Combined X‐ray diffraction and alpha particle X‐ray spectrometer analysis of geologic materials

The shallow interrogation depth of the lightest elements (Na, Mg, Al, and Si) detected by the particle‐induced X‐ray emission branch of the Curiosity Rover's alpha particle X‐ray spectrometer suggests that the X‐rays of these elements very likely emerge from a single mineral grain. This reality violates the assumption of atomic homogeneity at the micron scale made in both existing spectrum‐reduction approaches for the alpha particle X‐ray spectrometer. Consequently, analytical results for these elements in igneous geochemical reference materials exhibit deviations from certified concentrations in a manner that can be related to the total alkali‐silica diagram. A computer code is introduced here to provide quantitative prediction of these deviations using the mineral abundances determined from X‐ray diffraction. The latter are converted to area coverage fractions to represent the sample surface, and a fundamental parameters computation predicts the elemental X‐ray yields from each mineral and sums these. In this process, the chemistry of each individual mineral has to be varied by an iterative simplex approach; X‐ray yields are computed and compared with the peak areas from the fit of the bulk sample. When the difference between mineral yields and peak areas for each element are minimized, the mineral formulae are set and elemental X‐ray yields provided. The ratio between the summed mineral X‐ray yields and the corresponding yields based on the homogeneity assumption may then be compared directly with the concentration deviations measured in our earlier work. For several rock types, good agreement is found, thereby consolidating our understanding of the effects of sample mineralogy on alpha particle X‐ray spectrometer results. Copyright © 2017 John Wiley & Sons, Ltd.     

X‐ray dynamical diffraction Fraunhofer holography

An X‐ray dynamical diffraction Fraunhofer holographic scheme is proposed. Theoretically it is shown that the reconstruction of the object image by visible light is possible. The spatial and temporal coherence requirements of the incident X‐ray beam are considered. As an example, the hologram recording as well as the reconstruction by visible light of an absolutely absorbing wire are discussed.     

Application of a pnCCD in X‐ray diffraction: a three‐dimensional X‐ray detector

The first application of a pnCCD detector for X‐ray scattering experiments using white synchrotron radiation at BESSY II is presented. A Cd arachidate multilayer was investigated in reflection geometry within the energy range 7 keV < E < 35 keV. At fixed angle of incidence the two‐dimensional diffraction pattern containing several multilayer Bragg peaks and respective diffuse‐resonant Bragg sheets were observed. Since every pixel of the detector is able to determine the energy of every incoming photon with a resolution ΔE/E? 10^?2, a three‐dimensional dataset is finally obtained. In order to achieve this energy resolution the detector was operated in the so‐called single‐photon‐counting mode. A full dataset was evaluated taking into account all photons recorded within 10⁵ detector frames at a readout rate of 200 Hz. By representing the data in reciprocal‐space coordinates, it becomes obvious that this experiment with the pnCCD detector provides the same information as that obtained by combining a large number of monochromatic scattering experiments using conventional area detectors.     

Simultaneous X‐ray fluorescence and scanning X‐ray diffraction microscopy at the Australian Synchrotron XFM beamline

Owing to its extreme sensitivity, quantitative mapping of elemental distributions via X‐ray fluorescence microscopy (XFM) has become a key microanalytical technique. The recent realisation of scanning X‐ray diffraction microscopy (SXDM) meanwhile provides an avenue for quantitative super‐resolved ultra‐structural visualization. The similarity of their experimental geometries indicates excellent prospects for simultaneous acquisition. Here, in both step‐ and fly‐scanning modes, robust, simultaneous XFM‐SXDM is demonstrated.     

Utilizing broadband X‐rays in a Bragg coherent X‐ray diffraction imaging experiment

A method is presented to simplify Bragg coherent X‐ray diffraction imaging studies of complex heterogeneous crystalline materials with a two‐stage screening/imaging process that utilizes polychromatic and monochromatic coherent X‐rays and is compatible with in situ sample environments. Coherent white‐beam diffraction is used to identify an individual crystal particle or grain that displays desired properties within a larger population. A three‐dimensional reciprocal‐space map suitable for diffraction imaging is then measured for the Bragg peak of interest using a monochromatic beam energy scan that requires no sample motion, thus simplifying in situ chamber design. This approach was demonstrated with Au nanoparticles and will enable, for example, individual grains in a polycrystalline material of specific orientation to be selected, then imaged in three dimensions while under load.     

Characterization of ashes from greenhouse crops plant biomass residues using X‐ray fluorescence analysis and X‐ray diffraction

A characterization of ashes obtained by thermal treatments on greenhouse crops plant biomass residues is presented. The chemical analysis, by X‐ray fluorescence (wavelength‐dispersive X‐ray fluorescence), and phase analysis, by X‐ray diffraction, of the resultant ashes are reported. Thermal treatments of selected samples of these residues increase the relative amounts of inorganic Mg, Si, P, and S in the ashes, being these amounts as high as increasing temperature. As an opposite effect, Na, Cl, and K contents decrease as increasing temperature by a volatilization process of the chlorides, as confirmed by X‐ray diffraction. The crystalline phase analysis of the ashes demonstrates the formation of inorganic constituents of the biomass, including alkaline chlorides and calcium salts (calcite, anhydrite, and apatite). Progressive thermal treatments induce the formation of new silicate phases (akermanite and grossularite) and silica (α‐quartz and cristobalite). Furthermore, the particle size of the starting biomass samples does not influence the evolution of the crystalline phases by thermal treatments. In contrast, a previous leaching using water and subsequent heating at 1,000 °C produces the formation of periclase (MgO), lime (CaO), and the silicate gehlenite, without the presence of anhydrite. This study is interesting for future investigations on the residues as a profitable biomass source for energy production and sustainable large‐scale management. Some potential applications of the resultant ashes can be proposed.     

Quantitative performance measurements of bent crystal Laue analyzers for X‐ray fluorescence spectroscopy

Third‐generation synchrotron radiation sources pose difficult challenges for energy‐dispersive detectors for XAFS because of their count rate limitations. One solution to this problem is the bent crystal Laue analyzer (BCLA), which removes most of the undesired scatter and fluorescence before it reaches the detector, effectively eliminating detector saturation due to background. In this paper experimental measurements of BCLA performance in conjunction with a 13‐element germanium detector, and a quantitative analysis of the signal‐to‐noise improvement of BCLAs are presented. The performance of BCLAs are compared with filters and slits.     

High‐energy transmission Laue micro‐beam X‐ray diffraction: a probe for intra‐granular lattice orientation and elastic strain in thicker samples

An understanding of the mechanical response of modern engineering alloys to complex loading conditions is essential for the design of load‐bearing components in high‐performance safety‐critical aerospace applications. A detailed knowledge of how material behaviour is modified by fatigue and the ability to predict failure reliably are vital for enhanced component performance. Unlike macroscopic bulk properties (e.g. stiffness, yield stress, etc.) that depend on the average behaviour of many grains, material failure is governed by `weakest link'‐type mechanisms. It is strongly dependent on the anisotropic single‐crystal elastic–plastic behaviour, local morphology and microstructure, and grain‐to‐grain interactions. For the development and validation of models that capture these complex phenomena, the ability to probe deformation behaviour at the micro‐scale is key. The diffraction of highly penetrating synchrotron X‐rays is well suited to this purpose and micro‐beam Laue diffraction is a particularly powerful tool that has emerged in recent years. Typically it uses photon energies of 5–25 keV, limiting penetration into the material, so that only thin samples or near‐surface regions can be studied. In this paper the development of high‐energy transmission Laue (HETL) micro‐beam X‐ray diffraction is described, extending the micro‐beam Laue technique to significantly higher photon energies (50–150 keV). It allows the probing of thicker sample sections, with the potential for grain‐level characterization of real engineering components. The new HETL technique is used to study the deformation behaviour of individual grains in a large‐grained polycrystalline nickel sample during in situ tensile loading. Refinement of the Laue diffraction patterns yields lattice orientations and qualitative information about elastic strains. After deformation, bands of high lattice misorientation can be identified in the sample. Orientation spread within individual scattering volumes is studied using a pattern‐matching approach. The results highlight the inability of a simple Schmid‐factor model to capture the behaviour of individual grains and illustrate the need for complementary mechanical modelling.     

Individual GaAs nanorods imaged by coherent X‐ray diffraction

Using scanning X‐ray diffraction microscopy with a spot size of 220 × 600 nm, it was possible to inspect individual GaAs nanorods grown seed‐free through circular openings in a SiN_x mask in a periodic array with 3 µm spacing on GaAs[111]B. The focused X‐ray beam allows the determination of the strain state of individual rods and, in combination with coherent diffraction imaging, it was also possible to characterize morphological details. Rods grown either in the centre or at the edge of the array show significant differences in shape, size and strain state.     

Continuous‐scan capability at SSRL and applications to X‐ray diffraction

Typical X‐ray diffraction measurements are made by moving a detector to discrete positions in space and then measuring the signal at each stationary position. This step‐scanning method can be time‐consuming, and may induce vibrations in the measurement system when the motors are accelerated and decelerated at each position. Furthermore, diffraction information between the data points may be missed unless a fine step‐scanning is used, which further increases the total measurement time. To utilize beam time efficiently, the motor acceleration and deceleration time should be minimized, and the signal‐to‐noise ratio should be maximized. To accomplish this, an integrated continuous‐scan system was developed at the Stanford Synchrotron Radiation Lightsource (SSRL). The continuous‐scan system uses an in‐house integrated motor controller system and counter/timer electronics. SPEC software is used to control both the hardware and data acquisition systems. The time efficiency and repeatability of the continuous‐scan system were tested using X‐ray diffraction from a ZnO powder and compared with the step‐scan technique. Advantages and limitations of the continuous‐scan system and a demonstration of variable‐velocity continuous scan are discussed.     

Diffraction of X‐ray free‐electron laser femtosecond pulses on single crystals in the Bragg and Laue geometry

A solution of the problem of dynamical diffraction for X‐ray pulses with arbitrary dimensions in the Bragg and Laue cases in a crystal of any thickness and asymmetry coefficient of reflection is presented. Analysis of pulse form and duration transformation in the process of diffraction and propagation in a vacuum is conducted. It is shown that only the symmetrical Bragg case can be used to avoid smearing of reflected pulses.     

Performance calculations of the X‐ray powder diffraction beamline at NSLS‐II

The X‐ray Powder Diffraction (XPD) beamline at the National Synchrotron Light Source II is a multi‐purpose high‐energy X‐ray diffraction beamline with high throughput and high resolution. The beamline uses a sagittally bent double‐Laue crystal monochromator to provide X‐rays over a large energy range (30–70 keV). In this paper the optical design and the calculated performance of the XPD beamline are presented. The damping wiggler source is simulated by the SRW code and a filter system is designed to optimize the photon flux as well as to reduce the heat load on the first optics. The final beamline performance under two operation modes is simulated using the SHADOW program. For the first time a multi‐lamellar model is introduced and implemented in the ray tracing of the bent Laue crystal monochromator. The optimization and the optical properties of the vertical focusing mirror are also discussed. Finally, the instrumental resolution function of the XPD beamline is described in an analytical method.     

High‐throughput synchrotron X‐ray diffraction for combinatorial phase mapping

Discovery of new materials drives the deployment of new technologies. Complex technological requirements demand precisely tailored material functionalities, and materials scientists are driven to search for these new materials in compositionally complex and often non‐equilibrium spaces containing three, four or more elements. The phase behavior of these high‐order composition spaces is mostly unknown and unexplored. High‐throughput methods can offer strategies for efficiently searching complex and multi‐dimensional material genomes for these much needed new materials and can also suggest a processing pathway for synthesizing them. However, high‐throughput structural characterization is still relatively under‐developed for rapid material discovery. Here, a synchrotron X‐ray diffraction and fluorescence experiment for rapid measurement of both X‐ray powder patterns and compositions for an array of samples in a material library is presented. The experiment is capable of measuring more than 5000 samples per day, as demonstrated by the acquisition of high‐quality powder patterns in a bismuth–vanadium–iron oxide composition library. A detailed discussion of the scattering geometry and its ability to be tailored for different material systems is provided, with specific attention given to the characterization of fiber textured thin films. The described prototype facility is capable of meeting the structural characterization needs for the first generation of high‐throughput material genomic searches.     

X‐ray powder diffraction at the XRD1 beamline at LNLS

Various upgrades have been completed at the XRD1 beamline at the Brazilian synchrotron light source (LNLS). The upgrades are comprehensive, with changes to both hardware and software, now allowing users of the beamline to conduct X‐ray powder diffraction experiments with faster data acquisition times and improved quality. The main beamline parameters and the results obtained for different standards are presented, showing the beamline ability of performing high‐quality experiments in transmission geometry. XRD1 operates in the 5.5–14 keV range and has a photon flux of 7.8 × 10⁹ photons s^?1 (with 100 mA) at 12 keV, which is one of the typical working energies. At 8 keV (the other typical working energy) the photon flux at the sample position is 3.4 × 10¹⁰ photons s^?1 and the energy resolution ΔE/E = 3 × 10^?4.     

Grazing‐incidence X‐ray diffraction study of rubrene epitaxial thin films

The growth of organic semiconductors as thin films with good and controlled electrical performances is nowadays one of the main tasks in the field of organic semiconductor‐based electronic devices. In particular it is often required to grow highly crystalline and precisely oriented thin films. Here, thanks to grazing‐incidence X‐ray diffraction measurements carried out at the ELETTRA synchrotron facility, it is shown that rubrene thin films deposited by organic molecular beam epitaxy on the surface of tetracene single crystals have the structure of the known orthorhombic polymorph, with the (2 0 0) plane parallel to the substrate surface. Moreover, the exact epitaxial relationship between the film and the substrate crystalline structures is determined, demonstrating the presence of a unique in‐plane orientation of the overlayer.     

Pressure study of monoclinic ReO2 up to 1.2 GPa using X‐ray absorption spectroscopy and X‐ray diffraction

The crystal and local atomic structure of monoclinic ReO₂ (α‐ReO₂) under hydrostatic pressure up to 1.2 GPa was investigated for the first time using both X‐ray absorption spectroscopy and high‐resolution synchrotron X‐ray powder diffraction and a home‐built B₄C anvil pressure cell developed for this purpose. Extended X‐ray absorption fine‐structure (EXAFS) data analysis at pressures from ambient up to 1.2 GPa indicates that there are two distinct Re—Re distances and a distorted ReO₆ octahedron in the α‐ReO₂ structure. X‐ray diffraction analysis at ambient pressure revealed an unambiguous solution for the crystal structure of the α‐phase, demonstrating a modulation of the Re—Re distances. The relatively small portion of the diffraction pattern accessed in the pressure‐dependent measurements does not allow for a detailed study of the crystal structure of α‐ReO₂ under pressure. Nonetheless, a shift and reduction in the (011) Bragg peak intensity between 0.4 and 1.2 GPa is observed, with correlation to a decrease in Re—Re distance modulation, as confirmed by EXAFS analysis in the same pressure range. This behavior reveals that α‐ReO₂ is a possible inner pressure gauge for future experiments up to 1.2 GPa.     

Fast X‐ray powder diffraction on I11 at Diamond

The commissioning and performance characterization of a position‐sensitive detector designed for fast X‐ray powder diffraction experiments on beamline I11 at Diamond Light Source are described. The detecting elements comprise 18 detector‐readout modules of MYTHEN‐II silicon strip technology tiled to provide 90° coverage in 2θ. The modules are located in a rigid housing custom designed at Diamond with control of the device fully integrated into the beamline data acquisition environment. The detector is mounted on the I11 three‐circle powder diffractometer to provide an intrinsic resolution of Δ2θ? 0.004°. The results of commissioning and performance measurements using reference samples (Si and AgI) are presented, along with new results from scientific experiments selected to demonstrate the suitability of this facility for powder diffraction experiments where conventional angle scanning is too slow to capture rapid structural changes. The real‐time dehydrogenation of MgH₂, a potential hydrogen storage compound, is investigated along with ultrafast high‐throughput measurements to determine the crystallite quality of different samples of the metastable carbonate phase vaterite (CaCO₃) precipitated and stabilized in the presence of amino acid molecules in a biomimetic synthesis process.     

High‐energy X‐ray diffraction using the Pixium 4700 flat‐panel detector

The Pixium 4700 detector represents a significant step forward in detector technology for high‐energy X‐ray diffraction. The detector design is based on digital flat‐panel technology, combining an amorphous Si panel with a CsI scintillator. The detector has a useful pixel array of 1910 × 2480 pixels with a pixel size of 154 µm × 154 µm, and thus it covers an effective area of 294 mm × 379 mm. Designed for medical imaging, the detector has good efficiency at high X‐ray energies. Furthermore, it is capable of acquiring sequences of images at 7.5 frames per second in full image mode, and up to 60 frames per second in binned region of interest modes. Here, the basic properties of this detector applied to high‐energy X‐ray diffraction are presented. Quantitative comparisons with a widespread high‐energy detector, the MAR345 image plate scanner, are shown. Other properties of the Pixium 4700 detector, including a narrow point‐spread function and distortion‐free image, allows for the acquisition of high‐quality diffraction data at high X‐ray energies. In addition, high frame rates and shutterless operation open new experimental possibilities. Also provided are the necessary data for the correction of images collected using the Pixium 4700 for diffraction purposes.     

Micro‐Raman spectroscopy on analcime and pollucite in comparison to X‐ray diffraction

Natural and synthetic samples of analcime and pollucite (both zeolites belonging to the analcime group) were studied by means of micro‐Raman spectrometry, X‐ray fluorescence analysis (XFA) and X‐ray diffraction (XRD). On knowing the chemical and structural characteristics of each solid‐solution member, the observed shift in the spectral position of the Raman active modes can be explained and used for phase determination. As shown, the distinction between members of the analcime–pollucite solid‐solution series using Raman spectroscopy is significantly more conclusive than the corresponding XRD findings. Also, information about the structurally bound water inside the zeolite structure can be gained using Raman spectroscopy as long as a suitable exciting wavelength is selected. Copyright © 2008 John Wiley & Sons, Ltd.     

Understanding the instrumental profile of synchrotron radiation X‐ray powder diffraction beamlines

A Monte Carlo algorithm has been developed to calculate the instrumental profile function of a powder diffraction synchrotron beamline. Realistic models of all optical elements are implemented in a ray‐tracing software. The proposed approach and the emerging paradigm have been investigated and verified for several existing X‐ray powder diffraction beamlines. The results, which can be extended to further facilities, show a new and general way of assessing the contribution of instrumental broadening to synchrotron radiation data, based on ab initio simulations.