一维Co单晶纳米线的x射线研究

对电化学沉积法在多孔氧化铝中制备的一维单晶Co纳米线阵列的结构和形态利用各种x射线衍射测量方法进行了细致的表征.确定了阵列中的纳米线在线长方向均为一致的晶体学取向，并以很高的平行度排列.并且发现生长条件可能在一维纳米线中引起不同程度的螺旋晶格曲扭.根据实验观察结果提出了一个具有手性的螺旋曲扭模型.利用超导量子干涉磁强计测量了样品在300K下的磁特性，分析发现螺旋扭曲可以在相当大的程度上改变纳米线阵列的各向异性.说明利用磁弹性效应有可能有效地调节纳米线的磁各向异性. 关键词： 纳米线 单晶 x射线摇摆曲线 x射线极图     

X射线双晶衍射技术的发展及应用

简要介绍了X射线双晶衍射技术的原理;描述了双晶衍射技术的发展与演化,中简要讲述了多晶衍射技术的应用范围及应用鑫晶衍射仪所能做的工作。     

用电泳法制备ZnxMg1-xO薄膜及其特性研究

用电泳法制备了一系列ZnxMg1 -xO薄膜 .对ZnxMg1 -xO薄膜的光致发光研究表明 ,在薄膜发射谱的紫外区域有两个显著的峰 ,分别对应自由激子和激子间碰撞的发光 .在可见光区域 ,发射谱的强度基本保持恒定 ,没有发现通常报道的绿光发射 ,说明生长的薄膜中氧与其他元素保持很好的化学配比 ,抑制了基于氧空位的绿带发射机理 .另一方面 ,薄膜成分中Mg含量的变化和退火温度的变化对薄膜的发射谱有显著的影响 ,表现在ZnxMg1 -xO的紫外发射峰随Mg含量的增加向短波方向移动 ,同时峰强度随退火温度的升高显著增加     

利用x射线小角散射技术研究微晶硅薄膜的微结构

采用x射线小角散射（SAXS）技术研究了由射频等离子体增强化学气相沉积（rf-PECVD）、 热丝化学气相沉积(HWCVD)和等离子体助热丝化学气相沉积(PE-HWCVD)技术制备的微晶硅（ μc-Si:H）薄膜的微结构.实验发现，在相同晶态比的情况下，PECVD沉积的μc-Si:H薄膜微 空洞体积比小，结构较致密，HWCVD沉积的μ-Si:H薄膜微空洞体积比大，结构较为疏松，PE -HWCVD沉积的μc-Si:H薄膜，由于等离子体的敲打作用，与HWCVD样品相比，微结构得到明 显改善.采用HWCVD二步法和PE-HWCVD加适量Ar离子分别沉积μc-Si:H薄膜，实验表明，微结 构参数得到了进一步改善.45°倾角的SAXS测量显示，不同方法制备的μc-Si:H薄膜中微空 洞分布都呈各向异性.红外光谱测量也证实了SAXS的结果. 关键词： 微晶硅薄膜 微结构 微空洞 x射线小角散射     

用电泳法制备ZnxMg1-xO薄膜及其特性研究

用电泳法制备了一系列ZnxMg1-xO薄膜. 对ZnxMg1-xO薄膜的光致发光研究表明，在薄膜发射谱的紫外区域有两个显著的峰，分别对应自由激子和激子间碰撞的发光. 在可见光区域，发射谱的强度基本保持恒定，没有发现通常报道的绿光发射，说明生长的薄膜中氧与其他元素保持很好的 化学配比，抑制了基于氧空位的绿带发射机理. 另一方面，薄膜成分中Mg含量的变化和退火 温度的变化对薄膜的发射谱有显著的影响，表现在ZnxMg1-xO的紫 外发射峰随Mg含量的增加向短波方向移动，同时峰强度随退火温度的升高显著增加. 关键词： 发射谱 x射线衍射 电泳法 ZnMgO薄膜     

Yb掺杂C60薄膜的x射线光电子能谱研究

在超高真空系统中制备了C60的Yb填隙化合物薄膜.用x射线光电子能谱研究了Yb和C60结合过程中C1s,Yb4f和Yb4d的变化.利用Yb4f和C1s的谱峰强度确定出相纯样品的化学组分接近Yb2.75C60,这一结果与晶体x射线衍射结果一致.Yb4f和Yb4d的峰形与峰位表明化合物中Yb的价态为Yb2+.相纯样品(Yb2.75C60)的C1s峰位相对于纯C60向低结合能方向移动约0.5eV.C1s结合能减小说明有Yb6s电子转移到C60的最低未充填分子轨道能带上.结合能变化大小及峰宽的具体数值为进一步在薄膜样品上研究Yb2.75C60提供了表征样品的手段.     

高分辨率多晶多反射X射线衍射仪在半导体材料分析中的应用

用高分辨率多晶多反射Ｘ射线衍射仪进行衍射空间的二维扫描是目前非损伤性表生半导体材料质量的手段之一。不同质量的材料在二维衍射空间中的衍射图形状不同。本文以ＧａＡＳ／ＡｌＧａＡｓ为例，展示了如何利用Ｘ射线的二维衍射空间图的形状来定性地分析半导体单晶样品的宏观弯曲，微观倾斜，组分梯度，应变，弛豫以及平行于界面的连续性等问题。     

同步辐射硬x射线衍射增强成像新进展

对于相位衬度成像的实验方法研究及其在医学、材料等领域的应用研究已成为国际上研究的热点.衍射增强成像方法(DEI)作为其中的一种方法通过测量相位衬度的一阶导数而成像.在北京同步辐射装置(BSRF)4W1A束线上，对衍射增强成像方法进行了研究，并对一系列生物医学样品及材料样品成像，得到了非常清晰的相位衬度图像. 关键词： 衍射增强成像 同步辐射 硬x射线     

时空分辨软x射线谱诊断技术研究

利用平焦场光栅谱仪、门控宽微带x射线分幅相机及可见光CCD设计了一套时空及高谱分辨x 射线诊断系统，利用该x射线诊断系统通过一系列的实验研究建立了同时具有时间、空间及 高谱分辨x射线谱诊断技术，该技术已经成功应用于辐射加热样品的吸收谱，获得了较好的 实验结果. 关键词： x射线吸收谱 诊断技术 时空分辨     

X射线衍射和倒易点阵

X射线衍射和倒易点阵概念抽象,是学习的难点,X射线衍射分析的理论基础是倒易点阵,倒易点阵构建的基础是X射线衍射,两者互为基础.然而,大部分教科书中X射线衍射和倒易点阵都是分开讲解,更是给学习理解带来了困难,本文系统介绍了X射线衍射原理,并基于X射线衍射引出倒易点阵,将X射线衍射和倒易点阵统一讲解,使学习理解更加容易.     

High resolution X-ray diffraction investigation of epitaxially grown SrTiO3 thin films by laser-MBE

SrTiO3 thin films are epitaxially grown on DyScO3, LaAlO3 substrates with/without buffer layers of DyScO3 and SrRuO3 using laser-MBE. X-ray diffraction methods, such as high resolution X-ray diffraction, grazing incident X-ray diffraction, and reciprocal space mapping are used to investigate the lattice structure, dislocation density, in-plane lattice strain distribution along film thickness. From the measurement results, the effects of substrate on film lattice quality and microstructure are discussed.     

A tem study on polyoxymethylene rodlike crystals grown epitaxially on NaCl

Rodlike crystals of polyoxymethylene (POM) were isothermally grown onto the newly cleaved (001) face of NaCI from a 0.1 wt% solution in nitrobenzene and then were studied by transmission electron microscopy (TEM). Morphological observation in bright- and dark-field imaging modes and selected-area electron diffraction analysis directly evidenced that POM chain stems in the rodlike crystals are set parallel to the substrate surface and also perpendicular to the rod axis. That is, each of the rodlike crystals is an “edge-on” lamella of POM, the lateral face of which is in contact with the substrate surface. The contact plane of the edge-on lamella in question, namely, the crystallographic plane parallel to the substrate surface, is determined as the (100) plane of the hexagonal crystal lattice of POM.     

Mg掺杂对AlGaN薄膜特性的影响

利用高精度x射线衍射和拉曼散射光谱，对MOCVD生长的不同Mg掺杂量的AlGaN薄膜的c轴 晶格常数、摇摆曲线和拉曼频移进行测量发现：当Mg掺杂剂量较小时，E2模式向 低频方向漂移表明张力应力有所增加，但是摇摆曲线和A1(LO)模式半高宽减小表 明薄膜质量有所提高；随着Mg掺杂剂量的增加，E2模式反向漂移表明此时薄膜中 存在压力应力，同时薄膜质量有所下降.最后根据拉曼频移和应力改变进行拟合得出相应的 线性表达式为Δσ＝-0298+0562·ΔE. 关键词： AlGaN:Mg 异质外延 x射线衍射 拉曼散射     

X-ray analysis of ZnO nanorods grown by microwave irradiation heating on ZnO films

Utilizing microwave irradiation heating, 100-nm-diameter ZnO nanorods were grown from aqueous solution on sputtered ZnO films on glass substrates. Its out-of-plane X-ray diffraction (XRD) measurement indicated that the ZnO nanorods were grown with c-axis orientation, similar with the underlying ZnO films. In the in-plane XRD measurement, intensity of the () diffraction was comparable with that of the () one, suggesting their intensity ratio would contain useful information on nanorods density.     

Variable-temperature micromagnetic study of epitaxially grown MnAs films on GaAs(001)

We present variable-temperature magnetic force microscopy (VT-MFM) studies of epitaxially grown MnAs layers on GaAs(001). In MnAs, a structural and magnetic phase transition occurs at T_c40 °C from the hexagonal, ferromagnetic -phase below T_c to the orthorhombic, paramagnetic -phase above T_c. In the investigated MnAs-GaAs system, both phases coexist over a temperature range of 30 °C below T_c due to the involved strain. Using MFM we are able to distinguish between the ferromagnetic and the paramagnetic phases by measuring topographic and magnetic contrast of the same sample area. For VT-MFM studies, we have employed a temperature stage that allows heating and cooling in a controlled atmosphere with small thermal drift (for this system, the temperature was varied from below 0 °C to above 45 °C). The ratio of the ferromagnetic to the paramagnetic phases shows a temperature hysteresis, i.e. the ratio is dependent on whether the sample was heated or cooled to reach the measurement temperature. Detailed studies of the domains and their arrangements over the hysteretic temperature cycle are shown and compared. Mainly three different domain types are found that are dominant in their respective temperature ranges. PACS 68.37.Rt; 68.35.Rh; 75.70.-i     

Transition of synthetic chromium oxide gel to crystalline chromium oxide: a hot‐stage Raman spectroscopic study

Chromium oxide gel material was synthesised and appeared to be amorphous in X‐ray diffraction study. The changes in the structure of the synthetic chromium oxide gel were investigated using hot‐stage Raman spectroscopy based upon the results of thermogravimetric analysis. The thermally decomposed product of the synthetic chromium oxide gel in nitrogen atmosphere was confirmed to be crystalline Cr₂O₃ as determined by the hot‐stage Raman spectra. Two bands were observed at 849 and 735 cm⁻¹ in the Raman spectrum at 25 °C, which were attributed to the symmetric stretching modes of O Cr^III OH and O Cr^III O. With temperature increase, the intensity of the band at 849 cm⁻¹ decreased, while that of the band at 735 cm⁻¹ increased. These changes in intensity are attributed to the loss of OH groups and formation of O Cr^III O units in the structure. A strongly hydrogen‐bonded water H O H bending band was found at 1704 cm⁻¹ in the Raman spectrum of the chromium oxide gel; however, this band shifted to around 1590 cm⁻¹ due to destruction of the hydrogen bonds upon thermal treatment. Six new Raman bands were observed at 578, 540, 513, 390, 342 and 303 cm⁻¹ attributed to the thermal decomposed product Cr₂O₃. The use of the hot‐stage Raman spectroscopy enabled low‐temperature phase changes brought about through dehydration and dehydroxylation to be studied. Copyright © 2010 John Wiley & Sons, Ltd.     

Transition of chromium oxyhydroxide nanomaterials to chromium oxide: a hot‐stage Raman spectroscopic study

The transition of disc‐like chromium hydroxide nanomaterials to chromium oxide nanomaterials has been studied by hot‐stage Raman spectroscopy. The structure and morphology of α‐CrO(OH) synthesised using hydrothermal treatment were confirmed by X‐ray diffraction (XRD) and transmission electron microscopy (TEM). The Raman spectrum of α‐CrO(OH) is characterised by two intense bands at 823 and 630 cm⁻¹ attributed to ν₁ Cr^III O symmetric stretching mode and the band at 1179 cm⁻¹ attributed to Cr^III OH δ deformation modes. No bands are observed above 3000 cm⁻¹. The absence of characteristic OH stretching vibrations may be due to short hydrogen bonds in the α‐CrO(OH) structure. Upon thermal treatment of α‐CrO(OH), new Raman bands are observed at 599, 542, 513, 396, 344 and 304 cm⁻¹, which are attributed to Cr₂O₃. This hot‐stage Raman study shows that the transition of α‐CrO(OH) to Cr₂O₃ occurs before 350 °C. Copyright © 2010 John Wiley & Sons, Ltd.