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研究了多光束非定域干涉现象,得到了多光束非定域干涉的反射光强分布函数.数值计算结果表明:随着镜面反射系数的增加,多光束非定域干涉条纹半值宽度降低,条纹变得更加锐细,光谱分辨率提高;当镜面反射率较高时,除了暗条纹外,在低干涉级次处紧邻暗条纹还有很窄的亮条纹存在;亮条纹振幅逐渐衰减至背景光强度,干涉级次越低亮条纹振荡越明显;第一束反射光提供了一个均匀的背景,第二束反射光的加入产生了双光束干涉,干涉条纹较粗,对比度较低,更多光束的加入使干涉暗条纹变得锐细,在相邻暗条纹间出现了明暗相间的低强度明暗条纹;足够多光束的加入使相邻暗条纹间低强度变化的明暗条纹消失,同时在紧邻暗条纹处出现了振幅振荡衰减的亮条纹.最后,将多光束非定域干涉理论应用于光学滤波器的研究,结果表明:提高镜面反射率,可以显著降低多光束非定域干涉的滤波带宽;改变镜面间距,可以灵活调整多光束干涉仪滤波波长和相消波长间距. 相似文献
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进行穿透扫描探测实验时,在回波图像中发现了由于介质具有倾斜角度产生的周期性干涉条纹,这种干涉条纹对介质后或者介质中的目标成像有严重影响.研究表明,这种干涉条纹主要由介质表面反射波及透射后的层面反射波引起.文中建立点源辐射模型分析干涉条纹现象的形成机理,推导出薄层介质的干涉条纹间距表达式.考虑到天线的影响,建立了角锥喇叭天线近场模型,并且基于该模型进行精确的电磁仿真.商用软件Computer SimulationTechnology的电磁仿真结果与MATLAB程序的数字计算结果进一步验证了干涉条纹的成因分析及其与介质倾斜角度的关系.从推导的薄层介质干涉条纹间距表达式可以看出,干涉条纹间距与介质倾斜角度有关,控制影响条纹间距的因素,可以抑制干涉条纹现象,从而达到提高目标分辨率和成像质量的效果. 相似文献
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静态傅里叶变换光谱仪的机理及干涉条纹的校正 总被引:1,自引:0,他引:1
针对高速、瞬时光谱测量要求光谱仪的结构简单、装备方便、实时性强的特点,文章介绍了一种静态傅里叶变换光谱仪,并对其原理进行了推导与剖析。针对其调整中出现的干涉条纹的倾斜校正问题,进行了详细的理论分析和干涉条纹模型的数学推导,得出倾斜镜旋转参数和光学元件最小通光口径之间的数学关系,以及倾斜镜旋转参数和干涉条纹旋转参数之间的数学关系。通过利用Matlab7.0数学工具,对所总结推导的干涉条纹模型进行模拟,对所得的各种参数之间的数学关系进行验证。分析结果表明据此数学关系所求得的β角校正精度达到1.4%,是一种有效可行的校正方法。 相似文献
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通过研究激光在湍流大气中的传输情况,旨在为光学高分辨率干涉成像提供理论依据。采用相位屏的近似处理方法对激光通过大气湍流传输进行模拟,研究激光通过湍流大气的干涉情况。试验结果表明:孔径间距越大,干涉条纹越密;在传输距离为2km,大气湍流折射率结构常数C2n为10-14,即接近强湍流的情况下,可以形成比较好的干涉条纹。孔径间距较小时,干涉的明暗条纹清晰可见。在实际干涉成像中,可以选择适当的孔径间距来获得较好的干涉条纹,从而获得目标的高分辨率像。 相似文献
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基于激光微加工的新型光纤法布里-珀罗折射率传感器 总被引:4,自引:0,他引:4
提出了一种新型的光纤法布里-珀罗(F-P)折射率传感器,该传感器由单模光纤头端面和靠近该端面的由157 nm激光加工而成的短空气腔构成.短空气腔两个端面的反射光和光纤头端面的反射光发生干涉形成了传感器的反射谱干涉条纹.干涉条纹的对比度受光纤头端面外部的折射率影响,在干涉条纹包络的波谷处具有最大的对比度,外部待测折射率可通过计算该处的对比度得到.传感器对温度不敏感同,测量范围广.在1.33至1.441范围内,折射率灵敏度约为27 dB,分辨率约为1.12X10-4;在1.45~1.62范围内.折射率灵敏度约为24 dB,分辨率约为1.26×10-4. 相似文献
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研究了多光束非定域干涉现象,得到了多光束非定域干涉的透射光强分布函数。理论研究结果表明,干涉圆环中心位置光强与定域干涉结果一致。对得到的多光束非定域干涉透射光强分布函数进行了数值分析,分析结果表明随着镜面反射系数的增加,非定域干涉条纹变得更加锐细,光谱分辨率提高,同时在低干涉级次处出现了噪声,并且反射系数越高,噪声越明显。在镜面间距不变的情况下,通过改变观察屏位置,对透射光强分布进行数值分析,结果表明干涉级次与干涉圆环倾角的余弦值存在线性关系,通过求斜率可以得到镜面间距。保持观察屏位置不变,通过改变镜面间距,数值分析结果表明干涉级次与干涉圆环半径平方存在线性关系,并且直线斜率与镜面间距也存在线性关系。 相似文献
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Yu G. Vasilenko Yu N. Dubnitshev V. P. Koronkevitch V. S. Sobolev A. G. Senin A. A. Stolpovski E. N. Utkin 《Optical and Quantum Electronics》1973,5(2):153-161
For a generalized scheme of LDV, the expressions describing the light intensity distribution in a photo-receiver plane with regard to the size of the scattering particles have been calculated using Fourier optics.The LDV signal should be considered as a narrow-band stochastic process representing the sum of random phase radio frequency pulses arising from each light scattering particle. Then the expected error of the mean velocity measurement is equal to half the reciprocal of the number of interference fringes squared and the input signal-to-noise ratio is equal to the square root of the product of Doppler frequency, fringe number and averaging time.The device developed by the authors includes d.c. optical signal compensation. The device is described and the results of its use are given. 相似文献
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Jing-tao DongRong-sheng Lu 《Optics and Lasers in Engineering》2012,50(3):502-511
The phase shifting technique is the most widely used approach for detecting the envelope in low coherence interferometry. However, if the phase shifts calibration contains errors, some parasitic fringe structure will propagate into the calculated envelopes and cause imprecision in the envelope peak detection. To tackle these problems, a five-point stencil algorithm is introduced into the phase shifting interference microscopy. Considering the amount of parasitic fringes, envelope peak detection and computational efficiency, the presented approach leads to satisfactory results in performance. In combination with a simple polynomial curve fitting method the proposed algorithm exhibits good performance on envelope peak detection in surface profiling. Both of the simulated results and the experimental results indicated that the presented approach can be taken as an alternative to the currently existing methods used for phase shifting low-coherence interference microscopy. 相似文献
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David Abusch-Magder F. Simmel D. A. Wharam M. A. Kastner J. P. Kotthaus 《Physica E: Low-dimensional Systems and Nanostructures》2000,6(1-4)
We present an experimental study of the fluctuations of Coulomb blockade peak positions of a quantum dot. The dot is defined by patterning the two-dimensional electron gas of a silicon MOSFET structure using stacked gates. The ratio of charging energy to single-particle energy is considerably larger than in comparable GaAs/AlGaAs quantum dots. The statistical distribution of the conductance peak spacings in the Coulomb blockade regime was found to be unimodal and does not follow the Wigner surmise. The fluctuations of the spacings are much larger than the typical single-particle level spacing and thus clearly contradict the expectation of random matrix theory. Measurements of the natural line width of a set of several adjacent conductance peaks suggest that all of the peaks in the set are dominated by electrons being transported through a single-broad energy level. 相似文献
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Based on the method of matrix decomposition and expanding the aperture function into a sum of finite complex Gaussian functions, the analytical propagation equations of Gaussian beams through cat eye optical lens with center shelter are derived. Through numerical calculation, the laws governing the variation of the intensity distribution of the cat eye reflected light with the center shelter ratio and the diameter of the detector at the focal plane are given. The results show that the diffraction series and the intensity of the cat eye reflected light depend strongly on the center shelter ratio. As a further extension, it is found that the eye optical lens can be interpreted as a spatial filter, and different filter effect can be obtained by changing the pinhole size. 相似文献
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光源功率谱对白光干涉测量的影响 总被引:1,自引:0,他引:1
本文从理论上分析了白光干涉测量中光源功率谱宽、包络函数、纵模形状和间隔等与干涉峰宽度、周期间的关系,从而讨论了空间干涉法在保偏光纤参数测量和传感应用中光源功率谱参数对测量分辨率、动态范围等的影响。 相似文献
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We present a novel on-chip method for quantitative two-dimensional differential phase imaging. This technique uses four circular holes (600 nm diameter, 1.2 mum spacing) arranged in a 'plus' pattern that are fabricated in a layer of metal above a complementary metal-oxide semiconductor (CMOS) imaging sensor. The interference pattern of the aperture shifts position with respect to the differential phase of the incident light. By imaging the interference pattern with the CMOS sensor, this method measures amplitude and differential phase (1 degrees /microm sensitivity for signal-to-noise ratio >/=16 dB) of the incident light field simultaneously. An application to optical beam profiling is presented; we show the amplitude and differential phase profiles of a Gaussian laser beam and an optical vortex. 相似文献
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Methods for the preparation of two-coordinate holographic diffraction gratings using a two-, three- and four-beam interferometer are considered. The analytical relationship of the interference fringe intensity distribution in the output aperture of these interferometers is presented. Experimental results are given. 相似文献