High-resolution X-ray focusing concave (elliptical) curved crystal spectrograph for laser-produced plasma

The X-ray spectrum emitted, from laser-produced plasma contains plentiful information. X-ray spectrometer is a powerful tool for plasma diagnosis and studying the information and evolution of the plasma. X-ray concave (elliptical) curved crystals analyzer was designed and manufactured to investigate the properties of laser-produced plasma. The experiment was carried out on Mianyang Xingguang-Ⅱ Facility and aimed at investigating the characteristics of a high density iron plasma. Experimental results using KAP, LIF, PET, and MICA curved crystal analyzers are described, and the spectra of Au, Ti laser-produced plasma are shown. The focusing crystal analyzer clearly gave an increase in sensitivity over a flat crystal.     

Elliptically-bent crystal spectrograph for X-ray diagnosis of laser-produced plasmas

In order to measure spatially and temporarily resolved laser-produced plasma X-ray spectra in 0.2 - 2nm region, a novel two-channel elliptically-bent crystal spectrograph has been developed. Dispersive elements are LiF, PET, Mica, and KAP crystals, which cover Bragg angles in the range of 30 - 67.5degrees. Eccentricity and focal distance of twin ellipses are 0.9586 and 1350 mm, respectively. Spatially resolved spectrum is photographically recorded with an X-ray film or X-CCD camera in one channel, and temporarily resolved one is photographically recorded with an X-ray streak camera in another channel,thus spatially and temporarily resolved spectra can be simultaneously obtained. Spectral images were acquired with X-CCD and PET in SHENGUANG-Ⅱ laser facility, and experimental results show that the spectral resolution of the spectrograph is about 0.002 nm.     

高分辨椭圆弯晶谱仪在激光等离子体实验中的应用

 描述了用于激光等离子体X射线光谱研究的椭圆弯曲晶体谱仪系统。在“神光Ⅱ”第九路激光上对该谱仪进行标定实验,利用CCD相机成功地获得了激光等离子体铝和钛离子的K壳层和金离子M壳层谱;通过研究和辨认谱线,得到了X射线光谱,同时还给出了实验测定的谱仪分辨率。椭圆弯曲晶体谱仪除有高的收集光子效率外,还有更好的谱分辨和空间分辨率。分析了椭圆弯曲晶体谱仪在前沿科学技术和高技术实验中的应用。     

高分辨椭圆弯晶谱仪在激光等离子体实验中的应用

描述了用于激光等离子体X射线光谱研究的椭圆弯曲晶体谱仪系统。在“神光Ⅱ”第九路激光上对该谱仪进行标定实验,利用CCD相机成功地获得了激光等离子体铝和钛离子的K壳层和金离子M壳层谱;通过研究和辨认谱线,得到了X射线光谱,同时还给出了实验测定的谱仪分辨率。椭圆弯曲晶体谱仪除有高的收集光子效率外,还有更好的谱分辨和空间分辨率。分析了椭圆弯曲晶体谱仪在前沿科学技术和高技术实验中的应用。     

Broadband time-resolved elliptical crystal spectrometer for X-ray spectroscopic measurements in laser-produced plasmas

The X-ray spectrometer used in high-energy-density plasma experiments generally requires both broad X-ray energy coverage and high temporal, spatial, and spectral resolutions for overcoming the difficulties imposed by the X-ray background, debris, and mechanical shocks. By using an elliptical crystal together with a streak camera, we resolve this issue at the SG-II laser facility. The carefully designed elliptical crystal has a broad spectral coverage with high resolution, strong rejection of the diffuse and/or fluorescent background radiation, and negligible source broadening for extended sources.The spectra that are Bragg reflected(23?< θ < 38?) from the crystal are focused onto a streak camera slit 18 mm long and about 80 μm wide, to obtain a time-resolved spectrum. With experimental measurements, we demonstrate that the quartz(1011) elliptical analyzer at the SG-II laser facility has a single-shot spectral range of(4.64–6.45) keV, a typical spectral resolution of E/?E = 560, and an enhanced focusing power in the spectral dimension. For titanium(Ti) data, the lines of interest show a distribution as a function of time and the temporal variations of the He-α and Li-like Ti satellite lines and their spatial profiles show intensity peak red shifts. The spectrometer sensitivity is illustrated with a temporal resolution of better than 25 ps, which satisfies the near-term requirements of high-energy-density physics experiments.     

Focusing crystal mirrors for X-ray diagnostics of laser-produced plasma

The paper describes an investigation of the characteristics of spherical focusing Bragg-reflection mirrors. The integral reflectivity of bent crystals at Bragg angles 80–90°, the width of the spectrum of the reflected x-rays, and the spatial resolution of the images formed by the focusing crystals are considered. Results are presented of the calculated integral reflectivity of bent silicon and quartz crystals of different orientation and in different orders of reflection. The feasibility is demonstrated of laser-plasma diagnostics using the images obtained with the aid of a multichannel x-ray microscope based on focusing crystals. Possible schemes of active diagnostics of a dense laser plasma using a monochromatic transilluminating x-ray beam are considered.Laser Plasma Laboratory, Lebedev Physics Institute. Translated from FIAN Preprint No. 143, Lebedev Physics Institute of the Academy of Sciences of the USSR, Moscow, 1989.     

Band tunable X-ray flat crystal spectrometer for laser-produced plasma spectroscopy measurements

An updated design of a band-tunable flat crystal spectrometer is presented. The new configuration contributes to a broad spectral coverage with greater resolving power, a strong rejection of hard X-ray backgrounds, and decreased sensitivity to source broadening for an extended source. To verify the performance of the spectrometer, spectral lines were measured using a potassium acid phthalate crystal for highly ionized species of aluminum or silicon, and the results were compared by measuring H- and He-like Al and Si lines by rotating the crystal to selected Bragg angles, at the Shenguang II laser facility. The observed energy-coverage range is consistent with the theoretical predictions, as well as with the measured spectral resolution of ~300.     

High resolution X-ray spherically bent crystal spectrometer for laser-produced plasma diagnostics

A new high spectral resolution crystal spectrometer is designed to measure very low emissive X-ray spectra of laser-produced plasma in 0.5-0.9 nm range. A large open aperture （30 ×20 （mm）） mica （002） spherically bent crystal with curvature radius R = 380 mm is used as dispersive and focusing element. The imaging plate is employed to obtain high spectral resolution with effective area of 30 × 80 （mm）. The long designed path of the X-ray spectrometer beam is 980 mm from the source to the detector via the crystal. Experiment is carried out at a 20-J laser facility. X-ray spectra in an absolute intensity scale is obtained from Al laserproduced plasmas created by laser energy of 6.78 J. Samples of spectra obtained with spectral resolution of up to E/△E - 1500 are presented. The results clearly show that the device is good to diagnose laser high-density plasmas.     

High-resolution soft X-ray emission spectrograph at advanced light source

The progress of valence electronic spectroscopy with X-rays has been largely limited by the challenge of fine instrumentation. Relatively weak scattering cross-section and/or limited (coarse) energy resolution restrict X-ray spectroscopy to address fundamental issues in condensed-matter electron physics. Depending on the nature of excitations, high brightness photon beam from third-generation synchrotron facilities helps raise the count rates to a detectable limit over the noise level. Over the past decade, it has been realized that high-resolution resonant inelastic soft X-ray scattering has the potential to play an important role in understanding complex phenomena observed in highly correlated systems. Driven by such demand, we have developed a soft X-ray emission spectrograph based on variable line spacing (VLS) gratings to work in the soft X-ray and deep UV (the M edge of transition metals) regime. The slit-less design coupled with high quality optical elements and a high quantum efficiency (QE) in-vacuum CCD detector greatly improves the overall throughput. The M edge spectrograph has been demonstrated to have a resolving power better than 10,000 and will be used in conjunction with meV-resolution beamline (MERLIN) at the Advanced Light Source at Lawrence Berkeley National Laboratory.     

激光等离子体球面晶体光谱成像

 利用自聚焦原理,研制了一种新型的球面弯晶谱仪。晶体分析器采用云母材料,其弯曲半径为380 mm,布拉格角为51°。利用成像板接收光谱信号,其有效面积为30 mm×80 mm,从等离子体源经晶体到成像板的光程长为980 mm。物理实验在中国工程物理研究院激光聚变研究中心20 J激光装置上进行,入射激光能量为6.78 J,成像板获得了铝激光等离子体X射线的光谱空间分辨信号。球面云母弯晶谱仪的光谱分辨率达到1 000～1 500,在相同环境放置的PET平晶的光谱分辨率为50～100。结果表明：球面弯晶具有较高的光谱分辨率和信噪比,适合于激光等离子体X射线的光谱学研究。     

激光等离子体球面晶体光谱成像

利用自聚焦原理,研制了一种新型的球面弯晶谱仪。晶体分析器采用云母材料,其弯曲半径为380 mm,布拉格角为51°。利用成像板接收光谱信号,其有效面积为30 mm×80 mm,从等离子体源经晶体到成像板的光程长为980 mm。物理实验在中国工程物理研究院激光聚变研究中心20 J激光装置上进行,入射激光能量为6.78 J,成像板获得了铝激光等离子体X射线的光谱空间分辨信号。球面云母弯晶谱仪的光谱分辨率达到1 000～1 500,在相同环境放置的PET平晶的光谱分辨率为50～100。结果表明：球面弯晶具有较高的光谱分辨率和信噪比,适合于激光等离子体X射线的光谱学研究。     

用于Z箍缩X辐射谱诊断的柱面凸晶摄谱仪的性能分析

 考虑X光源的空间尺寸和晶体的摇摆曲线,用光线追迹方法计算了诊断丝阵Z箍缩等离子体X辐射谱的柱面凸晶摄谱仪的色散、能谱分辨和空间分辨以及系统参数对它们的影响。结果表明：决定柱面凸晶摄谱仪能谱分辨的主要因素是光源尺寸以及光源-晶体之间距离;增大光源-晶体之间距离能够改善能谱分辨,但导致径向空间分辨能力下降。并依此建立了云母晶体摄谱仪,在“强光一号”装置上对系统进行了测试,获得时间积分铝丝阵负载Z箍缩等离子体X辐射谱。     

用于Z箍缩X辐射谱诊断的柱面凸晶摄谱仪的性能分析

考虑X光源的空间尺寸和晶体的摇摆曲线,用光线追迹方法计算了诊断丝阵Z箍缩等离子体X辐射谱的柱面凸晶摄谱仪的色散、能谱分辨和空间分辨以及系统参数对它们的影响。结果表明：决定柱面凸晶摄谱仪能谱分辨的主要因素是光源尺寸以及光源-晶体之间距离;增大光源-晶体之间距离能够改善能谱分辨,但导致径向空间分辨能力下降。并依此建立了云母晶体摄谱仪,在“强光一号”装置上对系统进行了测试,获得时间积分铝丝阵负载Z箍缩等离子体X辐射谱。     

A concave photonic crystal waveguide with a corrugated surface for high-quality focusing

A concave two-dimensional(2D) photonic crystal waveguide(PCW) with corrugated surface is theoretically used as a focusing structure.To design this structure,a genetic algorithm is combined with the finite-difference time-domain method.For PCWs with different degrees of concaveness,the power reaches about 80% at different focusing points when the morphology of the concave surface is optimized.More importantly,the focusing location is easily controlled by changing the location of the detector placed in the output field.     

用云母弯晶谱仪探测Z箍缩等离子体X射线光谱

 为了研究Z箍缩等离子体辐射的X射线光谱,研制了可用于“阳”加速器上探测宽频谱范围的X射线椭圆弯曲晶体谱仪。该谱仪晶体分析器采用云母材料,椭圆焦距为1 350 mm,离心率为0.948 5,覆盖布拉格范围为30°~60°,可探测X射线波长范围为0.10~1.73 nm(0.86~1.00 nm除外),用X射线胶片接收光谱信号。探测实验在中国工程物理研究院“阳”加速器上进行,实验结果表明:谱仪获取了氩的类氢共振线L_ya及其伴线、类氦共振线(1s2p¹P₁-1s2¹S₀)w线及磁四级M₂2跃迁(1s2p³P₂-1s²¹S₀)x线、互组合跃迁(1s2p³P₁-1s²¹S­₀)y线、禁戒谱线(1s2p³S₁-1s²¹S₀)z线和K­_-a线,谱线分辨率达到564。实验证明弯晶谱仪适合于Z箍缩等离子体X射线光谱学诊断。     

激光产生的CuⅩⅩⅡ离子X光谱线辨认

用TIAP晶体谱仪拍摄了8～14(?)波长范围内铜的激光等离子体X光谱,以铜的类氧离子为例,采用由能级值反推跃迁波长的方法,同时结合等电子序列的莫塞莱定律,归类了2p~3ss—2s~22p~4和2p~33d—2s~22p~4之间一百多条新的谱线,与实验结果相比较,大部分波长误差在±5m(?)以内.     

基于离散小波包变换的规整化波前解卷积

直接波前解卷积可以有效地克服大气湍流对天文观测的影响,但解卷积问题具有病态特性,必须进行规整化。基于奇异值分解的规整化方法在处理图像边缘等高频部分不够理想;而WVD方法仅适用某些解卷积问题。在提出一种基于小波包变换的新规整化方法的基础上,将此方法应用于室内模拟点源实验中,并与基于奇异值分解规整化的维纳逆滤波进行了对比,实验结果表明：该规整化方法可以有效地解决解卷积问题的病态特性,应用该规整化方法所恢复的图像质量明显提高。     

斜辐照激光等离子体辐射X光子特性

 在神光Ⅱ高功率激光装置上,实验研究了激光斜辐照形成的激光等离子体辐射X射线光子的特性及真空喷射热等离子体流的方向。采用针孔X射线相机测量了钕玻璃激光（基频1.053 μm）辐照铝靶形成的激光铝等离子体辐射的X射线光子的空间分布,并针对正入射和入射激光斜辐照情况下测得的X射线光子量及特性进行了分析和比较。结果发现：入射激光斜辐照固体平面靶产生的向真空喷射热等离子体流的方向是垂直靶面（即法线方向）;正入射和斜入射激光叠加驱动靶时,一定程度上能改善激光辐照的均匀性,但等离子体源辐射的X射线光子数并未发现显著地增加;当激光斜辐照与靶相互作用时,激光能量被等离子体吸收下降。     

作为X激光增益介质的激光等离子体特性

本文报道利用具有空间分辨能力的透射光栅谱仪对以三体复合泵浦实现锂离子(Si~(11+)X光自发辐射放大的增益介质——硅激光等离子体特性的研究。结果表明,等离子体5～100A范围软X线辐射主要来自类氦离子(Si~(12+))到(S~(11+))复合辐射和Si~(11+)(n=3→n=2)跃迁发射的贡献,且它们辐射的最大强度距靶面130μm,对应的电子密度3×10~(20)cm~(-3)与Si~(11+)+1s~23d能级的粒子数相对丰度比36;实验中还观察到Si~(11+)(1s~23d-1s~22p)跃迁发射存在着明显的自吸收现象。     

Analysis of X-ray spectra emitted from a laser-produced lead plasma

X-ray spectra emitted by a laser produced plasma are analyzed using calculated X-ray energies for Co-, Ni-, Cu-, Zn-, Ga-, Ge-, As-, Se-, Br-, Kr-, Rb-, Sr-, Y-, and Zr-like lead ions. The charge state distribution in the plasma is studied and a functional dependence of this distribution as a function of the ionic charge, atomic number, free electron density and temperature in the plasma is proposed.