Te-rich Ge–Te–Se glass for the CO2 infrared detection at 15 μm

Te_80−xGe₂₀Se_x glasses have been prepared along the GeSe₄–GeTe₄ axis using the classical method in silica tube under vacuum. A phase separation domain appears for composition around Te₄₀Ge₂₀Se₄₀. Our attention was turned toward the Te-rich compositions corresponding to 1 < x < 5 at.%. These glasses are transparent from 4 to about 20 μm without any purification of the starting elements. Furthermore the difference ΔT between the crystallization temperature T_x and the vitreous transition temperature T_g lies at about 110 °C that is to say 30 °C higher than for the GeTe₄ reference glass. Finally the introduction of a few percentages of Se makes the glasses much easier to prepare and more stable against crystallization, making them drawable as optical fibers for example. Taking into account their transparency window, encompassing the CO₂ absorption band around 15 μm, the Te_80−xGe₂₀Se_x with 1 < x < 5 at.% could become matchless composition for the CO₂ infrared detection as planed by the Darwin mission of the European Space Agency.     

Crystallization process on amorphous GeTeSb samples near to eutectic point Ge15Te85

One of most important properties of some tellurium-based chalcogenide glasses is the optical and electrical switching between two states: the glass and the crystalline state. The understanding in these systems of the glass to crystal transition and its transformation kinetics is essential for their application in non-volatile memories. GeTeSb and GeTe amorphous samples of compositions close to the eutectic point Ge₁₅Te₈₅ were obtained by rapid solidification from the liquid state employing melt spinning technique. The glass forming ability of this system, for this cooling technique, is restricted to a small composition range nearby the binary eutectic. The crystallization kinetics of the samples was studied by means of differential scanning calorimetry (DSC) under both isothermal and continuous heating regimes. The quenched samples and the crystallization products have been characterized by X-ray diffraction with Cu(Kα) radiation. The crystallization temperature, activation energy, crystallization enthalpy and the dependence of these properties on concentration are reported. The crystallization study of Ge₁₅Te₈₅ glasses shows: a primary crystallization of Te superimposed with a secondary crystallization of GeTe. The addition of Sb (5 at.%) to the eutectic point Ge₁₅Te₈₅ modifies this behavior: the crystallization of Ge₁₃Sb₅Te₈₂ glasses consists on the crystallization of Te and Ge₂Sb₂Te_5. The crystallization of the ternary glasses was modeled.     

Glass formation in the GexTe100−x binary system: Synthesis by twin roller quenching and co-thermal evaporation techniques

The Ge–Te system exhibits one main composition domain where glasses can be easily prepared by melt quenching technique; this domain is centered on the eutectic composition Ge₁₅Te₈₅. In this work, bulk flakes and films of composition Ge_xTe_100−x with x  50 at.% were prepared by two different quenching techniques: (i) the twin roller quenching for bulk flakes and, (ii) the co-thermal evaporation for films (with thickness comprised between 2 and 14 μm). Electron Probe Micro-Analysis was used to check the composition of the materials while X-ray diffraction allowed identifying the amorphous state and/or the crystalline phases present in the Ge_xTe_100−x samples. Thermal properties for both types of materials were investigated by differential scanning calorimetry. The glass-forming regions were: 11.7–22.0 at.% Ge for bulk flakes and 10.2–35.9 at.% Ge for films. A similar thermal behavior of bulk flakes and thick films was highlighted by Differential Scanning Calorimetry.     

Capacitance-voltage characteristics of In0.3Ge2Sb2Te5 thin films

The influence of indium doping on the capacitance variation with temperature and applied bias voltage of Ge₂Sb₂Te₅ is investigated. The capacitance-voltage (C-V) measurements of In_0.3Ge₂Sb₂Te₅ and Ge₂Sb₂Te₅ thin films were performed for a sweep of voltages from −20 to +20 V at different temperatures. The results show different capacitance behavior of In_0.3Ge₂Sb₂Te₅ and Ge₂Sb₂Te₅ films. As the temperature increases the capacitance of the indium-doped sample decreases and becomes negative. The negative capacitance effect might be attributed to a significant increase of the film’s conductivity due to temperature and applied bias voltage. The nonlinearity in the capacitance and conductivity could be related to the nucleation mechanism as the temperature becomes close to the amorphous-crystalline transition temperature.     

The selenium based chalcogenide glasses with low content of As and Sb: DSC, StepScan DSC and Raman spectroscopy study

Thermal properties and structure of As_xSe_100−x and Sb_xSe_100−x glass-forming systems (x = 0, 1, 2, 4, 8 and 16) were studied by conventional and StepScan DSCs and Raman spectroscopy. Compositional dependence of the glass transition temperature, T_g, was determined from reversible part of StepScan DSC records and discussed. The attention was also focused on the crystallization of undercooled melts of these systems. It was found that only selenium crystallizes from undercooled melts of As–Se system and its tendency to crystallize decreases markedly with increasing As content, for arsenic content higher than 4 at.% no crystallization was observed. In the case of Sb–Se system Sb₂Se₃ crystallizes in the first step followed by trigonal selenium crystallization from non-stoichiometric undercooled melt. Sb₂Se₃ crystallizes from incongruent melt with crystallization enthalpy ΔH_c(Sb₂Se₃) = −52 ± 2 J/(g of Sb₂Se₃), Johnson–Mehl–Avrami kinetics of crystallization and kinetic exponent close to 3 was found. Raman spectra were measured to obtain basic information on the structure of both glassy systems.     

Smallest (∼10 nm) phase-change marks in amorphous and crystalline Ge2Sb2Te5 films

Electrical nano-scale crystallization and amorphization in amorphous and crystalline Ge₂Sb₂Te₅ films have been studied using scanning probe microscopes. In scanning tunneling microscopes, the phase changes can be induced, not by tunneling currents, but by conducting currents flowing through contacted probes. In an atomic force microscope, metallic cantilevers can produce phase-change marks with minimal sizes of ∼10 nm. The crystallization and amorphization processes show different dependences upon thickness of Ge₂Sb₂Te₅ films. These features are discussed from thermo-dynamical and microscopic structural points-of-view.     

A concerted rational crystallization/amorphization mechanism of Ge2Sb2Te5

Reverse Monte Carlo refinements using electron diffraction data and density functional theory calculations of the local atomic structure of amorphous Ge₂Sb₂Te₅ confirm presence of a noticeable number of four-membered rings with the general Ge(Sb)TeGe(Sb)Te composition similar to the building blocks of its cubic crystalline phase. The persistence of these rings, as well as the presence of the medium range order at the scale of about 1 nm, suggests that the amorphization/crystallization transition in Ge₂Sb₂Te₅ can be modelled with a concerted rotation of the sheets of atom-squares in {1 0 0} faces of cubic subcells of the cubic crystalline phase, similar to Rubik’s cube rotation. This mechanism can produce large models of material that agree with a range of the previous experimental and theoretical studies and also with the experimental electron diffraction data.     

Electrical and dielectric properties of Sb2O3–V2O5–K2O glasses

Electric measurements, including temperature dependencies of direct electrical conductivity and temperature dependencies of complex electrical modulus, have been implemented using Sb₂O₃–V₂O₅–K₂O glass samples. These glasses absorb ambient humidity but their resistance to water attack depends on composition. The significant decrease of conductivity up to 100 °C can arise from water desorption. Cycling measurements of direct electrical conductivity versus temperature were also implemented. They show that the 30Sb₂O₃–30V₂O₅–40K₂O and 70Sb₂O₃–30K₂O glasses are irreversibly damaged with the formation of the hydrated layer. In addition, it was observed that the evolution of DC conductivity is ruled by Arrhenius relation, while activation energy decreases as Sb₂O₃ concentration increases.     

Glass formation and non-isothermal crystallization of Zr62.5Al12.1Cu7.95Ni17.45 bulk metallic glass

Glass forming ability (GFA) and non-isothermal crystallization kinetics of Zr_62.5Al_12.1Cu_7.95Ni_17.45 bulk metallic glass were investigated. Its critical dimension is up to 7.5 mm and its critical cooling rate is less than 40 K s⁻¹, indicating its better GFA. It manifests two crystallization procedures and the second crystallization peak is more sensitive to heating rate than the first crystallization peak. The glass transition and crystallization both have remarkable kinetics effects. The apparent activation energies derived from the Kissinger plots are 175.24 ± 27.59 KJ mol⁻¹ for glass transition E_g, 212.84 ± 15.84 KJ mol⁻¹ for onset crystallization E_x, 230.51 ± 23.85 KJ mol⁻¹ for the first crystallization peak E_p1 and 124.85 ± 15.15 KJ mol⁻¹ for the second crystallization peak E_p2.     

Structural change of laser-irradiated Ge2Sb2Te5 films studied by electrical property measurement

Sheet resistance of laser-irradiated Ge₂Sb₂Te₅ thin films prepared by magnetron sputtering was measured by the four-point probe method. With increasing laser power the sheet resistance undergoes an abrupt drop from 10⁷ to 10³ Ω/□ at about 580 mW. The abrupt drop in resistance is due to the structural change from amorphous to crystalline state as revealed by X-ray diffraction (XRD) study of the samples around the abrupt change point. Crystallized dots were also formed in the amorphous Ge₂Sb₂Te₅ films by focused short pulse laser-irradiated, the resistivities at the crystallized dots and the non-crystallized area are 3.375 × 10^?3 and 2.725 Ω m, sheet resistance is 3.37 × 10⁴ and 2.725 × 10⁷ Ω/□ respectively, deduced from the I–V curves that is obtained by conductive atomic force microscope (C-AFM).     

Optical properties of thin films of system (As2Se3)80−x(As2Te3)x(SnTe)20 prepared by PLD

Thin amorphous films from system (As₂Se₃)_80−x(As₂Te₃)_x(SnTe)₂₀ were prepared by pulsed laser deposition (PLD) from their bulk glasses and their optical properties were studied by spectral ellipsometry. Spectral dependencies of refractive index, absorption and extinction coefficient and optical gap (1.41–1.66 eV for (As₂Se₃)_80−x(As₂Te₃)_x(SnTe)₂₀ with x = 20 resp. x = 0) were calculated from optical tansmittance, from ellipsometric data by Tauc method. High values of refractive index n₀ (2.49–2.60) and of non-linear χ⁽³⁾ coefficient of index of refraction (4.9–7.5 × 10⁻¹² esu for the glass (As₂Se₃)_80−x(As₂Te₃)_x(SnTe)₂₀ with x = 0 resp. x = 20) made studied thin films of system (As₂Se₃)_80−x(As₂Te₃)_x(SnTe)₂₀ promising candidates for application in optics and optoelectronics.     

Structural and electrical properties of Germanium-doped Sb70Te30 eutectic thin films

Ge-doped Sb₇₀Te₃₀ eutectic films show high potential for high transfer rate recording and non-volatile memory applications. Their potential applications are based on the difference in optical and electrical properties between the crystalline and amorphous phases. However, the structure and crystallization mechanism of such films is not yet well understood.The aim of this work is to study the amorphous-to-crystalline phase transformation mechanism in eutectic thin films of pure Sb₇₀Te₃₀ and doped with 2, 5 and 10 at% of Ge. Results of isokinetics and isothermal annealing were carried out using various techniques: four-probe electrical, optical reflectance and X-ray measurements.The results of optical and electrical measurements of Ge doped Sb₇₀Te₃₀ eutectic films showed that the addition of Ge increases both, the crystallization temperature and the effective activation energy of crystallization and that the mechanism of crystallization does not depend on Ge contents.In amorphous films, Ge acts as impurity center and does not affect the optical band gap value, but decreases the pre-exponential factor in the thermally activated conductivity. In crystalline films, Ge is probably incorporated into the Sb₇₀Te₃₀ structure and Ge vacancy are responsible for p-type metallic conduction, which increases with increasing the Ge content.     

Ternary system Li2O–K2O–Nb2O5: Re-examination of the 30 mol% K2O isopleth and growth of fully stoichiometric potassium lithium niobate single crystals by the micro-pulling down technique

Potassium lithium niobate (KLN) single crystals have attractive properties for non-linear optical applications based on frequency conversion of laser diodes in the blue range. Especially, fully stoichiometric K₃Li₂Nb₅O₁₅ crystals would be capable of doubling a laser light in the near UV range. Using powder X-ray diffraction and DSC experiments, we have re-investigated the 30 mol% K₂O isopleth of the ternary system Li₂O–K₂O–Nb₂O₅ in order to explore the possibility of a limited existence field for this phase. From our results, it was shown that the stoichiometric KLN phase exists between 970 and 1040 °C, temperature at which it undergoes a non-congruent melting. From this conclusion, compositionally homogeneous a-axis oriented single crystals fibers of stoichiometric K₃Li₂Nb₅O₁₅ were successfully grown by the micro-pulling down technique with pulling rates in the range 0.3–0.7 mm min⁻¹. The crystal length was between 10 and 120 mm for an apparent diameter near 500 μm. The fibers, characterized by optical microscopy, X-ray diffraction and Raman spectroscopy, appeared free of macro-defects and of good quality and their stoichiometric composition was also confirmed.     

Effects of Ge addition on the optical and electrical properties of eutectic Sb70Te30 films

The aim of this work is to study the influence of Ge addition on the optical and electrical properties in eutectic SbTe thin films (with the compositions: Sb₇₀Te₃₀, Ge₂Sb₇₀Te₂₈, Ge₅Sb₇₀Te₂₅ and Ge₁₀Sb₆₅Te₂₅) using visible optical reflectance, ellipsometry measurements, near infrared transmittance spectra, and four probe electrical resistivity measurements. From near infrared transmittance measurements the optical band gap was determined using Tauc’s expression for amorphous materials, a value of about 0.47 eV was obtained without any clear dependence on the Ge content. All amorphous films have approximately the same reflectance value, however the contrast ratio between the crystalline and amorphous phases decrease with increase of Ge. Using in situ four probe measurements versus temperature the dependence of the activation energy of conductance and the onset of the crystallization temperature have been determined for different materials. Four probe measurements have shown that the resistivity of amorphous films increases with increase of Ge. The results obtained have shown that optical and electrical properties of SbTe films with near eutectic composition change with the Ge content and depending on the application, in either optical or electrical memory devices, the most suitable composition needs to be determined.     

Thickness dependence of crystallization and melting kinetics of eutectic Sb70Te30 phase change recording film

As the thickness of eutectic Sb₇₀Te₃₀ phase change recording film was reduced, the crystallization temperature and activation energy for crystallization would increase, while the melting temperature and activation energy for melting would decrease. Accordingly, the archival stability and recording sensitivity can be improved. However, the recording speed for direct over write will be slowed down. Based upon the Johnson-Mehl-Avrami equation, it was found that the increase of film thickness would increase the nucleation rate of eutectic Sb₇₀Te₃₀ recording film and make the crystallization process become more nucleation-dominated.     

Crystal growth, characterization and spectroscopic study of europium-doped NaY(PO3)4

Europium-doped NaY(PO₃)₄ single crystals have been synthesized by the flux method with sizes around 1 mm³. The unit cell parameters at room temperature refined by X-ray powder diffraction are a=7.1510(4) Å; b=13.0070(8) Å; c=9.6973(2) Å; β=90.606(3)°, Z=4 with the space group P2₁/n in monoclinic system. The present single crystals have a needle shape, they are elongated along the a crystallographic direction, and their size is in the 500 μm–1 mm range. The linear thermal expansion tensor parameters were determined, being the maximum value along the b direction, 16.1×10⁻⁶ K⁻¹ and the minimum along the a direction being 11.7×10⁻⁶ K⁻¹. The IR vibration modes attributed to the group P–O are consistent with the crystallographic data concerning the chain aspect of the phosphate anion. This material melts incongruently at 1141 K. Intense visible emissions attributed to Eu^{3+ 5}D₀→⁷F₁, ⁵D₀→⁷F₂ and ⁵D₀→⁷F₄, electronic transitions have been observed after pumping at 355 nm at room temperature.     

Vibrational modes and structure of (AgI)x (GeS1.5)100−x chalcohalide glasses

We report a structural investigation of bulk Ge-rich Ge–S–AgI chalcohalide glasses. A vibrational spectroscopic study of the quaternary system (AgI)_x (GeS_1.5)_100−x (0  x_AgI  20) has been undertaken using infrared spectroscopy and Fourier transform Raman scattering. It was found that the GeS_1.5 Raman spectrum is compatible with a glass structure composed of corner- and edge-sharing mixed GeS_nGe_4−n (n = 0–4) tetrahedra where units with n = 2–4 dominate, whilst the fraction of corner-sharing units are significantly lower than the corresponding fraction in the stoichiometric GeS₂ glass. The addition of AgI has revealed a subtle but systematic effect in the structure of the Ge-rich glass matrix, manifested by mild decrease of the ES units and the concomitant increase of complex GeS_nI_4−n or GeS_nGe_mI_4-n−m tetrahedra whose vibrational modes form a continuum at low frequencies. Although, AgI seems to cause subtle structural changes due to the formation of Ge–I bonds, it is also evident that AgI does not act as a real modifier that would depolymerize appreciably the Ge–S network structure.     

Growth and optical properties of self-frequency-doubling laser crystal Yb:LuAl3(BO3)4

Single crystal of Yb:LuAl₃(BO₃)₄(Yb:LuAB) was grown by the flux method for the first time. The cell parameters of the grown crystal were estimated by X-ray diffraction analysis. The result indicates the symmetry of trigonal space group R32, with lattice parameters a=b=9.26372 Å, c=7.21405 Å, V=536.14 Å³, and Z=4. The absorption and emission spectra of Yb:LuAB crystal at room temperature has also been studied. The fluorescence lifetime for Yb:LuAB crystal is about 1.48 ms. The heat capacity was measured from 25 to 500 °C. Its second harmonic generation efficiency in LuAl₃(BO₃)₄ crystal is 3–4 times that of KDP crystal. These results show that Yb:LuAB crystal would be a potential self-frequency-doubling laser crystal.     

Reduced operating voltage in nanotube‐shaped Ge2Sb2Te5 unites by nanosphere lithography

Ge₂Sb₂Te₅ Units for Phase Change Memory are fabricated on 2‐dimesional polystyrene (PS) template in a magnetron sputtering system. SEM and TEM observations show the Ge₂Sb₂Te₅ nanotubes form on the 200 nm PS beads which are etched for 30 s. And the lengths of the nanotubes are tuned by the film deposition. HRTEM and the electron diffraction measurements confirm the phase transition between the amorphous and the crystallized state. Resistance–voltage measurements show the operating voltage of the Ge₂Sb₂Te₅ nanotube‐shaped unit is reduced due to the small contact area with the bottom electrode, which indicates its potential applications for phase change memory.     

An investigation of the kinetic transformation mechanism of Ge12.5Te87.5 chalcogenide glass under non-isothermal regime

Differential scanning calorimetry (DSC) technique was used to study the kinetics of amorphous to crystalline transformation in Ge_12.5Te_87.5 chalcogenide glass. The kinetic parameters of glassy Ge_12.5Te_87.5 under non-isothermal conditions are analyzed by the model-free and model-fitting approaches from a series of experiments at different constant heating rates (5-50 K/min). The effective activation energy of crystallization was determined by analyzing the data using the isoconversional methods of Kissinger-Akahira-Sunose (KAS), Tang, Starink, Flynn-Wall-Ozawa (FWO) and Vyazovkin. The analysis of the present data shows that the effective activation energy of crystallization is constant throughout the entire interval of conversions and hence with temperature. The transformation mechanism examined using the local Avrami exponents indicates that one mechanism (three-dimensional growth) is responsible for the transformation process for all heating rates used. The reaction model that may describe the transformation process of the Ge_12.5Te_87.5 chalcogenide glass is the Avrami-Erofeev model (g(α) = [− ln(1 − α)]^1/n) with n = 3 for all heating range at the whole range of crystallized fraction (α = 0.05-0.95). A good agreement between the experimental and the reconstructed (α-T) curves has been achieved. The transformation from amorphous to crystalline phase in Ge_12.5Te_87.5 chalcogenide glass demonstrates a single-step mechanism.