Enhancement of intensities in glow discharge mass spectrometry by using mixtures of argon and helium as plasma gases

Glow discharge mass spectrometry (GD-MS) is an excellent technique for fast multi-element analysis of pure metals. In addition to metallic impurities, non-metals also can be determined. However, the sensitivity for these elements can be limited due to their high first ionization potentials. Elements with a first ionization potential close to or higher than that of argon, which is commonly used as discharge gas in GD-MS analysis, are ionized with small efficiency only. To improve the sensitivity of GD-MS for such elements, the influence of different glow-discharge parameters on the peak intensity of carbon, chlorine, fluorine, nitrogen, phosphorus, oxygen, and sulfur in pure copper samples was investigated with an Element GD (Thermo Fisher Scientific) GD-MS. Discharge current, discharge gas flow, and discharge gas composition, the last of which turned out to have the greatest effect on the measured intensities, were varied. Argon–helium mixtures were used because of the very high potential of He to ionize other elements, especially in terms of the high energy level of its metastable states. The effect of different Ar–He compositions on the peak intensity of various impurities in pure copper was studied. With Ar–He mixtures, excellent signal enhancements were achieved in comparison with use of pure Ar as discharge gas. In this way, traceable linear calibration curves for phosphorus and sulfur down to the μg kg⁻¹ range could be established with high sensitivity and very good linearity using pressed powder samples for calibration. This was not possible when pure argon alone was used as discharge gas. This contribution is based on a presentation given at the Colloquium for Analytical Atomic Spectroscopy (CANAS ’07) held March 18–21, 2007 in Constance, Germany.     

Bias-current modulation technique of a radio-frequency glow discharge plasma for atomic emission analysis associated with a fast Fourier transform analyzer

A measuring method using a fast Fourier transform (FFT) analyzer is suggested to estimate the emission intensity from a radio-frequency (RF)-powered glow discharge plasma for atomic emission analysis. The FFT analyzer has an ability to disperse the components by frequency from an overall signal, and thus works as a selective detector in modulation spectroscopy. In the RF glow discharge plasma, a dc bias current can be introduced by connecting an external electric circuit with the discharge lamp, which predominantly enhances the emission intensities. Further, the bias current can be pulsated with a switching device to modulate the emission intensities, and then the modulated component was selectively detected with the FFT analyzer. This method greatly improved the data precision. The emission intensity of the Cu I 324.75-nm line in an Fe-based alloy sample containing 0.043 mass% Cu could be estimated with a relative standard deviation of 0.20%. The 3σ detection limits of Cu in Fe-based alloys could be obtained to be 2.3 × 10^− 6 mass% Cu for Cu I 324.75 nm and 6.8 × 10^− 6 mass% Cu for Cu I 327.40 nm.     

Conversion of natural gas to C2 hydrocarbons through dielectric-barrier discharge plasma catalysis

The experiments are carried out in the system of continuous flow reactors with dielectric-barrier discharge (DBD) for studies on the conversion of natural gas to C₂ hydrocarbons through plasma catalysis under the atmosphere pressure and room temperature. The influence of discharge frequency, structure of electrode, discharge voltage, number of electrode, ratio of H₂/CH₄, flow rate and catalyst on conversion of methane and selectivity of C₂ hydrocarbons are investigated. At the same time, the reaction process is investigated. Higher conversion of methane and selectivity of C₂ hydrocarbons are achieved and deposited carbons are eliminated by proper choice of parameters. The appropriate operation parameters in dielectric-barrier discharge plasma field are that the supply voltage is 20–40 kV (8.4–40 W), the frequency of power supply is 20 kHz, the structure of (b) electrode is suitable, and the flow of methane is 20–60 mL · min⁻¹. The conversion of methane can reach 45%, the selectivity of C₂ hydrocarbons is 76%, and the total selectivity of C₂ hydrocarbons and C₃ hydrocarbons is nearly 100%. The conversion of methane increases with the increase of voltage and decreases with the flow of methane increase; the selectivity of C₂ hydrocarbons decreases with the increase of voltage and increases with the flow of methane increase. The selectivity of C₂ hydrocarbons is improved with catalyst for conversion of natural gas to C₂ hydrocarbons in plasma field. Methane molecule collision with radicals is mainly responsible for product formation.     

Comparison of the cold vapor generation using NaBH4 and SnCl2 as reducing agents and atomic emission spectrometry for the determination of Hg with a microstrip microwave induced argon plasma exiting from the wafer

A 2.45 GHz low power microwave microstrip plasma (MSP) exiting the wafer and operated with Ar at atmospheric pressure was used for the optical emission spectrometric determination of Hg with the aid of a miniaturized optical fiber spectrometer with a CCD detector and the cold vapor (CV) generation technique using NaBH₄ and SnCl₂ as reductants. The experimental conditions were optimized with respect to the relative intensity of the Hg I 253.6 nm line and its signal-to-background intensity ratio (SBR). So as to understand the results of the optimization experiments, the excitation temperatures as measured from Ar I lines (T _exc) and the electron number densities (n _e) for the Ar MSP loaded with Hg vapors were determined and found to be in the range from 5500 to 6300 K and from 1.4 to 2.0 × 10¹⁴ cm⁻³, respectively. Under the optimized conditions, the detection limit for Hg of the CV-MSP-OES using SnCl₂ as the reducing agent was found to be much lower (0.11 ng mL⁻¹) than in the case where NaBH₄ was used (9 ng mL⁻¹). The linearity range was found to be up to 1 μg mL⁻¹ while the precision was of the order of 0.7–5%. The procedure with SnCl₂ as reductant was used for the determination of Hg at a concentration of 0.2 μg mL⁻¹ in synthetic water samples containing 1 to 4% (m/v) of NaCl with an accuracy of 3% as well as in a solution of the domestic sludge standard reference material (NIST SRM 2781) with a certified concentration for Hg of 3.64 ± 0.25 μg g⁻¹ for which 3.55 ± 0.41 μg g⁻¹ was found. Correspondence: J. A. C. Broekaert, Institut für Anorganische und Angewandte Chemie, Universit?t Hamburg, 20146 Hamburg, Germany     

Environmental application of elemental speciation analysis based on liquid or gas chromatography hyphenated to inductively coupled plasma mass spectrometry—A review

In recent years the number of environmental applications of elemental speciation analysis using inductively coupled plasma mass spectrometry (ICP-MS) as detector has increased significantly. The analytical characteristics, such as extremely low detection limits (LOD) for almost all elements, the wide linear range, the possibility for multi-elemental analysis and the possibility to apply isotope dilution mass spectrometry (IDMS) make ICP-MS an attractive tool for elemental speciation analysis. Two methodological approaches, i.e. the combination of ICP-MS with high performance liquid chromatography (HPLC) and gas chromatography (GC), dominate the field. Besides the investigation of metals and metalloids and their species (e.g. Sn, Hg, As), representing “classic” elements in environmental science, more recently other elements (e.g. P, S, Br, I) amenable to ICP-MS determination were addressed. In addition, the introduction of isotope dilution analysis and the development of isotopically labeled species-specific standards have contributed to the success of ICP-MS in the field. The aim of this review is to summarize these developments and to highlight recent trends in the environmental application of ICP-MS coupled to GC and HPLC.