共查询到19条相似文献,搜索用时 62 毫秒
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概述了CuSO4电镀工艺"CU-BRITE TFⅡ"的开发和特性,适用于镀铜层填充导通孔和贯通孔。 相似文献
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电镀铜导通孔填充工艺 总被引:1,自引:0,他引:1
概述了MacDermid利用电镀铜微盲导通孔填充工艺,可以防止焊接时的孔隙,洞生成和组装时的释气(爆孔),显著的改善了微盲导通孔填充的可靠性。 相似文献
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概述了PCB表面处理技术的最新动向:PCB制造工艺和特性;铜和树脂的粘结;微细图形电镀;堆积导通孔构造和无芯积层板;化学镀铜用催化剂等。 相似文献
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A. Radisic O. LühnH.G.G. Philipsen Z. El-MekkiM. Honore S. RodetS. Armini C. DrijboomsH. Bender W. Ruythooren 《Microelectronic Engineering》2011,88(5):701-704
In this paper we report on Cu plating of through-silicon-vias (TSV-s) using in-house made acidic Cu bath with model additives (SPS, PEG, and JGB). Although the model additives might not be as potent as commercial additives, they have been studied in detail, and their role in Cu plating has been described extensively in scientific literature. This in turn allows deeper insight into how changes in bath composition affect the plating mechanism and Cu via-fill. 相似文献
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The feasibility of applying direct-metallization as an additive process for printed circuit board was explored. Pd/Sn catalyst
was used in the activation step and the content of Pd adsorption was found to be the controlling factor. The Pd content was
affected by the conditions of various steps including condition, activation, acceleration, and promotion. The sequence of
applying photoresist and activation with Pd/Sn catalyst plus promotion with Na2S solution was also studied. It was found that a well-defined pattern could be obtained by applying the Pd/Sn catalyst layer
before applying the photo-resist film. If the photoresist was applied before the activation step, copper deposition tended
to develop beyond the desired pattern region on the surface. We also found that the lateral growth rate of copper deposition
was inversely affected by the concentration of copper sulfate. This can be explained by a deposition model in which the lateral
growth of copper deposition is caused by the charge transfer of the sulfur atom as a bridging ligand. 相似文献
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Investigations regarding Through Silicon Via filling for 3D integration by Periodic Pulse Reverse plating with and without additives 总被引:1,自引:0,他引:1
Lutz Hofmann Ramona EckeStefan E. Schulz Thomas Gessner 《Microelectronic Engineering》2011,88(5):705-708
In this contribution we show experimental investigations regarding Periodic Pulse Reverse (PPR) plating for the filling of Through Silicon Vias that are aimed for the use in 3D integration applications. The purpose of this method is to prevent the use of plating additives that induce high process complexity in terms of process control and high process costs due to the high consumption of those additives. We therefore compare the effect of PPR plating without additives to that effect of PPR plating with additives. In first results with non-optimized PPR plating we already show the large gain in step coverage during TSV filling compared to standard DC plating. 相似文献
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针对印制电路板(printed circuit board, PCB)光电图像模糊且含噪声的具体情况,提出了改进的边缘信息提取算法。首先分别对自适应模糊集增强算法与数学形态学边缘检测算法(edge detection algorithm of mathematical morphology, EDAMM)实施改进,并分析了其基本原理。然后结合这两种算法对PCB光电图像进行预处理及边缘信息提取。最后对两幅由不同成像系统获取的PCB光电图像进行了边缘信息提取实验。结果表明:用本文算法获得的PCB光电图像明暗对比度较高,并提取了精确且清晰的图像边缘信息,明显减少了噪声,所得图像的优质系数较高,两幅图像的优质系数分别是0.885 2、0.874 9,均高于本文中所提到的另外4种算法的结果。可见,采用本文算法可以更好地去除PCB光电图像中的模糊与噪声,并精确地提取出PCB光电图像的边缘信息。 相似文献