强脉冲超硬Ｘ射线产生技术研究

 分析了利用强流脉冲电子束轫致辐射产生强脉冲超硬X射线的几种主要技术途径的特点，以及提高超硬X射线产额的方法；利用MCNP软件计算了电子能量在0.4～1.4 MeV范围内，超硬X射线产生效率与钽辐射转换靶厚度的关系曲线；介绍了在“强光一号”加速器上开展产生强脉冲超硬X射线实验方法与实验结果，获得了3种强脉冲超硬X射线：脉冲宽度约35 ns，输出窗面积约50 cm²，能量密度为5～7 J/cm²；脉冲宽度约35 ns，输出窗面积约50 cm²，能量密度为12 J/cm²；脉冲宽度约35 ns，输出窗面积约500 cm²，能量密度为1 J/cm²。     

脉冲软X光辐射三种材料的喷射冲量实验研究

 在强光一号脉冲加速器上进行了国内首次的实验室软X光辐射三种材料的喷射冲量研究。结果表明，在能量为(0.2～0.33)keV、平均脉宽为39ns左右的X光辐射下，对灰漆、白漆和硬铝，在能注量分别为(92～152)J/cm²、(115～136)J/cm²和(163～192)J/cm²时，它们的冲量耦合系数分别为(0.61～0.80)Pa·s/(J·cm^-2)、(0.58～0.97)Pa·s/(J·cm^-2)和(0.61～0.84)Pa·s/(J·cm^-2)。     

电子束在VO2薄膜中引起的价态、相结构和光学性能的改变

 利用能量为1.7MeV, 注量分别为1.25×10¹³/cm², 1.25×10¹⁴/cm², 1.25×10¹⁵/cm²的电子束辐照VO₂薄膜,采用XPS, XRD等测试手段对电子辐照前后的样品进行分析,并研究了电子辐照对样品相变过程中光透射特性的影响。结果表明电子辐照引起VO₂薄膜中V离子出现价态变化现象,并使薄膜的X射线衍射峰发生变化。电子辐照在样品中产生的这些变化显著改变了VO₂薄膜的热致相变光学特性。     

中等银纬区逆康普顿γ射线强度

使用最近期的EGRET/CGRO γ射线数据,确定出了中等银纬区(|b|=10°-20°)银河宇宙线与星际气体相互作用产生的γ射线的发射率q/4π,其中采用了由γ射线数据本身来确定该发射率的方法;并由此获得了以银经为函数的不同能区的逆康普顿(IC)γ射线积分强度.在该银纬区,沿银经平均的IC微分强度可表为:I_Ic(E)=1.58×10^－6E^{－2.08±0.06}cm^－2·s^－1·sr^－1GeV^－1,b=10°—20°;I_Ic(E)=2.08×10^－6E^{－2.03±0.06}cm^－2·s^－1·sr^－1GeV^－1,b=－20°—－10°,其中,能量E的范围为30MeV到4000MeV.     

紫外超短脉冲激光辐照固体靶产生硬X射线研究

 实验研究了紫外高强度超短脉冲激光(248nm, 440fs, 50mJ)辐照固体靶时产生的硬X-射线(>30 keV)能量连续谱，靶上强度达到10¹⁷ W/cm²。P极化光45°照射5mm铜片，实验探测到了能量大于200keV的X射线信号，利用Maxwellian分布拟合能谱得到了的超热电子温度为67keV。     

氧分压对ZrO2薄膜激光损伤阈值的影响

 在不同的氧分压下用电子束热蒸发的方法制备了ZrO₂薄膜。分别通过X射线衍射、光学光谱、热透镜技术、抗激光辐照等测试，对所制备样品的微结构、折射率、吸收率及激光损伤阈值进行了测量。实验结果表明，薄膜中晶粒主要是四方相为主的多晶结构，并且随着氧分压的增加，结晶度、折射率以及弱吸收均逐渐降低。薄膜的激光损伤阈值开始随着氧分压增加从18.5J/cm²逐渐增加，氧分压为9×10^-3Pa时达到最大，值为26.7 J/cm²，氧分压再增加时则又降低到17.5 J/cm²。由此可见，氧分压引起的薄膜微结构变化是ZrO₂薄膜激光损伤阈值变化的主要原因。     

电子通量对ZnO/K2SiO3热控涂层光学性能的影响

 研究了电子通量对ZnO/K₂SiO₃热控涂层光学性能的影响。分别采用通量为5×10¹¹/cm²·s，8×10¹¹/cm²·s，1×10¹²/cm²·s 和5×10¹²/cm²·s的电子对试样进行辐照。电子辐照下涂层的光学性能发生了退化，并且发现了退化涂层在空气中的“漂白”现象。分析了ZnO/K₂SiO₃热控涂层光学性能的退化机制，同时讨论了电子通量对太阳光谱吸收系数的影响。实验结果发现，在5×10¹¹～1×10¹²/cm²·s的电子通量范围内，电子通量对ZnO/K₂SiO³热控涂层光学性能的影响相同。因此在这个电子通量范围内，采用加速地面试验来模拟空间的电子辐照效应是有效的。     

用激光分子束外延在Si衬底上外延生长高质量的TiN薄膜

采用激光分子束外延技术，利用两步法，在Si单晶衬底上成功地外延生长出TiN薄膜材料.原子力显微镜分析结果显示， TiN薄膜材料表面光滑，在10 μm×10 μm范围内，均方根粗糙度为0842nm.霍耳效应测量结果显示，TiN薄膜在室温条件下的电阻率为36×10^-5Ω·cm，迁移率达到5830 cm²/V·S，表明TiN薄膜材料是一种优良的电极材料.X射线θ—2θ扫描结果和很高的迁移率均表明，高质量的TiN薄膜材料被外延在Si衬底     

激光等离子体脉冲软X光标定源

 利用神光Ⅱ上激光与等离子体相互作用得到的软X光,建立了基于多层镜的四通道软X光单色器系统。研究了光源的性能,测量了光源强度、单色器系统稳定性、相应通道的一致性。研究表明,采用多层镜作为脉冲光源的分光元件,可以得到具有较好单色性的强脉冲软X 光标定源。光源的光子能量为253 eV和820 eV,两能道的光源强度分别为1.8×10¹⁹ photon/(s·cm²)和3.2×10¹⁹ photon/(s·cm²)。在该标定源上可以实现XRD、平面镜、多层镜、透射光栅和滤片的标定。     

半导体器件单粒子效应的加速器模拟实验

 着重描述了应用加速器开展半导体器件的单粒子效应实验研究的方法。采用金箔散射法可以降低加速器束流几个量级，从而满足半导体器件单粒子效应实验的要求。研制的弱流质子束流测量系统和建立的质子注量均匀性测量方法解决了质子注量的准确测量问题。实验测得静态随机存取存储器的质子单粒子翻转截面为10^-7 cm²·bit^-11量级，单粒子翻转重离子LET阈值为4～8MeV·cm²/mg，重离子单粒子翻转饱和截面为10^-7 cm²·bit^-1量级。     

Gamma ray radiation induced visible light absorption in P-doped silica fibers at low dose levels

A CCD Fiber Optic Spectrometer has been used to monitor the gamma ray radiation induced loss in P-doped fibers at different dopant concentrations (1, 5 and 10 mol%) with a light source (an incandescent bulb with a temperature of 2800–3000 K). The range of dose rates is limited to that used in medical applications (cancer treatments), that is 0.1 to 1.0 Gray per minute (Gy/min). At low integral dose level (<2.0 Gy) four absorption peaks were observed (470, 502, 540 and 600 nm) within the visible region. It has been observed that the radiation induced loss at 470 and 600 nm depends strongly on dose rate. At dose rates of 0.2 and 0.5 Gy/min the induced loss shows nonlinear relation to the total dose. However, at high dose rate (1.0 Gy/min) and low dose rate (0.1 Gy/min) it seems to have a linear dependence with total dose. The conversion from NBOHCs to GeX centers was observed during gamma radiation at low dose rates (0.1–0.5 Gy/min). At the wavelength of 502 and 540 nm, the radiation induced losses show excellent linear relations with total dose (<2.0 Gy) with little dose rate dependence. Experimental results show that the sensitivity (induced loss (dB) per meter fiber per Gy) of 5 mol% P-doped silica fiber is more than 30 times greater than that of a standard multi-mode (MM) communication fiber. The results suggest that P-doped silica fiber is a good candidate as a sensing component in fiber optic dosimetry, especially for radiation therapy applications.     

Application of silver nanoparticle‐based SERS spectroscopy for DNA analysis in radiated nasopharyngeal carcinoma cells

This work aims to explore the application of silver nanoparticle‐based surface‐enhanced Raman scattering (SERS) for nasopharyngeal carcinoma cell line CNE2's DNA analysis after X‐ray radiation. The cells are separated into control group and radiated groups with different dose of 6, 10, 15 and 20 Gy. The results show that after radiation (6, 10, 15 and 20 Gy), the DNA of radiated CNE2 have changed after 72 h of cell incubation. Principal components analysis is employed for significant differences and the DNA extracted after 72 h of incubation show significant divisions from control group. Moreover, a classifier based on support vector machines shows high classification accuracy between DNA extracted after 72 h of incubation and control group. In conclusion, this study first reveals SERS characteristics of CNE2's DNA under different dose of X‐ray radiation, and the final results may do favor to make known the mechanism of X‐ray radiation interacting with tumor. Copyright © 2013 John Wiley & Sons, Ltd.     

一台基于串级二极管技术的高强度脉冲硬X射线源

介绍了利用串级二极管产生高强度脉冲硬X射线的方法及其辐射场参数。以“闪光二号”加速器为平台,通过适应性改造,产生快前沿电压脉冲;研制了两级阻抗1 Ω串级二极管,通过串联分压降低二极管端电压、各级二极管电子束独立打靶在空间叠加形成高强度均匀辐射场。解决了悬浮电极绝缘支撑、二极管阴极均匀发射等技术难题,实现了串级二极管的稳定工作。在总电压约700 kV、电流约310 kA条件下,X射线平均能量87 keV,500 cm2上的平均能注量36 mJ/cm2,剂量均匀性（最大值比最小值）达到2∶1。     

Ne离子束辐照引起Gd2Ti2O7烧绿石体积肿胀效应研究

在液氮低温下用400 keV的Ne2+离子束对Gd₂Ti₂O₇多晶烧绿石进行了辐照实验研究, 离子束辐照量范围为5×1014—1×1016ions/cm2。利用掠X射线衍射技术对样品辐照层的结构变化进行了分析表征, X射线的掠射角分别为γ=0.25°, 0.5°, 1°和3°。结果表明: 在该实验条件的离子束辐照下, Gd₂Ti₂O₇辐照层会发生明显的体积肿胀效应, 体积肿胀程度随入射离子束辐照量的增大而增大; 在同一辐照量下, 辐照层的体积肿胀程度也随X射线入射角的增大而增大。当辐照量达到1×1016ions/cm2时, 辐照层发生非晶化相变。Polycrystalline pyrochlore Gd₂Ti₂O₇ compounds were irradiated with 400 keV Ne2+ ions at cryogenic temperature (~77 K). The irradiation fluences was ranging from 5×1014 to 1×1016 ions/cm2, corresponding to a peak ballistic damage dose of ~0.16 to 3.3 displacements per atom . Irradiation\|induced structural evolution was examined using grazing incidence X\|ray diffraction (GIXRD) at angles from 0.25° to 3° degrees. It was found that the lattice parameter increases as a function of (1) X\|ray incident angle and (2) ion irradiation fluence, suggesting that the irradiated layer is volumetrically swelled compared with the underlying un\|irradiated substrate. At ion fluence of 1×1016 ions/cm2, the irradiation layer was found to be amorphous.     

Radiochromic film containing spiropyran dye for dosimetry of low energy X‐rays

A composite film containing photochromic spiropyran dye 1 and BaFCl:Eu was developed for X‐ray dose measurement at a level of a few dozen gray (Gy). The reflectance intensity at selected wavelength, obtained from X‐radiation, can be satisfactorily related to the absorbed dose in the range of 0?30 Gy. The composite film shows significant color change in the visible region, and the sensitivity of the composite to the absorbed dose was achieved based on the high molar extinction coefficient of the photomerocyanine form of dye 1. For practical application, the photoinduced blue area indicates an X‐radiated area, and the initial pale pink area indicates an unexposed area. Copyright © 2011 John Wiley & Sons, Ltd.     

Status of the hard X‐ray microprobe beamline ID22 of the European Synchrotron Radiation Facility

The ESRF synchrotron beamline ID22, dedicated to hard X‐ray microanalysis and consisting of the combination of X‐ray fluorescence, X‐ray absorption spectroscopy, diffraction and 2D/3D X‐ray imaging techniques, is one of the most versatile instruments in hard X‐ray microscopy science. This paper describes the present beamline characteristics, recent technical developments, as well as a few scientific examples from recent years of the beamline operation. The upgrade plans to adapt the beamline to the growing needs of the user community are briefly discussed.     

Hard X‐ray microbeam lithography using a Fresnel zone plate with a long focal length

Focused hard X‐ray microbeams for use in X‐ray nanolithography have been investigated. A 7.5 keV X‐ray beam generated at an undulator was focused to about 3 µm using a Fresnel zone plate fabricated on silicon. The focused X‐ray beam retains a high degree of collimation owing to the long focal length of the zone plate, which greatly facilitates hard X‐ray nanoscale lithography. The focused X‐ray microbeam was successfully utilized to fabricate patterns with features as small as 100 nm on a photoresist.     

基于X射线衍射仪的X光晶体本征参量的标定

X光晶体本征参量的实验标定是准确鉴定X光晶体种类和品质,研制各种类型晶体谱仪,X光线谱定量测量和高分辨X光单能成像的基础.基于X射线衍射仪,通过制作平面晶体样品架,采取控制X射线管电源、滤波片选取和厚度控制等措施,极大地抑制了Cu-KJ3及韧致辐射,使X射线管光源Cu-Kα单能化,提出了用滤片作为光源单能化的判据.对X光线谱测量中常用的X光分光晶体季戊四醇[PET(002)]的晶格常量2d和Cu-Ka能点的积分衍射效率R.进行了标定方法研究,其标定值分别为(0.87425±0.00042)nm和(1.759±0.024)×10-4 Rad.基于X射线衍射仪的X光晶体本征参量的精密实验标定方法既快速高效,且十分方便和灵活.通过更换衍射仪的X射线管靶材,采取类似方法,可以标定其它能点的晶体积分衍射效率,可为X光晶体的本征参量库提供更多的标定数据.     

低剂量辐射诱导hepG2细胞克隆存活和细胞周期适应性反应

以低剂量γ射线(0.05 Gy)预照射人肝癌细胞hep G2, 8 h后再用高剂量(3 Gy)照射, 测定了细胞的克隆存活率和细胞周期。 结果表明, 低剂量辐射预处理可诱导hep G2细胞产生克隆存活适应性反应, 并且有助于细胞通过G2/M期阻滞; 低剂量辐射诱导的克隆存活适应性反应与增强的通过细胞周期阻滞的能力之间有一定的相关性。 Human hepatoma cells hep G2 were irradiated with 3 Gy of γ ray 8 hours after primed with 0.05 Gy of γ ray, thereafter,cell survival and cell cycle were determined. The results indicated that both survival adaptive response and the enhanced ability to overcome G2/M arrest could be induced by pre irradiation with low dose of γ ray. It is suggested that there is a certain correlation between the survival adaptive response and the enhanced ability to overcome cell cycle arrest.     

光学元件表面粗糙度对第三代同步辐射光源空间相干性的影响

以单丝的同轴全息干涉花样为判别标准,通过计算机数值模拟,研究了Ｂｅ窗的表面粗糙度对硬Ｘ射线相干特性的影响。提出了Ｘ射线在粗糙表面反射的一个简单模型,以此为基础模拟研究了反射镜表面粗糙度的对硬Ｘ射线及软Ｘ射线空间相干特性的影响,模拟结果与实验结果相符。