利用色散法探索玻尔氢原子理论测量普朗克常数

普朗克常数是物理学中一个重要的常数,利用测角仪器分光计,探索用玻尔氢原子理论来测普朗克常数。根据最小偏向角测量三棱镜折射率的原理,利用分光计测量三棱镜的折射率来研究光的色散规律,测量棱镜材料对不同波长入射光的折射率,得到棱镜材料的色散曲线和拟合方程。根据玻尔的氢原子理论,用分光计测出氢原子光谱四条谱线（α,β,γ,δ）的偏向角对应的折射率,由科西经验公式计算出相应的波长。     

三棱镜色散系数研究

根据不同波长对同一棱镜的折射率不同,使用棱镜作为"色散系统"实现分光,测量了汞灯各色光对棱镜的折射率,利用最小二乘法研究得到样品棱镜的色散系数。     

棱镜法测量水的色散

本文改进了测量液体折射率的一种方法，由原先对单色波长光源测量液体折射率发展为用复合光源（汞灯）直接测量色散．在原先两个等边三棱镜之间加入液体膜，在利用全反射原理的基础上，增加了一个棱镜用于产生色散．测出了水对于不同波长的光的色散，与文献对照不确定度在0．1％以内．最后对这种测量方法作了讨论．     

K-Na离子交换单模平面波导的制备及其表征

通过K-Na离子交换技术制备了多模玻璃平面波导.采用棱镜耦合技术测量了波导的有效折射率,用IWKB方法拟合得到K-Na离子交换波导的折射率分布符合高斯分布,由色散曲线得到单模波导的制备条件(即扩散深度范围),从而得出单模波导的离子交换时间范围,制备出单模波导,并通过求解WKB色散方程得出单模波导的表面折射率.用普通数码相机,通过对离子交换平面玻璃光波导传输线进行数字成像,根据传输线上的光强分布拟合出光强传输衰减曲线,计算出单模波导的传输损耗大约为0.4 dB/cm.     

K-Na离子交换单模平面波导的制备及其表征

通过K-Na离子交换技术制备了多模玻璃平面波导.采用棱镜耦合技术测量了波导的有效折射率,用IWKB方法拟合得到K-Na离子交换波导的折射率分布符合高斯分布,由色散曲线得到单模波导的制备条件(即扩散深度范围),从而得出单模波导的离子交换时间范围,制备出单模波导,并通过求解WKB色散方程得出单模波导的表面折射率.用普通数码...     

棱镜耦合法测量掺杂波导模折射率中的误差分析

讨论了棱镜耦合法测量离子交换掺Er-Yb平面光波导中传播模式的模折射率实验中的误差与不确定度,模折射率误差由耦合棱镜折射率与底角及同步入射角误差决定，得出了测量模折射率不确定度的传递公式,作为实例．用Ag^＋-Na^＋离子交换技术,在285℃下交换15min．得到了Er-Yb共掺磷酸盐玻璃平面波导，给出了波导模折射率（@632．8nm）及不确定度。     

用伯林-布罗卡棱镜装置测量折射率

本文叙述的实验系统用于测量从近红外到紫外宽光谱区内固体和液体的折射率。伯林-布罗卡棱镜在实验系统中用作色散元件。所得到的折射率测量精度为△n=±10~(-4)。     

方形容器测量液体折射率和色散率

介绍了一种利用激光测液体折射率的简易方法.通过测量光线穿过垂直棱镜角后发生全反射时的入射临界角,进而求出液体的折射率.再利用折射率与临界角的关系,结合科希经验公式求出液体色散率.     

用棱镜耦合方法测量块状材料折射率

本文介绍一种用棱镜耦合方法测量块状材料折射率的简单方法。由测得的棱镜入射角(棱镜基面上的全反射在入射角变弱)确定折射率。该方法具有操作简单,试样制备方便等优点。如果棱镜经过良好校定,该方法的精度与最小偏向角不相上下。本文给出了几种材料的实验结果,并估计出可能产生的误差。     

宽谱段共光轴线色散成像光谱仪三棱镜分光系统设计

针对棱镜型成像光谱仪结构复杂、具有严重的色散不均匀性,进行了共光轴线色散棱镜式宽谱段成像光谱仪研究。利用棱镜的色散公式建立了对称型三棱镜组合分光结构的数学模型,获得了满足直视结构的棱镜组合,并在此基础上分析影响棱镜组色散线性因素：棱镜材料的折射率和色散率对棱镜组线色散影响比较大,入射角度对其影响比较小,并提出改善色散线性的方法,获得了满足线色散要求的棱镜组合的折射率条件,从而为共光轴结构的线色散棱镜式成像光谱仪初始结构的选择提供了重要理论依据。在工作波段为400~1 000 nm、中心波长偏向角为0°、最大色散角为0.6°、光谱仪系统数值孔径NA为0.18、光谱分辨率为5 nm条件下,实现共光轴三棱镜分光系统的线色散设计,最后利用ZEMAX进行了模拟分析表明,理论计算结果与实际仿真结果基本相符。     

汞光谱色散规律的实验研究

在分光计实验中,低压汞灯发出五种不同波长的单色光经玻璃三棱镜后发生色散现象,实验研究表明玻璃三棱镜对汞光源光谱折射率是随波长增大而减小的变化的规律,其中对黄光折射率最小,紫光折射率最大,这种色散属于正常色散,通过这个实验进一步说明了科希公式的正确性.     

光波导技术同步测量棱镜及波导薄膜参数

依据全反射理论和棱镜耦合原理,实现了对棱镜折射率及波导薄膜材料折射率和厚度的同步测量。使用高准直半导体激光器激光入射到棱镜内部与波导膜的分界面上,逐步旋转棱镜或改变棱镜的入射角,得到棱镜耦合M线,曲线前面几组的波谷为波导模激发,在M线左侧收尾处有一个不完整波峰,其反射光强随入射角迅速衰减,为全反射时的临界点,由此可实现棱镜及波导薄膜参数的同步测量;用此法测量了棱镜耦合一体化平面波导棱镜的折射率和聚甲基丙烯酸甲酯(PMMA)聚合物波导薄膜的折射率和厚度。测量棱镜折射率精度为±1.9×10-4,波导薄膜折射率和厚度的精度分别为±6.2×10-4 μm和±1.6×10-2 μm。     

TE0导模干涉刻写周期可调亚波长光栅理论研究

通过棱镜耦合激发非对称金属包覆介质波导结构中的TE₀导波模式, 利用两束TE₀模的干涉从理论上实现了周期可调的亚波长光栅刻写. 分析了TE₀模式的色散关系, 刻写亚波长光栅的周期与激发光源、棱镜折射率、光刻胶薄膜厚度及折射率之间的关系. 用有限元方法数值模拟了金属薄膜、光刻胶薄膜和空气多层结构中TE₀导模的干涉场分布. 研究发现, 激发光源波长越短, TE₀ 模干涉刻写的亚波长光栅周期越小; 光刻胶越厚, 刻写的亚波长光栅周期越小; 高折射率光刻胶有利于更小周期亚波长光栅的刻写. 相较于表面等离子体干涉光刻, 基于TE₀ 模的干涉可在厚光刻胶条件下通过改变激发光源、棱镜折射率、光刻胶材料折射率、特别是光刻胶薄膜的厚度等多种方式实现对亚波长光栅周期的有效调控.     

Rapid assessment of mid-infrared refractive index anisotropy using a prism coupler: chemical vapor deposited ZnS

A state-of-the-art mid-infrared prism coupler was used to study suspected anisotropy in the refractive index of forward-looking-infrared grade chemical vapor deposited (CVD) zinc sulfide. Samples were prepared with columnar grain structure in and perpendicular to the sample plane, as well as from different depths in the CVD growth body. This study was motivated by the growing industry concern among optical design engineers, as well as developers of mid-infrared systems, over the reliability of historically accepted index data. Prior photoluminescence and x-ray diffraction measurements have suggested that refractive index may vary according to sample orientation with respect to the grain structure. Measurements were conducted to provide optical dispersion and thermal index (dn/dT) data at discrete laser wavelengths between 0.633 and 10.591 μm at two temperature set points (30 °C and 90 °C). Refractive index measurements between samples exhibited an average standard deviation comparable to the uncertainty of the prism coupler measurement (0.0004 refractive index units), suggesting that the variation in refractive index as a function of sample orientation and CVD deposition time is negligible and should have no impact on subsequent optical designs. Measured dispersion data at mid-infrared wavelengths were also found to agree well with prior published measurements.     

Dispersion characteristics of complex refractive-index planar slab optical waveguide by using finite element method

In this paper, finite element method (FEM) mode analyses of planar slab optical waveguide having complicated refractive index profile are presented. We try to estimate the dispersion graph, mode cut-off condition, group delay and waveguide dispersion for the case of α-power and chirped-type refractive index profile. In order to obtain the more accurate result, we have derived the higher-order polynomial, which establishes the suitable relationship between b and V for different profile of optical waveguide. On the basis of the derived polynomials, the waveguide dispersion is analyzed for different type of refractive index profile waveguide. Our study shows that the waveguide dispersion can be substantially reduced when we deployed the optical waveguide having linearly chirped-type refractive index profile. Earlier too, the arbitrary refractive index profile has been analyzed but to the best of our knowledge chirped-type refractive index profile has not been analyzed till date for the case of planar slab optical waveguide.     

Mathematical modeling and simulation of refractive index based Brix measurement system

Optical techniques developed for sensing and analysis purposes have been used in various fields. An attempt has been made to design optimization of refractormetric based method for the measurement of Brix. Mathematical modeling and simulation of the proposed system has been performed. From the study it is seen that mathematical model may help for getting the better performance to developed experimental model. Optimization of various constructional parameters including selection and location of source, prism and detector, position of source, angular position and height of source from prism plane, divergent angle of source, refractive index of prism, size of prism, the location of detector to pickup the optimum reflected light, refractive index of sample, critical angle, choice of suitable prism. The various possibilities of mounting position of source, detector, prism are studied. The mathematical model is developed considering the above mentioned parameters.     

测量三棱镜折射率的一种新方法

本文介绍一种用移测显微镜测量三棱镜折射率的方法,该方法通过测量物点和物点在三棱镜中所成虚像之间的几何关系,可计算得到三棱镜折射率。