Depth-resolved molecular structure and orientation of polymer thin films by synchrotron X-ray diffraction

An exemplary system suitable for optoelectronics applications, i.e. poly(3-hexylthiophene), hereinafter P3HT, deposited by spin casting onto silicon substrates functionalised by three selected molecules and then properly annealed, has been examined. Grazing Incidence X-ray Scattering (GIXS) measurements have been performed with 4-circle diffractometer, allowing for a fine control of sample axes movement.By choosing different grazing incident angles, diffraction patterns from different layers of polymeric thin films have been recorded. Both in-plane and out-of-plane geometries have been combined in order to obtain complementary structural information. In this way structural and orientational differences of the polymer along with the film thickness (?50 nm) have been highlighted. For all P3HT films spun on functionalized Si wafer, macromolecular layers close to the substrate surface give some evidence of higher order and orientation than those outmost the surface, and this behaviour is pronounced to a different extent depending on the functionalized molecules used. Contrariwise P3HT layers deposited onto bare Si wafer display reduced orientation and decreased crystallite size, especially at buried interface.     

Characterization of iron-silicon thin films by means of electron diffraction and X-ray spectroscopy

Iron-silicon thin films have been characterized by means of analytical transmission electron microscopic methods. Under certain conditions — composition and annealing temperature — these films exhibit thermoelectric behavior. In particular, the morphology and phase formation which results from annealing of these films, and doping with oxygen and nitrogen, are of interest. The thermoelectric phase -FeSi₂ is formed at temperatures above 500°C. This phase is transformed into electrically conducting phases at about 1000°C. A small oxygen content does not influence this crystallization process. If the oxygen content is higher than 15 atom-% the electrically conducting phases exist even at 500°C. The presence of a small nitrogen content inhibits the formation of the -FeSi₂ phase. The development of silicon and iron nitrides is possible.     

Determining the orientation and molecular packing of organic dyes on a TiO2 surface using X-ray reflectometry

The determination of the orientation and molecular density for several porphyrin dyes adsorbed on planar TiO(2) surfaces using X-ray reflectometry (XRR) is reported. Adsorption of nanoscale water layers occurred rapidly upon exposure of freshly prepared TiO(2) surfaces to ambient conditions; however, this was successfully eliminated, resulting in clearly discernible adsorbed dye layers for sensitized surfaces. Adsorbed dye orientations, determined from computations constrained by the measured dye layer thickness, were calculated to have a binding tilt angle of 35°-40°. Combining the XXR data with the orientation models indicates that the porphyrins form densely packed surfaces with an intermolecular spacing of 3-4 ?, consistent with π-π stacking interactions. Changes in the molecular size of probe dyes were reflected in corresponding changes in the measured dye layer thickness, confirming the ability of this technique to resolve small variations in dye layer thickness and consequently adsorption orientation. Application of these results to understanding the behavior of dye-sensitized devices is discussed.     

Magnetically driven growth of anthracene thin films by organic molecular beam deposition

The possible use of a static magnetic field during organic molecular beam deposition of thin molecular films for inducing some preferential growth is discussed and the magnetic properties of diamagnetic molecules and molecular crystals are recalled. Considering prototypical materials, namely anthracene molecules and potassium phthalate substrates, which interact and may give rise to polycrystalline films with specific orientations, we show that in the presence of a magnetic field the films display a macroscopic preferential orientation as a result of minimization of the magnetic energy contribution. A very good agreement between the results of optical spectroscopy, atomic force microscopy, and predictions made on the basis of the anisotropic magnetic susceptibility of anthracene is found.     

A low-temperature X-ray diffraction study of the Cu2ZnSnSe4 thin films

Low-temperature XRD measurements were performed to confirm the phase composition and structural parameters of the electrochemically deposited Cu₂ZnSnSe₄ thin films on flexible metal substrates.     

X-ray diffraction study of TiO2 thin films on mica

Thin layers of polycrystalline TiO₂ were deposited on flaky muscovite and phlogopite particles. Deposition was performed in water slurry using aqueous TiCl₄ as titanium source. The effect of heat treatments on the structure of TiO₂ thin films was investigated at different layer thicknesses. On muscovite mica the films crystallized as anatase TiO₂. On phlogopite mica the increasing layer thickness favored partial rutile formation at higher calcination temperatures, although the films could not be converted to pure rutile. The preferred orientation of the TiO₂ films was evident. The most intense reflections were measured from (004) and (105) planes. The crystallite size of TiO₂ was strongly dependent on calcination temperature and TiO₂ layer thickness. It varied between 15 and 47 nm for films deposited on phlogopite, and 15 and 57 nm for films deposited on muscovite.     

Growth-related properties and postgrowth phenomena in organic molecular thin films

The problem of monitoring the structural and morphological evolutions of thin films of organic molecular materials during their growth by organic molecular beam epitaxy and in the postgrowth stage is addressed here by a combination of in situ optical reflectance anisotropy measurements, ex situ optical and morphological investigations, and theoretical simulation of the material optical response. For alpha-quaterthiophene, a representative material in the class of organic molecular semiconductors, the results show that molecules crystallize in the first stage of growth in metastable structures, even when deposition is carried out at room temperature. In the postdeposition stage, the film structure evolves within a few days to the known equilibrium structure of the low temperature polymorph. When deposition is carried out at low substrate temperatures, an evolution of the film morphology is also demonstrated.     

Lamellar organic thin films through self-assembly and molecular recognition.

Molecular clips possessing U-shaped cavities have been functionalized on their convex side with long aliphatic tails. These molecules form dimers which self-assemble into malleable lamellar thin films. Upon addition of a guest (methyl 3,5-dihydroxybenzoate), a 1:1 host-guest complex is formed, which prohibits clip dimerization. As a result, the lamellar structure of the material is lost. Complexation of 3,5-dihydroxybenzoic acid in the clip results in host-guest complexes which dimerize by hydrogen bonding interactions between the carboxylic acid functions of the bound guests. This dimerization restores the lamellar type architecture of the material.     

X-ray diffraction method for the investigation of the oxidation kinetics in thin iron films

Summary The time-dependent decrease of the intensity of X-ray diffraction peaks due to the interaction of the investigated metals with gases can be measured in situ with the help of a recently developed ultrahigh-vaccum diffraction chamber. We have used this method to study the oxidation kinetics of about 450 nm thick iron films. The activation energy obtained from the temperature dependence of the kinetics at a relatively high oxygen exposure corresponds to the well-known cation vacancy diffusion while distinctly smaller values are found for short duration of exposure. This result leads to the conclusion that grain boundary diffusion becomes effective in the films at the early stages of the oxidation process.

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Röntgenographisches Verfahren zur Untersuchung der Oxidationskinetik in dünnen Eisenschichten

Zusammenfassung Die zeitliche Änderung der Intensität von Röntgenbeugungsreflexen, die von der Wechselwirkung der untersuchten Metalle mit Gasen herrührt, kann in situ mit Hilfe einer kürzlich entwickelten Ultrahochvakuum-Röntgenbeugungskammer gemessen werden. Wir haben diese Methode zum Studium der Oxidationskinetik ca. 450 nm dicker Eisenfilme herangezogen. Die Aktivierungsenergie, die man aus der Temperaturabhängigkeit der Kinetik bei relativ hohen Einwirkungszeiten des Sauerstoffs erhält, entspricht der wohlbekannten Kationenleerstellendiffusion, während deutlich kleinere Werte für kurze Einwirkungszeiten gefunden werden. Dieses Ergebnis legt den Schluß nahe, daß zu Beginn des Oxidationsprozesses eine Korngrenzendiffusion wirksam wird.

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Financial support of the Deutsche Forschungsgemeinschaft is gratefully acknowledged. Thanks are due to Mrs Schuster of the Institute of Material Science I of our University for preparing the SEM micrographs.     

Tetracene thin films grown by organic molecular beam deposition under a static magnetic field

The diamagnetic response of tetracene is exploited to increase the in-plane orientation of thin films grown by organic molecular beam deposition, while applying a magnetic field of 0.2 T parallel to the surface of the silica and potassium hydrogen phthalate substrates. The combined spectroscopic analysis of the films in the UV/visible region and morphological investigation of their surface performed by atomic force microscopy demonstrate a substantial increment of the film order when the magnetic field is applied along the c axis of potassium hydrogen phthalate, in agreement with the anisotropic magnetic susceptibility of tetracene.     

X-ray diffraction measurements and depth profiling by secondary neutral mass spectrometry on epitaxially grown high-Tc superconducting thin films

YBa₂Cu₃O_7– thin films were deposited by pulsed laser deposition (PLD) on various substrates with different misfit. X-ray diffraction (XRD) measurements were performed in order to characterize the growth quality of the films and to study the orientation between the films and the substrates. On the used substrates all investigated films are relaxed independently, and epitaxially grown who show a long range ordered two domain structure. The elemental concentration depth profiles of these films detected by secondary neutral mass spectrometry (SNMS) show homogeneous stoichiometric element distributions with slight deviation of the Y content.Dedicated to Professor Dr. rer. nat. Dr. h.c. Hubertus Nickel on the occasion of his 65th birthday     

Investigation of thin surface films by microprobe analysis

The electron microprobe has been applied to study thin films on metallic substrates. The intensities of the characteristic X-rays emitted by thin films of various elements and thicknesses on sublayers of different materials were measured. Two different theoretical approaches (Bishop and Poole, as well as Yakowitz and Newbury) were applied to interpet the X-ray intensities and to determine the film thickness from the intensity measurements. The effect of backscattering from the substrate, resulting in an increase of the intensity of characteristic X-rays of the film, is being described on the basis of a theory given by Hutchins. The corresponding equation for the backscattering factor has been modified to take into account the transmission of the electrons through the film, depending on the mass thickness of the film and the electron energy. The results obtained from theory and experiment are in good agreement for the different experimental parameters applied, except for very thick layers of high atomic numbers measured at low energies where the absorption of electrons in the film plays a dominant role.     

Patterned removal of molecular organic films by diffusion

We demonstrate that "contact patterning" subtractively patterns a wide range of molecular organic films of nanoscale thickness with nanometer-scale accuracy. In "contact patterning", an elastomeric stamp with raised features is brought into contact with the organic film and subsequently removed, generating patterns by the diffusion of the film molecules into the stamp. The mechanism of material removal via diffusion is documented over spans of minutes, hours, and days and is shown to be consistently repeatable. Contact patterning provides a photolithography-free, potentially scalable approach to subtractive patterning of a wide range of molecular organic films.     

The gas-phase molecular structure of methyl formate,determined by electron diffraction

The structure of methyl formate in the gas phase has been reinvestigated by electron diffraction. The results confirm that the molecular skeleton is cis-planar, with bond lengths and angles in close agreement with those found by microwave techniques. Principal parameters (r_a) are: r(CO) 120.2(2) pm, r(C-O) 134.0(2), and 143.5(3) pm; ∠ (OC-O) 125.4(5)°, and ∠ (C-O-C) 115.9(5)°.     

The gas-phase molecular structure of silyl chloroacetylene,determined by electron diffraction

The molecular structure of SiH₃CCCl in the gas phase has been investigated using electron diffraction. Mean amplitudes of vibration and perpendicular amplitude correction factors calculated from spectroscopic data enabled refinement of both r_a and r_α structures to be carried out. The r_α refinement leads to a linear skeleton, with r_α parameters: r(Si-C) 181.2(5) pm, r(CC) 123.4(6) pm, r(C-Cl) 162.0(5) pm, r(Si-H) 148.8(12) pm, ∠HSiC 109.4(20)°. The r_a structure shows an apparent angle in the skeleton of 172(3)° (∠CCCl) owing to shrinkage.     

Structure of thin block copolymer films studied by X-ray reflectivity

Summary X-ray reflectivity may be used to determine the internal structure of thin polymer films. An electron density difference of 10% for polystyrene and polyisoprene is sufficient to distinguish between a random distribution of lamellae, complete orientation parallel to the substrate surface and a surface induced formation of lamellae. The disappearance of the lamellar Bragg-peaks, with heating of the film, shows the transition into the disordered state.