Evidence of domain wall scattering in thin films of granular CoFe-AgCu

Thin films of the giant magnetoresistive granular CoFe-AgCu system prepared by rf sputtering displayed a great variety of domain-like microstructures with a net out-of-plane component of the magnetization for ferromagnetic volume concentrations above about 0.25. Therefore, magnetic percolation takes place at ferromagnetic concentrations much lower than the physical percolation threshold. The out-of-plane structure of the as-deposited samples in magnetic virgin state consisted of a distribution of both quasi-circular domains and short stripes depending on the ferromagnetic content. Furthermore, these samples present high metastability and a variety of remanent in-plane and out-of-plane microstructures can be achieved as a function of the magnetic history. Besides, the evolution of the magnetic microstructure yields strong training effects on magnetotransport properties, due to the extra contribution of the electron scattering at the domain walls. All in all, the observed behavior is the result of a subtle correlation between perpendicular anisotropy produced by residual stresses, exchange interparticle interactions due to CoFe alloyed in the matrix, and dipolar interactions. Thus, as high structural evolution occurs through annealing, the features of randomly distributed ferromagnetic particles are recovered and, the out-of-plane domain structures and the training effects disappear. Received 30 September 1999     

Magnetic properties of field-annealed FeCo thin films

Fe₅₀Co₅₀ thin films with thickness of 30 and 4 nm have been produced by rf sputtering on glass substrates, and their surface has been observed with atomic force microscopy (AFM) and magnetic force microscopy (MFM); MFM images reveal a non-null component of the magnetization perpendicular to the film plane. Selected samples have been annealed in vacuum at temperatures of 300 and 350 °C for times between 20 and 120 min, under a static magnetic field of 100 Oe. DC hysteresis loops have been measured with an alternating gradient force magnetometer (AGFM) along the direction of the field applied during annealing and orthogonally to it. Samples with a thickness of 4 nm display lower coercive fields with respect to the 30 nm thick ones. Longer annealing times affect the development of a harder magnetic phase more oriented off the film plane. The field applied during annealing induces a moderate magnetic anisotropy only on 30 nm thick films.     

Saturation field direction dependence of domain structures in NiFe elements

The domain structures in NiFe elements were studied by magnetic force microscopy measurement and micromagnetic modeling. The remanent states in the elements were dependent on the direction of the saturation field. The “S” and “U” states were observed at remanence by applying the saturation field at different directions. The “S” and “U” states are metastable: magnetic force microscopy tip field-induced switching from the “S” and “U” states to the flux closure configuration was observed.     

Structural and magnetoresistive properties of half metallic Co2Mn1−xSi thin films

Polycrystalline Co₂Mn_1−xSi (CMS) thin films with Mn-deficiency can grow on different types of substrates such as MgO (1 0 0) single crystal, α-sapphire (0 0 0 1) and Si coated with SiO₂ either by using V or Ta/Cu as the seed layer. The magnetic property, especially the coercivity of the CMS thin films strongly depends on the crystalline structure and microstructure of the CMS thin film, hence it is affected by the substrate and also the seed layer. Very soft CMS thin film with coercivity of about 20 Oe has been obtained when MgO (1 0 0) is used as the substrate. Magnetic tunnel junctions (with MR ratio of about 9%–18%) by utilizing the CMS as one of ferromagnetic electrodes have been successfully fabricated. The degradation of the magnetoresistive effect of the MTJ after magnetic annealing is attributed to the diffusion of the Mn-atoms into the tunnel barrier during the annealing process.     

Magnetic properties of FeSiB thin films displaying stripe domains

FeSiB amorphous thin films with thicknesses from 25 to 600 nm have been produced by rf sputtering on Si₃N₄ substrates. A spin reorientation transition has been observed on the as-prepared samples, as a function of thickness and temperature. Spin reorientation transition is shown to depend on the thermal treatments to which the as-prepared samples have been submitted. Static hysteresis loops obtained as a function of temperature, and magnetic force microscopy images taken at room temperature at the remanence and as a function of an applied magnetic field, have been employed to study the magnetic domain configuration of all the samples, and to see how it is affected by sample thickness, measurement temperature and annealing conditions.     

Temperature dependence of magnetic stripe domain period in ultrathin films

In ultrathin films, due to the thermal activation and temperature dependencies of the magnetic parameters, magnetization reversal processes are strongly affected by thermal effects. We analyze changes of domain periods of ultrathin cobalt and L₁₀$\mathrm{L}{1}_0$ films in a wide temperature range. With regard to the temperature dependencies of the film magnetic parameters we calculate the equilibrium stripe period as a function of temperature. It is shown that on film heating the equilibrium domain structure (DS) period decreases and at the reorientation phase transition (RPT) approaches its minimal value corresponding to the temperature independent period of the sinusoidal domain structure. Just below the RPT temperature (or thickness) the stripe domain period was found to exponentially decrease with temperature. Irreversible temperature changes of the domain period affected by coercivity are also discussed.     

Magnetic and magneto-optical properties of FeRh thin films

The magnetic and magneto-optical properties of FeRh thin films epitaxially deposited onto MgO(1 0 0) substrates by RF sputter-deposition system have been investigated in conjunction with the structure. An intriguing virgin effect has been found in the M–T curves of the as-deposited FeRh thin films, which is presumably interpreted in term of a change in structural phase when heating. Also, a (negative) maximum peak of Kerr rotation at around 3.8 eV has been observed when FeRh thin films are in ferromagnetic state. The polar Kerr rotation angle is found to increase at temperatures above 100 °C, which corresponds to the antiferromagnet (AF)–ferromagnet (FM) transition of FeRh thin films.     

Magnetic domain structure in Fe78.8−xCoxCu0.6Nb2.6Si9B9 nanocrystalline alloys studied by Lorentz microscopy

The magnetic domain structures of Fe_78.8−xCo_xCu_0.6Nb_2.6Si₉B₉ (x=0, 20, 40, 60) alloys are investigated by Lorentz microscopy coupled with the focused ion beam method. The specimen prepared using the FIB method is found to have a considerably more uniform thickness compared to that prepared using the ion-milling method. In Fe_38.8Co₄₀Cu_0.6Nb_2.6Si₉B₉ and Fe_18.8Co₆₀Cu_0.6Nb_2.6Si₉B₉ alloys, 180° domain walls extending in the direction of the induced magnetic anisotropy are observed. Analysis with Lorentz microscopy reveals that the width of the magnetic domains decreases with an increase in the cobalt content or the induced magnetic anisotropy K_u, that is, the domain width d is proportional to the induced magnetic anisotropy (K_u)^−1/4. On the other hand, in the in situ Lorentz microscopy observation as a function of temperature, magnetic ripple structures are found to appear in a localized area due to the fluctuation of magnetization vectors from 423 K. It is observed that the induced magnetic anisotropy caused by the applied magnetic field at 803 K is not suppressed by the magnetic ripple structures observed at 423–443 K.     

Magnetic properties of thin epitaxial films investigated by spin-polarized photoemission

The surface sensitivity of the spin-polarized photoemission experiment was exploited to study two-dimensional magnetism. The magnetization of thin films of Fe, Co, and V in the monolayer (ML) range, grown on Cu(001) and Ag(001) single crystals, was measured as a function of perpendicularly applied field and temperature. Bcc Fe films and fcc Fe and Co films exhibit ferromagnetism down to the single monolayer range, while no evidence for ferromagnetism is found for V on Ag(001). All Co films are magnetized in plane and have a Curie temperature far above room temperature. A thickness dependence of the anisotropy and Curie temperature is observed for the two phases of Fe. Remanent magnetization perpendicular to the surface is found at 30 K for fcc Fe films thicker than 2 ML and for bcc Fe between 3 and 4 ML. The magnetic effects caused by coating and by interdiffusion are discussed in the light of measurements of Cu/Fe/Cu sandwiches and of overlayers obtained by simultaneous evaporation of Fe and Cu. The fcc Fe films are shown to be suitable for thermomagnetic writing.     

Simultaneous observation of atomic step and domain wall structure of ultrathin Co films by magnetic force microscopy in ultrahigh vacuum

We have applied magnetic force microscopy in ultrahigh vacuum to study the correlation between the atomic step and magnetic domain wall structure of ultrathin Co films prepared in situ on Au(111) substrates. For the first time we were able to achieve high-resolution images showing simultaneously a clear domain wall contrast and the underlying atomic step structure. Although for in-plane magnetized Co films the domain walls were found to run preferentially in a direction perpendicular to the steps, no such correlation could be observed for out-of-plane magnetized Co films. Received: 3 June 1999 / Accepted: 4 June 1999 / Published online: 29 July 1999     

Transmission X-ray microscopy using X-ray magnetic circular dichroism

X-ray magnetic circular dichroism (X-MCD) was used as a large, element-specific and quantitative magnetic contrast mechanism in the soft X-ray microscopes at BESSY I (Berlin) and the ALS (Berkeley). The present state and potential of magnetic transmission X-ray microscopy (MTXM) is outlined. The possibility to record images in varying magnetic fields and the high spatial resolution down to 25 nm were used to image out-of-plane magnetized (4 ?Fe / 4 ?Gd)×75 systems. Magnetic domains could be studied in arrays of circular and square dots with lateral dimensions down to 180 nm. Hysteresis loops of individual dots were deduced using the direct proportionality of the X-MCD contrast to the sample magnetization. Images of a 3 nmCr / 50 nmFe / 6 nmCr film demonstrate for the first time that MTXM is also able to observe in-plane magnetized domains. In the future the possible applications of MTXM will be extended with regard to the strength of the external field, the available energy range and the sample conditions by building a dedicated transmission X-ray microscope for magnetic imaging at BESSY II. Received: 22 May 2001 / Accepted: 4 July 2001 / Published online: 5 October 2001     

Magnetic and high-pressure magnetotransport properties of cesium-substituted lanthanum calcium manganites

The nature of the double-exchange (DE) interaction in lanthanum manganites is studied through chemical substitutions, Cs for La, and high-pressure measurements. Static and high-frequency magnetic measurements and high-pressure electrical transport studies were carried out on bulk polycrystalline and radio-frequency sputtered thin films of La_0.7-xCs_xCa_0.3MnO₃ for x=0-0.1. The samples are found to be cubic. Curie temperature T_c measurements provide evidence for bond-length-related weakening of DE as x is increased from 0 to 0.03. For higher x, the bond-angle-related changes lead to an increase in the strength of DE. High-pressure mangetoresistance data indicate both bond length and bond-angle-related increase of 10–20 K/GPa in T_c with pressure, with the largest increase measured for x=0.03. The rate of increase in the Curie temperature with pressure decreases with increasing T_c. Anomalies are observed in the magnetic parameters for x=0.03. The Cs-concentration dependence of the low-temperature saturation magnetization shows a minimum close to x=0.03. Ferromagnetic resonance studies at x-band reveal a 5% decrease in the g-value for x=0.03 relative to the end members (x=0 and 0.1). The low-field magnetostriction for x=0.03 indicates a relatively strong electron–phonon spin coupling compared to neighboring compositions. Received: 15 May 2000 / Accepted: 24 July 2000 / Published online: 9 November 2000     

Layer-resolved microscopy of magnetic domains in multi-layered systems

Photoelectron emission microscopy in connection with magnetic circular dichroism in soft X-ray absorption can be used for the microscopic imaging of magnetic domains in layered thin film structures consisting of several magnetic layers. Due to the element-selectivity of the method, the different magnetic layers in such a structure can be imaged separately, provided that they contain different elements. This has been applied for the investigation of Co/Cu/Ni trilayers, epitaxially grown on Cu (001). The magnetic coupling between the Co and Ni layers can be directly visualized from comparing layer-resolved magnetic domain images of both layers. As a consequence of the competition between the anisotropy energies of the two magnetic layers and the magnetic coupling energy, spin-reorientation transitions between collinear and non-collinear magnetic configurations are observed. Apart from this globally observable magnetic interlayer coupling a micromagnetic coupling mechanism is also evident from the layer-resolved domain images. It is caused by magnetostatic interaction of local stray fields from domain walls. Received: 22 August 2002 / Accepted: 2 October 2002 / Published online: 5 February 2003 RID="*" ID="*"Corresponding author. Fax: +49-345/5511-223, E-mail: kuch@mpi-halle.de     

Magnetic and structural study of Cu-doped TiO2 thin films

Transparent pure and Cu-doped (2.5, 5 and 10 at.%) anatase TiO₂ thin films were grown by pulsed laser deposition technique on LaAlO₃ substrates. The samples were structurally characterized by X-ray absorption spectroscopy and X-ray diffraction. The magnetic properties were measured using a SQUID. All films have a FM-like behaviour. In the case of the Cu-doped samples, the magnetic cycles are almost independent of the Cu concentration. Cu atoms are forming CuO and/or substituting Ti in TiO₂. The thermal treatment in air promotes the CuO segregation. Since CuO is antiferromagnetic, the magnetic signals present in the films could be assigned to Cu substitutionally replacing cations in TiO₂.     

Magnetic domain wall pinning and coercivity in FePt/MgO and FePt/Pt thin films

FePt thin layers have been epitaxied either on Pt(0 0 1) or on MgO(0 0 1) substrates, and magnetically characterized using extraordinary Hall effect magnetometry and magnetic force microscopy. The coercivity originates in both cases from the pinning of domain walls on structural defects. Whereas the coercivity increases with the FePt layer thickness in FePt/Pt samples, it decreases in FePt/MgO samples. This discrepancy is explained on the basis of structural observations, and of atomistic simulations of magnetic domain wall pinning.     

Magnetic force microscopy applied in magnetic data storage technology

Microstructured thin-film elements with critical dimensions of 1 μm or less play an increasingly important role in magnetic components for information technology applications. Devices that are directly based on such microstructures are key components in magnetoelectronics for storage and sensor applications as well as modern concepts which are likely to substitute today’s hard disk drives. Basic research on magnetic materials as well as industrial applications create an increasing demand for high-resolution magnetic imaging methods. One such method is magnetic force microscopy (MFM). In spite of considerable achievements, MFM also has some serious shortcomings, which have not been overcome to date. Under normal circumstances, the method yields only qualitative information about the magnetic object and it is difficult to improve the resolution to values below 100 nm. In this paper, we will report on advanced MFM probe preparation, based on electron beam methods, and discuss the possibilities for batch fabrication of such advanced MFM tips. We show that the advanced probes allow high-resolution imaging of fine magnetic structures within thin-film permalloy elements without perturbing them. Additionally, we present high-frequency MFM measurements on a hard disk write head. Received: 2 September 2002 / Accepted: 2 September 2002 / Published online: 5 March 2003 RID="*" ID="*"Corresponding author. Fax: +49-681/302-3790, E-mail: m.koblischka@mx.uni-saarland.de     

Investigation of ripple structures of thin polycrystalline Co films by magnetic force microscopy

Received: 14 August 1997/Accepted: 14 August 1997     

Shape anisotropy and magnetic domain structures in striped monolayers

We study the effect of dipolar interactions on a magnetic striped monolayer with a microscopic unit cell of square symmetry, and of size spins. Even if the aspect ratio r=N _x /N _y is very large, an in-plane shape anisotropy is always negligible, except if N_y is fairly small (N _y <40). In-plane domains are not possible, except for values of the dipolar coupling larger than the domain wall energy. Received: 11 July 1997 / Revised: 24 September 1997 / Accepted: 24 October 1997     

Effect of annealing on structure and magnetic properties of Fe-N and Fe-Ti-N thin films

The structure and magnetic properties of Fe-N and Fe-Ti-N films have been studied as a function of annealing temperature T_a with a transmission electron microscope and a vibrating sample magnetometer. The as-prepared Fe-N films consist of the γ^′-Fe₄N and α^′′-Fe₁₆N₂ phases, and the Fe-Ti-N films are composed of the γ^′-Fe₄N, α^′′-Fe₁₆N₂, and TiN phases. The structural changes with annealing temperature in the Fe-N films are distinct. The α^′′-Fe₁₆N₂ decomposes into α+γ^′ phases in the Fe-N film annealed at about 300 °C, and it disappears in the film annealed at 350 °C. Annealing of the Fe-Ti-N films shows no structural changes between room temperature (RT) and 500 °C. The saturation magnetization 4πM_S and coercivity H_c of the Fe-N films change drastically with the annealing temperature T_a, whereas those of the Fe-Ti-N films do not change with T_a up to 500 °C. These results indicate that the additon of Ti may improve the thermal stability of Fe-N films. Recieved: 6 Juli 1998 / Accepted: 19 Oktober 1998 / Published online: 10 March 1999