Poly(ethylene oxide) thin films produced by electrospray deposition: morphology control and additive effects of alcohols on nanostructure

Nanostructured thin films were prepared by electrospray deposition (ESD) from poly(ethylene oxide) (PEO) aqueous solution. The surface morphologies of the deposited films were observed using scanning electron microscopy (SEM). The SEM images revealed the correlations between the morphologies and the ESD conditions. By changing the applied voltage and solution properties such as viscosity, surface tension, conductivity, and molecular weight, PEO thin films with diverse nanostructures--from nanospheres to nanofibers--were fabricated. It was also revealed that the addition of alcohols to polymer solution, which enables simultaneously changing the viscosity, the surface tension, and the conductivity, enhanced the formation of the fibrous structure. These results indicate that the ESD method is potentially a useful option for producing nanoengineered polymer surface.     

传感器用镓掺杂氧化锌纳米盘/纳米花状结构催化剂的制备及表面表征

采用简便的旋涂过程和一步水热法在压电基片上制备了Ga掺杂的ZnO纳米薄膜(GZO)。在水热处理过程中,通过添加不同的聚合物可形成纳米盘和纳米花状形貌的薄膜。采用场发射扫描电镜(Fe-SEM)、X射线衍射(XRD)和Raman光谱表征了样品的形貌、微结构和组成。 XRD和FE-SEM结果证明,在AlN/Si压电基片上形成的纳米盘、纳米棒和纳米花状GZO均为纤维锌矿相。采用浸渍法进一步在所制GZO样品上固定了绿色的荧光蛋白质(GFP)。运用原子力显微镜和荧光光谱分析了GFP与GZO表面结合的性质,考察了其用于传感器和生物成像技术的可行性。痕量GFP的固定使该材料产生荧光响应,表明其用于紫外光传感器时具有较好活性。     

Organic/inorganic hybrid nano-microstructured coatings on insulated substrates by electrospray deposition

Organic/inorganic hybrid nano-microstructured coatings on insulated polymer films were prepared by electrospray deposition (ESD) from an acrylic resin/silica sol blend solution. The surface morphologies of the coated films were observed using scanning electron microscopy (SEM). The SEM images showed that a nano-microscaled fibrous structure was formed on the film. The fiber diameter decreased from 4.4 microm to 600 nm with the increase in the silica sol content. Energy-dispersive X-ray analysis also revealed that silica atoms were homogeneously distributed in the fibrous structure on the polymer film. These results indicated that the ESD method is potentially a useful option for producing nano-microstructured coatings on not only conductive, but also insulating surfaces.     

复合方式对MWCNTs/TiO2纳米复合薄膜光电化学性能的影响

采用溶胶-凝胶法制备了不同复合方式的系列多壁碳纳米管(multi-walled carbon nanotubes, MWCNTs)/TiO2纳米复合薄膜电极. 通过SEM表征了薄膜的表面形貌, 并测定了MWCNTs引入前后对TiO2晶型结构和光吸收性能的影响以及不同复合方式的纳米复合薄膜的光电化学特性. 结果表明, MWCNTs/TiO2纳米复合薄膜表面形成无序多孔的形貌, 其光谱吸收边可拓展到可见光区; MWCNTs底层分布的纳米复合薄膜比纯TiO2表现出更好的光电活性, 而MWCNTs在表层分布及均匀分布的纳米复合薄膜的光电活性相对较差. 依据载流子分离原理探讨了不同复合方式对纳米复合薄膜光电性能的影响, 底层分布MWCNTs的纳米复合薄膜由于MWCNTs有效地收集传递电子并阻止载流子的复合从而提高了光电化学活性.     

溶胶-凝胶法在聚酰亚胺衬底上制备c轴取向ZnO薄膜

通过溶胶-凝胶工艺, 采用两步加热法在聚酰亚胺表面制备了具有c轴取向的ZnO薄膜. 通过差式扫描量热-热重分析(DSC-TGA)得出最佳的前热处理温度和后热处理温度分别为300和390 ℃. 通过X射线衍射(XRD)和扫描电子显微镜(SEM)对薄膜的晶体取向和表面形貌进行了分析, 描述了ZnO薄膜在聚酰亚胺上的生长过程. 拉伸实验结果表明, ZnO薄膜与聚酰亚胺衬底有较强的附着力.     

帽状铜纳米粒子的制备及表面增强拉曼散射活性研究

采用真空热蒸发法在SiO₂纳米粒子自组装单层膜上沉积铜薄膜制备了帽状铜纳米粒子。用扫描电镜、原子力显微镜和紫外-可见-近红外分光光度计对帽状复合纳米粒子的表面形貌和光学性质进行了表征。以亚甲基蓝和吡啶-(2-偶氮-4)间苯二酚为探针分子,研究了该复合纳米粒子的表面增强拉曼散射(SERS)活性。通过比较吸附在不同基底上的吡啶-(2-偶氮-4)间苯二酚的谱峰强度,探讨了SERS效应与表面等离子体共振(SPR)的关系。     

帽状金纳米结构的制备、表征及表面增强拉曼散射活性

采用真空离子溅射法在自组装的单层阵列二氧化硅纳米粒子表面沉积金薄膜, 制备了以SiO₂为核的帽状金纳米结构. 用透射电镜、扫描电镜、原子力显微镜、X 射线衍射仪和紫外-可见-近红外分光光度计对样品的表面形貌、结构及光学性质进行了表征. 以亚甲基蓝作为探针分子, 对金纳米帽的表面增强拉曼散射活性进行了研究, 结果显示, 吸附在金纳米帽上的分子拉曼散射信号得到显著增强, 增强因子达到10⁷数量级. 该基底在超灵敏生物和化学检测方面具有潜在的应用前景.     

Study of tri-layer antireflection coatings prepared by sol–gel method

Antireflective coatings (ARCs) on tri-layer thin film stacks were studied in this paper. Silica sols have been prepared by acid-catalyzed or base-catalyzed hydrolysis and condensation reactions of tetraethyl orthosilicate. Antireflective nanometric SiO₂/TiO₂ films are formed on both sides of the glass substrates by combining the sol–gel method and the dip-coating technique. Seen from the transmittance spectra of different films, a maximum light transmittance of 99.9% was obtained at the band of 300–800 nm. Scanning electron microscope (SEM) and atomic force microscopy (AFM) confirm the well-covered surface morphology. By the SEM observations we can see that the films are full of coverage on glass surface and containing no voids or cracks. The image root mean square roughness of the two types of ARCs provided by the AFM is 1.21 and 3.04 nm, respectively. Furthermore, a surface profiler was used to determine the thickness of each layer in the obtained multi-layer coating system.     

聚(ε-己内酯)薄膜结晶形貌及分子取向研究

用匀胶机通过溶液铸膜方法在硅片和铝箔基板上分别制备具有不同厚度的聚(ε-己内酯)(PCL)薄膜. 通过原子力显微镜(AFM)和偏光衰减全反射傅里叶红外光谱(ATR-FTIR)对薄膜中PCL的结晶形貌、 片晶生长方式及分子链取向进行了研究. AFM结果表明, 在200 nm或更厚的薄膜中, PCL主要以侧立(edge-on)片晶的方式生长; 对于厚度小于200 nm的薄膜, PCL片晶更倾向于以平躺(flat-on)的方式生长. 这种片晶生长方式的改变在硅片和铝箔基板上都表现出同样的倾向. 此外, 在15 nm或更薄的薄膜中, PCL结晶由通常的球晶结构变为树枝状晶体. 偏光ATR-FTIR结果表明, 当膜厚小于200 nm时, 薄膜结晶中PCL分子链沿垂直于基板表面方向取向, 并且膜越薄, 取向程度越高, 与AFM的观测结果一致.     

Piezoelectricity of ZnO Films Prepared by Sol-Gel Method

"ZnO piezoelectric thin films were prepared on crystal substrate Si(111) by sol-gel technology, then characterized by scanning electron microscopy, X-ray diffraction and atomic force microscopy (AFM). The ZnO films characterized by X-ray diffraction are highly oriented in (002) direction with the growing of the film thickness. The morphologies, roughness and grain size of ZnO film investigated by AFM show that roughness and grain size of ZnO piezoelectric films decrease with the increase of the film thickness. The roughness dimension is 2.188-0.914 nm. The piezoelectric coeocient d33 was investigated with a piezo-response force microscope (PFM). The results show that the piezoelectric coeocient increases with the increase of thickness and (002) orientation. When the force reference is close to surface roughness of the films, the piezoelectric coefficient measured is inaccurate and fluctuates in a large range, but when the force reference is big, the piezoelectric coeocient d33 changes little and ultimately keeps constant at a low frequency."     

自组装制备二氧化铪图案化薄膜

采用短波紫外光(UV)在十八烷基三氯硅烷(OTS)自组装单分子层刻蚀不同的微型图案,利用液相自组装技术在OTS模板表面沉积HfO₂图案化薄膜。通过XRD、AFM、SEM、EDS等测试手段对OTS膜和HfO₂薄膜进行表征,结果表明：以OTS为模板利用液相自组装技术成功制备出边缘轮廓清晰、粗糙度较小、条纹宽度为10μm的立方晶型的HfO₂图案化薄膜。     

Atomic force microscopy imaging of molybdenum oxide film electrodeposited on a carbon electrode

Non-stoichiometric mixed-valent molybdenum(VI, V) oxide film was grown on carbon substrates by the electrodeposition method. Responses of the prepared molybdenum oxide thin films to potential and to different solution acidities were studied by cyclic voltammetry, and the corresponding morphological changes of the film were monitored by atomic force microscopy (AFM). AFM images of the molybdenum oxide film show that the characteristic domed structure on the film surface increased during the transition from the oxidized state to the reduced state without signification change in the RMS surface roughness value. Furthermore, AFM studies show that the solution acidity has great effect on the morphology of the films, and the films undergo a homogenizing process with increasing pH of the solutions.     

Comparison of resistance to protein adsorption and stability of thin films derived from alpha-hepta-(ethylene glycol) methyl omega-undecenyl ether on HSi(111) and HSi(100) surfaces

Oligo(ethylene glycol)-terminated thin films were prepared by photo-induced hydrosilylation of alpha-hepta-(ethylene glycol) methyl omega-undecenyl ether (EG(7)) on hydrogen-terminated silicon (111) and (100) surfaces. Their resistance to protein adsorption, and stabilities (from hours to days) under a wide variety of conditions, such as air, water, biological buffer, acid, and base, were investigated using contact-angle goniometry and ellipsometry techniques. Results indicated higher stability of the films chemisorbed on Si(111) than on Si(100). Furthermore, micron-sized patterns were fabricated on the films via AFM anodization lithography. Using atomic force microscopy (AFM) and fluorescence microscopy, we demonstrated that various proteins including fibrinogen, avidin, and bovine serum albumin (BSA) predominately adsorbed onto the patterns, but not the rest of the film surfaces.     

Synthesis of thin dense titania films via an aqueous solution-gel method

Nanostructured titanium dioxide films have been reported to be used in many applications ranging from optics and solar energy devices to gas sensors. This work describes the synthesis of nanocrystalline titania films via an aqueous solution-gel method. The thin films are deposited by spin coating an aqueous citratoperoxo-Ti(IV)-precursor solution onto a silicon substrate. The influence of processing parameters like Ti⁴⁺ concentration and crystallization temperature on the phase formation, crystallite size and surface morphology of the films is studied by X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM) and atomic force microscopy (AFM). Furthermore, the effect of successive layer deposition on the film thickness of the resulting films is studied by means of cross sectional SEM. SEM and TEM micrographs clearly show that, after optimization of the process parameters, thin, smooth, dense nanocrystalline films are synthesized in a reproducible manner. The films are composed of 15–20 nm grains. At higher crystallization temperatures (600, 650°C) also larger particles (40–70 nm) are present. XRD data reveal that a phase pure anatase film is formed at 450°C. Crystallization temperatures equal to or higher than 600 °C however give rise to the formation of both the anatase and rutile crystalline phases. The smoothness of the films is proved by their very low rms surface roughness (≤1.1 nm) measured by AFM.     

聚羟基丁酸酯共聚物超薄膜中向日葵晶形成的原子力显微镜观察

低维数下的高分子(如在二维薄膜或一维管道及孔洞中)的各种行为由于更加触及高分子的动力学、热力学本质而逐渐成为高分子科学研究的热点之一．实验表明,薄膜中聚合物的玻璃化转变温度、结晶动力学及形貌等与本体有很大的偏离．我们先前的研究结果表明,在基板的作用下,共混物薄膜的相形态会发生逆转;     

Characterization of vapor deposition polymerized polyimide thin films

Vapor deposition polymerized (VDP) polyimide (PI) thin films were prepared and characterized by using thermogravimetrical analysis (TGA), scanning electron microscopy (SEM), atomic force microscopy (AFM), Fourier transform infrared (FTIR), and bending-beam techniques. The film properties investigated were thermal stability, wet-etching characteristics, surface topology, imidization characteristics, internal stress upon curing and thermal cycling, and hygroscopic stress upon moisture diffusion. Markedly different characteristics are observed for the VDP-PI films when comparing with the conventional ones. They seem denser in film structure and have better mechanical properties, but are somewhat less stable in thermal resistance. © 1996 John Wiley & Sons, Inc.     

Comparative characterisation by atomic force microscopy and ellipsometry of soft and solid thin films

Ellipsometry and atomic force microscopy (AFM) were used to study the film thickness and the surface roughness of both ‘soft’ and solid thin films. ‘Soft’ polymer thin films of polystyrene and poly(styrene–ethylene/butylene–styrene) block copolymer were prepared by spin‐coating onto planar silicon wafers. Ellipsometric parameters were fitted by the Cauchy approach using a two‐layer model with planar boundaries between the layers. The smooth surfaces of the prepared polymer films were confirmed by AFM. There is good agreement between AFM and ellipsometry in the 80–130 nm thickness range. Semiconductor surfaces (Si) obtained by anisotropic chemical etching were investigated as an example of a randomly rough surface. To define roughness parameters by ellipsometry, the top rough layers were treated as thin films according to the Bruggeman effective medium approximation (BEMA). Surface roughness values measured by AFM and ellipsometry show the same tendency of increasing roughness with increased etching time, although AFM results depend on the used window size. The combined use of both methods appears to offer the most comprehensive route to quantitative surface roughness characterisation of solid films. Copyright © 2007 John Wiley & Sons, Ltd.     

Shape controlled synthesis of CaMoO4 thin films and their photoluminescence property

CaMoO₄ (CMO) disordered and ordered thin films were prepared by the complex polymerization method (CPM). The films were annealed at different temperatures and time in a conventional resistive furnace (RF) and in a microwave (MW) oven. The microstructure and surface morphology of the structure were monitored by atomic force microscopy (AFM) and high-resolution scanning electron microscopy (HRSEM). Order and disorder were characterized by X-ray diffraction (XRD) and optical reflectance. A strong photoluminescence (PL) emission was observed in the disordered thin films and was attributed to complex cluster vacancies. The experimental results were compared with density functional and Hartree-Fock calculations.     

Functionalized imidazolium wear‐resistant ionic liquid ultrathin films for MEMS/NEMS applications

As a kind of new material, ionic liquids (ILs) are considered a new type of lubricant for micro/nanoelectromechanical system (M/NEMS) due to their excellent thermal and electrical conductivity. However, so far, only a few reports have investigated the friction and wear of thin films of these materials at the micro scale. Evaluating the nanoscale tribological performance of ILs when applied as films of a few nanometers thickness on a substrate is a critical step for their application in M/NEMS devices. To achieve this purpose, IL thin films with four kinds of anions were synthesized and prepared on single‐crystal silicon wafers by the dip‐coating method. Film thickness was determined by the ellipsometric method. Their surface morphologies were observed by means of atomic force microscopy (AFM). The nano and micro tribological properties of the IL films were investigated by a friction force microscope (FFM)with a spherical probe and a UMT‐2MT tribotester, respectively. The corresponding morphologies of the wear tracks of the IL films were examined using a three‐dimensional non‐contact interferometric microscope. The impact of temperature on the adhesion behavior was studied, as well as the effect of sliding frequency and load on the friction coefficient, load bearing capacity and anti‐wear durability. It was found that friction, adhesion and durability of IL films were strongly dependent on their anionic molecular structures, wettability and ambient environment. Copyright © 2010 John Wiley & Sons, Ltd.     

总气压与Ar/O2流量比对直流对向靶磁控溅射TiO2薄膜光催化性能的影响

采用对向靶磁控溅射法在不同气压和Ar/O₂流量比条件下, 以氟化SnO₂ (FTO)导电玻璃为基底制备了多晶TiO₂薄膜. 台阶仪测量结果显示所制备TiO₂薄膜的平均厚度约为200 nm. 随着溅射气压的升高, TiO₂薄膜由锐钛矿与金红石混晶结构转变为纯锐钛矿结构. 分别采用场发射扫描电镜(FESEM)和原子力显微镜(AFM)分析了不同气压和Ar/O₂流量比对TiO₂薄膜表面形貌的影响, 结果显示TiO₂薄膜的表面粗糙度随溅射总气压和Ar/O₂流量比的增加而增大. 以初始浓度为100×10^-6 (体积分数)的异丙醇(IPA)气体为目标物检测所制备TiO₂薄膜的光催化性能, 并分析该气相光催化反应的机理, 在紫外照射条件下异丙醇先氧化为丙酮再被氧化为CO₂.当总溅射气压为2.0 Pa、Ar/O₂流量比为1:1时, 溅射所得TiO₂薄膜具备最优光催化活性并可在IPA降解反应中保持较高的催化活性和稳定性.