Time-resolved small angle X-ray scattering study of sol-gel precursor solutions of lead zirconate titanate and zirconia

The evolution of nanostructure in sol-gel derived lead zirconate titanate (PZT) and zirconia precursor sols at different hydrolysis ratios was investigated by small angle X-ray scattering (SAXS). The shape of the clusters in the zirconia sol could be described by the length-polydisperse cylindrical form factor. The zirconia-based clusters were characterized by a cross-sectional radius, r(0), of 0.28 nm and a practically monodisperse length of ca. 1.85 nm. These clusters were probably constructed of zirconia-related tetrameric building blocks. Similar cylindrical structural motifs were observed in PZT precursor sols with [H(2)O]/[Zr+Ti]=9.26 and 27.6, but the polydispersity in length was much higher. Clear scattering contributions from Ti and Pb centers were not detected, which was interpreted in terms of a homogeneous distribution of unbound lead ions in solution and the relatively low scattering intensity from any Ti-based clusters or oligomers that may have been present in the sols.     

Effect of diphenyldiethoxysilane on the self-organized formation of nanocrystalline layered organosilicates in organic–inorganic hybrid films

Hybrid organic–inorganic films containing layered organosilicate nanocrystals have been obtained through self-organization from aqueous precursor sols containing 3-glycidoxypropyltrimethoxysilane. Diethoxydiphenylsilane has been added, in different amounts, to the precursor sol containing 3-glycidoxypropyltrimethoxysilane to prepare hybrid films with the ordered nanostructures. The effect of aging time of the precursor sol has been studied preparing different samples from sols aged up to 8 days; the formation of crystalline layered films has been observed in the samples obtained from sols of higher aging time. The hybrid films have been characterized by gracing incidence X-ray diffraction, Raman and Fourier transform infrared spectroscopy, transmission electron microscopy and UV–Vis spectroscopy. The change of the surface contact angle as a function of sol aging time and composition has been also measured. The capability of the films to be used in devices through lithographic techniques has been tested by writing the films with direct exposition to deep X-ray lithography and soft lithography with micromolds; patterns of different geometries with a thickness up to 100 μm have been obtained.     

Dehydroxylation and the Crystalline Phases in Sol-Gel Zirconia

The formation and evolution with temperature of the crystalline phases in sol-gel ZrO₂ was analyzed by using X-ray powder diffraction, refinement of the crystalline structures, ESR, and UV-Vis spectroscopy. The precursor phase of crystalline zirconia was amorphous Zr(OH)₄ with the same local order as the tetragonal crystalline phase. This amorphous phase dehydroxylated with temperature, generating nanocrystalline tetragonal zirconia, and producing point defects that stabilized the tetragonal structure, generated a paramagetic ESR signal with g values like the free electron, and had a light absorption band at 310 nm. When the sample was annealed at higher temperatures, it continued dehydroxilating, and the point defects disappeared, causing the transformation of the nanocrystalline tetragonal phase into nanocrystalline monoclinic zirconia. The two crystalline nanophases coexisted since the beginning of crystallization.     

溶胶-凝胶-水热晶化法制备锐钛矿TiO2纳米膜的耐蚀性能

以钛酸正丁酯为前驱体, 采用溶胶-凝胶-水热晶化法在不锈钢(SS)表面制备TiO₂纳米膜. 利用X射线衍射(XRD)、Raman光谱、场发射扫描电子显微镜(SEM)、原子力显微镜(AFM)和俄歇电子能谱(AES)表征了TiO₂纳米膜的晶型、表面形貌和表面化学组成. 通过极化曲线和电化学阻抗谱(EIS)研究了TiO₂纳米膜的耐蚀性能. 170 °C下水热晶化制备的锐钛矿TiO₂与450 °C焙烧制备的锐钛矿TiO₂的结晶度类似, 但两种TiO₂薄膜的表面结构存在明显差异, 水热晶化法制备的TiO₂纳米膜在3.5% (w) NaCl溶液中的耐蚀性能优于焙烧法制备的.     

双晶型TiO2薄膜的低温制备及表征

采用溶胶-凝胶法低温制备了具有锐钛矿、板钛矿双晶型的TiO2薄膜. 分别利用X射线衍射(XRD)、透射电子显微镜(TEM)、UV-Vis透光率曲线和原子力显微镜(AFM)等手段对所得TiO2溶胶和薄膜进行了性能表征. 采用光催化降解罗丹明B水溶液评价TiO2薄膜的光催化活性. 结果发现, 所得TiO2薄膜具有较高的透明度和光催化活性. 同时, 考察了溶胶回流温度对所制备TiO2薄膜性能的影响, 发现升高溶胶回流温度可以完善薄膜的晶型, 增大薄膜的粗糙度, 从而提高薄膜的光催化活性. 溶胶回流温度为100 ℃时所制备的TiO2薄膜具有最高的光催化活性.     

Structural evolution of nanostructured barium titanate thin film sol–gel derived

Ferroelectric nanostructured barium titanate (BT) thin films derived by a modified sol–gel process were formed by a deep coating method on Si (100) substrate. In this work was investigated the influence of different types and amounts of water (free water directly added in process and crystalline water from barium precursors) and of different barium precursors (hydroxide and acetate) on the gel-structure evolution and the barium titanate thin film crystallization. The IR-spectroscopy and X-ray diffraction analysis were used for sample characterization. Experimental results show that crystalline water from barium hydroxide octahydrate stabilizes the cubic phase of barium titanate. Barium titanate crystallizes in the tetragonal form in thin films when sols were prepared with free water and Ba-acetate or Ba-hydroxide monohydrate as precursors. The type of Ba-precursor used in preparation of sols effects the rate of crystallization of the BT in thin films, making it slower in the case when as precursor was used Ba-acetate than Ba-hydroxides. The prepared BT-thin films demonstrated good adhesion towards substrate and were smooth and uniform.     

Deposition of Silicon Carbide Thin Films from 1,1-Dimethyl-1-Silacyclobutane

1,1-Dimethyl-1-silacyclobutane was used as a single-source precursor to deposit SiC thin films on Si(100) and Si(111) by low-pressure chemical vapor deposition (LPCVD). Polycrystalline β-SiC thin films were grown at temperatures 1100 and 1200°C. At temperatures between 950 and 1100°C, amorphous thin films of silicon carbide were obtained. The films were studied by X-ray diffraction (XRD), infrared spectroscopy (IR), scanning electron microscopy (SEM), scanning transmission electron microscopy (STEM), and electron diffraction (ED).     

钌锡比对Ru-Ir-Sn氧化物阳极涂层性能的影响

应用溶胶凝胶法制备了不同钌锡摩尔比氧化物阳极涂层.SEM,EDX,强化电解寿命,循环伏安和电化学阻抗等测试表明,钌锡摩尔比对阳极涂层的表面形貌以及电化学性能有很大影响.随着钌含量的增加涂层的强化电解寿命呈先增加后降低变化,析氯电位呈先降低后增加;电流效率呈先增加后降低,与其对应的循环伏安电量以及双电层电容值亦呈先增加后减小变化.     

Mullite Based Compositions Prepared by Sol-Gel Techniques

Ceramic powders and gels in the multi-alumina system with different compositions were prepared by sol-gel method. The preparation of gels was done in strong acidic conditions and also with the addition of ammonia. The powders were prepared by dropping the sols on a hot plate. The effect of water/alkoxide and ethanol/alkoxide ratios was studied together with the type of catalyst used (hydrochloric acid or ammonia). The thermal evolution of materials was followed by thermal analysis, X-ray diffraction, specific surface area measurements and electron microscopy. The morphology of powders was also studied. The characteristic exothermic peak attributed to a good mixing degree of the Al and Si species was observed at ∼980°C. The intensity of this exothermic peak was more pronounced in gels than in sol-gel derived powders. The crystalline phases formed are related with the preparation conditions and with the thermal treatment. The crystallisation of mullite and transient phases of alumina were observed in powder samples heat treated at 1000°C while in gel samples mullite was the only crystalline phase detected.     

Elemental composition analysis of silicon carbonitride thin films by energy dispersive spectroscopy

Specific features of elemental composition analysis of silicon carbonitride thin films by energy dispersive spectroscopy (EDS) are considered. The films were preliminarily examined by IR spectroscopy, X-ray photoelectron spectroscopy (XPS), scanning electron (SEM) and atomic force microscopy (AFM), and X-ray diffraction analysis using synchrotron radiation (SR-XRD) to acquire data on their chemical and phase composition, crystalline structure and surface morphology. The effect of film thickness, substrate material and electron beam energy on the results of energy dispersive analysis was investigated.     

Composition and structure of platinum-containing thin composite films prepared from silica sols

Chemical processes that can occur during aging of sols based on water–alcohol solutions of tetraethoxysilane (TEOS) and hexachloroplatinic acid and during formation of films from these sols are analyzed by the results of visible and UV spectroscopy and X-ray powder diffraction. The sizes and compositions of the platinum particles that are formed in xerogels and in thin films on the nanometer and submicron levels are estimated based on X-ray crystallography, energy dispersive spectral analysis, high-resolution scanning and transmission electron microscopy, and grazing incidence small-angle X-ray scattering studies.     

Dielectric and Pyroelectric Properties of Compositionally Graded Pb(Zr1-xTix)O3 Thin Films Prepared by Sol-gel Process

"Compositionally graded ferroelectric lead zirconate titanate Pb(Zr1-xTix)O3 (PZT) thin films were grown on Pt/Ti/SiO2/Si substrates by using a sol-gel process. The final structure consists of six layers, up-graded graded films starting from PbZrO3 on the Pt electrode to the top PZT(50) layer, it consists of no Ti, 10%Ti, 20%Ti, 30%Ti, 40%Ti, and 50%Ti respectively. Whereas films with opposite gradient are called down-graded graded films. Structure and dielectric properties of the graded films was investigated by X-ray diffraction, Auger electron spectroscopy and by impedance analysis. The up-graded and down-graded PZT films annealed at 600 o, exhibited the remanent polarization values of 18.0 and 24.2 1C/cm2, respectively. The typical small signal dielectric constants and loss tanffi at a frequency of 100 Hz were 523 and 0.018, 544, and 0.020, respectively, for up-graded and down-graded PZT thin films. The temperature dependence of pyroelectric coeoients of the graded PZT films was measured by a dynamic technique. From 20 o to 82 o, the pyroelectric coeoients of the up-graded and down-graded PZT films up to 374 and 407 1C/m2K, respectively."     

Silica-Titania Mesostructured Films

Mesostructured silica-titania mixed oxide films in which the titania is well accessible on the silicate pore wall have been synthesized by a ligand-assisted templating (LAT) approach in combination with sol-gel processing. Control over the different hydrolysis and condensation rates of silicon and titanium alkoxides was achieved by complexation of the titanium species to the poly(ethylene oxide) part of an amphiphilic surfactant molecule (Brij56®). This modified precursor was used as structure-directing agent in the formation of thin mesostructured films. The structure and composition of the resulting material was characterized by X-ray diffraction, UV-vis spectroscopy and transmission electron microscopy.     

Microstructural and Spectroscopic Studies of Sol-Gel Derived Silica-Titania Waveguides

Silica-titania planar waveguides were prepared via the sol-gel method from acid-catalyzed solutions of firstly, ÿ-Glycidoxypropyltrimethoxysilane mixed with tetrapropylorthotitanate (labeled as GT), and secondly, ÿ-Glycidoxypropyltrimethoxysilane mixed with both tetrapropylorthotitanate and tetraethoxysilane (labeled as GTT). Atomic force microscopy, thermal gravimetric analysis, differential thermal analysis, UV-visible spectroscopy, Fourier transform infrared spectroscopy, and Raman spectroscopy were used to study the structural and optical properties of the waveguide films prepared from the two types of sols. The obtained results showed that in both cases, crack-free and highly transparent silica-titania films with a thickness of more than 0.5 m could be obtained by a single spin-coating process after a heat treatment at 500°C. The GT derived films showed more shrinkage and a higher refractive index after annealing as compared to the GTT derived films. When such films were deposited on a silica-on-silicon substrate to act as a surface planar waveguide, the light propagation loss was measured to be about 0.9 dB/cm and 1.3 dB/cm respectively. Raman spectroscopy results indicated that the GTT derived waveguide films with 0.5 molar titanium content contained amorphous carbon phase after being heated at above 500°C in air directly.     

Thermal imidization and structural evolution of thin films of poly(4,4'-oxydiphenylene p-pyromellitamic diethyl ester)

The evolution of chemical composition and structure during the thermal imidization of an ester-type polyimide precursor, poly(4,4'-oxydiphenylene p-pyromellitamic diethyl ester), in micrometer scale films were studied for a heating rate of 2.0 degrees C/min with time-resolved synchrotron X-ray diffraction, in-situ infrared spectroscopy, and modulated differential scanning calorimetry. Our analyses show that the precursor polymer undergoes imidization in a two-step process. In the first step, the precursor polymer is decomplexed from the residual solvent molecules, and in the second step, it undergoes imide ring formation with the release of ethanol as a byproduct. The imidization reaction starts around 210 degrees C and continues up to 320 degrees C. The thermal imidization reaction induces the structural evolution of the film. As the imidization reaction proceeds, the coherent length along the polymer chain axis increases. This imidization-induced structural evolution was found to occur via three steps: (i) initiation, (ii) the first crystallization, and (iii) the second crystallization. The initiation step is necessary prior to the evolution of the crystalline structure to increase the chain mobility of the precursor polymer chains, and it requires thermal heating up to at least 238 degrees C at which point 22.5% of the imidization is complete. Thereafter, the first crystallization occurs up to 310 degrees C, at which point 98.3% of the imidization is complete. In the range 310-380 degrees C, the second crystallization occurs and produces almost complete imidization of the polymer chains.     

Effect of sol-gel preparation method on particle morphology in pure and nanocomposite PZT thin films

Double-scale composite lead zirconate titanate Pb(Zr_0.52Ti_0.48)O₃ (PZT) thin films of 360 nm thickness were prepared by a modified composite sol-gel method. PZT films were deposited from both the pure sol and the composite suspension on Pt/Al₂O₃ substrates by the spin-coating method and were sintered at 650°C. The composite suspension formed after ultrasonic mixing of the PZT nanopowder and PZT sol at the powder/sol mass concentration 0.5 g mL⁻¹. PZT nanopowder (≈ 40–70 nm) was prepared using the conventional sol-gel method and calcination at 500°C. Pure PZT sol was prepared by a modified sol-gel method using a propan-1-ol/propane-1,2-diol mixture as a stabilizing solution. X-ray diffraction (XRD) analysis indicated that the thin films possess a single perovskite phase after their sintering at 650°C. The results of scanning electron microscope (SEM), energy-dispersive X-ray (EDX), atomic force microscopy (AFM), and transmission electron microscopy (TEM) analyses confirmed that the roughness of double-scale composite PZT films (≈ 17 nm) was significantly lower than that of PZT films prepared from pure sol (≈ 40 nm). The composite film consisted of nanosized PZT powder uniformly dispersed in the PZT matrix. In the surface micrograph of the film derived from sol, large round perovskite particles (≈ 100 nm) composed of small spherical individual nanoparticles (≈ 60 nm) were observed. The composite PZT film had a higher crystallinity degree and smoother surface morphology with necklace clusters of nanopowder particles in the sol-gel matrix compared to the pure PZT film. Microstructure of the composite PZT film can be characterized by a bimodal particle size distribution containing spherical perovskite particles from added PZT nanopowder and round perovskite particles from the sol-matrix, (≈ 30–50 nm and ≈ 100–120 nm), respectively. Effect of the PZT film preparation method on the morphology of pure and composite PZT thin films deposited on Pt/Al₂O₃ substrates was evaluated.     

TEM-induced structural evolution in amorphous Fe oxide nanoparticles

Exposure to the high energy electron beam of a TEM changes the morphology of amorphous Fe oxide nanoparticles from solid spheres to hollow shells. Amorphous Fe oxide nanoparticles prepared via high-temperature methods using hexadecylamine and trioctylphosphine oxide surfactants were compared to crystalline gamma-Fe2O3 particles of similar size. Both sets of particles are fully characterized via SQUID magnetometry, X-ray powder diffraction, BET surface analysis, EPR spectroscopy, high-resolution transmission electron microscopy (TEM), and electron energy loss spectroscopy (EELS). Time-resolved TEM images reveal that the amorphous Fe oxide particles evolve from solid spheres into hollow shells in <2 min, whereas crystalline gamma-Fe2O3 are unaffected by the electron beam. The resulting nanocrystalline Fe oxide shells bear striking resemblance to core-shell nanocrystals, but are a result of a morphology change attributed to restructuring of particle voids and defects induced by quasi-melting in the TEM. These results thus imply that caution is necessary when using TEM to analyze nanoparticle core-shell and heterostructured nanoparticles.     

Microstructure and properties of sol-gel derived Pb(Zr<Subscript>0.3</Subscript>Ti<Subscript>0.7</Subscript>)O<Subscript>3</Subscript> thin films on GaN/sapphire for nanoelectromechanical systems

Highly (111) oriented, phase-pure perovskite Pb(Zr_0.3Ti_0.7)O₃ (or PZT 30/70) thin films were deposited on single-crystal, (0001) wurtzite GaN/sapphire substrates using the sol-gel process and rapid thermal annealing. The phase, crystallinity, and stoichiometry of annealed PZT films were evaluated by X-ray diffraction and Rutherford backscattering spectroscopy. The atomic force microscopy revealed a smooth PZT surface (rms roughness ∼1.5 nm) with striations and undulations possibly influenced by the nature of the underlying GaN surface. The cross-sectional field-emission scanning electron microscopic images indicated a sharper PZT/GaN interface compared to that of sol-gel derived PZT on (111) Pt/TiO₂/SiO₂/(100) Si substrates. The capacitance-voltage (C-V) characteristics for PZT in the Pt/PZT/GaN (metal-ferroelectric-semiconductor or MFS) configuration were evaluated as a function of annealing temperature and applied voltage. The observed C-V hysteresis stemmed from trapped charge at defect sites within PZT. Also, the lower capacitance density (C/A = 0.35 μF/cm², where A is the area of an electrode) and remnant polarization (P _r ∼ 4 μC/cm²) for PZT in the MFS configuration, compared to the values for PZT in the MFM configuration (Pt/PZT/Pt), were attributed to the high depolarization field within PZT.     

Surface structure and properties of poly-(ethylene terephthalate) hydrolyzed by alkali and cutinase

This study was aimed at comparatively investigating the hydrolysis of crystalline and amorphous poly-(ethylene terephthalate) films by alkali and cutinase. Changes of surface properties were investigated by FTIR spectroscopy (ATR mode). The A₁₃₄₁/A₁₄₁₀ and I₁₁₂₀/I₁₁₀₀ absorbance ratios, and the full width at half maximum of the carbonyl stretching band (FWHM₁₇₁₅) were used to evaluate the polymer crystallinity and its changes upon hydrolysis. The effect of different treatments on chain orientation was evaluated by calculating R ratios of appropriate bands. The spectroscopic indexes showed that both alkali and enzyme treatments induced structural and conformational rearrangements with a consequent increase in crystallinity in both amorphous and crystalline films. The crystalline PET film was modified more strongly by alkali than by cutinase, while the opposite occurred for the amorphous one. The trend of the water contact angle (WCA) clearly indicates that alkali is more effective than cutinase in enhancing hydrophilicity of PET films and that the effect is stronger on amorphous than on crystalline films. The values of WCA correlate well with the FTIR indexes calculated from the spectra of hydrolyzed crystalline PET films. The mechanism of the surface hydrolysis of PET by alkali and cutinase is discussed.     

镍锡析氢活性阴极的电化学制备及其在碱性溶液中的电催化机理

采用恒电流电沉积法在铜箔基底上获得镍锡合金镀层电极. 电子能谱(EDS)、X射线衍射(XRD)以及高分辨透射电镜(HRTEM)分析表明, 随着锡含量的增加, 镀层由镍晶胚与非晶镍锡构成的非晶态结构转变为Ni₃Sn₄与Ni₃Sn₂的混晶结构. 扫描电镜(SEM)分析发现, 非晶结构镍锡合金电极表面粒子分布均匀且粒径细小, Ni₃Sn₄与Ni₃Sn₂混晶结构的镍锡合金电极表面粗糙且断面呈分层自组装结构. 在25℃, 1 mol·L^-1 NaOH溶液中的稳态极化曲线表明非晶结构的镍锡合金电极具有良好的催化活性, 其析氢过电位仅为85 mV. 交流阻抗测试表明, 非晶以及混晶结构的镍锡合金在析氢电催化反应过程中由电化学吸附(Volmer)以及电化学脱附(Heyrovsky) 两个电荷转移过程控制, 且非晶结构电极相比于Ni₃Sn₄与Ni₃Sn₂混晶结构电极的高活性源于其活性氢具有更快的电化学吸附以及脱附速度.