geometrical relationship mimics a prominent property of optimally doped high-T c superconductors. Band bending by built-in electric fields from ionized donors and acceptors induces electron and heavy-hole bound states in alternate GaAs quantum wells. A proposed superlattice structure meeting this criterion for superconductivity is studied by self-consistent numerical simulation.  相似文献   

9.
Diffuse scatterings appearing in electron diffraction patterns of Ti–(50???x)Ni–xFe (x?=?6, 7, 8, 10, in at.%) alloys were investigated. In the alloys, martensitic (R-phase) transformation is suppressed down to 4.2 K, but the electrical resistivity exhibits a local minimum at T min (210 K, 195 K, 180 K and 140 K for x?=?6, 7, 8, 10, respectively). The following results were obtained for all the alloys. Diffuse scattering appears below T min and its intensity maximum is located at an incommensurate position of g?+??ζζ0?*, where g is a reciprocal lattice vector of the B2-phase. The value?ζ?at T min is significantly smaller than 1/3 and increases with decreasing temperature; it decreases with increasing Fe content. The value of?ζ?at T min agrees with the length of nesting vector obtained by a band calculation, suggesting that the diffuse scattering is caused by the nesting effect of the Fermi surface in the B2-type structure.  相似文献   

10.
Using quantitative high-resolution transmission electron microscopy we studied the chemical morphology of wetting layers in In x Ga1? x As/GaAs quantum dot structures which were optimized for applications to optical devices operating around 1.3?µm. The samples are grown by low-pressure metal–organic chemical vapour deposition on GaAs substrates. The In concentration profiles of the wetting layers are evaluated with the composition evaluation by lattice fringe analysis method. The profiles reveal a clear signature of segregation. A fit of the profiles with the Muraki et al. model for segregation reveals a segregation efficiency R?=?0.65?±?0.05 at the growth temperature of 550°C, which is significantly lower than segregation efficiencies observed in samples grown by molecular beam epitaxy at similar temperatures.  相似文献   

11.
Gamzatov  A. G.  Batdalov  A. B.  Aliev  A. M.  Ellouze  M.  Jemma  F. 《Physics of the Solid State》2017,59(10):2092-2096

The heat capacity and the magnetocaloric effect of Pr0.6Sr0.4Mn1–xFexO3(x = 0 and 0.1) manganite have been studied in the temperature range 80–350 K and magnetic fields to 18 kOe. The magnetocaloric effect is estimated using two independent methods: the method of magnetic field modulation (direct method) and from the data on the heat capacity in magnetic field and without magnetic field (indirect method). The substitution of Fe atoms for Mn atoms (x = 0.1) shifts T C by 167 K to lower temperatures; in this case, the magnetocaloric effect (MCE) is changed insignificantly in magnetic field 18 kOe with ΔS M = 2.05 and 2.31 J/kg K for x = 0 and 0.10, respectively.

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Various negatron effects in films of alloys of II–VI compounds deposited from solutions as a function of the deposition mode and heat treatment are studied. It is found that the negative photocapacitance effect, which was first discovered in ZnS1?x Se x films, and the slowly relaxing negative photoelectric effects, which are caused by the transition of electrons located in a nanoscale surface layer from the shallow energy levels of trapping centers to deeper levels with a lower polarizability and by the presence of nanoscale clusters in these materials, which play the role of a “reservoir” for minority charge carriers, occur according to a single mechanism. A model to explain the basic laws of negative photoconductivity in CdSe1 ? x Te x films deposited from a solution is proposed. Negative residual conductivity is explained in terms of double-barrier relief model, while negative differential photoconductivity is attributed to the presence of nanoscale electric domains.  相似文献   

14.
Physics of the Solid State - The heat capacity of multiferroics Bi1–x Pr x FeO3 (0 ≤ x ≤ 0.20) has been studied in the temperature range 130–800 K. An insignificant...  相似文献   

15.
The electrical resistance of Gd x Mn1 ? x S solid solutions with x = 0.1, 0.15, and 0.2 has been measured at magnetic field H = 0.8 T and at zero magnetic field within the 100 K < T < 550 K temperature range. The magnetoresistance peak is observed above room temperature. On heating, the composition with x = 0.2 exhibits the change of magnetoresistance sign from positive to negative and the magnetoresistance peak near the transition to the magnetically ordered state. The experimental data are interpreted in the framework of the model involving the orbital ordering of electrons and the arising electrical polarization leading to the changes in the spectral density of states for electrons in the vicinity of the chemical potential in the applied magnetic field.  相似文献   

16.
An efficient analytical model to calculate the optical gain of the quantum-well laser of the GaN–In x Ga1?x N material system is used in this paper. Based on the anisotropic effective mass theories, empirical formulas delineating the relations between optical gain, emission wavelength, well width and material compositions are obtained for such a quantum-well lasers.  相似文献   

17.
Physics of the Solid State - The heat capacity of ceramic BiFe1–x Zn x O3 multiferroics has been studied in the temperature range 150–750 K. It is found that the antiferromagnetic...  相似文献   

18.
A number of solid solutions Bi7Ti4 + x W x Ta1–2x O21 (x = 0–0.5) have been synthesized from oxides by solid-phase reaction. The crystal structure, the electrophysical characteristics, and the microstructure of the prepared ceramic samples have been studied. According to X-ray powder diffraction, all the compounds are single-phase with the structure of mixed-layer Aurivillius phases (m = 2.5) with the orthorhombic crystal lattice (space group I2cm, Z = 2). Temperature dependences of the relative permittivity ε(T) of the compound have been measured, from which it has been found that the Curie temperature T C of perovskite-like oxides Bi7Ti4 + x W x Ta1–2x O21 (x = 0–0.5) decreases linearly as substitution parameter x decreases. The activation energies of charge carriers have been found in different temperature ranges.  相似文献   

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Results of an X-ray diffraction study as well as magnetic and electrical measurements of the solid-state reactions in Ge/Mn polycrystalline films of an 80/20 atomic composition have been presented. It has been shown that the ferromagnetic Mn5Ge3 phase is formed first on the Ge/Mn interface after annealing at ??120°C. The further increase in the annealing temperature to 300°C leads to the beginning of the synthesis of the Mn11Ge8 phase, which becomes dominating at 400°C. The existence of new structural transitions in the Mn-Ge system in the region of ??120 and ??300°C has been predicted on the basis of the presented results and results obtained earlier when studying solid-state reactions in different film structures. The supposition about the general chemical mechanisms of the synthesis of the Mn5Ge3 and Mn11Ge8 phases during the solid-state reactions in the Ge/Mn films of the 80/20 atomic composition and the phase separation in Ge x Mn1 ? x (x > 0.95) diluted semiconductors has been substantiated.  相似文献   

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