Fick's law of diffusion depth profiles applied to the degradation of oxidized polystyrene during ARXPS analysis

Angle‐resolved x‐ray photoelectron spectroscopy (ARXPS) measurements were made, using Al Kα and Mg Kα radiation alternately, on a polystyrene sample that had been exposed to a helium plasma. It was observed that oxygen was introduced into the sample surface by the plasma treatment, and that some of it was lost over a period of 5 h under x‐ray irradiation in the vacuum of the spectrometer. Laplace transforms of Fick's law of diffusion profiles were derived and applied to the data. The ARXPS results obtained in this study are consistent with a sample history in which the oxidation of the polymer surface resulting from exposure to plasma is controlled by a diffusion process, whereas the loss of oxygen during exposure to x‐rays is principally controlled by a first‐order reaction such as the liberation of oxygen (presumably as CO₂) from carbon–oxygen groups by the action of radicals created by the ionizing radiation. Copyright © 2005 John Wiley & Sons, Ltd.     

Studies of the oxidation of iron by air after being exposed to water vapour using angle‐resolved x‐ray photoelectron spectroscopy and QUASES™

Air oxidation of Fe was compared with and without a pre‐exposure to water vapour. Angle‐resolved x‐ray photoelectron spectroscopy (ARXPS) and QUASES^? were used to determine the thickness of the oxide layer formed and its composition. The extent of oxidation was found to be much less if the surface was pre‐exposed to water rather than air alone. Studies performed using ARXPS were able to show that the hydroxyl‐containing layer located at the surface after Fe was exposed to water vapour was located below the surface after exposure to air. This observation suggested that the oxidation of Fe in air is mediated by cation diffusion. Copyright © 2004 John Wiley & Sons, Ltd.     

Error surface calculations on the parameters defining oxygen depth profile models fitted to ARXPS data obtained from polystyrene exposed to an oxygen/helium plasma

Error surfaces are calculated for the fitting of concentration–depth profiles to angle‐resolved x‐ray photoelectron spectroscopy (ARXPS) data. The shapes of the error surfaces indicate that model parameters related to composition (especially at the very surface of the sample) are well constrained by the data, whereas parameters related to depth have a less significant impact on the fit. It is then shown that certain parameters in the different depth profile models employed are highly correlated and that the different models convey essentially the same information in different ways. Finally, a compromise profile definition is proposed for the fitting of constrained but flexible depth profiles to ARXPS data. Copyright © 2003 John Wiley & Sons, Ltd.     

Study of the degradation of plasma‐oxidized polystyrene by time‐ and angle‐resolved x‐ray photoelectron spectroscopy

Angle‐resolved x‐ray photoelectron spectroscopy (ARXPS) measurements were made, in repeated sequences employing Al and Mg x‐ray sources alternately, on a polystyrene sample that had been exposed to an oxygen plasma. It was observed that oxygen was lost from the sample over a period of 5 h and 40 min. The ARXPS data sets were corrected for the time displacement between consecutive measurements at different photoemission angles and fitted with three simple models in order to extract oxygen concentration–depth profiles, consistent with the data, as a function of time. The oxygen depth profiles were found to evolve in a consistent manner, indicating both a loss of average oxygen content and thickness in the ‘oxidized polymer layer’. Copyright © 2003 John Wiley & Sons, Ltd.     

Characterization of Ni?B amorphous alloys with x‐ray photoelectron and secondary ion mass spectroscopy

Amorphous Ni? B alloys with nominal compositions 30 at.% B and 50 at.% B were produced via electrodeposition on pure Ni polycrystalline substrates. The surfaces of the alloys were characterized with x‐ray photoelectron spectroscopy (XPS) and dynamic secondary ion mass spectrometry (DSIMS). Information on the compositional variation with depth was acquired with XPS both non‐destructively, in angle‐resolved mode (ARXPS), and destructively with argon ion etching, as well as with DSIMS. Boron oxide dominates the outermost surface of the alloys. Its presence also in the bulk of the alloys is attributed to oxidation during processing, whereas the presence of hydrogen detected with SIMS is attributed to adsorption occurring during processing. The Auger parameter concept and information from the primary and secondary structure of the XPS spectrum were employed to probe the electronic changes occurring upon alloying. It is suggested that the main electronic changes occurring are hybridization of the Ni spd states with the B sp states and an apparent increase of the electron density around the Ni sites. Copyright © 2005 John Wiley & Sons, Ltd.     

Nondestructive in‐depth composition profile of oxy‐hydroxide nanolayers on iron surfaces from ARXPS measurement

In this work the maximum entropy method (MEM) is applied, for the first time, to angle‐resolved X‐ray photoelectron spectroscopy (ARXPS) data from oxy‐hydroxide films on iron surfaces. This nondestructively derives information on the in‐depth distribution of the composition and chemical state. An MEM algorithm was created and first tested on the simulated data. The reconstructed composition depth profiles agreed very well with the theoretical ones up to 5% Gaussian noise added to the data. The same algorithm was then applied to ARXPS data from iron samples to investigate the in‐depth variations in the composition and chemical state of the nanosized oxy‐hydroxide film naturally grown on the iron surface. The resulting surface film presents a complex multilayer structure with concentration gradients. The effect of air exposure on the structure was also investigated. Copyright © 2006 John Wiley & Sons, Ltd.     

Resolving the Differences Between the 1.9 Å and 1.95 Å Crystal Structures of Photosystem II: A Single Proton Relocation Defines Two Tautomeric Forms of the Water‐Oxidizing Complex

Great progress has been made in characterizing the water‐oxidizing complex (WOC) in photosystem II (PSII) with the publication of a 1.9 Å resolution X‐ray diffraction (XRD) and recently a 1.95 Å X‐ray free‐electron laser (XFEL) structure. However, these achievements are under threat because of perceived conflicts with other experimental data. For the earlier 1.9 Å structure, lack of agreement with extended X‐ray absorption fine structure (EXAFS) data led to the notion that the WOC suffered from X‐ray photoreduction. In the recent 1.95 Å structure, Mn photoreduction is not an issue, but poor agreement with computational models which adopt the ‘high’ oxidation state paradigm, has again resulted in criticism of the structure on the basis of contamination with lower S states of the WOC. Here we use DFT modeling to show that the distinct WOC geometries in the 1.9 and 1.95 Å structures can be straightforwardly accounted for when the Mn oxidation states are consistent with the ‘low’ oxidation state paradigm. Remarkably, our calculations show that the two structures are tautomers, related by a single proton relocation.     

The structure of the water–propane interface investigated by x‐ray reflectivity measurements

We present an x‐ray reflectivity study of the water–propane interface. The vertical structure of the interface is analyzed and the adsorption of thin layers of propane on the water surface is observed. An increase of layer thickness with rising pressure is found. The electron density of the thin films is identical with the corresponding value of bulk liquid propane. From the adsorption isotherm we determine the Hamaker constant of the system, which shows a considerably higher value compared to calculations based on the Lifshitz theory. The surface tension of the molecularly thin layer is reduced in comparison to the bulk value. The measured surface roughness is in good agreement with a modified model based on capillary wave fluctuations of the water‐propane–gas interfaces. Copyright © 2008 John Wiley & Sons, Ltd.     

Multianalytical study of corrosion layers in some archaeological copper alloy artefacts

Corrosion layers in some copper and bronze archaeological objects from Haft Tappeh archaeological site, southwest Iran, were studied. For this purpose, optical microscopy, scanning electron microscopy with energy dispersive X‐ray microanalysis, micro‐Raman spectroscopy and X‐ray diffraction methods were applied to observe corrosion stratigraphy and their characteristics as well as identification of chemical composition and phase determination of different corrosion layers. Based on optical and electron microscopy, three different corrosion strata were identified in cross section of different metallic objects including various red, green, white‐grey powdery and dark internal compact layers. Scanning electron microscopy with energy dispersive X‐ray microanalysis on different corrosion layers revealed that Cu, Sn and Cl are the main elements in the chemical composition of different layers. Tin‐rich phases were detected in white‐grey and dark layers that may be formed because of the internal oxidation of tin as well as the decuprification (selective dissolution of copper) phenomena occurring during long‐term burial period in the soil. Also, the XRD and micro‐Raman spectroscopy results proved that the main corrosion products are nantokite (CuCl), copper trihydroxychlorides and copper oxides. The combination of these analytical methods allows us to explore the surface and internal corrosion layers of the archaeological copper and bronze samples, and major interest is on studying their chemistry, microstructural properties and corrosion stratigraphy. Copyright © 2015 John Wiley & Sons, Ltd.     

Enhanced Carbon Dioxide Electroreduction to Carbon Monoxide over Defect‐Rich Plasma‐Activated Silver Catalysts

Efficient, stable catalysts with high selectivity for a single product are essential if electroreduction of CO₂ is to become a viable route to the synthesis of industrial feedstocks and fuels. A plasma oxidation pre‐treatment of silver foil enhances the number of low‐coordinated catalytically active sites, which dramatically lowers the overpotential and increases the activity of CO₂ electroreduction to CO. At −0.6 V versus RHE more than 90 % Faradaic efficiency towards CO was achieved on a pre‐oxidized silver foil. While transmission electron microscopy (TEM) and operando X‐ray absorption spectroscopy showed that oxygen species can survive in the bulk of the catalyst during the reaction, quasi in situ X‐ray photoelectron spectroscopy showed that the surface is metallic under reaction conditions. DFT calculations reveal that the defect‐rich surface of the plasma‐oxidized silver foils in the presence of local electric fields drastically decrease the overpotential of CO₂ electroreduction.     

Effects of elastic scattering and analyzer‐acceptance angle on the analysis of angle‐resolved X‐ray photoelectron spectroscopy data

We have made calculations of N 1s, O 1s, Si(oxide) 2p, Hf 4f, and Si(substrate) 2p photoelectron intensities at selected emission angles for films of SiO_1.6N_0.4 and HfO_1.9N_0.1 of various thicknesses on silicon. These calculations were made with the National Institute of Standards and Technology (NIST) Database for Simulation of Electron Spectra for Surface Analysis (SESSA) to investigate effects of elastic scattering and analyzer‐acceptance angle that could be relevant in the analysis of angle‐resolved X‐ray photoelectron spectroscopy (ARXPS) experiments. The simulations were made for an XPS configuration with a fixed angle between the X‐ray source (i.e. for the sample‐tilting mode of ARXPS) and with Al and Cu Kα X‐ray sources. The no‐loss intensities changed appreciably as elastic scattering was switched ‘on’ and ‘off’, but changing the analyzer‐acceptance angle had a smaller effect. Ratios of intensities for each line from the overlayer film for the least realistic model condition (elastic scattering switched ‘off’, small analyzer‐acceptance angle) to those from the most realistic model condition (elastic scattering switched ‘on’, finite analyzer‐acceptance angle) changed relatively slowly with emission angle, but the corresponding intensity ratio for the Si(substrate) 2p line changed appreciably with emission angle. The latter changes, in particular, indicate that neglect of elastic‐scattering effects can lead to erroneous results in the analysis of measured ARXPS data. The elastic‐scattering effects were larger in HfO_1.9N_0.1 than in SiO_1.6N_0.4 (due to the larger average atomic number in the former compound) and were larger with the Al Kα X‐ray source than with the Cu Kα source because of the larger cross sections for elastic scattering at the lower photoelectron energies. Copyright © 2010 John Wiley & Sons, Ltd.     

Surface structure of cationic surfactant solutions investigated by angular resolved X‐ray photoelectron spectroscopy with calibrated transmission function

The main goal of the present work is to investigate the surface structure of cationic surfactant solutions by angular resolved X‐ray photoelectron spectroscopy (ARXPS) after calibrating transmission function of the spectrometer. We have estimated the transmission function of the ARXPS spectrometer, and with it, we investigated solution of tetrabutylammonium iodide in a nonaqueous polar solvent. By genetic algorithm, the fractional concentration‐depth profiles of constituents were reconstructed. These depth profiles evidence the enrichment of surfactant and the depletion of solvent in the surface regime and verify the separate distributions of oppositely charged surfactant ions. From those profiles we draw a conclusion that there is a preferred orientation for cation present at the surface, and the possibility for cation to take this orientation is related to its surface amount. Copyright © 2010 John Wiley & Sons, Ltd.     

Studies on the migration in PA6‐OMMT nanocomposites: effect of annealing on migration as evidenced by ARXPS (angle resolved X‐ray photoelectron spectroscopy)

The present paper deals with experiments in which the angle resolved X‐ray photoelectron spectroscopy (ARXPS) technique was applied to investigate the phenomenon of migration in polyamide 6 with organically modified montmorillonite (PA6‐OMMT) nanocomposites. This is the first time ARXPS was used, to gain a more detailed insight into the migration process. Curve‐fitting analyses are reported which enable the differentiation between a manual mixture of PA6 with OMMT at room temperature from a nanocomposite structure. The ARXPS technique was applied to annealed samples at 250, 275, and 285°C, for 2 hr, and with three take of angles, α, of 90, 60, and 30°. The depth of the layer investigated is 9 nm in case the sample surface is well defined. By tilting the take‐off angle of the beam‐out electrons one can determine the intensity of the signals at various distances from the surface within the investigated layer. The concentration gradient of the Si signals is observed. The rate of migration is found to be more rapid in the layer closest to the surface. The intensity of the Si signals in the investigated layer is found to be 1.8 to 9.1 times that of the same composite sample at room temperature. This ratio determines the extent of migration. At temperatures higher than 250°C and times of annealing greater than 30 min a decrease in the extent of migration is observed. This decrease is explained by the gradual decomposition of the surfactant and the consequent removal of the polymeric matrix molecules from the migrating exfoliated units, culminating in denuded alumino‐silicate layers. These layers aggregate to noncolloidal microcomposite particles which do not migrate. The concentration of the exfoliated units decreases with consequent decrease in migration. A gradient of decreasing concentration of Si2p signals was observed after various times of annealing, where the gradient becomes more uniform with increase in time. Copyright © 2008 John Wiley & Sons, Ltd.     

Surface roughness and electrical conductivity of the SnO2 ultra‐thin layers investigated by X‐ray reflectivity

Spray pyrolysis technique was applied to deposit two sets of ultra‐thin layers of tin dioxide (SnO₂). For the first and second sets, 0.01 and 0.05 molar precursor solutions were prepared, respectively. In both sets, utilizing the X‐ray reflectivity (XRR) technique, the effect of precursor concentration (PC) and precursor volume (PV) on the layer structure are investigated. The layer thickness of the samples, in each set, is a PV‐dependent parameter. For the same PV, samples with higher PC have a larger thickness and higher density. The electron density profiles deduced from XRR data analyses establish a link between measured values of sheet resistance and electron densities. The samples with higher PV and PC show less sheet resistance. The quantum size effect was utilized to show that the surface roughness for layers of more than almost 200 Å of samples in set two plays no role in the layer conductivity. Meanwhile, the same effect explains, adequately, the role of the surface roughness in the resistivity of the ultra‐thin layers in Set 1.     

GDOES,XPS, and SEM with EDS analysis of porous coatings obtained on titanium after plasma electrolytic oxidation

In the paper, the glow discharge optical emission spectroscopy, X‐ray photoelectron spectroscopy, scanning electron microscopy, and energy‐dispersive X‐ray spectroscopy results of a commercial purity titanium grade 2 after plasma electrolytic oxidation (PEO), also known as micro arc oxidation (MAO), are presented. The PEO treatment was performed in the electrolyte containing concentrated (85%) phosphoric acid with copper nitrate at the voltage of 450 ± 10 V for 1 min. For the electrolyte, copper nitrate addition from 300 to 600 g/l was used. Porous coatings of specific properties were obtained. The measurements results allow to state that the copper and nitrogen ions can be introduced into the surface layer formed on pure titanium by the plasma electrolytic oxidation. The distributions of these elements were detected to depend on the electrolyte composition, with the highest amounts revealed in the coating created in the electrolyte containing 600 g Cu(NO₃)₂ in 1 l H₃PO₄. Three sub‐layers of the coating, displayed in this work by two models, were developed in the study. The analysis performed shows that under the PEO treatment in each of the electrolytes used, the formation of coating with the top sub‐layers always enriched in copper compounds was found. Copyright © 2016 John Wiley & Sons, Ltd.     

Study on surface structure of plasma‐treated polydimethylsiloxane (PDMS) elastomer by slow positron beam

In this paper, the variations in surface structure of polydimethylsiloxane elastomers before and after argon plasma treatments have been investigated by X‐ray photoelectron spectroscopy, slow positron beam, and scanning electron microscope. An inorganic silica‐like layer was probed by X‐ray photoelectron spectroscopy after 3 minutes or longer time of treatments, and the sample surface turned into totally hydrophilic. Short time (1 and 2 min) plasma exposure mainly removed preexisting low molecular weighted (LMW) siloxanes on sample surface. By using slow positron beam, the thicknesses of silica‐like layer for 3‐, 5‐, and 10‐minute–treated samples were estimated to be around 30, 66, and 91 nm, respectively. Beneath the silica‐like layer, a loose polymeric structure was also detected, which was ascribed to the accumulation of LMW siloxanes. Scanning electron microscope images showed that the silica‐like layer cracked after 10 minutes of plasma treatment, which provided direct diffusion pathways for LMW siloxanes. Hence, 10‐minute–treated sample showed rather low organic composition near surface. Slow positron beam provides valuable depth profile information for evaluating the surface aging condition of polydimethylsiloxane composite.     

On the choice of the residual norm function in the interpretation of ARXPS data by regularized fitting

Angle‐resolved X‐ray photoelectron spectroscopy (ARXPS) data taken on a polystyrene film exposed to a nitrogen plasma are interpreted by the fitting of regularized depth profiles. Three ways of measuring the goodness of fit are compared—the χ² statistic with variances drawn from the raw spectra, the χ² statistic with variances drawn from the concentration figures obtained from the data analysis, and a simple sum of the squared differences (ssd) that does not require variances to be calculated. It is shown that for these data, the depth profiles obtained using an objective method for the choice of the regularization parameter are essentially identical irrespective of whether or how the variances are introduced into the calculation. Copyright © 2010 John Wiley & Sons, Ltd.     

低温熔盐法制备球状多孔 La1-xSrxMn0.8Fe0.2O3（0≤x≤0.6）及其催化 CO氧化性能

汽车尾气中 CO, HC, NOx,硫化物及其颗粒粉尘严重危害人们身体健康和大气环境,是大气环境的主要污染源之一.目前,尾气净化是其减排的最主要方式.汽车尾气催化剂的发展经历了几代的研究,一直以来广泛采用 Pt, Pd和 Rh等贵金属,但因其资源匮乏,价格昂贵,容易被 S和 P中毒,因此人们逐渐将目光投向非贵金属催化剂的研发.钙钛矿复合氧化物因具有独特的物理化学性质以及灵活的“化学剪裁”特性而在材料研究等领域颇受青睐,有望成为贵金属催化剂的替代品.一般而言,催化剂的比表面积越大,表面活性位点越多,其催化活性越高,且会明显降低起燃温度.目前,一些制备工艺,如水热法、共沉淀法、微乳液法和硬模板法,虽可在一定程度上提高催化剂的比表面积,但却存在费时、耗能及制备工艺复杂等缺点.因此,如何简单有效地制备出大比表面积的钙钛矿型催化剂依然是一个难题.本文以合成的分级多孔δ-MnO2微球为模板,采用熔盐法制备出球状多孔 La1-xSrxMn0.8Fe0.2O3(0≤x≤0.6)钙钛矿氧化物,研究了球状多孔钙钛矿氧化物的形成过程和合适的制备温度,以及 B位 Fe3+掺杂量为20%时 A位 Sr2+掺杂量对钙钛矿催化剂结构和催化活性的影响.采用 X射线粉末衍射、扫描电子显微镜、透射电子显微镜、N2吸附-脱附、傅里叶红外光谱(FT-IR)和 X射线能谱(XPS)等方法对催化剂进行了表征.在固定床石英管反应器上评价了催化剂催化 CO氧化活性及稳定性,采用气相色谱联接氢火焰离子化检测器检测了产物和反应物的组成.结果表明,以分级多孔δ-MnO2微球为模板,采用熔盐法在450oC反应4 h制备出的球状多孔 La1-xSrxMn0.8Fe0.2O3(0≤x≤0.6)钙钛矿氧化物具有良好的结晶性、较大的比表面积(55.73 m2/g)和孔体积(0.37 cm3/g).其球状多孔结构的形成可分为两个阶段：原位形成钙钛矿相和纳片表面析出钙钛矿晶粒及钙钛矿晶粒的再生长.另外, FT-IR光谱表明, Fe3+和 Sr2+成功进入 A, B位.同时, CO转化曲线表明, B位 Fe3+的掺杂量为20%时, A位 Sr2+的掺杂量高于30%时可以明显改善催化剂催化 CO氧化活性： La1-xSrxMn0.8Fe0.2O3(0≤x≤0.3)的T50和T90分别在180和198oC左右;而 La0.55Sr0.45Mn0.8Fe0.2O3和 La0.4Sr0.6Mn0.8Fe0.2O3的T50均低于125oC; La0.55Sr0.45Mn0.8Fe0.2O3的T90为181oC,而 La0.4Sr0.6Mn0.8Fe0.2O3却仍低于125oC. XPS结果则证明,较高的催化活性得益于 La0.4Sr0.6Mn0.8Fe0.2O3表面存在较多的 Mn4+、氧空位及吸附氧.最后, La0.55Sr0.45Mn0.8Fe0.2O3和 La0.4Sr0.6Mn0.8Fe0.2O3的稳定性测试结果表明,采用熔盐法以δ-MnO2为模板在450oC焙烧4 h制备的多孔球状钙钛矿具有较好的催化稳定性.虽然催化剂制备工艺简单,周期短,但比表面积最大只有55.73 m2/g,为硬模板法的1/2,因此提高比表面积将是今后研究的方向.     

Coordination‐Based Molecular Assemblies of Oligofurans and Oligothiophenes

Molecular assemblies (MAs) of oligofurans and oligothiophenes were formed from solutions on various substrates. These films were obtained by alternating deposition of organic chromophores (oligofurans or oligothiophenes) and a palladium salt. These coordination‐based MAs were characterized by UV/Vis spectroscopy, spectroscopic ellipsometry, atomic force microscopy (AFM), X‐ray reflectivity (XRR), X‐ray photoelectron spectroscopy (XPS), and electrochemistry. The MAs exhibit similar electrochemical behavior and their growth and structure are apparently not affected when different organic template layers are used. The density of the MAs is a function of the structure of the molecular component. The oligothiophene density is approximately 50 % higher than that observed for the oligofuran‐based assemblies. The optical and electrochemical properties of the MAs scale linearly with their thickness. The UV/Vis data indicate that upon increasing the film thickness, there is no significant conjugation between the metal‐separated organic chromophores. DFT calculations confirmed that the HOMO–LUMO gap of the surface‐bound oligofuran and oligothiophene metal oligomers do not change significantly upon increasing their chain length. However, electrochemical measurements indicate that the susceptibility of the MAs towards oxidation is dependent on the number of chromophore units.     

Ultrathin Carbon Film Electrodes from Vacuum‐Carbonised Cellulose Nanofibril Composite

A novel way to produce ultrathin transparent carbon layers on tin‐doped indium oxide (ITO) substrates is developed. The ITO surface is coated with cellulose nanofibrils (from sisal) via layer‐by‐layer electrostatic binding with poly(diallyldimethylammonium chloride) or PDDAC acting as the binder. The cellulose nanofibril‐PDDAC composite film is then vacuum‐carbonised at 500 °C. The resulting carbon films are characterised by atomic force microscopy (AFM), small angle X‐ray scattering (SAXS), wide‐angle X‐ray scattering (WAXS), and Raman methods. Smooth carbon films with good adhesion to the ITO substrate are formed. The electrochemical characterisation of the carbon films is based on the oxidation of hydroquinone and the reduction of benzoquinone in aqueous phosphate buffer media. A modest effect of the cellulose nanofibril‐PDDAC film on the rate of electron transfer is observed. The effect of the film on the rate of electron transfer after carbonisation is more dramatic. For a 40‐layer cellulose nanofibril‐PDDAC film after carbonisation a two‐order of magnitude change in the rate of electron transfer occurs presumably due to a better interaction of the hydroquinone/benzoquinone system with the electrode surface.