模拟合成孔径雷达数据片波差的测量和胶片、波差的容限

本文介绍一种用马赫-陈德干涉系统测量模拟合成孔径雷达数据片波差的方法.该法能把两种原因产生的波差区分开来,即把通过胶片变形的波面与平面参考波面比较,求出胶片厚度不平产生的波差;把合成孔径雷达数据片的一级衍射波面与两个半径不等的参考球面波比较,分别求出由模拟装置产生的方位维和斜距维波差.本文给出一些实验结果和分析.这种方法还可以用于测量真实合成孔径雷达数据片的波差.由胶片厚度变化产生的波差可以用液体门补偿.但是,在实际中使用液体门是很繁复的,有时也没有必要.因此,我们认瑞利准则出发导出合成孔径雷达数据片胶片厚度变化产生的波差的容限,以此作为判断是否要用液体门的依据.     

Full X-ray pattern analysis of vacuum deposited pentacene thin films

Pentacene thin films with thicknesses ranging from 10 nm to 180 nm are investigated by specular X-ray diffraction in the reflectivity regime and in the wide angular regime. The results of the reflectivity measurements show a clear shift of the 001 reflection of the thin film phase depending on the layer thickness. It is shown that this shift can be explained by the dynamical scattering theory. The wide angular regime measurements show the 00L of the thin film phase. Williams-Hall plots are used to extract information on the crystallite size and mean micro strain of the thin film phase. The crystallite size is in good agreement with the results obtained by the reflectivity measurements. From this it can be concluded that the thin film phase crystallites are extended over the entire film thickness down to the substrate. Additionally an increase of the micro strain with increasing film thickness is observed.     

Measurement of absolute phase Shift on reflection of thin films using white-light spectral interferometry

A novel method to measure the absolute phase shift on reflection of thin film is presented utilizing a white-light interferometer in spectral domain. By applying Fourier transformation to the recorded spectral interference signal, we retrieve the spectral phase function Ф, which is induced by three parts： the path length difference in air L, the effective thickness of slightly dispersive cube beam splitter Teff and the nonlinear phase function due to multi-reflection of the thin film structure. We utilize the fact that the overall optical path difference （OPD） is linearly dependent on the refractive index of the beam splitter to determine both L and Teff. The spectral phase shift on reflection of thin film structure can be obtained by subtracting these two parts from Ф. We show theoretically and experimentally that our new method can provide a simple and fast solution in calculating the absolute spectral phase function of optical thin films, while still maintaining high accuracy.     

Phase aberration compensation of digital holographic microscopy based on least squares surface fitting

Digital holographic microscopy allows the numerical reconstruction of the complex wavefront of samples, especially biological samples such as living cells. In digital holographic microscopy, a microscope objective is introduced to improve the transverse resolution of the sample; however a phase aberration in the object wavefront is also brought along, which will affect the phase distribution of the reconstructed image. We propose here a numerical method to compensate for the phase aberration of thin transparent objects with a single hologram. The least squares surface fitting with points number less than the matrix of the original hologram is performed on the unwrapped phase distribution to remove the unwanted wavefront curvature. The proposed method is demonstrated with the samples of the cicada wings and epidermal cells of garlic, and the experimental results are consistent with that of the double exposure method.     

A modified phase diversity diffraction wavefront sensor with a grating

The phase diversity wavefront sensor is one of the tools used to estimate wavefront aberration, and it is often used as a wavefront sensor in adaptive optics systems. However, the performance of the traditional phase diversity wavefront sensor is limited by the accuracy and dynamic ranges of the intensity distribution at the focus and defocus positions of the CCD camera. In this paper, a modified phase diversity wavefront sensor based on a diffraction grating is proposed to improve the ability to measure the wavefront aberration with larger amplitude and higher spatial frequency. The basic principle and the optics construction of the proposed method are also described in detail. The noise propagation property of the proposed method is also analysed by using the numerical simulation method, and comparison between the diffraction grating phase diversity wavefront sensor and the traditional phase diversity wavefront sensor is also made. The simulation results show that the diffraction grating phase diversity wavefront sensor can obviously improve the ability to measure the wavefront aberration, especially the wavefront aberration with larger amplitude and higher spatial frequency.     

A modified phase diversity wavefront sensor with a diffraction grating

Phase diversity wavefront sensor is one of the useful tools to estimate the wavefront aberration, and it is often used as a wavefront sensor in adaptive optics system. However, the performance of the traditional phase diversity wavefront sensor is limited by the accuracy and dynamic ranges of the intensity distribution at focus and defocus positions of the CCD camera. In this paper, a modified phase diversity wavefront sensor based on a diffraction grating is proposed to improve the ability to measure the wavefront aberration with larger amplitude and higher spatial frequency. The basic principle and the optics construction of the proposed method are also described in detail. The noise propagation property of the proposed method is also analysed by using the numerical simulation method, and comparison between the diffraction grating phase diversity wavefront sensor and the traditional phase diversity wavefront sensor is also made. The simulation results show that the diffraction grating phase diversity wavefront sensor can obviously improve the ability to measure the wavefront aberration, especially the wavefront aberration with larger amplitude and higher spatial frequency.     

基于低相干光的阵列透镜束匀滑技术研究

基于激光加载的材料状态方程的实验研究对靶面光强分布的均匀性及稳定性提出了极高的要求,靶面光强的上述两大特性在很大程度上决定了实验结果的精度和可重复性.本文针对传统窄带高相干激光装置在激光加载材料状态方程实验中表现出的靶面光强均匀性和光强分布稳定性两方面可能存在的问题,提出了基于宽带低相干激光,利用消衍射阵列透镜联合诱导非相干技术的束匀滑方案,并重点分析了波前相位畸变对靶面不均匀性及稳定性的影响.模拟结果表明,该方法明显降低了靶面不均匀性,提高了对波前相位畸变的包容度,获得了均匀、稳定的光强分布.统计分析显示,焦斑强度分布极差和不均匀性与波前相位畸变均方根梯度相关性较强.因此,可以根据统计结果以及实验对焦斑强度分布的要求,给出波前相位畸变的容差范围,对状态方程实验中激光驱动器参数的设计与优化具有指导意义.     

微腔器件中金属镜反射相移与穿透深度研究

针对金属反射相移计算时电磁波相位符号表述混乱导致错误的穿透深度计算结果现象,通过理论推导得出电磁波两种相位表述符号下对应的金属复折射率有两种不同形式,从而导致金属反射相移位于不同的象限,穿透深度和反射相移之间的关系式也相应的有两种结论.并通过调节Ag膜的厚度制作了一系列对称全金属λ/2腔器件,器件结构为Glass/Ag/LiF/Ag.通过比较Ag膜穿透深度的实验结果和计算值,验证了其中一种金属穿透深度公式的正确性.     

投影光学系统中的偏振像差分析

当光束斜入射时,光学薄膜存在一定的偏振效应。在飞利浦棱镜系统中,当一定大小孔径角的照明光束斜入射到分色合色薄膜后,S偏振分量和P偏振分量存在一定的相位差,使得线偏振光变成椭圆偏振光。利用琼斯矩阵偏振光线追迹的方法,分析了投影光学系统中由于两偏振分量相位差引起的偏振像差,以及它与暗态泄漏光强和系统衬比度的关系。得出了系统出瞳面上的光波偏振特性,以及在不同大小孔径角的照明光束入射下偏振像差的变化。分析了膜厚监控误差对光学系统偏振像差的影响,发现膜厚监控误差对偏振像差和系统衬比度有很大的影响。所使用的分析方法可以应用于其他大口径光学系统。     

Measurement of Wavefront Aberration of Human Eye Using Talbot Image of Two-Dimensional Grating

The measurement of human ocular aberration is now frequently performed because of the increase in refractive surgery on the human cornea. The Hartmann-Shack (H-S) wavefront sensor is considered to be the most useful wavefront sensor, and a calculation method for wavefront aberration has been established. New methods of measuring wavefront aberrations of human eyes, using the Talbot image of a two-dimensional grating as a wavefront sensor and local shift of the Talbot image to calculate tilt of the wavefront are shown. The shift of the Talbot image was determined by comparing the phases of fundamental spatial frequency between the grating and the local patch of the Talbot image by Fourier transformation. The actual experiment was performed using a modified commercially available wavefront analyzer. Using these methods, Talbot images were obtained from model eyes and a human eye, and wavefront shapes were successfully reconstructed. Wavefront aberrations can be measured even when the obtained image is degraded by defocusing or scattering.     

The determination of the refractive index and the thickness of thin films of aluminium oxide on aluminium by the polarimetric method

Formulas for the reflection of light from glass (i. e. a dielectric) coated with a thin non-metallic film are generalized for the case of the reflection of light from a metal coated with a thin non-metallic film, e. g. a film of aluminium oxide on aluminium. It is shown how the refractive index and the thickness of the aluminium oxide film on an aluminium mirror can be determined by measurements in polarized light. In conclusion the results of Drude's classical theory of thin non-metallic films on metallic mirrors are compared with the results obtained by the author on the basis of the interference of light in thin films.     

非均匀激光辐照下硅镜热变形对光束传输特性的影响

 使用有限元法计算了硅镜在DF化学激光器非稳腔输出的中空非均匀激光辐照下镜面温升和反射面面形随时间变化的特性,使用65阶Zernike多项式对镜面面形进行了曲面拟合,使用光线追迹的方法计算了平行光束经不同数量硅镜反射后的光束波前分布PV值、Strehl比和Zernike像差系数随时间变化的特性。计算结果表明：在典型的DF激光器输出的中空方形光束辐照下,硅反射镜的热变形将使反射光束产生波前畸变,波前畸变中,y方向像散项占据主要地位,其次是离焦项;随着激光系统中反射镜面数量的增加,高阶像差系数将逐渐增大,且波前PV值与反射次数成线性关系。     

电介质膜对受抑全内反射结构中古斯-汉欣位移的增强

受抑全反射结构中,反射光束和透射光束的古斯汉欣(Goos-Hanchen)位移同时存在,对称双棱镜结构的受抑全反射古斯汉欣位移通常只有波长量级,在实验中很难测量。计算了在入射角大于棱镜与空气界面的临界角小于棱镜与薄膜界面临界角时,镀有电介质膜的对称双棱镜的受抑全反射过程中入射光束的反射系数和透射系数的复数表达式。利用稳态相位法计算得出透射光束和全反射光束的古斯汉欣位移。结果表明,反射光束和透射光束古斯汉欣位移量相同,与入射角大小、薄膜厚度以及空气层厚度有关。在入射角小于但接近棱镜与薄膜界面的临界角,薄膜厚度和空气层厚度一定时,古斯汉欣位移量共振增强达到波长的数百倍。     

Polarization phase in aberration compensation

A phase/amplitude mask on the aperture of an imaging system results in a pupil function that is multiplicative with the lens function, resulting in a morphological transformation of the imaging wavefront. It was shown that such amplitude and phase functions can be implemented using polarization masks, with the advantage that the phase and amplitude can be controlled in real time and in some cases, independently of each other. The phase and amplitude variation over the mask can be controlled either by changing the polarization of the mask or by changing the input beam parameters. Wavefront tailoring using polarization-masked apertures is therefore feasible and may be utilized for focal shift and partial aberration compensation. For complete compensation of aberration, the phase distribution over the mask should be conjugate to that of the phase error of the aberrant wavefront, which necessitates the use of a continuously variable polarization mask. Since such a mask is difficult to implement, we have considered polarizing masks consisting of discrete polarized zones on the lens aperture, leading to polarization phase steps on the exit pupil of the imaging system. The simulation results presented in this paper show that effects of focal shift, partial compensation of primary spherical aberration and astigmatism can indeed be achieved by the proper use of polarization masked apertures.     

New interferometric method for determining the refractive index of thin dielectric film,its thickness,the phase shift,and the order of interference

A new interferometric method is proposed, using white light fringes of equal chromatic order to determine simultaneously the following paramcters:

1. The refractive index of a thin dielectric film, and hence its dispersion.
2. The film thickness.
3. The correct value of the order of interference.
4. The phase shift occuring due to reflection at the dielectric/metal interface. In the present work, doubly silvered zinc sulphide (ZnS) thin dielectric film was used as an example in applying the proposed method.

     

基于位相变更的非相干数字全息自适应成像

菲涅耳非相干数字全息作为一种非扫描的三维成像技术具有其独特的优势,但其成像过程中会受到各种像差的影响,导致成像分辨率、再现像的质量降低.为了解决这一问题,可以结合适当的自适应光学技术对波前像差进行探测和校正.位相变更是一种基于两幅具有已知位相差的强度图像实现波前探测和像差校正的技术.本文发展了基于位相变更的非相干数字全息自适应成像技术,不需要引入引导星,利用全息记录过程中的两幅相移全息图,实现波前像差的探测.本文给出了所发展技术的数值仿真和实验结果,结合位相变更算法求解出系统像差的位相分布,将像差的共轭位相加载到光瞳面上,在全息图记录的同时校正像差,从而提高重建像的质量.     

棱镜-薄膜耦合结构中光束Goos-H(a)nchen位移的增强

棱镜-薄膜耦合结构是单侧镀电介质膜的双棱镜结构中的一种,在光信号传输方面具有十分重要的作用.利用稳态相位法分析了这种结构中反射和透射光束的Goos-Hanchen位移,研究结果表明,反射和透射光束的Goos-Hanchen位移随薄膜厚度或入射角的增大除出现共振峰外,还存在反射光束的Goos-Hanchen位移共振峰为负值的新现象.在共振点处透射和反射光束的正向或负向位移量最大可达百余波长.这一结构中薄膜和入射角.对光束Goos-Hanchen位移的调制在设计新型光位移调制和光传感器件中具有潜在的应用.     

特定折射率材料及光学薄膜制备

根据太阳电池阵激光防护膜性能优化的需要,应用离子辅助电子束双源共蒸工艺方法制备了优化设计所需的特定折射率的薄膜材料并用于制备激光防护膜。测试结果显示:用该工艺方法制备的掺杂材料薄膜的折射率n=1.75,与优化设计所需数值相符;激光防护膜性能优良,太阳辐射能透过率提高6%以上,实现了对该激光防护膜性能的进一步优化。为了使该双源共蒸方法适于大面积薄膜的制备,应用均匀性挡板技术来提高该方法制备大面积薄膜的膜厚均匀性,使制备的掺杂材料薄膜在口径为400 mm时的不均匀性小于2.1%。该双源共蒸方法制备工艺简单、可靠,适于实际工程应用。薄膜性能测试结果与理论优化结果相符,达到预期优化目标。     

白光干涉测量超薄透明电极ITO薄膜的厚度

随着平板显示技术的发展,透明电极ITO膜的厚度越来越薄。为了测试这种极薄的ITO膜,本文通过改进已有的频域分析算法,以便测试膜厚在20~150 nm之间的ITO膜。与现有算法相比,该算法有效改进了各个波长的位相解析精度。实验结果表明,待测透明电极薄膜的厚度为90~104 nm,其结果和标定值一致,证明了该算法能够测量膜厚小于100 nm的透明电极ITO薄膜。     

遗传算法在自适应光学系统中的应用

为了校正激光光束的波前像差,建立了一套无需直接探测波前信息的自适应光学(AO)系统模型,提出了一种基于实数编码的高斯变异的遗传算法(GA)用来控制61单元压电变形镜补偿波前像差,并仿真利用此算法控制61单元变形镜校正由变形镜本身产生的像差。结果表明,这种算法能够找到补偿各种像差所需的变形镜的最优面型。像差校正后,焦平面的峰值光强最多能够提高30倍。环围斯特尔比值(Strehl ratio)最多能够从校正前的0.032提高到0.96,变形镜61个驱动器后的电压值收敛性能良好。